AU9753698A - A contacting device - Google Patents

A contacting device

Info

Publication number
AU9753698A
AU9753698A AU97536/98A AU9753698A AU9753698A AU 9753698 A AU9753698 A AU 9753698A AU 97536/98 A AU97536/98 A AU 97536/98A AU 9753698 A AU9753698 A AU 9753698A AU 9753698 A AU9753698 A AU 9753698A
Authority
AU
Australia
Prior art keywords
contacting device
contacting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU97536/98A
Inventor
Robin Glenn Agnew
Neal William Vinson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitecs Ltd
Original Assignee
MATRIX TEST Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MATRIX TEST Ltd filed Critical MATRIX TEST Ltd
Publication of AU9753698A publication Critical patent/AU9753698A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
AU97536/98A 1997-11-01 1998-11-02 A contacting device Abandoned AU9753698A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9722998 1997-11-01
GBGB9722998.3A GB9722998D0 (en) 1997-11-01 1997-11-01 A contacting device
PCT/GB1998/003262 WO1999023496A1 (en) 1997-11-01 1998-11-02 A contacting device

Publications (1)

Publication Number Publication Date
AU9753698A true AU9753698A (en) 1999-05-24

Family

ID=10821358

Family Applications (1)

Application Number Title Priority Date Filing Date
AU97536/98A Abandoned AU9753698A (en) 1997-11-01 1998-11-02 A contacting device

Country Status (3)

Country Link
AU (1) AU9753698A (en)
GB (1) GB9722998D0 (en)
WO (1) WO1999023496A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10039928B4 (en) 2000-08-16 2004-07-15 Infineon Technologies Ag Device for automated testing, calibration and characterization of test adapters
DE10219618A1 (en) * 2002-05-02 2003-11-27 Scorpion Technologies Ag Device for testing printed circuit boards
DE102009004555A1 (en) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Method for testing printed circuit boards

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3537000A (en) * 1967-09-20 1970-10-27 Vimm Research Dev Corp Electrical probe including pivotable contact elements
DE3784710D1 (en) * 1987-05-26 1993-04-15 Ibm Deutschland CONTACT PROBE ARRANGEMENT WITH FINE POSITIONING DEVICE.

Also Published As

Publication number Publication date
GB9722998D0 (en) 1998-01-07
WO1999023496A1 (en) 1999-05-14

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase