AU2001296339A1 - High performance tester interface module - Google Patents

High performance tester interface module

Info

Publication number
AU2001296339A1
AU2001296339A1 AU2001296339A AU9633901A AU2001296339A1 AU 2001296339 A1 AU2001296339 A1 AU 2001296339A1 AU 2001296339 A AU2001296339 A AU 2001296339A AU 9633901 A AU9633901 A AU 9633901A AU 2001296339 A1 AU2001296339 A1 AU 2001296339A1
Authority
AU
Australia
Prior art keywords
high performance
interface module
performance tester
tester interface
module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001296339A
Inventor
Jonathan M. Becker
Arash Behziz
Derek Castellano
Arthur E. Lecolst
Frank Parrish
Donald Eric Thompson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of AU2001296339A1 publication Critical patent/AU2001296339A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
AU2001296339A 2000-09-28 2001-09-27 High performance tester interface module Abandoned AU2001296339A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/676,041 2000-09-28
US09/676,041 US6515499B1 (en) 2000-09-28 2000-09-28 Modular semiconductor tester interface assembly for high performance coaxial connections
PCT/US2001/030208 WO2002027337A2 (en) 2000-09-28 2001-09-27 High performance tester interface module

Publications (1)

Publication Number Publication Date
AU2001296339A1 true AU2001296339A1 (en) 2002-04-08

Family

ID=24712981

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001296339A Abandoned AU2001296339A1 (en) 2000-09-28 2001-09-27 High performance tester interface module

Country Status (8)

Country Link
US (2) US6515499B1 (en)
EP (1) EP1322963A2 (en)
JP (2) JP2004510164A (en)
KR (1) KR100855208B1 (en)
CN (1) CN1466687A (en)
AU (1) AU2001296339A1 (en)
TW (1) TW561268B (en)
WO (1) WO2002027337A2 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US20030062914A1 (en) * 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
US6686732B2 (en) 2001-12-20 2004-02-03 Teradyne, Inc. Low-cost tester interface module
KR100449204B1 (en) * 2002-11-25 2004-09-18 리노공업주식회사 Air Interface Apparatus for Use in High Frequency Probe
US7404718B2 (en) * 2003-11-05 2008-07-29 Tensolite Company High frequency connector assembly
US7503768B2 (en) * 2003-11-05 2009-03-17 Tensolite Company High frequency connector assembly
US7074047B2 (en) 2003-11-05 2006-07-11 Tensolite Company Zero insertion force high frequency connector
US7180321B2 (en) * 2004-10-01 2007-02-20 Teradyne, Inc. Tester interface module
US8115107B2 (en) * 2007-08-22 2012-02-14 Treadyne, Inc. System and method for mounting shielded cables to printed circuit board assemblies
KR101358925B1 (en) * 2007-10-18 2014-02-06 삼성전자주식회사 Interposer and probe card having the same
US7977583B2 (en) * 2007-12-13 2011-07-12 Teradyne, Inc. Shielded cable interface module and method of fabrication
USRE46958E1 (en) 2011-10-24 2018-07-17 Ardent Concepts, Inc. Controlled-impedance cable termination using compliant interconnect elements
USRE46936E1 (en) 2011-10-24 2018-07-03 Ardent Concepts, Inc. Controlled-impedance cable termination using compliant interconnect elements
USRE47459E1 (en) 2011-10-24 2019-06-25 Ardent Concepts, Inc. Controlled-impedance cable termination using compliant interconnect elements
US8936495B2 (en) * 2013-01-08 2015-01-20 Honeywell Federal Manufacturing & Technologies, Llc Dual contact pogo pin assembly
DE102013200971A1 (en) * 2013-01-22 2014-07-24 Robert Bosch Gmbh Method for electrically connecting a coaxial conductor to a circuit carrier
US9435855B2 (en) * 2013-11-19 2016-09-06 Teradyne, Inc. Interconnect for transmitting signals between a device and a tester
US9594114B2 (en) 2014-06-26 2017-03-14 Teradyne, Inc. Structure for transmitting signals in an application space between a device under test and test electronics
US9977052B2 (en) * 2016-10-04 2018-05-22 Teradyne, Inc. Test fixture
US9912104B2 (en) * 2017-04-18 2018-03-06 Honeywell Federal Maunfacturing and Technologies, LLC Lightning arrestor connector with mesh dielectric structure
US10677815B2 (en) 2018-06-08 2020-06-09 Teradyne, Inc. Test system having distributed resources
KR102174427B1 (en) * 2019-04-22 2020-11-05 리노공업주식회사 Test Device
US11363746B2 (en) 2019-09-06 2022-06-14 Teradyne, Inc. EMI shielding for a signal trace
JP7327659B2 (en) * 2020-04-22 2023-08-16 株式会社村田製作所 Inspection connector and inspection unit
US11651910B2 (en) 2020-12-10 2023-05-16 Teradyne, Inc. Inductance control system
US11862901B2 (en) 2020-12-15 2024-01-02 Teradyne, Inc. Interposer
JP2022096563A (en) * 2020-12-17 2022-06-29 日本発條株式会社 Measurement unit

