AU595615B2 - Apparatus for isotopic x-ray fluorescence analysis - Google Patents
Apparatus for isotopic x-ray fluorescence analysis Download PDFInfo
- Publication number
- AU595615B2 AU595615B2 AU74157/87A AU7415787A AU595615B2 AU 595615 B2 AU595615 B2 AU 595615B2 AU 74157/87 A AU74157/87 A AU 74157/87A AU 7415787 A AU7415787 A AU 7415787A AU 595615 B2 AU595615 B2 AU 595615B2
- Authority
- AU
- Australia
- Prior art keywords
- isotopic
- ray fluorescence
- fluorescence analysis
- sources
- passage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Description
J:
COMMONWEALTH OF AUSTRALI5 9 5 PATENTS ACT 1952 Form COMPLETE SPECIFICATION FOR OFFICE USE Short Title: Int. Cl: Applicati"- 'lumber: Lodged: Complete Specification-Lodged: Accepted: Lapsed: Published: g II j
**I
t r Priority:
C
Related Art: TO BE COMPLETED BY APPLICANT I I 1 Name of Applicant: Address of Applicant: Actual Inventor: Address for Service: INSTITUTE PO CVETNA METALURGIA 9, Assenovgradsko Chaussee, Plovdiv,
BULGARIA
Yasen Stamenov Stamenov Peyu Hristov Peev Sasho Atanasov Sevov and Petko Ivanov Petkov GRIFFITH HASSEL FRAZER 71 YORK STREET SYDNEY NSW 2000
AUSTRALIA
tt* Complete Specification for the invention entitled: APPARATUS FOR ISOTOPIC X-RAY FLUORESCENCE
ANALYSIS
The following statement is a full description of this invention, including the best method of performing it known to me/us:- 8446A:rk I I~ The invention refers to an apparatus for isotopic X-ray fluorescence analysis of a substance composition and is used for multi-element analysis of cnemical elements in solid, powderous and liquid specimens.
An apparatus for isotopic x-ray fluorescence analysis(l) is known comprising a detector disposed along the axis of a measuring head having a protective screen that is disposed between the front of the detector and a protective cylinder which encompasses the detector about its per'nheral surface. The protective cylinder has a central conical passage opening in the surface of which is formed a se r with an exciting source disposed therein.
S In front of the larger opening of the conical passage is cf (tt c situated a seat for the studied specimen, the seat being formed in a sample holder which encompasses a body, the body having an inner surface, which embraces the protective cylinder.
A drawback of the known apparatus for isotopic x-ray fluorescence analysis is its low functional ability C2 permitting analysis of only a restricted number of chemical elements. This is brought about by the fact that 2 ccc in irradiating the specimen with only one radioactive source of a single type, the characteristic x-ray lines of only a few chemical elements are excited in an efficient manner in the narrow energetic range being specific for that type of source.
The object of the invention is to provide an apparatus for isotopic x-ray fluorescence analysis with increased functional possibilities under optimal conditions for efficient excitation of the required elements and having a high precision of analysis.
This object is attained by means of an apparatus for isotopic x-ray fluorescence analysis comprising a detector disposed along the axis of a measuring head laving a protective screen disposed between the front uf the detector and a protective cylinder encompassing the detector about its peripheral surface. The protective cylinder has a central tapered passage of circular cross-section in the surface of which are formed seats 5106S/bm -2- U with exciting sources dispos d therein. In front of the larger opening of the tapered pa sage is disposed a seat for the investigated specimen, the seat being formed in a sample holder embracing a body, the body having an inner surface which encompasses the protective cylinder. In the tapered passage is placed a rotating tapered shutter of circular cross-section with at least one aperture. The screen in the zone of the smaller opening of the tapered passage embraces the shutter from the inside. The exciting sources are of different types and are situated in different sections of the conical passage. The C* aperture in the tapered shutter has a dimension along the forming surface of the cone such that upon rotatia it encompasses the active surface of each one of the exciting sources.
It is possible that there is more than one aperture in the tapered shutter, Ctiere being a corresponding aperture with respect to each source of a different type.
It is also possible that some of the sources are of the same type whereby the number of the apertures in the tapered shutter is equal to the number of the sources of e; the same type.
