AU2001268294A1 - Automated determination and display of the physical location of a failed cell inan array of memory cells - Google Patents

Automated determination and display of the physical location of a failed cell inan array of memory cells

Info

Publication number
AU2001268294A1
AU2001268294A1 AU2001268294A AU6829401A AU2001268294A1 AU 2001268294 A1 AU2001268294 A1 AU 2001268294A1 AU 2001268294 A AU2001268294 A AU 2001268294A AU 6829401 A AU6829401 A AU 6829401A AU 2001268294 A1 AU2001268294 A1 AU 2001268294A1
Authority
AU
Australia
Prior art keywords
inan
array
display
memory cells
physical location
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001268294A
Inventor
Suntra Anuntapong
Surasit Phurikhup
Wannee Soiluck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Micro Devices Inc
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Publication of AU2001268294A1 publication Critical patent/AU2001268294A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • User Interface Of Digital Computer (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
AU2001268294A 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell inan array of memory cells Abandoned AU2001268294A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/609,793 US6560729B1 (en) 2000-07-03 2000-07-03 Automated determination and display of the physical location of a failed cell in an array of memory cells
US09609793 2000-07-03
PCT/US2001/018729 WO2002003450A2 (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell in an array of memory cells

Publications (1)

Publication Number Publication Date
AU2001268294A1 true AU2001268294A1 (en) 2002-01-14

Family

ID=24442352

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001268294A Abandoned AU2001268294A1 (en) 2000-07-03 2001-06-08 Automated determination and display of the physical location of a failed cell inan array of memory cells

Country Status (9)

Country Link
US (1) US6560729B1 (en)
EP (1) EP1307912A2 (en)
JP (1) JP4698119B2 (en)
KR (1) KR20030019553A (en)
CN (1) CN1440570A (en)
AU (1) AU2001268294A1 (en)
BR (1) BR0112154A (en)
TW (1) TW494520B (en)
WO (1) WO2002003450A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6842534B1 (en) * 2000-09-28 2005-01-11 Itt Manufacturing Enterprises, Inc. Detecting material failures in ground locations
JP4246979B2 (en) * 2002-09-05 2009-04-02 株式会社日立製作所 Device management system
US6801470B2 (en) * 2002-12-23 2004-10-05 Intel Corporation Digital regulation circuit
US7418367B2 (en) 2003-10-31 2008-08-26 Hewlett-Packard Development Company, L.P. System and method for testing a cell
JP6657797B2 (en) * 2015-10-30 2020-03-04 富士ゼロックス株式会社 Printing system, display control device and program
CN110879931B (en) * 2018-09-05 2022-04-05 长鑫存储技术有限公司 Visual memory chip repair analysis program inspection method and device

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4876685A (en) 1987-06-08 1989-10-24 Teradyne, Inc. Failure information processing in automatic memory tester
JPH04278556A (en) * 1991-03-07 1992-10-05 Nec Corp Visual defect analysis system of lsi
JP3256555B2 (en) * 1991-03-18 2002-02-12 株式会社日立製作所 Semiconductor memory failure analysis system and defective cell display output method
JP3526894B2 (en) * 1993-01-12 2004-05-17 株式会社ルネサステクノロジ Nonvolatile semiconductor memory device
US5943437A (en) * 1995-10-09 1999-08-24 Kabushiki Kaisha Kobe Seiko Sho Method and apparatus for classifying a defect on a semiconductor wafer
US5720031A (en) 1995-12-04 1998-02-17 Micron Technology, Inc. Method and apparatus for testing memory devices and displaying results of such tests
JPH09270200A (en) * 1996-03-29 1997-10-14 Ando Electric Co Ltd Device and method of failure anaysis of memory cell array
JPH10104314A (en) * 1996-09-27 1998-04-24 Ando Electric Co Ltd Wafer defect analyzer
JPH10125092A (en) 1996-10-22 1998-05-15 Advantest Corp Flash memory tester
JPH11238395A (en) 1998-02-20 1999-08-31 Advantest Corp Memory testing device
KR100278926B1 (en) * 1998-05-25 2001-01-15 김영환 Pulley on-chip wafer level burn-in test circuit and its method
US6367042B1 (en) * 1998-12-11 2002-04-02 Lsi Logic Corporation Testing methodology for embedded memories using built-in self repair and identification circuitry
US6294918B1 (en) * 1999-09-23 2001-09-25 Taiwan Semiconductor Manufacturing Company, Ltd Method for locating weak circuit having insufficient driving current in IC chips

Also Published As

Publication number Publication date
EP1307912A2 (en) 2003-05-07
JP2004503041A (en) 2004-01-29
BR0112154A (en) 2003-07-01
WO2002003450A2 (en) 2002-01-10
TW494520B (en) 2002-07-11
JP4698119B2 (en) 2011-06-08
WO2002003450A3 (en) 2002-04-25
CN1440570A (en) 2003-09-03
KR20030019553A (en) 2003-03-06
US6560729B1 (en) 2003-05-06

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