AU2001272104A1 - Probe for eddy current testing - Google Patents

Probe for eddy current testing

Info

Publication number
AU2001272104A1
AU2001272104A1 AU2001272104A AU7210401A AU2001272104A1 AU 2001272104 A1 AU2001272104 A1 AU 2001272104A1 AU 2001272104 A AU2001272104 A AU 2001272104A AU 7210401 A AU7210401 A AU 7210401A AU 2001272104 A1 AU2001272104 A1 AU 2001272104A1
Authority
AU
Australia
Prior art keywords
probe
eddy current
current testing
testing
eddy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001272104A
Inventor
Teodor Dogaru
Stuart T. Smith
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU2001272104A1 publication Critical patent/AU2001272104A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
AU2001272104A 2000-03-07 2001-03-06 Probe for eddy current testing Abandoned AU2001272104A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/521,540 US6504363B1 (en) 2000-03-07 2000-03-07 Sensor for eddy current testing and method of use thereof
US09/521540 2000-03-07
PCT/US2001/007044 WO2001067085A1 (en) 2000-03-07 2001-03-06 Probe for eddy current testing

Publications (1)

Publication Number Publication Date
AU2001272104A1 true AU2001272104A1 (en) 2001-09-17

Family

ID=24077141

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001272104A Abandoned AU2001272104A1 (en) 2000-03-07 2001-03-06 Probe for eddy current testing

Country Status (3)

Country Link
US (1) US6504363B1 (en)
AU (1) AU2001272104A1 (en)
WO (1) WO2001067085A1 (en)

