AU2002351144A1 - Circuit arrangement for testing an analog-digital converter - Google Patents

Circuit arrangement for testing an analog-digital converter

Info

Publication number
AU2002351144A1
AU2002351144A1 AU2002351144A AU2002351144A AU2002351144A1 AU 2002351144 A1 AU2002351144 A1 AU 2002351144A1 AU 2002351144 A AU2002351144 A AU 2002351144A AU 2002351144 A AU2002351144 A AU 2002351144A AU 2002351144 A1 AU2002351144 A1 AU 2002351144A1
Authority
AU
Australia
Prior art keywords
analog
testing
digital converter
circuit arrangement
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002351144A
Inventor
Michael Ramm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of AU2002351144A1 publication Critical patent/AU2002351144A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for dc performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
AU2002351144A 2001-12-21 2002-12-12 Circuit arrangement for testing an analog-digital converter Abandoned AU2002351144A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE2001163651 DE10163651A1 (en) 2001-12-21 2001-12-21 Circuit arrangement for testing an analog-to-digital converter
DE10163651.2 2001-12-21
PCT/IB2002/005405 WO2003055078A1 (en) 2001-12-21 2002-12-12 Circuit arrangement for testing an analog-digital converter

Publications (1)

Publication Number Publication Date
AU2002351144A1 true AU2002351144A1 (en) 2003-07-09

Family

ID=7710649

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002351144A Abandoned AU2002351144A1 (en) 2001-12-21 2002-12-12 Circuit arrangement for testing an analog-digital converter

Country Status (3)

Country Link
AU (1) AU2002351144A1 (en)
DE (1) DE10163651A1 (en)
WO (1) WO2003055078A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102998560B (en) * 2012-11-22 2015-01-21 福州瑞芯微电子有限公司 Method for mutually testing high-speed analog to digital converter (ADC) interface and general purpose input/output (GPIO) interface

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774498A (en) * 1987-03-09 1988-09-27 Tektronix, Inc. Analog-to-digital converter with error checking and correction circuits
US5119098A (en) * 1989-06-20 1992-06-02 Sony Corporation Full flash analog-to-digital converter
US5124704A (en) * 1990-09-17 1992-06-23 Motorola, Inc. Multi-comparator a/d converter with circuit for testing the operation thereof
JPH07131347A (en) * 1993-11-04 1995-05-19 Mitsubishi Electric Corp A/d converter test circuit and d/a converter test circuit
FR2784193B1 (en) * 1998-10-05 2001-01-05 Texas Instruments France INTEGRATED MECHANISM FOR DETECTION OF FAILURES BY REAL-TIME AUTOMATIC TEST FOR AN ANALOG / DIGITAL CONVERTER
US6300889B1 (en) * 2000-06-19 2001-10-09 Cygnal Integrated Products, Inc. System on chip with ADC having serial test mode

Also Published As

Publication number Publication date
DE10163651A1 (en) 2003-07-03
WO2003055078A1 (en) 2003-07-03

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase