ATE42401T1 - Endflaecheneinschaetzung. - Google Patents
Endflaecheneinschaetzung.Info
- Publication number
- ATE42401T1 ATE42401T1 AT85303782T AT85303782T ATE42401T1 AT E42401 T1 ATE42401 T1 AT E42401T1 AT 85303782 T AT85303782 T AT 85303782T AT 85303782 T AT85303782 T AT 85303782T AT E42401 T1 ATE42401 T1 AT E42401T1
- Authority
- AT
- Austria
- Prior art keywords
- endface
- diffraction pattern
- end surface
- surface assessment
- subtends
- Prior art date
Links
- 238000005259 measurement Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Gyroscopes (AREA)
- Diaphragms For Electromechanical Transducers (AREA)
- Optical Transform (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB848413781A GB8413781D0 (en) | 1984-05-30 | 1984-05-30 | Endface assessment |
| EP85303782A EP0167269B1 (de) | 1984-05-30 | 1985-05-29 | Endflächeneinschätzung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE42401T1 true ATE42401T1 (de) | 1989-05-15 |
Family
ID=10561694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT85303782T ATE42401T1 (de) | 1984-05-30 | 1985-05-29 | Endflaecheneinschaetzung. |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US4620789A (de) |
| EP (1) | EP0167269B1 (de) |
| AT (1) | ATE42401T1 (de) |
| CA (1) | CA1232128A (de) |
| DE (1) | DE3569609D1 (de) |
| GB (1) | GB8413781D0 (de) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114088017A (zh) * | 2021-11-02 | 2022-02-25 | 武汉联胜光电技术有限公司 | 一种定制光纤端面角度和平面度检测装置和检测方法 |
-
1984
- 1984-05-30 GB GB848413781A patent/GB8413781D0/en active Pending
-
1985
- 1985-05-29 AT AT85303782T patent/ATE42401T1/de not_active IP Right Cessation
- 1985-05-29 US US06/738,711 patent/US4620789A/en not_active Ceased
- 1985-05-29 EP EP85303782A patent/EP0167269B1/de not_active Expired
- 1985-05-29 CA CA000482677A patent/CA1232128A/en not_active Expired
- 1985-05-29 DE DE8585303782T patent/DE3569609D1/de not_active Expired
-
1989
- 1989-05-31 US US07/359,876 patent/USRE33460E/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4620789A (en) | 1986-11-04 |
| GB8413781D0 (en) | 1984-07-04 |
| DE3569609D1 (de) | 1989-05-24 |
| USRE33460E (en) | 1990-11-27 |
| EP0167269A1 (de) | 1986-01-08 |
| EP0167269B1 (de) | 1989-04-19 |
| CA1232128A (en) | 1988-02-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification | ||
| REN | Ceased due to non-payment of the annual fee |