AU2003206910A1 - Method and system for large dimension profile measurement - Google Patents
Method and system for large dimension profile measurementInfo
- Publication number
- AU2003206910A1 AU2003206910A1 AU2003206910A AU2003206910A AU2003206910A1 AU 2003206910 A1 AU2003206910 A1 AU 2003206910A1 AU 2003206910 A AU2003206910 A AU 2003206910A AU 2003206910 A AU2003206910 A AU 2003206910A AU 2003206910 A1 AU2003206910 A1 AU 2003206910A1
- Authority
- AU
- Australia
- Prior art keywords
- profile measurement
- large dimension
- dimension profile
- measurement
- profile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000005259 measurement Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US36238702P | 2002-03-08 | 2002-03-08 | |
US60/362,387 | 2002-03-08 | ||
PCT/EP2003/001547 WO2003076874A1 (en) | 2002-03-08 | 2003-02-14 | Method and system for large dimension profile measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003206910A1 true AU2003206910A1 (en) | 2003-09-22 |
Family
ID=27805169
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003206910A Abandoned AU2003206910A1 (en) | 2002-03-08 | 2003-02-14 | Method and system for large dimension profile measurement |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU2003206910A1 (en) |
WO (1) | WO2003076874A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006026265B4 (en) | 2006-06-02 | 2016-03-10 | Benteler Automobiltechnik Gmbh | Device for optical measurement and / or inspection of welded assemblies |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4213245A (en) * | 1977-02-08 | 1980-07-22 | British Steel Corporation | Profile gauging |
US5129724A (en) * | 1991-01-29 | 1992-07-14 | Wyko Corporation | Apparatus and method for simultaneous measurement of film thickness and surface height variation for film-substrate sample |
DE29607417U1 (en) * | 1996-04-25 | 1996-06-20 | Siemens AG, 80333 München | Arrangement for checking a test object by comparison with a sample object |
US6822745B2 (en) * | 2000-01-25 | 2004-11-23 | Zygo Corporation | Optical systems for measuring form and geometric dimensions of precision engineered parts |
-
2003
- 2003-02-14 WO PCT/EP2003/001547 patent/WO2003076874A1/en not_active Application Discontinuation
- 2003-02-14 AU AU2003206910A patent/AU2003206910A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2003076874A1 (en) | 2003-09-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |