AU467648B2 - Method and apparatus for inspecting dielectric members - Google Patents

Method and apparatus for inspecting dielectric members

Info

Publication number
AU467648B2
AU467648B2 AU49647/72A AU4964772A AU467648B2 AU 467648 B2 AU467648 B2 AU 467648B2 AU 49647/72 A AU49647/72 A AU 49647/72A AU 4964772 A AU4964772 A AU 4964772A AU 467648 B2 AU467648 B2 AU 467648B2
Authority
AU
Australia
Prior art keywords
dielectric members
inspecting
inspecting dielectric
members
dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU49647/72A
Other versions
AU4964772A (en
Inventor
JOE SCHMERSAL and KENT LEON SCHEPKER LARRY
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Glass Inc
Original Assignee
Owens Illinois Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Owens Illinois Inc filed Critical Owens Illinois Inc
Priority to AU49647/72A priority Critical patent/AU467648B2/en
Publication of AU4964772A publication Critical patent/AU4964772A/en
Application granted granted Critical
Publication of AU467648B2 publication Critical patent/AU467648B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
AU49647/72A 1972-12-05 1972-12-05 Method and apparatus for inspecting dielectric members Expired AU467648B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU49647/72A AU467648B2 (en) 1972-12-05 1972-12-05 Method and apparatus for inspecting dielectric members

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU49647/72A AU467648B2 (en) 1972-12-05 1972-12-05 Method and apparatus for inspecting dielectric members

Publications (2)

Publication Number Publication Date
AU4964772A AU4964772A (en) 1974-06-06
AU467648B2 true AU467648B2 (en) 1975-12-11

Family

ID=3736250

Family Applications (1)

Application Number Title Priority Date Filing Date
AU49647/72A Expired AU467648B2 (en) 1972-12-05 1972-12-05 Method and apparatus for inspecting dielectric members

Country Status (1)

Country Link
AU (1) AU467648B2 (en)

Also Published As

Publication number Publication date
AU4964772A (en) 1974-06-06

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