AU599583B2 - Arrangement for the contact-less testing of the presence of an electrical voltage - Google Patents

Arrangement for the contact-less testing of the presence of an electrical voltage

Info

Publication number
AU599583B2
AU599583B2 AU53189/86A AU5318986A AU599583B2 AU 599583 B2 AU599583 B2 AU 599583B2 AU 53189/86 A AU53189/86 A AU 53189/86A AU 5318986 A AU5318986 A AU 5318986A AU 599583 B2 AU599583 B2 AU 599583B2
Authority
AU
Australia
Prior art keywords
arrangement
amplifier stage
electrical
sensor device
arrangement according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU53189/86A
Other versions
AU5318986A (en
Inventor
Hardy Nylen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU5318986A publication Critical patent/AU5318986A/en
Application granted granted Critical
Publication of AU599583B2 publication Critical patent/AU599583B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145Indicating the presence of current or voltage
    • G01R19/155Indicating the presence of voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06788Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Emergency Protection Circuit Devices (AREA)

Description

AU-AI 5 3 1 8 9 8 8 T /ORLD INTELLECTUAL PROPERY OGANIZATION INTERNATIONAL APPLICATION PUBLISHE l T PA T ITION TREATY (PCT) (51) International Patent Classification 4 (11) International Publication Number: WO 86/ 04424 G01R 19/155 Al (43) International Publi:ation Date: 31 July 1986 (31.07.86) (21) International Application Number: PCT/SE86/00016 GB, GB (European patent), IT (European patent), JP, KP, LU (European patent), NL (European patent), (22) International Filing 1P.te: 17 January 1986 (17.01.86) NO, SE (European patent), SU, US.
(31) Priority Application Number: 8500205-3 Published With international search report.
(32) Priority Date: 17 January 1985 (17.01.85) In English translation (filed in Swedish).
(33) Priority Country: SE (71)(72) Applicant and Inventor: NYLEN, Hardy [SE/SE]; SpAngberg, Aschebergsgatan 23 A, S-411 27 Gbteborg
(SE).
(74)Agents: HAGELBERG, Torvald et al.; Patentbyrdn West-Patent AB, Stora Nygatan 15, S-411 08 Gateborg (SE).
A.O.J.P, 11 SEP 1986 (81) Designated States: AT (European patent), AU, BE (European patent), BR, CH (European patent), DE, DE AUSTRALIAN (Utility model), DE (European patent), DK, FI, FR (European patent), 13 AUG 1986 PATENT OFFICE (54) Title: ARRANGEMENT FOR THE CONTACT-LESS
VOLTAGE
TESTING OF THE PRESENCE OF AN ELECTRICAL 7 (57) Abstract An arrangement for the contact-less testing for the presence of an electrical voltage in an electrical conductor or component. The arrangement comprises a sensor device exhibiting an electrical conductor ofa specified length, one end (22) of which is open, a first amplifier stage to the input of which the opposite end (31) of the sensor device is connected, and a second amplifier stage the input (32) of which is connected to the output (25) from the first amplifier stage. The seond amplifier stage exhibits an indicator device (20) which, when an electric current is induced through the sensor device, will indicate the presence of an electrical voltage in the aforementioned component within a specified sen- i sing area in the vicinity of the sensing device, i I Arrangement for the contact-less testing of the presence of an electrical voltage.
Technical Field: The present invention relates to an arrangement for the contact-less testing of the presence of an electrical voltage in an electrical conductor or component.
Technical Problem: There are available portable test devices for the contact-less testing of the presence of an electrical voltage, for example for finding concealed electrical conductors. The commercially available devices sense the magnetic field, however, which requires a current to be flowing through the conductor, that is to say a current consumer must be connected.
Furthermore these devices are not, as a general rule, so selective as to permit them to be used for checking whether a single fuse in a group installation is defective because of the positioning of the fuses adjacent S to one another. Previously disclosed ,evices can thus wrongly indicate the I .00 presence of a voltage as a result of the interference of the magnetic field 20 of an adjacent fuse.
The object of the present invention is to propose an easily handled arrangement by means of which the disadvantages referred to above are Sel imi ie.ted.
!The Solution: S" *25 Accordingly, in one broad form, there is provided an arrangement for contact-less testirl for the presence of an electrical voltage in an electrical test component, wherein the arrangement comprises: a sensor device including an electrical conductor of a predetermined S length having a free end and an inner end; S .4 ,0 a first amplifier stage having a first input and a first output said end of the electrical conductor being connected to the first input; a second amplifier stage having a second input, said first output being connected to the second input; and said second amplifier stage driving an indicator device for generating an indication signal when the sensor device Is within a predetermined distance frCm the electrical test component and in the presence of an electric fleld about said test component.
HRF/O115z ~3C I i ili.
2 as to indicate the presence of an electrical voltage i' e aforementioned component within a specifier sens area in the vicinity of the sensor device, and in the second amplifier stage contains a rectifier s ranged, in the presence of a detected voltage in t orementioned electrical component, as to conduct an e rical current through the indicator device for the purpe of the actuation of same.
Brief Description of the Drawings: The invention is described below in greater detail in relation to a couple of illustrative embodiments with reference to the accompanying drawings, in which Fig. 1 shows a side view of a test arrangement in accordance with the invention as a first illustrative embodiment; Fig. 2 shows a schematic longitudinal qeetion through the arrangement in accordance with Fig. 1; Figs. 3 and 4 show corresponding views of the test arrangement in accordance with a second illustrative embodiment; Fig. 5 shows a connection diagram for the arrangement in accordance with the invention; and Fig. 6 shows an example of the application of the arrangement.
Preferred Embodim on t: A first example of the mechanical construction of the test arrangement can be appreciated from Figs. 1 and 2. The test arrangement can be given an extremely compact construction similar in shape to a pen with a tubular casing 1 and an attachment clip 2 for securing the arrangement in a pocket or similar. The main part of the space inside the test arrangement is taken up by a current source consisting of two series-connected batteries or accumulators 4, with one of the poles of one of the batteries, usually the positive pole 6, connected to an electronic circuit 7 via a switching device 8. The other pole of the other battery, i.e. in this case the negative pole 9, is connected via a spring element 10 to the electrically conducting casing 11 in a similar fashion to the arrangement used in a flashlight. A detachable end plug 12 supports the spring element 10 and can be removed to 3 permit replacement of the batteries. In the example shown here the electrical circuit with its zero potential connection (see below) is connected to the conducting casing and is intended to be situated in a cylindrical component 13 made of an electrically insulating material, for example of moulded plastic with an opaque body 14. This cylindrical component can be assembled in a detachable fashion with the tubular electrically conducting component 11 by means of a threaded section 15. At the front end of the test arrangement, which constitutes the sensing tip 16, there is provided a conicrl part 17 which is translucent and is provided with, for example, a facetted surface 18. The conical part 17 exhibits more precisely the form of a truncated cone with a preferably flat end surface 19. The conical part 17 houses an indicator device 20 which, in the example illustrated, is of an optical type in the form of, for example, a light emitting diode capable of being switched between a lit and an extinguished state.
Also housed inside the conical part 17 is a sensor device 21 which exhibits a free, i.e. an open end 22, situated behind the end surface 19, and an end 23 connected to the electrical circuit 7.
The facetted surface 18 is formed by the prism grinding process and acts as a lens for the light emitted by the light emitting diode in its lit state. The sensor device 21 consists of an electrical conductor of precisely determined length.
Figs. 3 and 4 show a second embodiment of the test arrangement. This differs from the first embodiment essentially in that it is executed as a lamp with a bulb 42 situated between the batteries 4, 5 and the electrical circuit 7. This is situated in a slightly protruding translucent and preferably knurled section 43, in which case a separate bulb is not required. The switch for the bulb and possibly also for the electrical circuit 7 may be built into the clip 2, for example.
The layout of the electrical circuit 7 in accordance with a proposed example may be appreciated from Fig. 5. The electrical circuit 7 in actual fact represents the test arrangement as such, although other components have been included to permit the I practical function of the arrangement. The electrical circuit 7 i TCII.I----C..UB.
II~-
1 4 and thus the test arrangement itself is constructed from a first amplifier stage 24 and a second amplifier stage 26 connected to the output 25 from the first amplifier stage. The source of current 4, 5 is intended to be connected by its positive pole to the positive connection point 27 and to be connected by its negative pole to the negative connection point 28, which also constitutes the 'earth' for the arrangement, that is to say its zero potential. The first amplifier stage 24 consists in the example shown of a so-called Darlington pair of two transistors 29, 30, which are thus connected together in a Darlington arrangement, as shown in the Figure. The sensor devi:e 21 in form of the electrical conductor is, as stated above, free or )f at one of its ends, that is to say it is not conn' ed electrically to anythin!,. and is connected at its other end to the base 31 of the first transistor 29 in the first amplifier stage 24. Also included in tLe circuit is a resistance 33 of, for example, 10 ohms connected between the output 25 of the first amplifier stage and the input 32 of the second amplifier stage 26, and a resistance 34 of, for example, 2 kiloohms, connected between the input 32 of the second amplifier stage and its positive connection point 27. Also included is a capacitor 35 of, for example, 1 microfarad.
The principal component parts of the second amplifier stage 26 consist of a transistor 36 and the indicator device 20 in the form of the light-emitting diode.
The particular design of the test arrangement with an .open base allows the sensor device 21 to act as an antenna which senses the electrical field in an electrical conductor or component. In this way the test arrangement provides an indication of electrical voltage, irrespective of whether or not a current is flowing through the conductor or the component. This is extremely important, for example, for checking whether or not fuses are defective. Experience has shown that the procedure of checking fuses simply by examining the coloured end-plate of a fuse is very unreliable, since the plate will often remain in its position even if the fuse has blown and the conductive wire present inside the
