AU2003291966A1 - A method for classifying the quality of a surface - Google Patents
A method for classifying the quality of a surfaceInfo
- Publication number
- AU2003291966A1 AU2003291966A1 AU2003291966A AU2003291966A AU2003291966A1 AU 2003291966 A1 AU2003291966 A1 AU 2003291966A1 AU 2003291966 A AU2003291966 A AU 2003291966A AU 2003291966 A AU2003291966 A AU 2003291966A AU 2003291966 A1 AU2003291966 A1 AU 2003291966A1
- Authority
- AU
- Australia
- Prior art keywords
- classifying
- quality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
- G01N21/8986—Wood
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
- G01N2201/12746—Calibration values determination
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Wood Science & Technology (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Image Processing (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DKPA200201954 | 2002-12-19 | ||
DKPA200201954 | 2002-12-19 | ||
PCT/DK2003/000923 WO2004057317A1 (en) | 2002-12-19 | 2003-12-19 | A method for classifying the quality of a surface |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003291966A1 true AU2003291966A1 (en) | 2004-07-14 |
Family
ID=32668615
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003291966A Abandoned AU2003291966A1 (en) | 2002-12-19 | 2003-12-19 | A method for classifying the quality of a surface |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU2003291966A1 (en) |
WO (1) | WO2004057317A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ES2381723B1 (en) | 2010-04-12 | 2013-04-26 | Asociacion De Investigacion Y Desarrollo En La Industria Del Mueble Y Afines (Aidima) | ARTIFICIAL VISION SYSTEM FOR DETECTION OF DEFECTS IN FINISHED SURFACES |
US9670809B2 (en) | 2011-11-29 | 2017-06-06 | Corning Incorporated | Apparatus and method for skinning articles |
US9239296B2 (en) | 2014-03-18 | 2016-01-19 | Corning Incorporated | Skinning of ceramic honeycomb bodies |
US10611051B2 (en) | 2013-10-15 | 2020-04-07 | Corning Incorporated | Systems and methods for skinning articles |
CN106622997B (en) * | 2017-01-11 | 2022-09-16 | 广西师范大学 | Bamboo-wood strip sorting machine |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5274714A (en) * | 1990-06-04 | 1993-12-28 | Neuristics, Inc. | Method and apparatus for determining and organizing feature vectors for neural network recognition |
US6122065A (en) * | 1996-08-12 | 2000-09-19 | Centre De Recherche Industrielle Du Quebec | Apparatus and method for detecting surface defects |
DE19637234C2 (en) * | 1996-09-13 | 2001-08-02 | Michael F Braun | Procedure for checking the color purity of surfaces |
IL143478A (en) * | 1998-12-04 | 2005-09-25 | Fraunhofer Ges Forschung | Method and device for optically monitoring processes for manufacturing microstructured surfaces in the production of semiconductors |
DE19940879A1 (en) * | 1999-08-27 | 2001-03-08 | Innomess Elektronik Gmbh | Device and procedure for comparison of a digitized print image with a reference image for automatic quality control so that if error values exceed a threshold value an alarm is generated to inform print machine operators |
US6266138B1 (en) * | 1999-10-12 | 2001-07-24 | Perceptron, Inc. | System and method for detecting defects in a surface of a workpiece |
ITBO20010037A1 (en) * | 2001-01-30 | 2002-07-30 | E L C O S S R L | METHOD FOR THE CLASSIFICATION OF THE AESTHETIC QUALITY OF PLANAR MATERIALS AND EQUIPMENT FOR THE AUTOMATIC SELECTION OF PLANAR MATERIALS |
-
2003
- 2003-12-19 WO PCT/DK2003/000923 patent/WO2004057317A1/en not_active Application Discontinuation
- 2003-12-19 AU AU2003291966A patent/AU2003291966A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2004057317A1 (en) | 2004-07-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |