AU2021101262A4 - Device for simultaneous installation of acoustic emission probe and microseismic probe and test method for specimens - Google Patents
Device for simultaneous installation of acoustic emission probe and microseismic probe and test method for specimens Download PDFInfo
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- AU2021101262A4 AU2021101262A4 AU2021101262A AU2021101262A AU2021101262A4 AU 2021101262 A4 AU2021101262 A4 AU 2021101262A4 AU 2021101262 A AU2021101262 A AU 2021101262A AU 2021101262 A AU2021101262 A AU 2021101262A AU 2021101262 A4 AU2021101262 A4 AU 2021101262A4
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- probe
- acoustic emission
- microseismic
- mounting cylinder
- mounting
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- 239000000523 sample Substances 0.000 title claims abstract description 175
- 238000010998 test method Methods 0.000 title claims abstract description 7
- 238000009434 installation Methods 0.000 title description 7
- 238000012360 testing method Methods 0.000 claims abstract description 19
- 230000006835 compression Effects 0.000 claims description 7
- 238000007906 compression Methods 0.000 claims description 7
- 239000011435 rock Substances 0.000 abstract description 5
- 238000005259 measurement Methods 0.000 abstract description 3
- 238000012544 monitoring process Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 8
- 238000002474 experimental method Methods 0.000 description 7
- 239000007822 coupling agent Substances 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000002390 adhesive tape Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 229940099259 vaseline Drugs 0.000 description 1
Classifications
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B47/00—Survey of boreholes or wells
- E21B47/01—Devices for supporting measuring instruments on drill bits, pipes, rods or wirelines; Protecting measuring instruments in boreholes against heat, shock, pressure or the like
- E21B47/017—Protecting measuring instruments
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21C—MINING OR QUARRYING
- E21C39/00—Devices for testing in situ the hardness or other properties of minerals, e.g. for giving information as to the selection of suitable mining tools
Landscapes
- Engineering & Computer Science (AREA)
- Mining & Mineral Resources (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Physics & Mathematics (AREA)
- Geophysics (AREA)
- Environmental & Geological Engineering (AREA)
- Fluid Mechanics (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
The invention provides a device and a test method for a specimen which simultaneously
installs acoustic emission probe and microseismic probe, belonging to the technical field of
rock engineering test and monitoring. The first chute and the fixing point of the specimen are
arranged on the support base of the device; The sliding frame is provided with a second chute
perpendicular to the support base, and the bottom is fitted with the first chute; The probe
bracket fixing assembly comprises a sliding block arranged on the second chute; The sliding
block is provided with mounting holes for installing acoustic emission probe support and
microseismic probe support respectively; The acoustic emission probe support and
microseismic probe support include external mounting cylinder, internal mounting cylinder,
connecting screw, spring and adjusting bolt; The outer mounting cylinder is arranged in the
mounting hole; The inner mounting sleeve is arranged in the outer mounting cylinder and the
outer end is connected with the connecting screw; The adjusting bolt is connected with the
external thread of the external mounting cylinder; The two ends of the spring are respectively
connected with the connecting screw and adjusting bolt. The invention improves the accuracy
and comprehensiveness of the measurement.
FIGURES
1/11
35 A
20 500
21
Figure. 1
Description
1/11
35 A
20 500
21
Figure. 1
Device for simultaneous installation of acoustic emission probe and microseismic probe
and test method for specimens
The invention relates to the technical field of rock engineering test and monitoring, in particular
to a device for simultaneous installation of acoustic emission probe and microseismic probe and test
method for specimens.
Techniques such as acoustic emission and microseismic have been widely applied in rock
engineering testing and monitoring. Laboratories use acoustic emission devices to monitor the entire
damage process of rocks, concrete and other materials in real time and are able to spatially locate the
damage. Currently, acoustic emission probes and microseismic probes in the laboratory are mostly
fixed with adhesive tape or mechanically fixed by simple external brackets, and these methods still
have many problems. When fixed with tape or fixed by simple external bracket, the probe is easy to
fall off during the experiment, and the signal cannot be collected in real time, while ensuring the
stability of the probe and effective coupling with the specimen during the whole experiment is the
basis to ensure the accuracy of the experiment; the frequency width of the acoustic emission or
microseismic signal generated by the damage of different size specimens is different, and it is difficult
to collect the full damage information by using a single acoustic emission or microseismic probe. It
is difficult to collect the full damage information by using a single acoustic emission or microseismic
probe, and the simultaneous use of multiple probes can increase the width of the collected signal; not
only that, the tape adhesion or mechanical fixation often produces a certain amount of pressure around
the specimen, and the size of the pressure around the specimen is also difficult to measure, which has
a certain impact on the accuracy of the experiment.
