AU2001275915A1 - Multi-angle inspection for products - Google Patents

Multi-angle inspection for products

Info

Publication number
AU2001275915A1
AU2001275915A1 AU2001275915A AU7591501A AU2001275915A1 AU 2001275915 A1 AU2001275915 A1 AU 2001275915A1 AU 2001275915 A AU2001275915 A AU 2001275915A AU 7591501 A AU7591501 A AU 7591501A AU 2001275915 A1 AU2001275915 A1 AU 2001275915A1
Authority
AU
Australia
Prior art keywords
products
angle inspection
inspection
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001275915A
Inventor
Mark R Deyong
Alvaro D. Lewin
Robert W. Tait
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intelligent Reasoning Systems Inc
Original Assignee
Intelligent Reasoning Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intelligent Reasoning Systems Inc filed Critical Intelligent Reasoning Systems Inc
Publication of AU2001275915A1 publication Critical patent/AU2001275915A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S362/00Illumination
    • Y10S362/80Light emitting diode

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU2001275915A 2000-07-19 2001-07-13 Multi-angle inspection for products Abandoned AU2001275915A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/620,172 US6598994B1 (en) 1998-08-24 2000-07-19 Multi-angle inspection of manufactured products
US09620172 2000-07-19
PCT/US2001/022159 WO2002006798A1 (en) 2000-07-19 2001-07-13 Multi-angle inspection for products

Publications (1)

Publication Number Publication Date
AU2001275915A1 true AU2001275915A1 (en) 2002-01-30

Family

ID=24484881

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001275915A Abandoned AU2001275915A1 (en) 2000-07-19 2001-07-13 Multi-angle inspection for products

Country Status (3)

Country Link
US (1) US6598994B1 (en)
AU (1) AU2001275915A1 (en)
WO (1) WO2002006798A1 (en)

Families Citing this family (30)

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US6618123B2 (en) * 2000-10-20 2003-09-09 Matsushita Electric Industrial Co., Ltd. Range-finder, three-dimensional measuring method and light source apparatus
JP2004111357A (en) * 2002-07-09 2004-04-08 Topcon Corp Light source device
DE10249850A1 (en) * 2002-10-25 2004-05-13 Siemens Ag Process for quality control of connection balls of electronic components
US7631382B2 (en) * 2003-03-10 2009-12-15 Adidas International Marketing B.V. Intelligent footwear systems
JP2005274836A (en) * 2004-03-24 2005-10-06 Fujinon Corp Illuminating light source device
EP1612569A3 (en) * 2004-06-30 2006-02-08 Omron Corporation Method and apparatus for substrate surface inspection using multi-color light emission system
JP2006047290A (en) * 2004-06-30 2006-02-16 Omron Corp Image generation method for board inspection, board inspecting device and illumination device for board inspection
US20060092410A1 (en) * 2004-10-28 2006-05-04 Owens-Brockway Glass Container Inc. Container inspection by directly focusing a light emitting die element onto the container
US7430311B2 (en) * 2005-01-13 2008-09-30 Applied Vision Company, Llc System and method for inside can inspection
US7766508B2 (en) * 2006-09-12 2010-08-03 Cree, Inc. LED lighting fixture
US7665862B2 (en) 2006-09-12 2010-02-23 Cree, Inc. LED lighting fixture
US7824070B2 (en) * 2007-03-22 2010-11-02 Cree, Inc. LED lighting fixture
AT507018B1 (en) * 2008-07-09 2012-11-15 Profactor Res And Solutions Gmbh DEVICE FOR TESTING OBJECTS
EP2322907B1 (en) * 2009-11-14 2018-02-28 VMT Vision Machine Technic Bildverarbeitungssysteme GmbH Method for detecting the front lateral faces of hollow fibres and method for detecting the interior of unstuffed hollow fibres of a bundle of hollow fibres
CN102444793A (en) * 2010-10-07 2012-05-09 富准精密工业(深圳)有限公司 Light-emitting diode light fitting
US9500340B2 (en) 2011-10-25 2016-11-22 A-Dec, Inc. Dental light using LEDs
US9467609B2 (en) * 2013-05-10 2016-10-11 Mettler-Toledo, LLC Machine vision inspection systems and methods and aperture covers for use therewith
CN105358966B (en) * 2013-05-23 2019-08-02 材料开发中心股份公司 The equipment that the method for surface inspection is carried out to long material and executes such method
US9575008B2 (en) * 2014-02-12 2017-02-21 ASA Corporation Apparatus and method for photographing glass in multiple layers
JP2017067633A (en) * 2015-09-30 2017-04-06 キヤノン株式会社 Checkup apparatus, and manufacturing method
GB2545906A (en) * 2015-12-23 2017-07-05 Univ Southampton Modular electronic structures
US10974420B2 (en) 2017-03-21 2021-04-13 International Business Machines Corporation Feature casting for manufacture observation
USD873430S1 (en) * 2017-07-13 2020-01-21 Lin Zhou Bio-spectrum therapeutic apparatus
EP3719442B1 (en) 2017-11-27 2023-08-30 Nippon Steel Corporation Shape inspecting device and shape inspecting method
EP3722745B1 (en) 2017-12-08 2023-09-06 Nippon Steel Corporation Shape inspection device and shape inspection method
CN108535262A (en) * 2018-03-22 2018-09-14 深圳市永光神目科技有限公司 A kind of light-source structure and scolding tin defect detecting system
CN108535265A (en) * 2018-04-10 2018-09-14 深圳市纳研科技有限公司 A kind of multi-angle polisher and acquisition system
WO2020232618A1 (en) * 2019-05-21 2020-11-26 深圳市苍视智能科技有限公司 Surface defect inspection device based on dense independent light sources
US11536668B2 (en) * 2020-07-09 2022-12-27 Vitrox Technologies Sdn. Bhd. Apparatus for use in an automated optical inspection
CN215574703U (en) * 2021-05-19 2022-01-18 富泰华工业(深圳)有限公司 Detection device

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5039868A (en) 1988-11-24 1991-08-13 Omron Corporation Method of and apparatus for inspecting printed circuit boards and the like
DE8915535U1 (en) 1989-03-02 1990-10-25 Fa. Carl Zeiss, 7920 Heidenheim, De
US5309277A (en) 1992-06-19 1994-05-03 Zygo Corporation High intensity illuminator
DE59503466D1 (en) 1994-12-30 1998-10-08 Siemens Ag DEVICE FOR DETECTING THE POSITION OF CONNECTIONS OF COMPONENTS
TW402856B (en) * 1996-12-26 2000-08-21 Palite Corp LED illuminator
US6141033A (en) * 1997-05-15 2000-10-31 Cognex Corporation Bandwidth reduction of multichannel images for machine vision
US5920643A (en) 1997-05-16 1999-07-06 Northeast Robotics Llc Flexible lighting element circuit and method of manufacturing the same
US6022124A (en) 1997-08-19 2000-02-08 Ppt Vision, Inc. Machine-vision ring-reflector illumination system and method
JP3668383B2 (en) 1998-02-27 2005-07-06 松下電器産業株式会社 Electronic component mounting equipment
US5982493A (en) 1998-06-02 1999-11-09 Motorola, Inc. Apparatus and method for acquiring multiple images
US6161941A (en) * 1998-08-24 2000-12-19 Intelligent Reasoning Systems, Inc. Light array system and method for illumination of objects imaged by imaging systems

Also Published As

Publication number Publication date
US6598994B1 (en) 2003-07-29
WO2002006798A1 (en) 2002-01-24

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