Families Citing this family (79)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6822443B1 (en) * 2000-09-11 2004-11-23 Albany Instruments, Inc. Sensors and probes for mapping electromagnetic fields
US20030029345A1 (en) * 1998-03-11 2003-02-13 Tiernan Timothy C. Ultra sensitive magnetic field sensors
US6937967B2 (en) * 2001-02-28 2005-08-30 Tdk Corporation Method and system for finite element modeling and simulation of enhanced magnetoresistance in thin film semiconductors with metallic inclusions
US6888346B2 (en) * 2000-11-28 2005-05-03 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Magnetoresistive flux focusing eddy current flaw detection
CA2361813A1 (en) * 2001-01-29 2002-07-29 Peter O. Paulson Low frequency electromagnetic analysis of prestressed concrete tensioning strands
DE10145657C1 (en) * 2001-03-10 2002-10-10 Automation Hans Nix Gmbh & Co Method for eliminating error effects in using magnetic field sensors for measuring coating thickness involves subtracting voltage measured with no coil current from voltage with defined current
US6911826B2 (en) * 2001-06-12 2005-06-28 General Electric Company Pulsed eddy current sensor probes and inspection methods
US6933718B2 (en) * 2001-06-12 2005-08-23 The Boeing Company Quantification method and system for corrosion and damage assessment
FR2831667B1 (en) * 2001-10-29 2004-04-23 Cegelec SENSOR FOR DETECTING FAULTS IN A WORKPIECE
GB2382957A (en) * 2001-12-10 2003-06-11 Innovision Res & Tech Plc Detectable components and detection apparatus for detecting such components
AU2002352369A1 (en) 2001-12-10 2003-07-09 Innovision Research And Technology Plc Detectable components and detection apparatus for detecting such components
FR2851337B1 (en) * 2003-02-19 2005-07-08 Cegelec FAULT SENSOR COMPRISING A MAGNETORESISTANCE AND AN ELECTRIC POLARIZATION CIRCUIT
US20050007108A1 (en) * 2003-07-11 2005-01-13 Teodor Dogaru Probes and methods for detecting defects in metallic structures
EP1574850A1 (en) * 2004-03-08 2005-09-14 Siemens Aktiengesellschaft Apparatus for non-destructive detection of deep defects in electric conducting materials
US20060038558A1 (en) * 2004-08-20 2006-02-23 The Boeing Company Eddy current inspection device
WO2007002302A2 (en) * 2005-06-28 2007-01-04 Wyle Laboratories, Inc. Magnetoresistive sensor based eddy current crack finder
EP1929319B1 (en) * 2005-09-22 2009-04-22 Koninklijke Philips Electronics N.V. Magnetic sensor device with filtering means
WO2007034358A2 (en) * 2005-09-22 2007-03-29 Koninklijke Philips Electronics N. V. Sensor device with generator and sensor current sources
US7304474B2 (en) * 2005-11-29 2007-12-04 The Boeing Company Eddy current inspection device with arrays of magnetoresistive sensors
JP2007192803A (en) * 2005-12-19 2007-08-02 Ishikawajima Harima Heavy Ind Co Ltd Device and method for evaluating corrosion
EP1991862B1 (en) * 2006-02-24 2013-07-10 Commissariat à l'Énergie Atomique et aux Énergies Alternatives Method and device for non destructive evaluation of defects in a metallic object
EP1996928B1 (en) * 2006-03-10 2018-06-27 Bruker EAS GmbH System and method for the nondestructive testing of elongate bodies and their weldbond joints
US8133439B2 (en) * 2006-08-01 2012-03-13 Magic Technologies, Inc. GMR biosensor with enhanced sensitivity
US7389206B2 (en) * 2006-08-10 2008-06-17 General Electric Company Inspection systems and methods of operation
CN100429515C (en) * 2006-11-01 2008-10-29 浙江大学 Eddy current inspection device based on resistance transducer of gigantic magnetism
US8008908B2 (en) * 2007-06-25 2011-08-30 Allegro Microsystems, Inc. Low power magnetic field sensor
US8044658B2 (en) * 2007-07-30 2011-10-25 Yamaha Corporation Position detector
US7710131B1 (en) * 2007-08-18 2010-05-04 Radiation Monitoring Devices, Inc. Non-contact circuit analyzer
CN101140263B (en) * 2007-09-30 2010-10-13 浙江大学 Electric transverse currents detecting sensor based on strong magnetic resistance and method thereof
EP2056104B1 (en) * 2007-10-29 2017-12-27 General Electric Technology GmbH Method for determining geometrical characteristics of an anomaly in a test object and measuring apparatus for carrying out the method
US7952348B2 (en) * 2007-11-05 2011-05-31 General Electric Company Flexible eddy current array probe and methods of assembling the same
US7888932B2 (en) * 2007-11-05 2011-02-15 General Electric Company Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same
US8222888B2 (en) * 2008-09-29 2012-07-17 Allegro Microsystems, Inc. Micro-power magnetic switch
US8269489B2 (en) * 2008-11-25 2012-09-18 General Electric Company System and method for eddy current inspection of parts with complex geometries
US8240210B2 (en) * 2009-02-18 2012-08-14 General Electric Company Method and system for multimodal inspection with a coordinate measuring device
US8020308B2 (en) * 2009-05-29 2011-09-20 General Electric Company Non-destructive inspection system having self-aligning probe assembly
MX2013004133A (en) * 2010-10-14 2013-05-20 Halliburton Energy Serv Inc Method for measuring remote field eddy current thickness in multiple tubular configuration.
GB201200253D0 (en) * 2012-01-09 2012-02-22 Isis Innovation Monitoring engine components
JP5829930B2 (en) * 2012-01-27 2015-12-09 日立Ｇｅニュークリア・エナジー株式会社 Eddy current flaw detection system and eddy current flaw detection method
JP5861829B2 (en) * 2012-02-20 2016-02-16 株式会社Ihi Eddy current flaw detection method and apparatus
US9817078B2 (en) 2012-05-10 2017-11-14 Allegro Microsystems Llc Methods and apparatus for magnetic sensor having integrated coil
CN103090779B (en) * 2012-12-24 2015-05-13 西安交通大学 Eddy current sensor chip based on resonant structure and manufacture method of eddy current sensor chip
US9784715B2 (en) * 2013-04-19 2017-10-10 Zetec, Inc. Eddy current inspection probe based on magnetoresistive sensors
US9664494B2 (en) 2013-05-10 2017-05-30 Allegro Microsystems, Llc Magnetic field sensor with immunity to external magnetic influences
US10145908B2 (en) 2013-07-19 2018-12-04 Allegro Microsystems, Llc Method and apparatus for magnetic sensor producing a changing magnetic field
US10495699B2 (en) 2013-07-19 2019-12-03 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target
US9274180B2 (en) * 2013-07-29 2016-03-01 Innovative Mion Technology Microfabricated magnetic field transducer with flux guide
CZ304954B6 (en) * 2013-10-25 2015-02-04 České Vysoké Učení Technické V Praze Univerzitní Centrum Energeticky Efektivních Budov Contactless magnetic position sensor of magnetic or electrically conducting objects
CN103675094A (en) * 2013-12-16 2014-03-26 无锡乐尔科技有限公司 Non-destructive testing device
CN103760228A (en) * 2013-12-20 2014-04-30 兰州空间技术物理研究所 Portable nondestructive detection sensor and nondestructive detection system
CN103760226A (en) * 2013-12-20 2014-04-30 兰州空间技术物理研究所 Non-destructive detection method of spacecraft
CN103760224A (en) * 2013-12-20 2014-04-30 兰州空间技术物理研究所 Spacecraft nondestructive detection sensor and nondestructive detection system
CN103760227A (en) * 2013-12-20 2014-04-30 兰州空间技术物理研究所 Nondestructive detection method for deep space detector
US9529060B2 (en) 2014-01-09 2016-12-27 Allegro Microsystems, Llc Magnetoresistance element with improved response to magnetic fields
CN103822967B (en) * 2014-03-18 2016-09-14 江苏理工学院 Double-excitation-coil conductor defect automatic flaw detection device and flaw detection method
DE102014107262A1 (en) 2014-05-22 2015-11-26 Bundesanstalt für Materialforschung und -Prüfung (BAM) Sensor arrangement for eddy current testing of electrically conductive DUTs
US9823092B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor providing a movement detector
JP6763887B2 (en) 2015-06-05 2020-09-30 アレグロ・マイクロシステムズ・エルエルシー Spin valve magnetoresistive sensor with improved response to magnetic field
DE102015115539B4 (en) 2015-09-15 2023-07-06 Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) Test element, test head with a test element and manufacturing method therefor
US10012518B2 (en) 2016-06-08 2018-07-03 Allegro Microsystems, Llc Magnetic field sensor for sensing a proximity of an object
US10620279B2 (en) 2017-05-19 2020-04-14 Allegro Microsystems, Llc Magnetoresistance element with increased operational range
US11022661B2 (en) 2017-05-19 2021-06-01 Allegro Microsystems, Llc Magnetoresistance element with increased operational range
US10310028B2 (en) 2017-05-26 2019-06-04 Allegro Microsystems, Llc Coil actuated pressure sensor
US10996289B2 (en) 2017-05-26 2021-05-04 Allegro Microsystems, Llc Coil actuated position sensor with reflected magnetic field
US10324141B2 (en) 2017-05-26 2019-06-18 Allegro Microsystems, Llc Packages for coil actuated position sensors
US11428755B2 (en) 2017-05-26 2022-08-30 Allegro Microsystems, Llc Coil actuated sensor with sensitivity detection
US10641842B2 (en) 2017-05-26 2020-05-05 Allegro Microsystems, Llc Targets for coil actuated position sensors
US10837943B2 (en) 2017-05-26 2020-11-17 Allegro Microsystems, Llc Magnetic field sensor with error calculation
US10823586B2 (en) 2018-12-26 2020-11-03 Allegro Microsystems, Llc Magnetic field sensor having unequally spaced magnetic field sensing elements
US11061084B2 (en) 2019-03-07 2021-07-13 Allegro Microsystems, Llc Coil actuated pressure sensor and deflectable substrate
US10955306B2 (en) 2019-04-22 2021-03-23 Allegro Microsystems, Llc Coil actuated pressure sensor and deformable substrate
US11237020B2 (en) 2019-11-14 2022-02-01 Allegro Microsystems, Llc Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet
US11280637B2 (en) 2019-11-14 2022-03-22 Allegro Microsystems, Llc High performance magnetic angle sensor
US11262422B2 (en) 2020-05-08 2022-03-01 Allegro Microsystems, Llc Stray-field-immune coil-activated position sensor
CN112683999A (en) * 2020-12-10 2021-04-20 中国人民解放军空军工程大学 Eddy current array sensor based on magnetoresistive element and crack quantitative monitoring method thereof
US11493361B2 (en) 2021-02-26 2022-11-08 Allegro Microsystems, Llc Stray field immune coil-activated sensor
CN113418984A (en) * 2021-08-05 2021-09-21 重庆大学 Become oar bearing high strength steel crack detecting system
US11578997B1 (en) 2021-08-24 2023-02-14 Allegro Microsystems, Llc Angle sensor using eddy currents
US11719771B1 (en) 2022-06-02 2023-08-08 Allegro Microsystems, Llc Magnetoresistive sensor having seed layer hysteresis suppression

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6150809A (en) 1996-09-20 2000-11-21 Tpl, Inc. Giant magnetorestive sensors and sensor arrays for detection and imaging of anomalies in conductive materials

Also Published As

Publication number Publication date
WO2001067085A1 (en) 2001-09-13
US6504363B1 (en) 2003-01-07

Similar Documents

Publication Publication Date Title
AU2001272104A1 (en) Probe for eddy current testing
HK1121526A1 (en) Probe
AU2001247806A1 (en) Endoluminal mri probe
AU4012101A (en) Optical probes an methods for spectral analysis
GB9907643D0 (en) Measuring probe
AU2001283051A1 (en) Notched electrical test probe tip
GB2363854B (en) Non-contact type current measuring instrument
AU2001265356A1 (en) Testing instrument
SG96267A1 (en) Fixture for eddy current inspection probes
AU2001241473A1 (en) Eddy current braking apparatus
SG83791A1 (en) Probe socket for strip testing
AU2002351111A1 (en) Microprocessor-based probe for integrated circuit testing
GB0022447D0 (en) Measurement method
EP1390726A4 (en) Probe for non-destructive testing
AU2001283052A1 (en) Electrical test probe wedge tip
AU3584101A (en) Test apparatus
AU3660099A (en) Eddy current flexible field probe
GB2364777B (en) An improved capacitance measurement probe
GB0029815D0 (en) Voltage measuring apparatus
GB0012992D0 (en) Test method
GB0015310D0 (en) Tester
AU2001276319A1 (en) Measuring probe
EP1372121A4 (en) Measurement instrument
AU2001263857A1 (en) Method for analysing measured gas
GB0031391D0 (en) Pre-donation testing