AU6400099A - Multidimensional sensing system for atomic force miscroscopy - Google Patents

Multidimensional sensing system for atomic force miscroscopy

Info

Publication number
AU6400099A
AU6400099A AU64000/99A AU6400099A AU6400099A AU 6400099 A AU6400099 A AU 6400099A AU 64000/99 A AU64000/99 A AU 64000/99A AU 6400099 A AU6400099 A AU 6400099A AU 6400099 A AU6400099 A AU 6400099A
Authority
AU
Australia
Prior art keywords
sensing system
atomic force
multidimensional sensing
miscroscopy
force miscroscopy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU64000/99A
Inventor
Vincent Chau
Vladimir Mancevski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xidex Corp
Original Assignee
Xidex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xidex Corp filed Critical Xidex Corp
Publication of AU6400099A publication Critical patent/AU6400099A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AU64000/99A 1998-09-26 1999-09-24 Multidimensional sensing system for atomic force miscroscopy Abandoned AU6400099A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10196398P 1998-09-26 1998-09-26
US60101963 1998-09-26
PCT/US1999/022175 WO2000019166A1 (en) 1998-09-26 1999-09-24 Multidimensional sensing system for atomic force miscroscopy

Publications (1)

Publication Number Publication Date
AU6400099A true AU6400099A (en) 2000-04-17

Family

ID=22287406

Family Applications (1)

Application Number Title Priority Date Filing Date
AU64000/99A Abandoned AU6400099A (en) 1998-09-26 1999-09-24 Multidimensional sensing system for atomic force miscroscopy

Country Status (2)

Country Link
AU (1) AU6400099A (en)
WO (1) WO2000019166A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6545492B1 (en) 1999-09-20 2003-04-08 Europaisches Laboratorium Fur Molekularbiologie (Embl) Multiple local probe measuring device and method
US6583411B1 (en) * 2000-09-13 2003-06-24 Europaisches Laboratorium Für Molekularbiologie (Embl) Multiple local probe measuring device and method
JP5806337B2 (en) * 2011-02-25 2015-11-10 キーサイト テクノロジーズ， インク． Atomic force microscope controller and method
CN102825602B (en) * 2012-08-21 2015-03-25 华北电力大学（保定） PSD (Position Sensitive Detector)-based industrial robot self-calibration method and device
DE102017205528B4 (en) 2017-03-31 2021-06-10 Carl Zeiss Smt Gmbh Device and method for a scanning probe microscope
CN107505610B (en) * 2017-07-19 2019-11-08 中国科学院空间应用工程与技术中心 Six-freedom degree pose measurement method and device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4935634A (en) * 1989-03-13 1990-06-19 The Regents Of The University Of California Atomic force microscope with optional replaceable fluid cell
DE69309318T2 (en) * 1992-01-10 1997-10-30 Hitachi, Ltd., Tokio/Tokyo Method and device for observing a surface
US5440920A (en) * 1994-02-03 1995-08-15 Molecular Imaging Systems Scanning force microscope with beam tracking lens

Also Published As

Publication number Publication date
WO2000019166A1 (en) 2000-04-06
WO2000019166A9 (en) 2002-08-22

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase