AU2003293715A1 - Integrated electronic circuit comprising field effect sensors for detecting biomolecules - Google Patents
Integrated electronic circuit comprising field effect sensors for detecting biomoleculesInfo
- Publication number
- AU2003293715A1 AU2003293715A1 AU2003293715A AU2003293715A AU2003293715A1 AU 2003293715 A1 AU2003293715 A1 AU 2003293715A1 AU 2003293715 A AU2003293715 A AU 2003293715A AU 2003293715 A AU2003293715 A AU 2003293715A AU 2003293715 A1 AU2003293715 A1 AU 2003293715A1
- Authority
- AU
- Australia
- Prior art keywords
- field effect
- electronic circuit
- integrated electronic
- effect sensors
- detecting biomolecules
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
- G01N27/4145—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS specially adapted for biomolecules, e.g. gate electrode with immobilised receptors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
- G01N27/4148—Integrated circuits therefor, e.g. fabricated by CMOS processing
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2002155755 DE10255755B4 (en) | 2002-11-28 | 2002-11-28 | Integrated electronic circuit with field effect sensors for the detection of biomolecules |
| DE10255755.1 | 2002-11-28 | ||
| PCT/EP2003/013121 WO2004048962A1 (en) | 2002-11-28 | 2003-11-21 | Integrated electronic circuit comprising field effect sensors for detecting biomolecules |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2003293715A1 true AU2003293715A1 (en) | 2004-06-18 |
Family
ID=32335844
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2003293715A Abandoned AU2003293715A1 (en) | 2002-11-28 | 2003-11-21 | Integrated electronic circuit comprising field effect sensors for detecting biomolecules |
Country Status (3)
| Country | Link |
|---|---|
| AU (1) | AU2003293715A1 (en) |
| DE (1) | DE10255755B4 (en) |
| WO (1) | WO2004048962A1 (en) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8138496B2 (en) | 2004-04-01 | 2012-03-20 | Nanyang Technological University | Addressable transistor chip for conducting assays |
| WO2006041224A1 (en) * | 2004-10-14 | 2006-04-20 | Kabushiki Kaisha Toshiba | Fet-based nucleic acid detecting sensor |
| US8262900B2 (en) | 2006-12-14 | 2012-09-11 | Life Technologies Corporation | Methods and apparatus for measuring analytes using large scale FET arrays |
| US11339430B2 (en) | 2007-07-10 | 2022-05-24 | Life Technologies Corporation | Methods and apparatus for measuring analytes using large scale FET arrays |
| US8349167B2 (en) | 2006-12-14 | 2013-01-08 | Life Technologies Corporation | Methods and apparatus for detecting molecular interactions using FET arrays |
| EP4134667A1 (en) | 2006-12-14 | 2023-02-15 | Life Technologies Corporation | Apparatus for measuring analytes using fet arrays |
| DE102007019839B4 (en) | 2007-04-25 | 2018-10-11 | Bundesdruckerei Gmbh | Method for using a chip card and chip card |
| DE102007034331A1 (en) * | 2007-07-24 | 2009-01-29 | Robert Bosch Gmbh | Apparatus and method for detecting substances |
| DE102007043132B4 (en) | 2007-09-11 | 2012-07-26 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Biosensor and method for measuring a concentration of an analyte in a medium |
| US8470164B2 (en) | 2008-06-25 | 2013-06-25 | Life Technologies Corporation | Methods and apparatus for measuring analytes using large scale FET arrays |
| US20100137143A1 (en) | 2008-10-22 | 2010-06-03 | Ion Torrent Systems Incorporated | Methods and apparatus for measuring analytes |
| US20100301398A1 (en) | 2009-05-29 | 2010-12-02 | Ion Torrent Systems Incorporated | Methods and apparatus for measuring analytes |
| FR2938703B1 (en) * | 2008-11-20 | 2011-04-22 | Commissariat Energie Atomique | METHOD FOR PRODUCING A CHIP FOR DETECTING BIOLOGICAL ELEMENTS |
| US20120261274A1 (en) | 2009-05-29 | 2012-10-18 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
| US8776573B2 (en) | 2009-05-29 | 2014-07-15 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
| JP5952813B2 (en) | 2010-06-30 | 2016-07-13 | ライフ テクノロジーズ コーポレーション | Method and apparatus for testing ISFET arrays |
| CN109449171A (en) | 2010-06-30 | 2019-03-08 | 生命科技公司 | For detecting and measuring the transistor circuit of chemical reaction and compound |
| EP2588851B1 (en) | 2010-06-30 | 2016-12-21 | Life Technologies Corporation | Ion-sensing charge-accumulation circuit and method |
| US11307166B2 (en) | 2010-07-01 | 2022-04-19 | Life Technologies Corporation | Column ADC |