A-
fuse has melted. The sensitivity of the arrangement for such an application is adjusted so that the arrangement will not sense the electrical field from any adjacent fuses, or from one side of the fuse holder which will, of course, remain electrically conductive when a fuse blows.
The test arrangement is used in such a way that the rod- or pen-shaped arrangement is pointed at the fuse 37 in question which is to be tested in a group installation 38, and more specifically with its sensing tip 16 positioned relatively close to or against the inspection glass 39 in the fuse holder 40; see Fig. 6.
Indication of whether a fuse is defective or sound is achieved simply by activating the indicator device 20 and switching it from a first state to a second state,in the example illustrated here by the light-emitting diode lighting up, if the fuse is sound and if a voltage is accordingly present at the end of the fuse situated closest to the sensing tip 16.
When the light-emitting diode is extinguished, the input 32 to the second amplifier stage 26, that is to say the control electrode in the form of the base of the transistor 36, will exhibit a potential such that the transistor 36 is open, that is to say that a current will not flow in the circuit indicated by the arrows 41. When the test arrangement is held up to the fuse 37 which is to be tested, nothing will happen if the fuse is defective, since in this case no electrical field will be present at the sensor device 21 of such a strength as to cause an indication to be given. This is th* case because only that end of the fuse furthest away from the test arrangement will exhibit a voltage, that is to say the part situated in the bottom of the fuse holder 40. The sensitivity of the arrangement is thus adjusted in such a way that it will not react to the electrical field at a distance of about the length of a fuse. This is true at least in the presence of a mains voltage of 110-380 V. If the fuse is sound, which means that the fuse is also live at its end situated closest to the sensing tip 16, an electrical field will D -L4 35 be present at the sensor device 21 of such a strength that a "l potential difference will occur in the conductor which acts as an
S
6 antenna, which constitutes the sensor device 21, said potential difference being amplified in the first amplifier stage by the transistors 29, 30 changing state with regard to their conductivity, which in turn gives rise to a potential difference at the input 32 to the second amplifier stage 26, that is to say the control electrode in the form of the base of the transistor 36, due to the discharge of the capacitor 35, in which case the transistor 36 will change its state of conductivity from a cut-off state to a conductive state, with the result that a current will flow in the direction of the arrows 41 from the positive pole 27 through the light-emitting diode 20 and to the negati/e pole 28, in which case the light-emitting diode will be caused to light and the conical part 17 will be imparted with an even, strong Light because of the prism-ground surface. The light-emitting diode may, for example, be of the high-intensity light-emitting diode type, enabling a clear indication to be seen even in daylight conditions. When the test arrangement is moved away from the fuse, the light-emitting diode will be extinguished rapidly because of the change in the state of the conductivity of the Darlington transistors, since the absence of electrical field strength will once more produce a potential difference in the sensor device 21 executed ,is an open base. This in turn will cause a change to occur in the potential at the base 32 of the transistor 26, jthereby cutting off that transistor, which will thus act as a rectifier. There is no need for the circuit to be closed via the human body, as a result of which the arrangement can, if so desired, be executed with an insulated casing.
The invention is not restricted to the illustrative ,d embodiments described above and illustrated in the drawings, but may be modified in a number of ways within the scope of the following Patent Claims. For example the antenna, that is to say the sensor device 21, can be directed by means of a screened antenna with a screen which is, connected to the negative pole 28.
In this way the antenna is less sensitive in an angular sense, that is to say to electrical fields from conductors which are 1 t\ situated alongside the test arrangement in its longitudinal sense.
7 The screen can be executed in such a way that it is capable of being connected and disconnected for the purpose of varying the sensitivity. The length of the sensor device 21 as such can also be selected so as to provide the desired sensitivity so that the test arrangement will not react to the electrical field from adjacent fuses. The arrangement can also be equipped with two sensor devices of different lengths, which may be connected alternately so as to provide a choice between two levels of sensitivity. No manually operated change-over switch for the current source is required, since the arrangement uses practically no current at all when the transistors are cut off and the light-emitting diode is thus extinguished, as far as the embodiments in accordance with Figs. 1 and 2 are concerned. A change-over switch may be included, however, as a safety measure.
In the interests of clarity it must be pointed out that the expression 'contact-Less' is used to denote that the test arrangements do not require to be brought into contact with the electrical conductor or component which is to be tested.