The advantage of the apparatus for isotopic x-ray fluorescence analysis consists in its increased functional ,'29 possibility permitting, according to this method, analysis of all determinable chemical elements in cslid, powderous S and liquid specimens under optimal conditions for efficient excitation ensuring thereby a high precision of the analysis.
The invention is better explained by an example of the apparatus for isotopic x-ray fluorescence analysis as presented on the drawing annexed herewith that represents a view being a cross section of the apparatus.
The apparatus for x-ray fluorescence isotopic analysis comprises a detector 1, for example a semiconductor that is disposed along the axis of a measuring head comprising a protective screen 2 disposed between the front of detector 1 and a protective cylinder 3 encompassing the detector 1 about its peripheral 5106S/bm -3- 106-* 44L i *12 p~ surface. The protective cylinder 3 has a central conical passage 4 in the surface of which are formed seats 5 in which are situated exciting sources 6. In front of the larger opening of the conical passage 4 is disposed a seat 7 for the investigated sample that is formed in a sample holder 8 embracing in a removable manner the body 9, the inner surface of which encompasses the protective cylinder 3. In the conical passage 4 is disposed a rotating conical shutter 10 with apertures 11. The screen 2 in the zone of the smaller opening of the conical opening 4 embraces the shutter 10 from the inside. The exciting sources 6 are of different types, for example iron cadmium 109, americium 241 and are lying in different C sections of the conical passage 4. The aperture 11 in the conical shutter 10 has such dimensions along the forming °c surface of the cone that it embraces the active surface of each one of the exciting sources 6.
It is possible that the number of the apertures 11 is equal to the number of the sources 6 whereby for each 020 source 6 of a different type there is a corresponding aperture 11. If some of the sources are of the same type C tC then the number of the apertures 11 is equal to the number of the sources of the same type.
It is possible that the space determined by the 2 surface of the conical passage 4, the detector 1 and the t specimen placed in the seat 7 is to be purged with inactive gas, for example helium (not shown on the figure).
The apparatus for isotopic x-ray fluorescence analysis operates in the following manner: The specimen is placed by means of a passage cup with central opening in the seat 7 of the sample holder 8 and together with the conical shutter 10 it is rotated with respect to the body 9 and the protective cylinder 3, for example by a step engine and an electronic device (not shown on the figure) until one of the apertures 11 arrives over one of the operating sources 6. According to a signal from the electronic device the movement is discontinued and there is effected a measurement of the group of chemical elements excited by the selected source 5106S/bm -4- 6 and the characteristic x-ray radiations of the elements are recorded by the detector 1 and they are processed electronically, for example by means of a multichannel analyzer (not shown on the figure) until information about the concentration is obtained In an analogous manner there is effected consecutively the positioning of the shutter 10 over the other radioactive sources 6 and the concentration of the respective groups of elements is measured. A position is possible when the apertures 11 are open for parallel operation of several sources of the same type 6. The last position of the shutter 10 is idle when all sources are closed.
tr The proposed apparatus permits the incorporation simultaneously of radioactive sources of different types, the consecutive or simultaneous operation of which increases the functional possibilities for multi-element analysis of all determinable chemical elements by means of isotopic x-ray fluorescence analysis. By suitable disposition of the sources 6, specimen and detector 1 under specific and optimal geometric conditions and the specially elaborated conical shutter 10, the efficient cc tcct' excitation and the high precision of the analysis is maintained.
S'2 REFERENCES 1. Voldset "Applied spectrometry of x-ray radiation", Moscow, Atomizdat, 1977, p. 71, fig. 2.22.
510 6S/bm
Claims (5)
1. Apparatus for isotopic x-ray fluorescence analysis comprising a detector disposed along the axis of a measuring head having a protective screen disposed between the front of the detector and a protective cylinder that encompasses the detector about its peripheral surface whereby the protective cylinder has a central tapered passage, in the surface of which is formed a seat with an exciting source therein, while in front of the larger opening of the central tapered passage is disposed a seat for the investigated specimen, which seat is formed in a sample holder embracing a body, the body having an inner surface which encompasses the protective cylinder, characterized in that along the tapered surface of the passage there is at least one seat more in which is disposed an exciting source of a different type, in the tapered passage is placed a rotating tapered shutter with a tapered passage and with at least one aperture disposed on the wall (of the shiutter), and the protective screen in the zone of the smaller opening of the tapered passage encompasses the shutter from the inside.
