AU2021102988A4

AU2021102988A4 - Reliability test teaching device

Info

Publication number: AU2021102988A4
Application number: AU2021102988A
Authority: AU
Inventors: Wenhui He
Original assignee: Hefei Zhonglu Information Technology Co Ltd
Current assignee: Hefei Zhonglu Information Technology Co Ltd
Priority date: 2021-05-31
Filing date: 2021-05-31
Publication date: 2021-09-16
Anticipated expiration: 2029-05-31

Abstract

OF THE DISCLOSURE The present disclosure relates to the field of reliability test teaching devices for electronic parts and components or PCB (Printed Circuit Board) functional circuits. The device comprises an electrical parameter acquisition module 1, an electrical stress loading module 2, a test sample placing table 3, a display 4, a working table 5 and a PC (Personal Computer) 6. The PC also can be replaced by other intelligent controllers such as a single-chip microcomputer, a PLC (Programmable Logic Controller) and an industrial control computer, and the electrical parameter acquisition module also can be replaced by other detection equipment such as a universal meter and an oscilloscope. The device can carries out voltage or current loading on constant voltage (current) or given function rules for test samples, loading time and rules are controlled by the PC, acquisition and failure determination of electrical parameters of the test samples can be carried out simultaneously, and test data are automatically recorded and analyzed. The device has the characteristics of test content customization, test result analysis automation, test process visibility and test repeatability. The device solves reliability test teaching difficulties of high efficiency, flexible test content, visual and visible test and analysis and the like required for reliability test teaching. 8 - 1/1 FIG. 1

Description

- 1/1

FIG. 1

RELIABILITY TEST TEACHING DEVICE TECHNICAL FIELD

[01] The present disclosure relates to a reliability test teaching device, and electronic parts and components or PCB (Printed Circuit Board) functional circuits are used as test

objects.

BACKGROUNDART

[02] Existing reliability technical courses all have reliability test steps, but reliability

test teaching devices are lacked, and the reliability test devices used at present are not

special teaching devices, but are reliability test devices which are produced for

enterprises or are specially oriented to reliability analysis and testing of enterprise

products, so that the reliability test teaching requirements cannot be met. The device has

the following defects:

[03] firstly, the existing device is insufficient in functions, wherein environmental

stress can only be applied according to requirements, the function of detecting and

analyzing test results is omitted, and test contents cannot be customized;

[04] secondly, the test efficiency cannot meet the teaching requirement, wherein most

of tests require too long time, and all test tasks cannot be completed within 1-2 class

hours; and

[05] thirdly, the test environment is defective, wherein at present, most of reliability

test devices with slightly high test efficiency have factors, such as water, acid and

vibration noise, which have adverse effects on the teaching environment.

[06] Aiming at the reliability test requirements of electronic parts and components or

PCB functional circuits, the intelligent control technology is adopted, and the functions

of electrical stress loading, electrical parameter acquisition, test result analysis and the

like are integrated; and the device has the characteristics, such as small size, good test

environment, test process controllability, visual and visible test analysis process and test

results on a display screen, high test efficiency and test content customization, that other similar devices do not have, and the teaching requirements of reliability tests are fully met.

SUMMARY

[07] The present disclosure aims to provide a special reliability test device for teaching, electronic parts and components or PCB (Printed Circuit Board) functional circuits are

used as test samples for reliability test teaching, but the special reliability test device can

also be applied to reliability analysis and testing for enterprise products.

[08] The present disclosure provides a special test device for teaching (see attached

figures), wherein the test device consists of an electrical parameter acquisition module 1,

an electrical stress loading module 2, a test sample placing table 3, a display 4, a

working table 5 and a PC (Personal Computer) 6. As modification of the device, the

electrical parameter acquisition module 1 also can be replaced by other detection

equipment such as a universal meter and an oscilloscope, and the PC 6 also can be

replaced by other intelligent controllers such as a single-chip microcomputer and a PLC

(Programmable Logic Controller).

[09] The electrical parameter acquisition module 1 is used for acquiring electrical

property parameters of the test samples before and after a test or in the test process, is

provided with one or more connectors for physically connecting the test samples, has a

function of conditioning acquired signals, and is controlled by the PC 6.

[10] The electrical stress loading module 2 is used for carrying out electrical stress

loading on the test samples in the test, and is controlled by the PC.

[11] The sample placing table 3 is used for placing the test samples during a reliability

test, wherein one or more test samples can be fixed, and the sample placing table 3 is

provided with the connectors for physically connecting each sample with the electrical

parameter acquisition module 1 and the electrical stress loading device 2.

[12] The PC display 4 is used for displaying test input parameters, test process

monitoring parameters and test analysis processes.

[13] The working table 5 is used for supporting the electrical parameter acquisition

module 1, the electrical stress loading module 2, the test sample placing table 3 and the

PC display 4, and can also be used for placing other related electrical parameter

detection devices.

[14] The PC 6 is used for inputting test parameters before the test, detecting and displaying electrical parameters of the test samples, customizing and monitoring the test

process, carrying out data analysis and processing on test results and giving out the test

results.

BRIEF DESCRIPTION OF THE DRAWINGS

[15] FIG. 1 is a schematic diagram of constitution of a novel reliability test teaching

device.

[16] Reference signs: 1, electrical parameter acquisition module; 2, electrical stress

loading module; 3, test sampling placing table; 4, PC display; 5, working table; and 6,

PC. As another form of the device, the electrical parameter acquisition module 1 also

can be replaced by other detection devices such as a universal meter and an oscilloscope,

and the PC 6 (comprising the display 4 ) also can be replaced by other intelligent

controllers such as a single-chip microcomputer and a PLC.

[17] FIG. 1 only illustrates the configuration of modules in the present disclosure, and

the specific positions of the modules can be different from the layout shown in FIG. 1.

DETAILED DESCRIPTION OF THE EMBODIMENTS

[18] The content of the present disclosure is described in detail with reference to the

attached figures and embodiments, and a reliability test is carried out on test samples in

a specific embodiment.

[19] Firstly, placing one or more test samples on a sample placing table 3;

[20] secondly, carrying out physical connection on each sample and an electrical

parameter acquisition module 1;

[21] thirdly, starting a PC 6, and operating reliability test software;

[22] fourthly, setting a reliability test type and an electrical stress loading method on a

software main interface, and setting failure threshold values of test sample performance

parameters;

[23] fifthly, according to test requirements, physically connecting each sample with a corresponding connector of an electrical stress loading module 2;

[24] sixthly, customizing reliability test content on the PC, then entering PC stress loading program, setting stress loading parameters, and starting electrical stress loading,

wherein in the stress loading period, electrical parameters of the test samples can be

continuously or discontinuously monitored according to the test requirements, the

electrical parameters are automatically compared with the failure threshold values,

whether the samples fail or not is judged, the failure is recorded and stored in storage

equipment of the PC 6, and monitoring results and current test states are displayed on a

display 4;

[25] seventhly, after the test is finished, calling out the parameters in the test process

by the PC 6, playing back the parameters on the display 4, and observing the changes of

the stress loading parameters and the change of related performance parameters of the

test samples in the test process;

[26] eighthly, after the test process and the results are confirmed, disconnecting the

physical connection between the test samples and the electrical stress loading module 2

and the physical connection between the test samples and the electrical parameter

acquisition module 1; and

[27] ninthly, after the test is completed finished, entering test data analysis and

processing program, and automatically analyzing test results by the PC 6 to give out

analysis results.

[28] The electrical stress loading described by the present disclosure can be used for carrying out electrical impact on the test samples, voltage or current loading is carried

out at a constant voltage (current) or according to given function rules, and loading time

and rules are set by program of the PC 6.

[29] The electrical parameter acquisition described by the present disclosure is

controlled and realized by the PC 6, and the acquisition parameters comprise parameters

such as resistance, inductance, voltage, current, capacity, charging and discharging time,

pulse waveform rising edge or falling edge, waveform amplitude and frequency or

phase change.

[30] The test content customization described by the present disclosure refers to test types such as a complete sample reliability test, a timing ending reliability test, a

definite ending reliability test, a reliability acceleration test, a reliability acceptance test

and a reliability growth test, and the electrical stress loading method can be specified,

once the test content customization is completed, the test content customization can be

completed. and the PC automatically calls a corresponding program module to carry out

a test according to customized test content.

[31] Test data analysis processing described by the present disclosure comprises failure rate and reliability characteristic quantity calculation, acceleration coefficient and

acceleration equation calculation, failure distribution function fitting and checking,

parameter estimation and checking and the like, besides, SPC (Stored Program Control)

data statistics and analysis of product quality can be carried out, and the processing

process is automatically completed by the PC 6 calling different program modules

according to related national standards or test requirements.

Claims

WHAT IS CLAIMED IS:

1. A reliability test teaching device, comprising a working table, a PC (Personal

Computer), an electrical stress loading module, an electrical parameter acquisition

module and a test sample placing table, wherein the device carries out test content

customization, namely, a complete sample reliability test, a timing ending reliability test,

a definite ending reliability test, a reliability acceleration test, a reliability screening test,

a reliability acceptance test and a reliability growth test are selected, a corresponding

electrical stress loading method is specified, and once the test content customization is

completed, the PC automatically calls a corresponding program module to carry out a

test according to customized test content.

2. The reliability test teaching device according to claim 1, wherein the PC has the

functions of monitoring the test process, acquiring, displaying and storing test data and

analyzing test results, and the PC in the test teaching device can be replaced by a

single-chip microcomputer, a PLC (Programmable Logic Controller) or an industrial

personal computer.

3. The reliability test teaching device according to claim 1, wherein the electrical

stress loading module is used for carrying out electrical stress loading on test samples

according to given function rules, and loading time and the change rules thereof are set

by program of the PC.

4. The reliability test teaching device according to claim 1, wherein the electrical

parameter acquisition module is controlled by the PC and can read one or more

parameters including resistance, inductance, voltage, current, capacity, charging and

discharging time, pulse waveform rising edge or falling edge, waveform frequency,

amplitude or phase change, the parameter are displayed on a display and stored in

storage equipment, and the electrical parameter acquisition module in the test teaching

device can be replaced by a universal meter or an oscilloscope.

5. The reliability test teaching device according to claim 1, wherein the test data

analysis and processing functions of the PC comprise calculation of reliability

characteristic quantity, calculation of an acceleration coefficient and an acceleration equation, fitting and checking of a failure distribution function and parameter estimation and checking, SPC (Stored Program Control) data statistics and analysis of product quality are carried out, and the calculation and processing process of the PC is automatically completed by the PC calling different program modules according to related national standards or test requirements.

FIG. 1 －1/1－