AU2002228785A1 - Test head actuation system with positioning and compliant modes - Google Patents

Test head actuation system with positioning and compliant modes

Info

Publication number
AU2002228785A1
AU2002228785A1 AU2002228785A AU2878502A AU2002228785A1 AU 2002228785 A1 AU2002228785 A1 AU 2002228785A1 AU 2002228785 A AU2002228785 A AU 2002228785A AU 2878502 A AU2878502 A AU 2878502A AU 2002228785 A1 AU2002228785 A1 AU 2002228785A1
Authority
AU
Australia
Prior art keywords
positioning
test head
actuation system
head actuation
compliant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002228785A
Inventor
Brian J. Bosy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of AU2002228785A1 publication Critical patent/AU2002228785A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
AU2002228785A 2000-11-07 2001-11-05 Test head actuation system with positioning and compliant modes Abandoned AU2002228785A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/707,764 US6838868B1 (en) 2000-11-07 2000-11-07 Test head actuation system with positioning and compliant modes
US09/707,764 2000-11-07
PCT/US2001/046399 WO2002039127A2 (en) 2000-11-07 2001-11-05 Test head actuation system with positioning and compliant modes

Publications (1)

Publication Number Publication Date
AU2002228785A1 true AU2002228785A1 (en) 2002-05-21

Family

ID=24843082

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002228785A Abandoned AU2002228785A1 (en) 2000-11-07 2001-11-05 Test head actuation system with positioning and compliant modes

Country Status (7)

Country Link
US (1) US6838868B1 (en)
EP (1) EP1332376A2 (en)
CN (1) CN1236317C (en)
AU (1) AU2002228785A1 (en)
MY (1) MY128910A (en)
TW (1) TW523590B (en)
WO (1) WO2002039127A2 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE493665T1 (en) 2001-07-16 2011-01-15 Intest Corp SYSTEM AND METHOD FOR COUPLING A TEST HEAD
DE602004030768D1 (en) * 2003-01-28 2011-02-10 Intest Corp WRIST TO ATTACH A TEST HEAD
US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
DE102004008487B4 (en) * 2004-02-20 2007-01-04 Heigl, Helmuth, Dr. Handling device for positioning a test head
JP2006284384A (en) * 2005-03-31 2006-10-19 Fujitsu Ltd Testing device and test method of semiconductor device
US7312604B2 (en) * 2005-07-29 2007-12-25 Nextest Systems Corporation Portable manipulator for stackable semiconductor test system
WO2008085463A1 (en) * 2006-12-29 2008-07-17 In Test Corporation Test head positioning system and method
TWI439709B (en) * 2006-12-29 2014-06-01 Intest Corp Manupulator and load positioning system for translating load along axis of translation
EP2150823A4 (en) 2007-05-07 2016-12-21 Intest Corp Cradle and cable handler for a test head manipulator
US8981807B2 (en) * 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
SG10201605656TA (en) * 2011-07-12 2016-08-30 Intest Corp Method and apparatus for docking a test head with a peripheral
US10094854B2 (en) * 2015-10-23 2018-10-09 Teradyne, Inc. Manipulator in automatic test equipment
CN109891254A (en) * 2016-10-10 2019-06-14 里德-阿什曼制造公司 Executor

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6166552A (en) * 1996-06-10 2000-12-26 Motorola Inc. Method and apparatus for testing a semiconductor wafer
US5828223A (en) * 1996-10-28 1998-10-27 Rabkin; Richard Universal chip tester interface device
US5949002A (en) 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance

Also Published As

Publication number Publication date
TW523590B (en) 2003-03-11
CN1483146A (en) 2004-03-17
US6838868B1 (en) 2005-01-04
MY128910A (en) 2007-02-28
EP1332376A2 (en) 2003-08-06
WO2002039127A3 (en) 2002-10-10
WO2002039127A2 (en) 2002-05-16
CN1236317C (en) 2006-01-11

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