AU2002235210A1 - System and method for grating profile classification - Google Patents
System and method for grating profile classificationInfo
- Publication number
- AU2002235210A1 AU2002235210A1 AU2002235210A AU3521002A AU2002235210A1 AU 2002235210 A1 AU2002235210 A1 AU 2002235210A1 AU 2002235210 A AU2002235210 A AU 2002235210A AU 3521002 A AU3521002 A AU 3521002A AU 2002235210 A1 AU2002235210 A1 AU 2002235210A1
- Authority
- AU
- Australia
- Prior art keywords
- grating profile
- profile classification
- classification
- grating
- profile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70605—Workpiece metrology
- G03F7/70616—Monitoring the printed patterns
- G03F7/70625—Dimensions, e.g. line width, critical dimension [CD], profile, sidewall angle or edge roughness
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S706/00—Data processing: artificial intelligence
- Y10S706/902—Application using ai with detail of the ai system
- Y10S706/934—Information retrieval or Information management
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Image Analysis (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Character Discrimination (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/737,705 | 2000-12-14 | ||
US09/737,705 US6636843B2 (en) | 2000-12-14 | 2000-12-14 | System and method for grating profile classification |
PCT/US2001/048482 WO2002048746A2 (en) | 2000-12-14 | 2001-12-13 | System and method for grating profile classification |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002235210A1 true AU2002235210A1 (en) | 2002-06-24 |
Family
ID=24964961
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002235210A Abandoned AU2002235210A1 (en) | 2000-12-14 | 2001-12-13 | System and method for grating profile classification |
Country Status (5)
Country | Link |
---|---|
US (1) | US6636843B2 (en) |
JP (1) | JP2004515792A (en) |
AU (1) | AU2002235210A1 (en) |
TW (1) | TWI221982B (en) |
WO (1) | WO2002048746A2 (en) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6768983B1 (en) * | 2000-11-28 | 2004-07-27 | Timbre Technologies, Inc. | System and method for real-time library generation of grating profiles |
US6901340B1 (en) * | 2001-04-02 | 2005-05-31 | Advanced Micro Devices, Inc. | Method and apparatus for distinguishing between sources of process variation |
US6785638B2 (en) * | 2001-08-06 | 2004-08-31 | Timbre Technologies, Inc. | Method and system of dynamic learning through a regression-based library generation process |
US6792328B2 (en) * | 2002-03-29 | 2004-09-14 | Timbre Technologies, Inc. | Metrology diffraction signal adaptation for tool-to-tool matching |
US20030197872A1 (en) * | 2002-04-17 | 2003-10-23 | Littau Michael E. | Scatterometric measurement of undercut multi-layer diffracting signatures |
US7330279B2 (en) * | 2002-07-25 | 2008-02-12 | Timbre Technologies, Inc. | Model and parameter selection for optical metrology |
WO2004046655A2 (en) * | 2002-11-20 | 2004-06-03 | Mehrdad Nikoohahad | System and method for characterizing three-dimensional structures |
FR2849181B1 (en) * | 2002-12-23 | 2005-12-23 | Commissariat Energie Atomique | METHOD OF STUDYING STRUCTURE RELIEFS OPTICALLY |
US7064829B2 (en) * | 2003-03-20 | 2006-06-20 | Timbre Technologies, Inc. | Generic interface for an optical metrology system |
US7198964B1 (en) | 2004-02-03 | 2007-04-03 | Advanced Micro Devices, Inc. | Method and apparatus for detecting faults using principal component analysis parameter groupings |
US7065423B2 (en) * | 2004-07-08 | 2006-06-20 | Timbre Technologies, Inc. | Optical metrology model optimization for process control |
US20070091325A1 (en) * | 2005-01-07 | 2007-04-26 | Mehrdad Nikoonahad | Multi-channel optical metrology |