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3665601A (en) * 1969-07-22 1972-05-30 Connecting Devices Inc Method of making a connector
US3587033A (en) * 1969-08-11 1971-06-22 Gen Cable Corp Quick connection coaxial cable connector
US3685026A (en) * 1970-08-20 1972-08-15 Matsushita Electric Ind Co Ltd Process of switching an electric current
US3711794A (en) * 1971-10-21 1973-01-16 Gen Electric Surge suppression transmission means
US4125308A (en) * 1977-05-26 1978-11-14 Emc Technology, Inc. Transitional RF connector
US4739935A (en) 1986-03-12 1988-04-26 Nordson Corporation Flexible voltage cable for electrostatic spray gun
GB8621429D0 (en) * 1986-09-05 1987-01-14 Raychem Pontoise Sa Circuit protection device
US5148103A (en) * 1990-10-31 1992-09-15 Hughes Aircraft Company Apparatus for testing integrated circuits
US5092774A (en) * 1991-01-09 1992-03-03 National Semiconductor Corporation Mechanically compliant high frequency electrical connector
JPH063371A (en) 1992-06-18 1994-01-11 Taisee:Kk Coaxial contact probe
US5262754A (en) * 1992-09-23 1993-11-16 Electromer Corporation Overvoltage protection element
US5371654A (en) * 1992-10-19 1994-12-06 International Business Machines Corporation Three dimensional high performance interconnection package
JPH0799220A (en) * 1993-08-04 1995-04-11 Tokyo Electron Ltd Probe card, coaxial probe needle for probe card and their production
GB9421829D0 (en) * 1994-10-29 1994-12-14 At & T Global Inf Solution Apparatus for measuring an RF parameter
US5729150A (en) * 1995-12-01 1998-03-17 Cascade Microtech, Inc. Low-current probe card with reduced triboelectric current generating cables
JP3286183B2 (en) * 1996-09-30 2002-05-27 アジレント・テクノロジー株式会社 Coaxial connector floating mount device
US6229327B1 (en) * 1997-05-30 2001-05-08 Gregory G. Boll Broadband impedance matching probe
EP0922960A1 (en) * 1997-12-12 1999-06-16 Padar Tecnologie di Riccioni Roberto S.a.s. Microcircuit testing device
JP2000088920A (en) * 1998-09-08 2000-03-31 Hitachi Electronics Eng Co Ltd Interface unit for inspection apparatus
JP3027570B1 (en) * 1998-12-10 2000-04-04 山一電機株式会社 Connector structure
US6217382B1 (en) * 2000-01-20 2001-04-17 Hughes Electronics Corporation Coaxial cable ESD bleed
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US6686732B2 (en) * 2001-12-20 2004-02-03 Teradyne, Inc. Low-cost tester interface module

Also Published As

Publication number Publication date
JP2004510164A (en) 2004-04-02
WO2002027337A3 (en) 2002-08-29
JP2010032531A (en) 2010-02-12
CN1466687A (en) 2004-01-07
JP5254919B2 (en) 2013-08-07
US6939175B2 (en) 2005-09-06
US20030122538A1 (en) 2003-07-03
TW561268B (en) 2003-11-11
EP1322963A2 (en) 2003-07-02
KR20040005828A (en) 2004-01-16
US6515499B1 (en) 2003-02-04
WO2002027337A2 (en) 2002-04-04
KR100855208B1 (en) 2008-09-01

Similar Documents

Publication Publication Date Title
AU2001296339A1 (en) High performance tester interface module
AU2001273728A1 (en) Arrangement for connecting planar components
AU2001243392A1 (en) An integrated circuit architecture with standard blocks
AU2002259152A1 (en) Improved photovoltaic device
AU2001296591A1 (en) Compliant attachment interface
AU2002215121A1 (en) Interface device
AU2002353115A1 (en) Compact ate with timestamp system
AU2001223883A1 (en) Telecommunications interface
AU2001260966A1 (en) Propulsion module
AU2002316665A1 (en) Jack module
AU3229601A (en) Compression tester
EP1143277A3 (en) Receptacle module
AU2002360007A1 (en) Fuel cell
AU2001270594A1 (en) Filter module
AU7392501A (en) Connecting device
AU2001272273A1 (en) Laser-ultrasonic testing system
AU2002304886A1 (en) Fuel cell
AU2001279517A1 (en) Connecting device
EP1308965A3 (en) Test array
AU2001285795A1 (en) Electrical connecting device
AU2002221927A1 (en) Electrospray interface
AU2001236968A1 (en) Lssd interface
EP1199759A3 (en) Battery module
AU2002227409A1 (en) Seismic shothole reaming module
AU2001273371A1 (en) Circuit test light