In order to overcome the shortcomings of the existing technology, make up the defects of the
existing means and improve the accuracy and comprehensiveness of the measurement, the invention
provides a device and a test method for the specimen which simultaneously installs the acoustic
emission probe and the microseismic probe.
The invention provides a device for simultaneously installing acoustic emission probes and
microseismic probes, including a support base, a sliding frame, a probe bracket mounting assembly,
an acoustic emission probe bracket and a microseismic probe bracket; The first chute and the fixing
point of the specimen are arranged on the support base; The opening end of the first chute is arranged
at the edge of the support base, and the closed end is toward the fixing point of the specimen; The
sliding frame is provided with a second chute perpendicular to the support base, and the bottom is
fitted with the first chute; The probe bracket fixing assembly comprises a sliding block arranged on
the second chute; The slide block is provided with mounting holes for installing the acoustic emission
probe bracket and the microseismic probe bracket respectively. The acoustic emission probe support
and microseismic probe support include external mounting cylinder, internal mounting cylinder,
connecting screw, spring and adjusting bolt; The outer mounting cylinder is arranged in the mounting
hole; The inner mounting sleeve is arranged in the outer mounting cylinder and the outer end is
connected with the connecting screw; The adjusting bolt is connected with the external thread of the
external mounting cylinder; The two ends of the spring are respectively connected with the
connecting screws and adjusting bolts.
Further, in the bracket of the acoustic emission probe, the cable lead-out groove of the acoustic
emission probe is arranged on the side wall of the outer mounting cylinder and the inner mounting cylinder; The outer end of the inner mounting cylinder, the connecting screws and the adjusting bolts are provided with the lead-out hole of the cable leading out of the microseismic probe.
Further, the bottom of the sliding frame is provided with a first stop bolt against the groove wall
of the first chute.
Further, the probe bracket fixing assembly includes the first mounting block and the second
mounting block respectively arranged on the inner and outer sides of the slider; The first mounting
block and the second mounting block are provided with through-holes corresponding to the mounting
holes.
Further, the second mounting block is provided with a second limit bolt against the sliding frame.
Further, a scale line is arranged along the second slot on the slide frame.
Further, the support base comprises a square base plate and four extensions projecting outward
from the middle of the side edge of the square base plate; The number of the first slots is four, the
closed end is located in the square bottom plate, the open end is located in the edge of the extension;
The specimen fixing point is the center of the support base.
Further, the four inner corners of the square backplane are provided with handle ring mounting
holes.
Further, the acoustic emission probe bracket comprises a bracket for installing an acoustic
emission probe with a diameter of 8 mm and a diameter of 19 mm; The microseismic probe bracket
is the support for installing the microseismic probe with a diameter of 25 mm.
The invention also provides a test method for a specimen, which is implemented on the device
of simultaneously installing an acoustic emission probe and a microseismic probe, including the
following steps:
Si, the inner end face of the adjusting probe and the inner end face of the inner mounting cylinder
are flush with the inner end face of the outer mounting cylinder, and the probe contacts the surface of
the specimen but is not close to it, at which time the spring is in a natural state;
The circumferential pressure generated by the probe on the specimen is as follows:
F = nkx,
Wherein: F is the confining pressure, unit is N; k is the stiffness of the spring, in N/mm; x is to
adjust the compression amount of a coil spring inside the external mounting cylinder of the bolt,
expressed in mm; n is the number of turns in which the adjusting bolt is screwed.
Compared with the prior art, the present invention has the advantages as below:
When using the device provided by the invention to simultaneously install the acoustic emission
probe and the microseismic probe, sliding the sliding frame outward to the support base has enough
space to accommodate the specimen, pretreating the specimen, placing the specimen on the fixing
point of the specimen, respectively installing the transmitting probe and the microseismic probe into
the corresponding inner mounting cylinder, and applying a coupling agent on the surface of the probe,
the inner end face of the adjusting probe and the inner end face of the inner mounting cylinder are
flush with the inner end face of the outer mounting cylinder. Move the sliding frame and the sliding
block to contact the surface of the probe and the specimen but not close to it. Rotate the adjusting bolt
inside the outer mounting cylinder to the surface of the probe and the fitting. Record the number of the adjusting bolt, connect the cable of the probe to the external testing system. The device realizes the firm fixing of the probe, the probe will not fall off easily during the test process, and the stability of the probe is ensured during the whole experiment process. In the process of experiment, the pressure of the probe can be adjusted in real time, the close contact between the probe and the specimen can be ensured, and the coupling can be maintained. At the same time, the acoustic emission probe support and the microseismic probe support are used to collect the damage information of the specimen at the same time. The spring elastic force can be calculated by adjusting the screw advance of the bolt, and the pressure caused by the installation of the probe on the specimen can be determined.
In order to illustrate the technical scheme of the embodiment of the present invention more
clearly, the following will give a brief introduction to the drawings needed in the embodiment
description. Obviously, the drawings in the following description are only some embodiments of the
present invention. For ordinary technicians in the field, other drawings can be obtained from these
drawings without creative labor.
Fig. 1 is the main view of the device provided by embodiment 1 of the invention which
simultaneously installs the acoustic emission probe and the microseismic probe;
Fig. 2 is the top view of the device shown in Fig. 1 which simultaneously installs the acoustic
emission probe and the microseismic probe;
Fig. 3 is the enlarged view of part A of the device in which both the acoustic emission probe and
the microseismic probe are installed as shown in Fig. 1.
Fig. 4 is the main view of the support base in the device with the acoustic emission probe and
the microseismic probe installed at the same time as shown in Fig. 1.
Fig. 5 is the top view of the support base shown in Fig 4;
Fig. 6 is the main view of the sliding frame in the device in which both the acoustic emission
probe and the microseismic probe are installed.
Fig.7 is the side view of the sliding frame shown in Fig 6;
Fig. 8 is the state diagram of the maximum size specimen measured by a device equipped with
both an acoustic emission probe and a microseismic probe as shown in Fig. 1.
Fig. 9 is the top view of the state diagram shown in Fig 8;
Fig. 10 is the state diagram of the minimum size specimen measured by the installation of the
acoustic emission probe and the microseismic probe at the same time shown in Fig. 1.
Fig. 11 is the top view of the status map shown in Fig 10.
Label: 10-Support base; 11-First chute; 12-mounting holes of handle ring; 20-Sliding frame; 21
Second chute; 31-Sliding block; 32-First mounting block; 33-Second mounting block; 34-through
hole; 35- Second limit bolt; 41- Outer mounting cylinder; 42- Inner installation cylinder; 43
Connecting screw; 44- Spring; 45- Adjusting bolt; 46-Outlet hole; 100- Specimen.
Embodiment 1
In the description of the present invention, it needs to be explained that the orientation or position
relationship of the indication such as the terms " inside " and " outside " are based on the orientation
or position relationship shown in the drawings, only for the convenience of describing the present
invention and simplifying the description, rather than indicating or implying that the device or
element must have a specific orientation, be constructed and operated in a particular orientation, and
therefore cannot be understood as a limitation to the present invention. Among them, " inside " refers to the direction toward the inside of the support base, " outside " refers to the direction toward the outside of the support base.
The embodiment provides a device for simultaneously installing an acoustic emission probe and
a microseismic probe, including a support base 10, a sliding frame 20, a probe support mounting
assembly, an acoustic emission probe support and a microseismic probe support; The first chute 11
and the fixing point of the test piece are arranged on the support base 10; The opening end of the first
slot 11 is arranged at the edge of the support base 10, and the closed end faces the fixing point of the
specimen; The sliding frame 20 is provided with a second chute 21 perpendicular to the support base
, and the bottom is fitted with the first chute 11; The probe bracket fixing assembly comprises a
sliding block 31 arranged on the second slot 21; The slide block 31 is provided with mounting holes
for installing the acoustic emission probe bracket and the microseismic probe bracket respectively.