Claims (9)

Pa t e n t C l a i s:
1. An arrangement for the contact—less testing of the presence of an electrical voltage in an electrical conductor or component (37), c h a r a c t e r i z ed in that the arrangement comprises a sensor device (21), exhibiting an electrical conductor of a specified length, one end (22) of which is open, a first amplifier stage (24), to the input of which the opposite end (31) of the sensor device is connected, and a second amplifier stage (26)^ the input (32) of which is connected to the output (25) from the first amplifier stage, in addition to which the second amplifier stage exhibits an indicator device (20) which is so arranged as to indicate the presence of an electrical voltage in the aforementioned component within a specified sensing area in the vicinity of the sensor device, and in that the second amplifier stage (26) contains a rectifier (36) so arranged, in the presence of a detected voltage in the aforementioned electrical component, as to conduct an electric current through the indicator device (20) for the purpose of the actuation of same.
2. An arrangement according to Patent Claim 1, c h a r a c t e r¬ i z e d in that the indicator device consists of a light—emitting unit, preferably a light—emitting diode.
3. An arrangement according to any of the preceding Patent Claims, c h a r a c t e r i z e d in that the first amplifier stage (24) is so arranged as to produce very high current amplification.
4. An arrangement according to Patent Claim 3, c h a r a c t e r¬ i z e d in that the first amplifier stage (24) consists of two transistors connected together in a Darlington arrangement, with a first transistor (29) exhibiting an open base through the connection of the base to the opposite end (31) of the sensor device (21) which is open at one end (22).
5. An arrangement according to any of the preceding Patent Claims, c h a r a c t e r i z e d in that the sensor device (21) exhibits, in addition to an electrical conductor, partially enclosing electrical screening.
6. An arrangement according to any of the preceding Patent Claims, .. c h a r a c t e r i z e d in that the arrangement is constructed in the form of an essentially rod-shaped unit with a long sleeve—shaped component (1), inside which a current source is accommodated, a component situated ahead of the current source, which contains an electrical circuit, and situated ahead of it a sensing tip, which is executed in an electrically insulating material and which contains at least the sensor device (21).
7. An arrangement according to Patent Claim 6, c h a r a c t e r¬ i z e d in that, in the event of the indicator device (20) being an optical device so arranged as to emit a beam of light when indicating, the indicator device is situated in the sensing tip 071-, which in this case is executed in a transparent material.
8. An arrangement according to Patent Claim 7, c h a r a c t e r¬ i z e d in that the sensing tip (.T is essentially conical and tapers in the direction of the end of the arrangement and exhibits a prismatic ground lens surface at the conical generated surface.
9. An arrangement according to Patent Claim 7, c h a r a c t e r¬ i z ed in that the sensing tip. (16) exhibits essentially the form of a truncated cone with an essentially flat end surface (19), behind which is situated the free, open end (22) of the sensor device.
AU53189/86A 1985-01-17 1986-01-17 Arrangement for the contact-less testing of the presence of an electrical voltage Ceased AU599583B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE8500205 1985-01-17
SE8500205A SE452807B (en) 1985-01-17 1985-01-17 DEVICE FOR TESTLESS TESTING THE PRESENCE OF ELECTRIC VOLTAGE

Publications (2)

Publication Number Publication Date
AU5318986A AU5318986A (en) 1986-08-13
AU599583B2 true AU599583B2 (en) 1990-07-26

Family

ID=20358787

Family Applications (1)

Application Number Title Priority Date Filing Date
AU53189/86A Ceased AU599583B2 (en) 1985-01-17 1986-01-17 Arrangement for the contact-less testing of the presence of an electrical voltage

Country Status (4)

Country Link
EP (1) EP0238500A1 (en)
AU (1) AU599583B2 (en)
SE (1) SE452807B (en)
WO (1) WO1986004424A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD425803S (en) 1999-03-01 2000-05-30 Applied Power Inc. Electrical instrument

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5877618A (en) * 1997-07-31 1999-03-02 Applied Power, Inc. Hand held non-contact voltage tester
DE10023048B4 (en) * 2000-05-11 2009-06-04 Ch. Beha Gmbh Technische Neuentwicklungen Wechselspannungsdedektor
DE10326064A1 (en) * 2003-06-10 2005-01-05 Beha Innovation Gmbh Contactless safety voltage detector for warning a wearer or carrier if an object or component is live, is dimensioned so that it can easily be carried on the person or incorporated in clothing or a tool
JP6558028B2 (en) * 2015-04-01 2019-08-14 東京電力ホールディングス株式会社 Pen-type sensor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2956229A (en) * 1959-04-27 1960-10-11 James L Henel Voltage and polarity tester
DE3019061A1 (en) * 1980-05-19 1981-11-26 PHB Planungsbüro Hesse GmbH, 8500 Nürnberg Low voltage tester for e.g. vehicles - has CMOS comparator circuit for detecting voltage with LED indicator
DE3122841A1 (en) * 1981-03-10 1983-01-05 Arens, Wolfgang, 5948 Schmallenberg Electrical test instrument

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3004734C2 (en) * 1980-02-08 1981-10-01 Siemens AG, 1000 Berlin und 8000 München Test device in the form of a screwdriver for displaying an electrical voltage or for phase testing on the AC voltage network
DE3302509C1 (en) * 1983-01-26 1984-03-29 Arens, Wolfgang, 5948 Schmallenberg Single-pole electric testing device to identify and distinguish induction and mains AC voltages
SE431129B (en) * 1983-03-08 1984-01-16 Jonsson Knut SIMPLE VOLTAGE TESTER

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2956229A (en) * 1959-04-27 1960-10-11 James L Henel Voltage and polarity tester
DE3019061A1 (en) * 1980-05-19 1981-11-26 PHB Planungsbüro Hesse GmbH, 8500 Nürnberg Low voltage tester for e.g. vehicles - has CMOS comparator circuit for detecting voltage with LED indicator
DE3122841A1 (en) * 1981-03-10 1983-01-05 Arens, Wolfgang, 5948 Schmallenberg Electrical test instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD425803S (en) 1999-03-01 2000-05-30 Applied Power Inc. Electrical instrument

Also Published As

Publication number Publication date
SE452807B (en) 1987-12-14
EP0238500A1 (en) 1987-09-30
SE8500205D0 (en) 1985-01-17
WO1986004424A1 (en) 1986-07-31
SE8500205L (en) 1986-07-18
AU5318986A (en) 1986-08-13

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