2. Apparatus for isotopic x-ray fluorescence analysis according to claim 1, characterized in that the 'c exciting sources are lying in different sections of the cc 25 conical passage.
3. Apparatus for isotopic x-ray fluorescence analysis according to claims 1 and 2, characterized in that the aperture of the conic shutter has a dimension along the forming surface of the cone such that upon l t 30 rotation it can encompass the active surface of one or more cf the exciting sources.
4. Apparatus for isotopic x-ray fluorescence analysis according to claims 1 and 2, characterized in that the number of the apertures ip equal to the number of the sources whereby consequently for each source of a different type there is a correspondirng aperture. 5106S/MS -6- Apparatus for isotopic x-ray fluorescence analysis according to claim 1, characterized in that some of the sources are of the same type whereby the number of the apertures is equal to the number of the sources of the same type.
6. Apparatus for isotopic x-ray fluorescence analysis substantially as disclosed herzin in conjunction with the drawing. DATED 12th day of January 1990 15 INSTITUTE PO CVETNA METALURGIA 0I By their Patent Attorneys ,o00. GRIFFITH HASSEL FRAZER o000 0 4000 c 00o 0 B00000 Soo 00 000 0 0 ^c^ 5106S/MS -7-
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| BG7538286A BG44997A1 (en) | 1986-06-17 | 1986-06-17 | |
| BG75382 | 1986-06-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| AU7415787A AU7415787A (en) | 1987-12-24 |
| AU595615B2 true AU595615B2 (en) | 1990-04-05 |
Family
ID=3917411
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU74157/87A Ceased AU595615B2 (en) | 1986-06-17 | 1987-06-12 | Apparatus for isotopic x-ray fluorescence analysis |
Country Status (8)
| Country | Link |
|---|---|
| JP (1) | JPS6352046A (en) |
| AU (1) | AU595615B2 (en) |
| BG (1) | BG44997A1 (en) |
| DD (1) | DD283532A7 (en) |
| DE (1) | DE3718764A1 (en) |
| FI (1) | FI871633A (en) |
| FR (1) | FR2600165B1 (en) |
| GB (1) | GB2192277B (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1385784A (en) * | 1919-06-25 | 1921-07-26 | Chalmers G Hall | Drift-compensating device for airships |
| US3511989A (en) * | 1967-02-21 | 1970-05-12 | Solomon Lazarevich Yakubovich | Device for x-ray radiometric determination of elements in test specimens |
| US3889113A (en) * | 1973-05-03 | 1975-06-10 | Columbia Scient Ind Inc | Radioisotope-excited, energy-dispersive x-ray fluorescence apparatus |
| US4063089A (en) * | 1976-11-24 | 1977-12-13 | The United States Of America As Represented By The United States Energy Research And Development Administration | X-ray chemical analyzer for field applications |
| CA1132262A (en) * | 1979-10-26 | 1982-09-21 | Archibald H.C.P. Gillieson | Method and apparatus for evaluating notes |
-
1986
- 1986-06-17 BG BG7538286A patent/BG44997A1/xx unknown
-
1987
- 1987-04-14 FI FI871633A patent/FI871633A/en not_active IP Right Cessation
- 1987-05-25 FR FR8707324A patent/FR2600165B1/en not_active Expired - Fee Related
- 1987-06-02 DD DD30343887A patent/DD283532A7/en not_active IP Right Cessation
- 1987-06-04 DE DE19873718764 patent/DE3718764A1/en not_active Withdrawn
- 1987-06-12 AU AU74157/87A patent/AU595615B2/en not_active Ceased
- 1987-06-15 JP JP14889487A patent/JPS6352046A/en active Pending
- 1987-06-17 GB GB8714194A patent/GB2192277B/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DD283532A7 (en) | 1990-10-17 |
| GB2192277B (en) | 1990-01-31 |
| GB8714194D0 (en) | 1987-07-22 |
| JPS6352046A (en) | 1988-03-05 |
| GB2192277A (en) | 1988-01-06 |
| FR2600165A1 (en) | 1987-12-18 |
| FI871633A (en) | 1989-04-13 |
| FR2600165B1 (en) | 1990-08-03 |
| AU7415787A (en) | 1987-12-24 |
| DE3718764A1 (en) | 1987-12-23 |
| FI871633A0 (en) | 1987-04-14 |
| BG44997A1 (en) | 1989-03-15 |
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