The acoustic emission probe support and the microseismic probe support include external mounting
cylinder 41, internal mounting cylinder 42, connecting screw 43, spring 44 and adjusting bolt 45; The
outer mounting cylinder4lis arranged in the mounting hole; The inner mounting cylinder 42 sets is
arranged in the outer mounting cylinder 41 and the outer end is connected with the connecting screw
43; The adjusting bolt 45 is connected with the outer thread of the outer mounting cylinder 41; The
two ends of the spring 44 are respectively connected with the connecting screw 43 and the adjusting
bolt 45.
Further, the cable of the acoustic emission probe is thinner, so the cable lead-out groove of the
acoustic emission probe is arranged on the side wall of the external mounting cylinder 41 and the
inner mounting cylinder 42. The cable of the microseismic probe is thick, so the outer end of the inner
mounting cylinder 42, the connecting screw 43 and the adjusting bolt 45 are provided with the lead- out hole 46 for the cable of the microseismic probe, and the cable passes through the outer end of the inner mounting cylinder 42, the connecting screw 43, the spring 44 and the adjusting bolt 45, and finally leads out of the bracket.
Further, the bottom of the sliding frame 20 is provided with a first stop bolt against the groove
wall of the first slot 11 to secure the sliding frame 20.
Further, the probe bracket fixing assembly comprises a first mounting block 32 and a second
mounting block 33 respectively arranged on the inner and outer sides of the slider 31; The first
mounting block 32 and the second mounting block 33 are provided with through-holes 34
corresponding to the mounting hole. The acoustic emission probe bracket and the microseismic probe
bracket are fixed through the corresponding through-holes 34 and the mounting holes respectively.
The settings of the first mounting block 32 and second mounting block 33 can increase the stability
of the mounting of the bracket.
Further, the second mounting block 33 is provided with a second limit bolt 35 against the sliding
frame 20 to secure the acoustic emission probe support and the microseismic probe support.
Further, a graduated line is arranged along the second slot 21 on the sliding frame 20 to record
the height of the probe and improve the accuracy of the test. The position of the probe can be adjusted
flexibly by the mounting assembly of the sliding frame 20 and the probe bracket. The scale on the
sliding frame 20 can make the probe fixed accurately and improve the adaptability and flexibility of
the whole device.
When the whole failure process of rock and concrete is monitored in real time, the bottom surface
of specimen 100 is rectangular cuboid specimen, so in this embodiment, the support base 10 is preferably composed of a square base plate and four extensions protruding from the middle of the side edge of the square base plate outward; The number of the first slot 11 is four, the closed end is located in the square bottom plate, the open end is located in the edge of the extension; The specimen fixing point is the center of the support base 10. During the test, the acoustic emission probe and the microseismic probe can be attached to the four sides of specimen 100 to make a complete measurement of specimen 100.
Further, the handle ring mounting hole 12 is arranged on the four inner corners of the square
backplane to facilitate the installation of the handle ring.
Embodiment 2
This embodiment provides a device for simultaneously installing the acoustic emission probe
and the microseismic probe. Based on the device described in embodiment 1, the device is designed
in detail. Since the diameter of the commonly used acoustic emission probe is 8 mm and 19 mm, and
the diameter of the microseismic probe is 25 mm, in this embodiment, the acoustic emission probe
bracket includes a bracket for installing the acoustic emission probe with a diameter of 8 mm and 19
mm. The microseismic probe bracket is the support for installing the microseismic probe with a
diameter of 25 mm. As shown in the figure, from top to bottom are the brackets for installing the
acoustic emission probe with a diameter of 8 mm, the brackets for installing the microseismic probe
with a diameter of 25 mm, and the brackets for installing the acoustic emission probe with a diameter
of 19 mm.
In the bracket for mounting the acoustic emission probe with a diameter of 8mm, the stiffness
of spring 44 is 3.3iN/mm, and the compression of spring 44 is 1mm when adjusting bolt 45 is turned in one turn; in the bracket for mounting the acoustic emission probe with a diameter of 19mm, the stiffness of spring 44 is 7.624N/mm, and the compression of spring 44 is 1.5mm when adjusting bolt is turned in one turn; in the bracket for mounting the micro-vibration probe with a diameter of mm, the stiffness of spring 44 is 12.21N/mm, and the compression of spring 44 is 2mm when adjusting bolt 45 is turned in one turn. In the bracket for mounting a 25mm diameter micro-vibration probe, the stiffness of spring 44 is 12.21N/mm, and the compression of spring 44 is 2mm when the adjusting bolt 45 is rotated in one turn.
At present, the dimensions (length x width x height) of the general specimen 100 are 50 mm x
mm x 100 mm, 100 mm x 100 mm x 200 mm, 200 mm x 200 mm x 400 mm and 400 mm x 400
mm x 800 mm. The length and width of the support base 10 and the height of the sliding frame 20
are determined according to the size of the specimen 100 of 400 mm x 400 mm x 800 mm. the length
of the first slot 11 needs to meet both the test piece 100 with a minimum size of 50 mm x 50 mm x
100 mm and the test piece 100 with a maximum size of 400 mm x 400 mm x 800 mm.
Embodiment 3
This embodiment provides a test piece test method based on a device described in embodiment
1 that simultaneously installs an acoustic emission probe and a microseismic probe, including the
following steps:
SO: Pretreated specimen 100 shall be placed on the fixing point of the specimen. According to
the height of specimen 100 , adjust the height of the mounting assembly of the probe bracket, install
the probe into the inner mounting cylinder 42, draw out the probe cable and apply the coupling agent
on the surface of the probe;
The inner end face of the adjusting probe and the inner end face of the inner mounting cylinder
42 is flush with the inner end face of the outer mounting cylinder 41, and the probe contacts the
surface of the specimen 100 but is not close to it, at this time the spring 44 is in the natural state;
If the adjusting bolt 45 is screwed outward to the surface of the probe close to the specimen 100,
the confining pressure of the probe on the specimen 100 shall be as follows:
F = nkx,
Wherein: F is the confining pressure, unit is N; k is the stiffness of the spring, in N/mm; x is to
adjust the compression amount of a coil spring inside the external mounting cylinder of the bolt,
expressed in mm; n is the number of turns adjusting the screw advance of the bolt;
S2: Connect the outgoing probe cable with the external test system, and arrange other
experimental equipment.
In step SO, the pretreatment of test piece 100 includes testing the flatness of the test piece 100
surface, grinding the test piece 100 convex part with sandpaper and other tools when there are obvious
bumps, and removing the dirt from the surface to achieve the overall smoothness and smoothness of
the test piece 100 surface. The coupling agent is Vaseline, which is used to ensure the effective contact
and coupling between probe and specimen 100 and the effective transmission of signal.
After the experiment, the acoustic emission probe and microseismic probe are removed from the
inner mounting cylinder 42, the coupling agent on the surface of the probe is removed and the
recovery of the probe is completed. Adjust the mounting assembly of the sliding frame 20 and the
probe bracket to the minimum position, clean the support base 10, the acoustic emission probe bracket
and the microseismic probe bracket, and place the device in the special storage box.
As embodiments of the invention only, the patent scope of the invention is not limited, and any
equivalent structural or equivalent flow transformation using the contents of the specification of the
invention, or direct or indirect application in other relevant technical fields, are likewise included in
the patent protection scope of the inventions.
Claims (10)
1. A device for simultaneously installing the acoustic emission probe and the microseismic
probe is characterized in that it includes a support base (10), a sliding frame (20), a probe support
mounting assembly, an acoustic emission probe support and a microseismic probe support;
The support base (10) is provided with a first chute (11) and a test piece fixing point;
The opening end of the first chute (11) is arranged at the edge of the support base (10) and the
closed end faces the fixing point of the specimen;
The sliding frame (20) is provided with a second chute (21) perpendicular to the support base
(10) and the bottom is matched with the first chute (11);
The probe bracket fixing assembly comprises a sliding block (31) arranged on the second chute
(21);
The slide block (31) is provided with mounting holes for installing the acoustic emission probe
bracket and the microseismic probe bracket respectively, the inner side faces the fixing point of the
specimen and the outer side faces the outer side of the support base;
The acoustic emission probe support and the microseismic probe support include an outer
mounting cylinder (41), an inner mounting cylinder (42), connecting screws (43), springs (44) and
adjusting bolts (45);
The outer mounting cylinder (41) is arranged through the mounting hole;
The inner mounting cylinder (42) is arranged in the outer mounting cylinder (41) and the outer
end is connected with the connecting screw (43);
The adjusting bolt (45) is connected with the outer end thread of the outer mounting cylinder
(41);
The two ends of the spring (44) are respectively connected with the connecting screw (43) and
the adjusting bolt (45).
2. The device for simultaneously installing acoustic emission probes and microseismic probes
according to claim 1 is characterized in that an acoustic emission probe cable lead-out groove is
arranged on the side wall of the external mounting cylinder (41) and the inner mounting cylinder (42)
in the acoustic emission probe bracket;
The outer end of the inner mounting cylinder (42), the connecting screw (43) and the adjusting
bolt (45) are provided with an lead-out hole for the cable outlet of the microseismic probe.
3. The device for simultaneously installing acoustic emission probes and microseismic probes
in accordance with claim 1 is characterized in that the bottom of the sliding frame (20) is provided
with a first limit bolt against the wall of the groove of the first chute (11).
4. The device for simultaneously installing acoustic emission probes and microseismic probes
in accordance with claim 1 is characterized in that the probe bracket fixing assembly also includes a
first mounting block (32) and a second mounting block (33) respectively arranged on the inner and
outer surfaces of the slider (31);
The first mounting block (32) and the second mounting block (33) are provided with through
holes (34) corresponding to the mounting hole.
5. A device for simultaneously installing an acoustic emission probe and a microseismic probe
in accordance with claim 4 is characterized in that the second mounting block (33) is provided with
a second limit bolt (35) to counter the sliding frame (20).
6. The device for simultaneously installing acoustic emission probes and microseismic probes
according to claim 1 is characterized in that a scale line is arranged along a second chute (21) on the
sliding frame (20).
7. The device for simultaneously installing acoustic emission probes and microseismic probes
according to any of the 1-6 claims, characterized by a support base (10) comprising a square base
plate and four extensions projecting outward from the middle of the side edge of the square base
plate;
The number of the first chute (11) is four, the closed end is located in the square bottom plate
and the open end is located at the edge of the extension part;
The fixing point of the specimen is the center of the support base (10).
8. The device for simultaneously installing acoustic emission probes and microseismic probes
according to claim 7 is characterized in that mounting holes of handle ring (12) is arranged on the
four inner corners of the square base plate.
9. The device for simultaneously installing acoustic emission probes and microseismic probes
according to claim 1 is characterized in that the acoustic emission probe bracket comprises a bracket
for installing an acoustic emission probe with a diameter of 8 mm and a diameter of 19 mm;
The microseismic probe bracket is a support for installing a microseismic probe with a diameter
of 25 mm.
10. The specimen test method is characterized in that it is implemented on the basis of either of
the devices described in claim 1-9 that simultaneously install the acoustic emission probe and the
microseismic probe, including the following steps:
Si. The inner end face of the adjusting probe and the inner mounting cylinder (42) is flush with
the inner end face of the outer mounting cylinder (41), and the probe is not close to the surface of the
specimen (100), at which time the spring (44) is in a natural state;
The inner screwing adjusting bolt (45) of the outer mounting cylinder (41) is close to the surface
of the probe and the specimen (100), and the confining pressure of the probe on the specimen (100)
is as follows
F = nkx,
Wherein: F is the confining pressure, unit is N; k is the stiffness of the spring, in N/mm; x is to
adjust the compression amount of a coil spring inside the external mounting cylinder of the bolt,
expressed in mm; n is the number of turns in which the adjusting bolt is screwed.
FIGURES
Figure. 1 1/11
Figure. 2 2/11
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2021101262A AU2021101262A4 (en) | 2021-03-11 | 2021-03-11 | Device for simultaneous installation of acoustic emission probe and microseismic probe and test method for specimens |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2021101262A AU2021101262A4 (en) | 2021-03-11 | 2021-03-11 | Device for simultaneous installation of acoustic emission probe and microseismic probe and test method for specimens |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2021101262A4 true AU2021101262A4 (en) | 2021-05-06 |
Family
ID=75714356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2021101262A Active AU2021101262A4 (en) | 2021-03-11 | 2021-03-11 | Device for simultaneous installation of acoustic emission probe and microseismic probe and test method for specimens |
Country Status (1)
| Country | Link |
|---|---|
| AU (1) | AU2021101262A4 (en) |
-
2021
- 2021-03-11 AU AU2021101262A patent/AU2021101262A4/en active Active
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