| WO2012006222A1 (en) | 2010-07-03 | 2012-01-12 | Life Technologies Corporation | Chemically sensitive sensor with lightly doped drains |
| EP2617061B1 (en) | 2010-09-15 | 2021-06-30 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
| EP2619564B1 (en) | 2010-09-24 | 2016-03-16 | Life Technologies Corporation | Matched pair transistor circuits |
| US9970984B2 (en) | 2011-12-01 | 2018-05-15 | Life Technologies Corporation | Method and apparatus for identifying defects in a chemical sensor array |
| US8786331B2 (en) | 2012-05-29 | 2014-07-22 | Life Technologies Corporation | System for reducing noise in a chemical sensor array |
| US9080968B2 (en) | 2013-01-04 | 2015-07-14 | Life Technologies Corporation | Methods and systems for point of use removal of sacrificial material |
| US9841398B2 (en) | 2013-01-08 | 2017-12-12 | Life Technologies Corporation | Methods for manufacturing well structures for low-noise chemical sensors |
| US8962366B2 (en) | 2013-01-28 | 2015-02-24 | Life Technologies Corporation | Self-aligned well structures for low-noise chemical sensors |
| US8963216B2 (en) | 2013-03-13 | 2015-02-24 | Life Technologies Corporation | Chemical sensor with sidewall spacer sensor surface |
| US8841217B1 (en) | 2013-03-13 | 2014-09-23 | Life Technologies Corporation | Chemical sensor with protruded sensor surface |
| US9835585B2 (en) | 2013-03-15 | 2017-12-05 | Life Technologies Corporation | Chemical sensor with protruded sensor surface |
| CN105051525B (en) | 2013-03-15 | 2019-07-26 | 生命科技公司 | Chemical device with thin conducting element |
| WO2014149778A1 (en) | 2013-03-15 | 2014-09-25 | Life Technologies Corporation | Chemical sensors with consistent sensor surface areas |
| US9116117B2 (en) | 2013-03-15 | 2015-08-25 | Life Technologies Corporation | Chemical sensor with sidewall sensor surface |
| US20140264472A1 (en) | 2013-03-15 | 2014-09-18 | Life Technologies Corporation | Chemical sensor with consistent sensor surface areas |
| US20140336063A1 (en) | 2013-05-09 | 2014-11-13 | Life Technologies Corporation | Windowed Sequencing |
| US10458942B2 (en) | 2013-06-10 | 2019-10-29 | Life Technologies Corporation | Chemical sensor array having multiple sensors per well |
| KR20170097712A (en) | 2014-12-18 | 2017-08-28 | 라이프 테크놀로지스 코포레이션 | Methods and apparatus for measuring analytes using large scale fet arrays |
| TWI794007B (en) | 2014-12-18 | 2023-02-21 | 美商生命技術公司 | Integrated circuit device, sensor device and integrated circuit |
| US10077472B2 (en) | 2014-12-18 | 2018-09-18 | Life Technologies Corporation | High data rate integrated circuit with power management |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3387286A (en) * | 1967-07-14 | 1968-06-04 | Ibm | Field-effect transistor memory |
| FR2722294B1 (en) * | 1994-07-07 | 1996-10-04 | Lyon Ecole Centrale | PROCESS FOR THE QUALITATIVE AND / OR QUANTITATIVE ANALYSIS OF BIOLOGICAL SUBSTANCES PRESENT IN A CONDUCTIVE LIQUID MEDIUM AND BIOCHEMICAL AFFINITY SENSORS USED FOR THE IMPLEMENTATION OF THIS PROCESS |
| US5827482A (en) * | 1996-08-20 | 1998-10-27 | Motorola Corporation | Transistor-based apparatus and method for molecular detection and field enhancement |
| EP1085320A1 (en) * | 1999-09-13 | 2001-03-21 | Interuniversitair Micro-Elektronica Centrum Vzw | A device for detecting an analyte in a sample based on organic materials |
| US6284613B1 (en) * | 1999-11-05 | 2001-09-04 | Chartered Semiconductor Manufacturing Ltd. | Method for forming a T-gate for better salicidation |
| JP3701241B2 (en) * | 2000-03-30 | 2005-09-28 | インフィネオン テクノロジーズ アクチエンゲゼルシャフト | Sensor array and method for detecting the state of a transistor in the sensor array |
| DE10163557B4 (en) * | 2001-12-21 | 2007-12-06 | Forschungszentrum Jülich GmbH | Transistor-based sensor with specially designed gate electrode for high-sensitivity detection of analytes |
| US6926865B2 (en) * | 2002-02-11 | 2005-08-09 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for detecting DNA hybridization |
-
2002
- 2002-11-28 DE DE2002155755 patent/DE10255755B4/en not_active Expired - Fee Related
-
2003
- 2003-11-21 AU AU2003293715A patent/AU2003293715A1/en not_active Abandoned
- 2003-11-21 WO PCT/EP2003/013121 patent/WO2004048962A1/en not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| DE10255755A1 (en) | 2004-07-01 |
| WO2004048962A1 (en) | 2004-06-10 |
| DE10255755B4 (en) | 2006-07-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |