AU2983697A - Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatus - Google Patents
Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatusInfo
- Publication number
- AU2983697A AU2983697A AU29836/97A AU2983697A AU2983697A AU 2983697 A AU2983697 A AU 2983697A AU 29836/97 A AU29836/97 A AU 29836/97A AU 2983697 A AU2983697 A AU 2983697A AU 2983697 A AU2983697 A AU 2983697A
- Authority
- AU
- Australia
- Prior art keywords
- electrically conductive
- conductive patterns
- boards provided
- testing boards
- adapter intended
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
- G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9503902A SE9503902L (sv) | 1995-11-06 | 1995-11-06 | Apparat för testning av med elektriska ledningsmönster försedda kort samt för en sådan apparat avsedd adapter |
PCT/SE1997/000462 WO1998041878A1 (en) | 1995-11-06 | 1997-03-20 | Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2983697A true AU2983697A (en) | 1998-10-12 |
Family
ID=26662413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU29836/97A Abandoned AU2983697A (en) | 1995-11-06 | 1997-03-20 | Apparatus for testing boards provided with electrically conductive patterns and an adapter intended for such an apparatus |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2983697A (sv) |
SE (1) | SE9503902L (sv) |
WO (1) | WO1998041878A1 (sv) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4841241A (en) * | 1986-08-07 | 1989-06-20 | Siemens Aktiengesellschaft | Testing device for both-sided contacting of component-equipped printed circuit boards |
US4818933A (en) * | 1986-10-08 | 1989-04-04 | Hewlett-Packard Company | Board fixturing system |
US4912400A (en) * | 1988-09-13 | 1990-03-27 | Design And Manufacturing Specialties, Inc. | Apparatus for testing circuit boards |
US5574382A (en) * | 1991-09-17 | 1996-11-12 | Japan Synthetic Rubber Co., Ltd. | Inspection electrode unit for printed wiring board |
US5500606A (en) * | 1993-09-16 | 1996-03-19 | Compaq Computer Corporation | Completely wireless dual-access test fixture |
-
1995
- 1995-11-06 SE SE9503902A patent/SE9503902L/sv unknown
-
1997
- 1997-03-20 AU AU29836/97A patent/AU2983697A/en not_active Abandoned
- 1997-03-20 WO PCT/SE1997/000462 patent/WO1998041878A1/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
WO1998041878A1 (en) | 1998-09-24 |
SE9503902L (sv) | 1997-07-30 |
SE9503902D0 (sv) | 1995-11-06 |
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