AU2002368360A1 - High speed measuring system of resistance - Google Patents
High speed measuring system of resistanceInfo
- Publication number
- AU2002368360A1 AU2002368360A1 AU2002368360A AU2002368360A AU2002368360A1 AU 2002368360 A1 AU2002368360 A1 AU 2002368360A1 AU 2002368360 A AU2002368360 A AU 2002368360A AU 2002368360 A AU2002368360 A AU 2002368360A AU 2002368360 A1 AU2002368360 A1 AU 2002368360A1
- Authority
- AU
- Australia
- Prior art keywords
- resistance
- high speed
- measuring system
- speed measuring
- speed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2002-0071177 | 2002-11-15 | ||
KR1020020071177A KR20040042616A (en) | 2002-11-15 | 2002-11-15 | High speed measuring system of resistance |
PCT/KR2002/002288 WO2004046737A1 (en) | 2002-11-15 | 2002-12-05 | High speed measuring system of resistance |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002368360A1 true AU2002368360A1 (en) | 2004-06-15 |
Family
ID=32322236
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002368360A Abandoned AU2002368360A1 (en) | 2002-11-15 | 2002-12-05 | High speed measuring system of resistance |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR20040042616A (en) |
AU (1) | AU2002368360A1 (en) |
WO (1) | WO2004046737A1 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007106990A1 (en) * | 2006-03-23 | 2007-09-27 | Microbridge Technologies Inc. | Thermal pre-scanning of electric circuits using thermally-trimmable resistors |
JP2012237622A (en) * | 2011-05-11 | 2012-12-06 | Nidec-Read Corp | Measuring apparatus and measuring method |
JP5991034B2 (en) * | 2012-06-08 | 2016-09-14 | 日本電産リード株式会社 | Electrical property detection method and detection apparatus |
JP5953135B2 (en) * | 2012-06-14 | 2016-07-20 | 日置電機株式会社 | Resistance measuring device and circuit board inspection device |
CN106824833B (en) * | 2017-02-28 | 2023-07-18 | 中国振华集团云科电子有限公司 | Resistor screening process |
CN113945759B (en) * | 2021-10-18 | 2024-05-31 | 深圳市杰普特光电股份有限公司 | Resistance measurement method, resistance measurement device, resistance adjustment device and computer readable storage medium |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0755885A (en) * | 1993-06-30 | 1995-03-03 | Hitachi Ltd | Electrical characteristic inspection device of electrical circuit board |
JP3296068B2 (en) * | 1994-02-17 | 2002-06-24 | 三菱電機株式会社 | Antenna measuring device |
KR970007390A (en) * | 1995-07-27 | 1997-02-21 | 배순훈 | Electronic circuit controller using GPIB and computer |
US6100815A (en) * | 1997-12-24 | 2000-08-08 | Electro Scientific Industries, Inc. | Compound switching matrix for probing and interconnecting devices under test to measurement equipment |
KR20000002789A (en) * | 1998-06-23 | 2000-01-15 | 신동영 | Precision measurement apparatus of car audio system using personal computer |
US6388435B1 (en) * | 1998-12-31 | 2002-05-14 | General Electric Company | Methods and apparatus for voltage measurement |
JP2000221222A (en) * | 1999-01-29 | 2000-08-11 | Teijin Ltd | Resistance measuring instrument |
KR100359238B1 (en) * | 2000-08-24 | 2002-11-04 | 재단법인 포항산업과학연구원 | Auto Test Equipment For Impedance Transducer Hybrid IC For Vibration Sensor |
KR100355716B1 (en) * | 2001-01-15 | 2002-10-12 | 주식회사 대양기전 | Test method of low resistor for in-circuit tester |
-
2002
- 2002-11-15 KR KR1020020071177A patent/KR20040042616A/en not_active Application Discontinuation
- 2002-12-05 WO PCT/KR2002/002288 patent/WO2004046737A1/en not_active Application Discontinuation
- 2002-12-05 AU AU2002368360A patent/AU2002368360A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2004046737A1 (en) | 2004-06-03 |
KR20040042616A (en) | 2004-05-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |