AU2002237658A1 - Process for producing iii-v compound films by chemical deposition - Google Patents
Process for producing iii-v compound films by chemical depositionInfo
- Publication number
- AU2002237658A1 AU2002237658A1 AU2002237658A AU3765802A AU2002237658A1 AU 2002237658 A1 AU2002237658 A1 AU 2002237658A1 AU 2002237658 A AU2002237658 A AU 2002237658A AU 3765802 A AU3765802 A AU 3765802A AU 2002237658 A1 AU2002237658 A1 AU 2002237658A1
- Authority
- AU
- Australia
- Prior art keywords
- chemical deposition
- compound films
- producing iii
- iii
- producing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W16/00—Network planning, e.g. coverage or traffic planning tools; Network deployment, e.g. resource partitioning or cells structures
- H04W16/24—Cell structures
- H04W16/28—Cell structures using beam steering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
- C30B7/005—Epitaxial layer growth
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B7/00—Radio transmission systems, i.e. using radiation field
- H04B7/02—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas
- H04B7/04—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
- H04B7/06—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station
- H04B7/0613—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station using simultaneous transmission
- H04B7/0615—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station using simultaneous transmission of weighted versions of same signal
- H04B7/0617—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station using simultaneous transmission of weighted versions of same signal for beam forming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B7/00—Radio transmission systems, i.e. using radiation field
- H04B7/02—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas
- H04B7/04—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
- H04B7/08—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the receiving station
- H04B7/0837—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the receiving station using pre-detection combining
- H04B7/0842—Weighted combining
- H04B7/086—Weighted combining using weights depending on external parameters, e.g. direction of arrival [DOA], predetermined weights or beamforming
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US25226000P | 2000-11-20 | 2000-11-20 | |
US60/252,260 | 2000-11-20 | ||
US30524901P | 2001-07-12 | 2001-07-12 | |
US60/305,249 | 2001-07-12 | ||
PCT/US2001/043452 WO2002040752A2 (en) | 2000-11-20 | 2001-11-20 | Process for producing iii-v compound films by chemical deposition |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002237658A1 true AU2002237658A1 (en) | 2002-05-27 |
Family
ID=26942170
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002237658A Abandoned AU2002237658A1 (en) | 2000-11-20 | 2001-11-20 | Process for producing iii-v compound films by chemical deposition |
Country Status (3)
Country | Link |
---|---|
US (1) | US6770131B2 (en) |
AU (1) | AU2002237658A1 (en) |
WO (1) | WO2002040752A2 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6780239B2 (en) * | 2000-10-19 | 2004-08-24 | Ricoh Company, Ltd. | Crystal growth method, crystal growth apparatus, group-III nitride crystal and group-III nitride semiconductor device |
US6911083B2 (en) * | 2002-06-11 | 2005-06-28 | Tokyo Institute Of Technology | Method for producing powders made of gallium nitride and apparatus for producing the same |
JP5015417B2 (en) * | 2004-06-09 | 2012-08-29 | 住友電気工業株式会社 | GaN crystal manufacturing method |
KR100712753B1 (en) * | 2005-03-09 | 2007-04-30 | 주식회사 실트론 | Compound semiconductor device and method for manufacturing the same |
JP4818732B2 (en) * | 2005-03-18 | 2011-11-16 | シャープ株式会社 | Method of manufacturing nitride semiconductor device |
US20070082505A1 (en) * | 2005-10-11 | 2007-04-12 | Freescale Semiconductor, Inc. | Method of forming an electrically insulating layer on a compound semiconductor |
US20170155016A9 (en) * | 2013-03-07 | 2017-06-01 | Meijo University | Nitride semiconductor crystal and method of fabricating the same |
JP6111818B2 (en) * | 2013-04-24 | 2017-04-12 | 三菱電機株式会社 | Semiconductor device and method for manufacturing semiconductor device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4833103A (en) | 1987-06-16 | 1989-05-23 | Eastman Kodak Company | Process for depositing a III-V compound layer on a substrate |
US4975299A (en) * | 1989-11-02 | 1990-12-04 | Eastman Kodak Company | Vapor deposition process for depositing an organo-metallic compound layer on a substrate |
JP2642876B2 (en) * | 1994-08-11 | 1997-08-20 | 工業技術院長 | Lead titanate-based dielectric thin film |
US6001284A (en) * | 1995-08-04 | 1999-12-14 | Toyo Ink Manufacturing Co., Ltd. | Organoelectroluminescence device material and organoelectroluminescence device for which the material is adapted |
DE19929591A1 (en) * | 1999-06-28 | 2001-01-04 | Max Planck Gesellschaft | Process for producing an epitaxial gallium nitride layer on a substrate comprises applying a precursor compound containing gallium carbodiimide on the substrate, and converting into crystalline gallium nitride by pyrolysis |
US6294016B1 (en) * | 1999-10-20 | 2001-09-25 | Kwangju Institute Of Science And Technology | Method for manufacturing p-type GaN based thin film using nitridation |
-
2001
- 2001-11-20 WO PCT/US2001/043452 patent/WO2002040752A2/en not_active Application Discontinuation
- 2001-11-20 US US09/989,969 patent/US6770131B2/en not_active Expired - Fee Related
- 2001-11-20 AU AU2002237658A patent/AU2002237658A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2002040752A3 (en) | 2003-03-27 |
US6770131B2 (en) | 2004-08-03 |
WO2002040752A2 (en) | 2002-05-23 |
US20030012874A1 (en) | 2003-01-16 |
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