AU8760698A - Scanning probe microscope system removably attachable to an optical microscope objective - Google Patents

Scanning probe microscope system removably attachable to an optical microscope objective

Info

Publication number
AU8760698A
AU8760698A AU87606/98A AU8760698A AU8760698A AU 8760698 A AU8760698 A AU 8760698A AU 87606/98 A AU87606/98 A AU 87606/98A AU 8760698 A AU8760698 A AU 8760698A AU 8760698 A AU8760698 A AU 8760698A
Authority
AU
Australia
Prior art keywords
scanning probe
removably attachable
system removably
optical microscope
objective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU87606/98A
Inventor
John D Alexander
Thai Nguyen
Marco Tortonese
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Park Scientific Instruments
Original Assignee
Park Scientific Instruments
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/916,571 external-priority patent/US5861624A/en
Application filed by Park Scientific Instruments filed Critical Park Scientific Instruments
Publication of AU8760698A publication Critical patent/AU8760698A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G01Q30/025—Optical microscopes coupled with SPM

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Microscoopes, Condenser (AREA)
AU87606/98A 1997-08-22 1998-07-29 Scanning probe microscope system removably attachable to an optical microscope objective Abandoned AU8760698A (en)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US91683097A 1997-08-22 1997-08-22
US08916830 1997-08-22
US08916571 1997-08-22
US08/916,571 US5861624A (en) 1997-08-22 1997-08-22 Atomic force microscope for attachment to optical microscope
US09/119,808 US6005251A (en) 1997-08-22 1998-07-21 Voice coil scanner for use in scanning probe microscope
US09119808 1998-07-21
PCT/US1998/015758 WO1999010705A2 (en) 1997-08-22 1998-07-29 A scanning probe microscope system removably attached to an optical microscope objective

Publications (1)

Publication Number Publication Date
AU8760698A true AU8760698A (en) 1999-03-16

Family

ID=27382370

Family Applications (1)

Application Number Title Priority Date Filing Date
AU87606/98A Abandoned AU8760698A (en) 1997-08-22 1998-07-29 Scanning probe microscope system removably attachable to an optical microscope objective

Country Status (2)

Country Link
AU (1) AU8760698A (en)
WO (1) WO1999010705A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100399040C (en) * 2005-03-31 2008-07-02 电子科技大学 Magnetizer for magnetic probe of magnetic microscope
US10302598B2 (en) 2016-10-24 2019-05-28 General Electric Company Corrosion and crack detection for fastener nuts

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57103131A (en) * 1980-12-18 1982-06-26 Sony Corp Biaxial driver
US4667415A (en) * 1985-11-29 1987-05-26 Gca Corporation Microlithographic reticle positioning system
JPS62174811A (en) * 1986-01-29 1987-07-31 Hitachi Constr Mach Co Ltd Finely positioning device
DE68916667T2 (en) * 1988-03-04 1995-01-12 Toshiba Kawasaki Kk Microscope.
US4999495A (en) * 1988-08-31 1991-03-12 Seiko Instruments Inc. Scanning tunneling microscope
JP2821005B2 (en) * 1989-10-02 1998-11-05 オリンパス光学工業株式会社 Micro surface shape measuring device
US5289004A (en) * 1990-03-27 1994-02-22 Olympus Optical Co., Ltd. Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
JPH05196458A (en) * 1991-01-04 1993-08-06 Univ Leland Stanford Jr Piezoresistance cantilever structure for atomic power microscope
US5360974A (en) * 1992-10-20 1994-11-01 International Business Machines Corp. Dual quad flexure scanner
US5689063A (en) * 1993-07-15 1997-11-18 Nikon Corporation Atomic force microscope using cantilever attached to optical microscope
US5808302A (en) * 1994-08-27 1998-09-15 International Business Machines Corporation Fine positioning apparatus with atomic resolution
JPH08226928A (en) * 1994-12-08 1996-09-03 Nikon Corp Interatomic force microscope with optical microscope
US5834864A (en) * 1995-09-13 1998-11-10 Hewlett Packard Company Magnetic micro-mover
US6078044A (en) * 1996-05-13 2000-06-20 Seiko Instruments Inc. Probe scanning apparatus

Also Published As

Publication number Publication date
WO1999010705A2 (en) 1999-03-04
WO1999010705A3 (en) 1999-11-11

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase