AU2003206910A1 - Method and system for large dimension profile measurement - Google Patents

Method and system for large dimension profile measurement

Info

Publication number
AU2003206910A1
AU2003206910A1 AU2003206910A AU2003206910A AU2003206910A1 AU 2003206910 A1 AU2003206910 A1 AU 2003206910A1 AU 2003206910 A AU2003206910 A AU 2003206910A AU 2003206910 A AU2003206910 A AU 2003206910A AU 2003206910 A1 AU2003206910 A1 AU 2003206910A1
Authority
AU
Australia
Prior art keywords
profile measurement
large dimension
dimension profile
measurement
profile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003206910A
Inventor
Vladimir Busurin
Jean-Paul Collette
Emmanuel Mazy
Yvan Stockman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universite de Liege
Original Assignee
Universite de Liege
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universite de Liege filed Critical Universite de Liege
Publication of AU2003206910A1 publication Critical patent/AU2003206910A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU2003206910A 2002-03-08 2003-02-14 Method and system for large dimension profile measurement Abandoned AU2003206910A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US36238702P 2002-03-08 2002-03-08
US60/362,387 2002-03-08
PCT/EP2003/001547 WO2003076874A1 (en) 2002-03-08 2003-02-14 Method and system for large dimension profile measurement

Publications (1)

Publication Number Publication Date
AU2003206910A1 true AU2003206910A1 (en) 2003-09-22

Family

ID=27805169

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003206910A Abandoned AU2003206910A1 (en) 2002-03-08 2003-02-14 Method and system for large dimension profile measurement

Country Status (2)

Country Link
AU (1) AU2003206910A1 (en)
WO (1) WO2003076874A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006026265B4 (en) 2006-06-02 2016-03-10 Benteler Automobiltechnik Gmbh Device for optical measurement and / or inspection of welded assemblies

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4213245A (en) * 1977-02-08 1980-07-22 British Steel Corporation Profile gauging
US5129724A (en) * 1991-01-29 1992-07-14 Wyko Corporation Apparatus and method for simultaneous measurement of film thickness and surface height variation for film-substrate sample
DE29607417U1 (en) * 1996-04-25 1996-06-20 Siemens AG, 80333 München Arrangement for checking a test object by comparison with a sample object
US6822745B2 (en) * 2000-01-25 2004-11-23 Zygo Corporation Optical systems for measuring form and geometric dimensions of precision engineered parts

Also Published As

Publication number Publication date
WO2003076874A1 (en) 2003-09-18

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase