AU2003280728A1 - Package leakage defect inspection device and inspection method - Google Patents

Package leakage defect inspection device and inspection method

Info

Publication number
AU2003280728A1
AU2003280728A1 AU2003280728A AU2003280728A AU2003280728A1 AU 2003280728 A1 AU2003280728 A1 AU 2003280728A1 AU 2003280728 A AU2003280728 A AU 2003280728A AU 2003280728 A AU2003280728 A AU 2003280728A AU 2003280728 A1 AU2003280728 A1 AU 2003280728A1
Authority
AU
Australia
Prior art keywords
leakage defect
package leakage
inspection device
inspection method
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003280728A
Inventor
Yoshihiro Murakawa
Yoshihiro Wada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gunze Ltd
Original Assignee
Gunze Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gunze Ltd filed Critical Gunze Ltd
Publication of AU2003280728A1 publication Critical patent/AU2003280728A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws
    • G01N27/205—Investigating the presence of flaws in insulating materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
AU2003280728A 2002-11-29 2003-11-12 Package leakage defect inspection device and inspection method Abandoned AU2003280728A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002-347479 2002-11-29
JP2002347479A JP4072675B2 (en) 2002-11-29 2002-11-29 Pinhole inspection apparatus and pinhole inspection method
PCT/JP2003/014345 WO2004051255A1 (en) 2002-11-29 2003-11-12 Package leakage defect inspection device and inspection method

Publications (1)

Publication Number Publication Date
AU2003280728A1 true AU2003280728A1 (en) 2004-06-23

Family

ID=32462885

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003280728A Abandoned AU2003280728A1 (en) 2002-11-29 2003-11-12 Package leakage defect inspection device and inspection method

Country Status (3)

Country Link
JP (1) JP4072675B2 (en)
AU (1) AU2003280728A1 (en)
WO (1) WO2004051255A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103743791A (en) * 2013-12-27 2014-04-23 中国神华能源股份有限公司 Evaporator and method for monitoring breakage of liner of evaporator
JP7215724B2 (en) * 2019-02-19 2023-01-31 ニッカ電測株式会社 Pinhole inspection method and pinhole inspection device
US11067473B2 (en) * 2019-06-07 2021-07-20 Packaging Technologies & Inspection, LLC System and method for high voltage leak detection
US11397126B2 (en) 2020-02-20 2022-07-26 Packaging Technologies and Inspection, LLC System and method for grounded high voltage leak detection

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5386294A (en) * 1976-12-18 1978-07-29 Takeda Chemical Industries Ltd Inspecting method and apparatus for defect in insulation vessels
JPS6311654Y2 (en) * 1980-09-16 1988-04-05

Also Published As

Publication number Publication date
JP4072675B2 (en) 2008-04-09
WO2004051255A1 (en) 2004-06-17
JP2004184079A (en) 2004-07-02

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase