AU5160800A - Method for in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples - Google Patents

Method for in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples

Info

Publication number
AU5160800A
AU5160800A AU51608/00A AU5160800A AU5160800A AU 5160800 A AU5160800 A AU 5160800A AU 51608/00 A AU51608/00 A AU 51608/00A AU 5160800 A AU5160800 A AU 5160800A AU 5160800 A AU5160800 A AU 5160800A
Authority
AU
Australia
Prior art keywords
analysis
spectral imaging
particulate samples
fusion multi
layer spectral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU51608/00A
Inventor
Michael Khazanski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GreenVision Systems Ltd
Original Assignee
GreenVision Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GreenVision Systems Ltd filed Critical GreenVision Systems Ltd
Publication of AU5160800A publication Critical patent/AU5160800A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1429—Signal processing
    • G01N15/1433—Signal processing using image recognition

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AU51608/00A 1999-06-01 2000-05-25 Method for in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples Abandoned AU5160800A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US32297599A 1999-06-01 1999-06-01
US09322975 1999-06-01
PCT/US2000/014312 WO2000073977A1 (en) 1999-06-01 2000-05-25 Method for in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples

Publications (1)

Publication Number Publication Date
AU5160800A true AU5160800A (en) 2000-12-18

Family

ID=23257262

Family Applications (1)

Application Number Title Priority Date Filing Date
AU51608/00A Abandoned AU5160800A (en) 1999-06-01 2000-05-25 Method for in-situ focus-fusion multi-layer spectral imaging and analysis of particulate samples

Country Status (3)

Country Link
EP (1) EP1190372A1 (en)
AU (1) AU5160800A (en)
WO (1) WO2000073977A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103632160B (en) * 2012-08-24 2017-01-18 孙琤 Combined kernel function RVM hyperspectral classification method fusing multi-scale morphological characteristics
US9816940B2 (en) 2015-01-21 2017-11-14 Kla-Tencor Corporation Wafer inspection with focus volumetric method
CN114166700B (en) * 2021-11-26 2023-07-21 哈尔滨工程大学 Device and method for observing fusion phenomenon of liquid bridges among particle swarms

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5371690A (en) * 1992-01-17 1994-12-06 Cognex Corporation Method and apparatus for inspection of surface mounted devices
US5544256A (en) * 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
US5537491A (en) * 1993-11-24 1996-07-16 Xerox Corporation Analyzing an image or other data to obtain a stable number of groups

Also Published As

Publication number Publication date
WO2000073977A1 (en) 2000-12-07
EP1190372A1 (en) 2002-03-27

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase