AU9399398A - Automated visual inspection system and process for detecting and classifying defects - Google Patents

Automated visual inspection system and process for detecting and classifying defects

Info

Publication number
AU9399398A
AU9399398A AU93993/98A AU9399398A AU9399398A AU 9399398 A AU9399398 A AU 9399398A AU 93993/98 A AU93993/98 A AU 93993/98A AU 9399398 A AU9399398 A AU 9399398A AU 9399398 A AU9399398 A AU 9399398A
Authority
AU
Australia
Prior art keywords
detecting
inspection system
visual inspection
classifying defects
automated visual
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU93993/98A
Inventor
Mark R Deyong
Thomas C Eskridge
John W. Grace
Jeffrey E. Newberry
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intelligent Reasoning Systems Inc
Original Assignee
Intelligent Reasoning Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intelligent Reasoning Systems Inc filed Critical Intelligent Reasoning Systems Inc
Publication of AU9399398A publication Critical patent/AU9399398A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU93993/98A 1997-09-22 1998-09-22 Automated visual inspection system and process for detecting and classifying defects Abandoned AU9399398A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US93535197A 1997-09-22 1997-09-22
US08935351 1997-09-22
PCT/US1998/019544 WO1999016010A1 (en) 1997-09-22 1998-09-22 Automated visual inspection system and process for detecting and classifying defects

Publications (1)

Publication Number Publication Date
AU9399398A true AU9399398A (en) 1999-04-12

Family

ID=25466962

Family Applications (1)

Application Number Title Priority Date Filing Date
AU93993/98A Abandoned AU9399398A (en) 1997-09-22 1998-09-22 Automated visual inspection system and process for detecting and classifying defects

Country Status (2)

Country Link
AU (1) AU9399398A (en)
WO (1) WO1999016010A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6515962B1 (en) 1999-07-16 2003-02-04 Alcatel Hit-less switching pointer aligner apparatus and method
US6597381B1 (en) * 1999-07-24 2003-07-22 Intelligent Reasoning Systems, Inc. User interface for automated optical inspection systems
US6603873B1 (en) * 1999-11-12 2003-08-05 Applied Materials, Inc. Defect detection using gray level signatures
KR20010101550A (en) * 1999-11-25 2001-11-14 기시모토 마사도시 Defect inspection data processing system
JP2002008013A (en) 2000-06-27 2002-01-11 Matsushita Electric Works Ltd Device and method for preparing appearance inspection program
US6963076B1 (en) * 2000-07-31 2005-11-08 Xerox Corporation System and method for optically sensing defects in OPC devices
GB2417073A (en) * 2004-08-13 2006-02-15 Mv Res Ltd A machine vision analysis system and method
DE102008001174B9 (en) * 2008-04-14 2013-05-29 Rudolph Technologies Germany Gmbh Inspection system and method for the optical examination of object surfaces, in particular wafer surfaces
CN103398660B (en) * 2013-08-05 2015-12-09 河北工业大学 For obtaining the structured light vision sensor parameter calibration method of weld bead height information
US9833962B2 (en) 2014-02-26 2017-12-05 Toyota Motor Engineering & Manufacturing Norh America, Inc. Systems and methods for controlling manufacturing processes
CN109564166A (en) * 2016-07-08 2019-04-02 Ats自动化加工系统公司 The system and method checked for automatic and artificial combination
CN107748396A (en) * 2016-08-29 2018-03-02 张家港孚冈汽车部件有限公司 Motor assembles position detecting system
SG11202008944XA (en) * 2018-03-14 2020-10-29 Agency Science Tech & Res Method for visual inspection and apparatus thereof
US11314220B2 (en) 2018-04-26 2022-04-26 Liberty Reach Inc. Non-contact method and system for controlling an industrial automation machine
CN111079564B (en) * 2019-11-27 2021-06-01 奥特斯科技(重庆)有限公司 Method for handling a component carrier, optical inspection apparatus and computer-readable medium
CN112927170B (en) * 2021-04-08 2024-03-15 上海哥瑞利软件股份有限公司 Automatic defect removing method in semiconductor manufacturing process
CN113808094A (en) * 2021-09-10 2021-12-17 武汉联开检测科技有限公司 Ray detection welding defect image rating system and method
DE102022103844B3 (en) 2022-02-17 2023-06-22 Synsor.ai GmbH Method for optimizing a production process based on visual information and device for carrying out the method
CN115479891A (en) * 2022-08-12 2022-12-16 深圳市共进电子股份有限公司 Automatic detection system and method for circuit board mounted components based on image recognition

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4202092A (en) * 1976-09-17 1980-05-13 Matsushita Electric Industrial Co., Ltd. Automatic part insertion machine
DE3220800C2 (en) * 1982-06-03 1986-10-30 M.A.N.- Roland Druckmaschinen AG, 6050 Offenbach Device for scanning printing plates
US5101442A (en) * 1989-11-24 1992-03-31 At&T Bell Laboratories Three-dimensional imaging technique using sharp gradient of illumination
US5274714A (en) * 1990-06-04 1993-12-28 Neuristics, Inc. Method and apparatus for determining and organizing feature vectors for neural network recognition
DE4222804A1 (en) * 1991-07-10 1993-04-01 Raytheon Co Automatic visual tester for electrical and electronic components - performs video scans of different surfaces with unequal intensities of illumination by annular and halogen lamps
DE69300853T3 (en) * 1992-07-01 1999-05-12 Yamaha Hatsudoki K.K., Iwata, Shizuoka Method of assembling components and device therefor.
JPH07201946A (en) * 1993-12-28 1995-08-04 Hitachi Ltd Manufacture of semiconductor device and apparatus for manufacture the same, testing of the same and testing apparatus
US5812693A (en) * 1994-10-17 1998-09-22 Chrysler Corporation Integrated machine vision inspection and rework system -- CIP
US5751910A (en) * 1995-05-22 1998-05-12 Eastman Kodak Company Neural network solder paste inspection system

Also Published As

Publication number Publication date
WO1999016010A1 (en) 1999-04-01

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase