US6820247B1
(en)
*
|
2000-06-14 |
2004-11-16 |
Advanced Micro Devices, Inc. |
Method and apparatus for constructing a global interconnect model of a device having ambiguous submodule abutments
|
US7103863B2
(en)
*
|
2001-06-08 |
2006-09-05 |
Magma Design Automation, Inc. |
Representing the design of a sub-module in a hierarchical integrated circuit design and analysis system
|
US8082138B1
(en)
*
|
2002-04-11 |
2011-12-20 |
Synopsys, Inc. |
Automated bottom-up and top-down partitioned design synthesis
|
US6711730B2
(en)
|
2002-05-13 |
2004-03-23 |
Hewlett-Packard Development Company, L.P. |
Synthesizing signal net information from multiple integrated circuit package models
|
JP4320413B2
(en)
*
|
2002-09-11 |
2009-08-26 |
日本電気株式会社 |
Semiconductor integrated circuit and layout design apparatus
|
US7269817B2
(en)
|
2004-02-10 |
2007-09-11 |
International Business Machines Corporation |
Lithographic process window optimization under complex constraints on edge placement
|
US10215562B2
(en)
*
|
2004-07-16 |
2019-02-26 |
Invention Science Find I, LLC |
Personalized prototyping
|
US7806339B2
(en)
*
|
2004-03-16 |
2010-10-05 |
The Invention Science Fund I, Llc |
Embedded identifiers
|
US20060012081A1
(en)
*
|
2004-07-16 |
2006-01-19 |
Bran Ferren |
Custom prototyping
|
US20060025878A1
(en)
*
|
2004-07-30 |
2006-02-02 |
Bran Ferren |
Interior design using rapid prototyping
|
US20060031044A1
(en)
*
|
2004-08-04 |
2006-02-09 |
Bran Ferren |
Identification of interior design features
|
US20060004476A1
(en)
*
|
2004-07-02 |
2006-01-05 |
Bran Ferren |
System for making custom prototypes
|
US7664563B2
(en)
|
2007-09-14 |
2010-02-16 |
Searete Llc |
System for making custom prototypes
|
US7600208B1
(en)
|
2007-01-31 |
2009-10-06 |
Cadence Design Systems, Inc. |
Automatic placement of decoupling capacitors
|
US8713493B2
(en)
*
|
2007-12-21 |
2014-04-29 |
Cadence Design Systems, Inc. |
System and method for solving connection violations
|
US8103990B2
(en)
*
|
2008-02-28 |
2012-01-24 |
Arm Limited |
Characterising circuit cell performance variability in response to perturbations in manufacturing process parameters
|
US8677278B2
(en)
*
|
2008-08-01 |
2014-03-18 |
Autodesk, Inc. |
Package data format
|
US8316334B2
(en)
*
|
2010-02-04 |
2012-11-20 |
Qualcomm Incorporated |
Segment and bipartite graph based apparatus and method to address hold violations in static timing
|
US8539388B2
(en)
*
|
2010-07-14 |
2013-09-17 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Method and apparatus for low power semiconductor chip layout and low power semiconductor chip
|
US8977863B1
(en)
|
2010-08-30 |
2015-03-10 |
Cadence Design Systems, Inc. |
Methods, systems, and articles of manufacture for dynamic protection of intellectual property in electronic circuit designs
|
US8742464B2
(en)
|
2011-03-03 |
2014-06-03 |
Synopsys, Inc. |
Power routing in standard cells
|
US8612914B2
(en)
|
2011-03-23 |
2013-12-17 |
Synopsys, Inc. |
Pin routing in standard cells
|
US8513978B2
(en)
|
2011-03-30 |
2013-08-20 |
Synopsys, Inc. |
Power routing in standard cell designs
|
US8631374B2
(en)
|
2011-03-30 |
2014-01-14 |
Synopsys, Inc. |
Cell architecture for increasing transistor size
|
US8386982B1
(en)
*
|
2011-06-13 |
2013-02-26 |
Cadence Design Systems, Inc. |
System, method, and computer program product for pin assignment in an electronic design
|
US8719754B1
(en)
|
2011-08-31 |
2014-05-06 |
Cadence Design Systems, Inc. |
System and method to generate re-useable layout components from schematic components in an IC design with hierarchical parameters
|
US8464194B1
(en)
*
|
2011-12-16 |
2013-06-11 |
International Business Machines Corporation |
Machine learning approach to correct lithographic hot-spots
|
US9507909B2
(en)
*
|
2012-10-12 |
2016-11-29 |
The Boeing Company |
System and method for computational planning in a data-dependent constraint management system
|
US8694941B1
(en)
|
2012-06-01 |
2014-04-08 |
Cadence Design Systems, Inc. |
System and method for abutment in the presence of dummy shapes
|
US9830414B2
(en)
*
|
2014-06-16 |
2017-11-28 |
Raytheon Company |
Pattern matching techniques in analog and mixed signal circuits
|
CN113435158B
(en)
*
|
2021-07-14 |
2022-05-24 |
成都华大九天科技有限公司 |
Method for rebuilding parallel substructure of circuit
|