US7355728B2 (en) * | 2005-06-16 | 2008-04-08 | Timbre Technologies, Inc. | Optical metrology model optimization for repetitive structures |
US7305322B2 (en) * | 2006-03-31 | 2007-12-04 | Tokyo Electron Limited | Using a virtual profile library |
US7542859B2 (en) * | 2006-03-31 | 2009-06-02 | Tokyo Electron Ltd. | Creating a virtual profile library |
US7487053B2 (en) * | 2006-03-31 | 2009-02-03 | Tokyo Electron Limited | Refining a virtual profile library |
US7518740B2 (en) * | 2006-07-10 | 2009-04-14 | Tokyo Electron Limited | Evaluating a profile model to characterize a structure to be examined using optical metrology |
US20080013107A1 (en) * | 2006-07-11 | 2008-01-17 | Tokyo Electron Limited | Generating a profile model to characterize a structure to be examined using optical metrology |
US8706729B2 (en) | 2011-10-12 | 2014-04-22 | California Institute Of Technology | Systems and methods for distributed data annotation |
US9355167B2 (en) * | 2012-05-18 | 2016-05-31 | California Institute Of Technology | Systems and methods for the distributed categorization of source data |
US9355359B2 (en) | 2012-06-22 | 2016-05-31 | California Institute Of Technology | Systems and methods for labeling source data using confidence labels |
WO2016177548A1 (en) | 2015-05-07 | 2016-11-10 | Asml Netherlands B.V. | Metrology method and apparatus, computer program and lithographic system |
US11449788B2 (en) | 2017-03-17 | 2022-09-20 | California Institute Of Technology | Systems and methods for online annotation of source data using skill estimation |
US10997052B2 (en) * | 2017-05-01 | 2021-05-04 | Dell Products L.P. | Methods to associate workloads to optimal system settings based upon statistical models |
US10853093B2 (en) | 2017-09-29 | 2020-12-01 | Dell Products L.P. | Application profiling via loopback methods |
CN114966472B (en) * | 2022-08-01 | 2022-10-21 | 云南电力试验研究院(集团)有限公司 | Electric arc spectrum identification method and device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5003600A (en) * | 1989-08-03 | 1991-03-26 | The United States Of America As Represented By The Department Of Energy | Diffraction gratings used as identifying markers |
US5386558A (en) * | 1992-02-24 | 1995-01-31 | Adapsys, Inc. | Method and apparatus for executing control system functions in a computer system |
US5355306A (en) * | 1993-09-30 | 1994-10-11 | Motorola, Inc. | Alignment system and method of alignment by symmetrical and asymmetrical analysis |
CN1912885B (en) * | 1995-02-13 | 2010-12-22 | 英特特拉斯特技术公司 | Systems and methods for secure transaction management and electronic rights protection |
JPH0943058A (en) * | 1995-05-23 | 1997-02-14 | Olympus Optical Co Ltd | Apparatus for classifying color and apparatus for examining unevenness of color |
US5963329A (en) * | 1997-10-31 | 1999-10-05 | International Business Machines Corporation | Method and apparatus for measuring the profile of small repeating lines |
-
2000
- 2000-12-14 US US09/737,705 patent/US6636843B2/en not_active Expired - Lifetime
-
2001
- 2001-12-13 TW TW090130980A patent/TWI221982B/en not_active IP Right Cessation
- 2001-12-13 AU AU2002235210A patent/AU2002235210A1/en not_active Abandoned
- 2001-12-13 WO PCT/US2001/048482 patent/WO2002048746A2/en active Application Filing
- 2001-12-13 JP JP2002549998A patent/JP2004515792A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20020188580A1 (en) | 2002-12-12 |
US6636843B2 (en) | 2003-10-21 |
TWI221982B (en) | 2004-10-11 |
JP2004515792A (en) | 2004-05-27 |
WO2002048746A3 (en) | 2003-11-06 |
WO2002048746A2 (en) | 2002-06-20 |
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