AU2001275385A1 - System and method for locating irregular edges in image data - Google Patents

System and method for locating irregular edges in image data

Info

Publication number
AU2001275385A1
AU2001275385A1 AU2001275385A AU7538501A AU2001275385A1 AU 2001275385 A1 AU2001275385 A1 AU 2001275385A1 AU 2001275385 A AU2001275385 A AU 2001275385A AU 7538501 A AU7538501 A AU 7538501A AU 2001275385 A1 AU2001275385 A1 AU 2001275385A1
Authority
AU
Australia
Prior art keywords
image data
irregular edges
locating
locating irregular
edges
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001275385A
Inventor
Chu-Yin Chang
Clyde Maxwell Guest
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Technologies and Instruments Inc
Original Assignee
SEMICONDUCTOR TECHNOLOGIES AND
Semiconductor Technologies and Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SEMICONDUCTOR TECHNOLOGIES AND, Semiconductor Technologies and Instruments Inc filed Critical SEMICONDUCTOR TECHNOLOGIES AND
Publication of AU2001275385A1 publication Critical patent/AU2001275385A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/12—Edge-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer
AU2001275385A 2000-06-13 2001-06-07 System and method for locating irregular edges in image data Abandoned AU2001275385A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/592,641 2000-06-13
US09/592,641 US6459807B1 (en) 2000-06-13 2000-06-13 System and method for locating irregular edges in image data
PCT/US2001/018528 WO2001097170A2 (en) 2000-06-13 2001-06-07 System and method for locating irregular edges in image data

Publications (1)

Publication Number Publication Date
AU2001275385A1 true AU2001275385A1 (en) 2001-12-24

Family

ID=24371486

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001275385A Abandoned AU2001275385A1 (en) 2000-06-13 2001-06-07 System and method for locating irregular edges in image data

Country Status (3)

Country Link
US (2) US6459807B1 (en)
AU (1) AU2001275385A1 (en)
WO (1) WO2001097170A2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4612760B2 (en) * 2000-04-25 2011-01-12 キヤノン株式会社 Image processing apparatus and method
US8588511B2 (en) * 2002-05-22 2013-11-19 Cognex Corporation Method and apparatus for automatic measurement of pad geometry and inspection thereof
JP2004140683A (en) * 2002-10-18 2004-05-13 Ricoh Co Ltd Image processor
US7366344B2 (en) * 2003-07-14 2008-04-29 Rudolph Technologies, Inc. Edge normal process
US7340087B2 (en) * 2003-07-14 2008-03-04 Rudolph Technologies, Inc. Edge inspection
US7280200B2 (en) * 2003-07-18 2007-10-09 Ade Corporation Detection of a wafer edge using collimated light
WO2006085861A1 (en) * 2005-02-07 2006-08-17 Tankesmedjan Inc Method for recognizing and indexing digital media
KR20070075589A (en) * 2006-01-13 2007-07-24 삼성전자주식회사 Method for detecting an abnormality of probe card
US7616804B2 (en) 2006-07-11 2009-11-10 Rudolph Technologies, Inc. Wafer edge inspection and metrology
US8538077B2 (en) * 2011-05-03 2013-09-17 Microsoft Corporation Detecting an interest point in an image using edges
KR101812341B1 (en) * 2011-06-24 2017-12-26 엘지이노텍 주식회사 A method for edge enhancement of image
CN117531732B (en) * 2024-01-10 2024-03-22 浙江金连接科技股份有限公司 Semiconductor chip test probe sorting and defect detection equipment and detection method

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Publication number Priority date Publication date Assignee Title
US4645459A (en) * 1982-07-30 1987-02-24 Honeywell Inc. Computer generated synthesized imagery
JPH0623999B2 (en) * 1986-07-28 1994-03-30 株式会社日立製作所 Pattern defect detection method
US4833722A (en) * 1987-07-24 1989-05-23 Eastman Kodak Company Apparatus and methods for locating edges and document boundaries in video scan lines
US5027422A (en) * 1988-08-29 1991-06-25 Raytheon Company Confirmed boundary pattern matching
US5012524A (en) * 1989-02-27 1991-04-30 Motorola, Inc. Automatic inspection method
US5081689A (en) * 1989-03-27 1992-01-14 Hughes Aircraft Company Apparatus and method for extracting edges and lines
US5164994A (en) 1989-12-21 1992-11-17 Hughes Aircraft Company Solder joint locator
US5371690A (en) * 1992-01-17 1994-12-06 Cognex Corporation Method and apparatus for inspection of surface mounted devices
JP3073599B2 (en) * 1992-04-22 2000-08-07 本田技研工業株式会社 Image edge detection device
JP2851023B2 (en) * 1992-06-29 1999-01-27 株式会社鷹山 IC tilt inspection method
EP1383084A3 (en) * 1993-10-27 2004-07-14 Toshiba Engineering Corporation Method and apparatus of inspecting surface irregularity of an object article
JP3794502B2 (en) * 1994-11-29 2006-07-05 ソニー株式会社 Image region extraction method and image region extraction device
US5987172A (en) * 1995-12-06 1999-11-16 Cognex Corp. Edge peak contour tracker
US5754678A (en) * 1996-01-17 1998-05-19 Photon Dynamics, Inc. Substrate inspection apparatus and method
US6408109B1 (en) * 1996-10-07 2002-06-18 Cognex Corporation Apparatus and method for detecting and sub-pixel location of edges in a digital image
US5962926A (en) * 1997-09-30 1999-10-05 Motorola, Inc. Semiconductor device having multiple overlapping rows of bond pads with conductive interconnects and method of pad placement
US6096567A (en) * 1997-12-01 2000-08-01 Electroglas, Inc. Method and apparatus for direct probe sensing
JP3120767B2 (en) * 1998-01-16 2000-12-25 日本電気株式会社 Appearance inspection device, appearance inspection method, and recording medium recording appearance inspection program
US6477275B1 (en) * 1999-06-16 2002-11-05 Coreco Imaging, Inc. Systems and methods for locating a pattern in an image

Also Published As

Publication number Publication date
WO2001097170A3 (en) 2002-03-28
US6459807B1 (en) 2002-10-01
WO2001097170A2 (en) 2001-12-20
US7046837B2 (en) 2006-05-16
US20020191832A1 (en) 2002-12-19

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