AU2001260308A1 - A circuit for measuring absolute spread in capacitors implemented in planary technology - Google Patents

A circuit for measuring absolute spread in capacitors implemented in planary technology

Info

Publication number
AU2001260308A1
AU2001260308A1 AU2001260308A AU6030801A AU2001260308A1 AU 2001260308 A1 AU2001260308 A1 AU 2001260308A1 AU 2001260308 A AU2001260308 A AU 2001260308A AU 6030801 A AU6030801 A AU 6030801A AU 2001260308 A1 AU2001260308 A1 AU 2001260308A1
Authority
AU
Australia
Prior art keywords
planary
circuit
technology
measuring absolute
capacitors implemented
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001260308A
Inventor
Wolfdietrich Georg Kasperkovitz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Ideas to the Market ItoM BV
Original Assignee
Semiconductor Ideas to the Market ItoM BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Ideas to the Market ItoM BV filed Critical Semiconductor Ideas to the Market ItoM BV
Publication of AU2001260308A1 publication Critical patent/AU2001260308A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
AU2001260308A 2000-05-25 2001-05-16 A circuit for measuring absolute spread in capacitors implemented in planary technology Abandoned AU2001260308A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP00201821 2000-05-25
EP00201821A EP1158303A1 (en) 2000-05-25 2000-05-25 A circuit for measuring absolute spread in capacitors implemented in planary technology
PCT/EP2001/005617 WO2001090765A1 (en) 2000-05-25 2001-05-16 A circuit for measuring absolute spread in capacitors implemented in planary technology

Publications (1)

Publication Number Publication Date
AU2001260308A1 true AU2001260308A1 (en) 2001-12-03

Family

ID=8171533

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001260308A Abandoned AU2001260308A1 (en) 2000-05-25 2001-05-16 A circuit for measuring absolute spread in capacitors implemented in planary technology

Country Status (4)

Country Link
US (1) US6798218B2 (en)
EP (1) EP1158303A1 (en)
AU (1) AU2001260308A1 (en)
WO (1) WO2001090765A1 (en)

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US8085067B1 (en) 2005-12-21 2011-12-27 Cypress Semiconductor Corporation Differential-to-single ended signal converter circuit and method
US7312616B2 (en) 2006-01-20 2007-12-25 Cypress Semiconductor Corporation Successive approximate capacitance measurement circuit
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DE102007042315B3 (en) * 2007-09-06 2009-04-09 Texas Instruments Deutschland Gmbh Measuring circuit with switched capacitor for measuring the capacitance of an input capacitor
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US8866500B2 (en) 2009-03-26 2014-10-21 Cypress Semiconductor Corporation Multi-functional capacitance sensing circuit with a current conveyor
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US5563779A (en) * 1994-12-05 1996-10-08 Motorola, Inc. Method and apparatus for a regulated supply on an integrated circuit

Also Published As

Publication number Publication date
US6798218B2 (en) 2004-09-28
US20040090237A1 (en) 2004-05-13
EP1158303A1 (en) 2001-11-28
WO2001090765A1 (en) 2001-11-29

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