AU3184489A - Process for anisotropic etching of semiconductor materials using an electrochemical etch-stop - Google Patents
Process for anisotropic etching of semiconductor materials using an electrochemical etch-stopInfo
- Publication number
- AU3184489A AU3184489A AU31844/89A AU3184489A AU3184489A AU 3184489 A AU3184489 A AU 3184489A AU 31844/89 A AU31844/89 A AU 31844/89A AU 3184489 A AU3184489 A AU 3184489A AU 3184489 A AU3184489 A AU 3184489A
- Authority
- AU
- Australia
- Prior art keywords
- stop
- semiconductor materials
- anisotropic etching
- electrochemical etch
- etch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3063—Electrolytic etching
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3805752 | 1988-02-24 | ||
DE19883805752 DE3805752A1 (en) | 1988-02-24 | 1988-02-24 | ANISOTROPIC ETCHING PROCESS WITH ELECTROCHEMICAL ETCH STOP |
Publications (1)
Publication Number | Publication Date |
---|---|
AU3184489A true AU3184489A (en) | 1989-09-22 |
Family
ID=6348056
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU31844/89A Abandoned AU3184489A (en) | 1988-02-24 | 1989-02-24 | Process for anisotropic etching of semiconductor materials using an electrochemical etch-stop |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU3184489A (en) |
DE (1) | DE3805752A1 (en) |
WO (1) | WO1989008323A1 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3920644C1 (en) * | 1989-06-23 | 1990-12-20 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De | |
US5071510A (en) * | 1989-09-22 | 1991-12-10 | Robert Bosch Gmbh | Process for anisotropic etching of silicon plates |
US5207866A (en) * | 1991-01-17 | 1993-05-04 | Motorola, Inc. | Anisotropic single crystal silicon etching solution and method |
DE4204436A1 (en) * | 1992-02-14 | 1993-08-19 | Daimler Benz Ag | Semiconductor device mfr. from thin foil - using semiconductor supports during foil growth and structuring operations |
DE4226497A1 (en) * | 1992-08-11 | 1994-02-17 | Daimler Benz Ag | Thin etching silicon substrate - to mfr. IMPATT, beam-lead Schottky battery and PIN diodes |
US5580828A (en) * | 1992-12-16 | 1996-12-03 | Semiconductor Physics Laboratory Rt | Method for chemical surface passivation for in-situ bulk lifetime measurement of silicon semiconductor material |
CA2264908C (en) | 1996-09-06 | 2006-04-25 | Obducat Ab | Method for anisotropic etching of structures in conducting materials |
DE19710375C2 (en) * | 1997-03-13 | 2002-11-07 | Micronas Semiconductor Holding | Process for the production of spatially structured components |
US20060207890A1 (en) | 2005-03-15 | 2006-09-21 | Norbert Staud | Electrochemical etching |
US7569490B2 (en) | 2005-03-15 | 2009-08-04 | Wd Media, Inc. | Electrochemical etching |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3689389A (en) * | 1969-12-16 | 1972-09-05 | Bell Telephone Labor Inc | Electrochemically controlled shaping of semiconductors |
BE789090A (en) * | 1971-09-22 | 1973-01-15 | Western Electric Co | SEMICONDUCTOR ATTACK METHOD AND SOLUTION |
US3898141A (en) * | 1974-02-08 | 1975-08-05 | Bell Telephone Labor Inc | Electrolytic oxidation and etching of III-V compound semiconductors |
IT1027470B (en) * | 1974-02-08 | 1978-11-20 | Western Electric Co | PROCEDURE FOR THE THINNING OF A LAYER OF SEMICON DUCTOR MATERIAL |
US4026741A (en) * | 1976-06-16 | 1977-05-31 | Bell Telephone Laboratories, Incorporated | Technique for preparation of stoichiometric III-V compound semiconductor surfaces |
DD241975A1 (en) * | 1985-10-14 | 1987-01-07 | Messgeraetewerk Zwonitz Veb K | METHOD OF MANUFACTURING SEMICONDUCTOR BODIES WITH INTEGRATED CIRCUIT PARTS AND ASSOCIATED THREE-DIMENSIONAL STRUCTURES |
EP0253420A1 (en) * | 1986-06-23 | 1988-01-20 | Stiftung Hasler Werke | Apparatus and process for electrochemical etching of silicon |
-
1988
- 1988-02-24 DE DE19883805752 patent/DE3805752A1/en not_active Ceased
-
1989
- 1989-02-24 AU AU31844/89A patent/AU3184489A/en not_active Abandoned
- 1989-02-24 WO PCT/DE1989/000109 patent/WO1989008323A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
WO1989008323A1 (en) | 1989-09-08 |
DE3805752A1 (en) | 1989-08-31 |
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