BE556535A - - Google Patents
Info
- Publication number
- BE556535A BE556535A BE556535DA BE556535A BE 556535 A BE556535 A BE 556535A BE 556535D A BE556535D A BE 556535DA BE 556535 A BE556535 A BE 556535A
- Authority
- BE
- Belgium
- Prior art keywords
- dan
- pivot
- diffraction
- ruler
- rule
- Prior art date
Links
- 238000006073 displacement reaction Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
- 230000005855 radiation Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 239000011435 rock Substances 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002003 electron diffraction Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000009991 scouring Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Publications (1)
Publication Number | Publication Date |
---|---|
BE556535A true BE556535A (cs) |
Family
ID=180275
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE556535D BE556535A (cs) |
Country Status (1)
Country | Link |
---|---|
BE (1) | BE556535A (cs) |
-
0
- BE BE556535D patent/BE556535A/fr unknown
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Rowland | LXI. Preliminary notice of the results accomplished in the manufacture and theory of gratings for optical purposes | |
US5066127A (en) | Stigmatic imaging with spherical concave diffraction gratings | |
BE556535A (cs) | ||
Alcorn et al. | Extended line emission in the BCG of Abell 2390 | |
Petraco | Color atlas of forensic toolmark identification | |
WO2021102331A1 (en) | High-quality-factor metasurface for phase contrast imaging and spatial frequency filtering | |
Lowry et al. | X. Optical rotatory dispersion. Part III.—The rotatory dispersion of quartz in the infra-red, visible and ultra-violet regions of the spectrum | |
Tyndall | Optical properties of some metallic sulfides | |
Bunting et al. | Mathematical model of a laser-induced fluorescence fiber-optic sensor head for trace detection of pollutants in soil | |
Chevallier et al. | Application of optical filtering to the study of aerial photographs | |
Halliday | Canadian Scientists Report-XII Meteor Spectroscopy with Transmission Diffraction Gratings | |
Colless | Wide field spectroscopy and the universe | |
Nutting | Outlines of applied optics | |
Ives | A new color meter | |
CN102830089A (zh) | 一种带光栅的液体折射率测量装置 | |
Chakravarty | On the diffraction of light incident at nearly the critical angle on the boundary between two media | |
Buckley et al. | The plane reflection grating revisited | |
Frediani | Refractive Index Measurements at and above Melting Point of Solids | |
FR2561800A1 (fr) | Table de mesure | |
US3006237A (en) | Optical device for viewing and generating curved lines | |
Prakash et al. | Measurement of the angle of deviation of a penta prism | |
Zuo | Chip-integrated Metasurface Polarimetric Imaging Sensor and Applications | |
Winkelmolen et al. | An optical method of measuring grain orientation in sediments | |
Palmer et al. | An improved monochromator using a single graded interference filter | |
DE582617C (de) | Photogoniometer |