Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
  • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
  • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

• Physics & Mathematics (AREA)
• Electromagnetism (AREA)
• General Physics & Mathematics (AREA)
• Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
• Analysing Materials By The Use Of Radiation (AREA)

Applications Claiming Priority (2)

Publications (1)

Family

ID=31888951

Family Applications (1)

Country Status (3)

• 0
  • BE BE385676D patent/BE385676A/xx unknown
• 1932
  • 1932-01-15 FR FR729834D patent/FR729834A/fr not_active Expired
  • 1932-01-25 GB GB2282/32A patent/GB383478A/en not_active Expired
  • 1932-01-26 GB GB2357/32A patent/GB383806A/en not_active Expired

Also Published As

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