ATE178709T1 - Nicht-destruktives kontrollverfahren fur das mechanische verhalten eines objektes unter krafteinwirkung evaluationsverfahren und zugehoriger apparat - Google Patents

Nicht-destruktives kontrollverfahren fur das mechanische verhalten eines objektes unter krafteinwirkung evaluationsverfahren und zugehoriger apparat

Info

Publication number
ATE178709T1
ATE178709T1 AT93921112T AT93921112T ATE178709T1 AT E178709 T1 ATE178709 T1 AT E178709T1 AT 93921112 T AT93921112 T AT 93921112T AT 93921112 T AT93921112 T AT 93921112T AT E178709 T1 ATE178709 T1 AT E178709T1
Authority
AT
Austria
Prior art keywords
wave
mechanical behavior
object under
deformation
associated apparatus
Prior art date
Application number
AT93921112T
Other languages
English (en)
Inventor
Victor Yevgenievich Panin
Lev Borisovich Zuev
Pavel Vasilyevich Makarov
Valery Efimovich Yegorushkin
Vadim Vladimirovich Gorbatenko
Vladimir Ivanovich Danilov
Original Assignee
Kabushikigaisya Hutech
Rossiyskiy Materialovedcheskiy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kabushikigaisya Hutech, Rossiyskiy Materialovedcheskiy filed Critical Kabushikigaisya Hutech
Application granted granted Critical
Publication of ATE178709T1 publication Critical patent/ATE178709T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means
    • G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/06—Indicating or recording means; Sensing means
    • G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647—Image analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT93921112T 1993-01-19 1993-10-05 Nicht-destruktives kontrollverfahren fur das mechanische verhalten eines objektes unter krafteinwirkung evaluationsverfahren und zugehoriger apparat ATE178709T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2377393 1993-01-19

Publications (1)

Publication Number Publication Date
ATE178709T1 true ATE178709T1 (de) 1999-04-15

Family

ID=12119666

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93921112T ATE178709T1 (de) 1993-01-19 1993-10-05 Nicht-destruktives kontrollverfahren fur das mechanische verhalten eines objektes unter krafteinwirkung evaluationsverfahren und zugehoriger apparat

Country Status (7)

Country Link
US (1) US5508801A (de)
EP (1) EP0646770B1 (de)
KR (1) KR100297518B1 (de)
AT (1) ATE178709T1 (de)
AU (1) AU4835093A (de)
DE (1) DE69324360T2 (de)
WO (1) WO1994017362A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5703680A (en) * 1996-01-16 1997-12-30 The Goodyear Tire & Rubber Company Method for dynamic interference pattern testing
US6405600B1 (en) * 1997-04-28 2002-06-18 The United States Of America As Represented By The Secretary Of The Navy Test specimen design incorporating multiple fracture sites and multiple strain state material fractures
DE19721525A1 (de) * 1997-05-22 1998-12-24 Hsm Gmbh Verfahren zur Echtheitsprüfung eines Hologramms und Lesegerät zur Durchführung des Verfahrens
US6188482B1 (en) 1998-09-18 2001-02-13 Board Of Trustees Operating Michigan State University Apparatus for electronic speckle pattern interferometry
US6128082A (en) * 1998-09-18 2000-10-03 Board Of Trustees Operating Michigan State University Technique and apparatus for performing electronic speckle pattern interferometry
DE10028239A1 (de) * 2000-06-07 2001-12-13 Bundesdruckerei Gmbh Vorrichtung zur Auswertung von Echtheitsmerkmalen mit Beugungsstruktur
RU2192621C2 (ru) * 2001-01-09 2002-11-10 Институт физики прочности и материаловедения СО РАН Способ отображения зон локализации деформации поверхности и оптико-телевизионное устройство для его осуществления
DE10113216B4 (de) * 2001-03-18 2005-03-24 Leithner, Reinhard, Prof. Dr.techn. Verfahren zur Messung des Kriechens eines hohlzylindrischen Bauteils bei hoher Temperatur und hohem Innendruck und Verwendung des Verfahrens
WO2005033747A2 (en) * 2003-10-01 2005-04-14 Zetetic Institute Method and apparatus for enhanced resolution of high spatial frequency components of images using standing wave beams in non-interferometric and interferometric microscopy
US7512502B1 (en) 2006-11-28 2009-03-31 Southeastern Louisiana University Method and apparatus for analyzing deformation and predicting failure in solid-state objects
JP5442456B2 (ja) 2007-02-27 2014-03-12 エクソンモービル アップストリーム リサーチ カンパニー 軸方向の大きい塑性歪みに適応する炭素鋼構造およびパイプライン中の耐食合金溶接部
DE102012012861A1 (de) 2012-06-28 2014-01-02 Bilfinger Piping Technologies GmbH Verfahren zur Messung von Dehnungen

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2312435C3 (de) * 1973-03-13 1978-06-08 Opto-Produkte Ag, Zuerich (Schweiz) Holographische Anordnung zur Ermittlung unregelmäßiger Verformungen durch zerstörungsfreie Werkstoffprüfung
US3911733A (en) * 1974-04-01 1975-10-14 Trw Inc Optical signature method and apparatus for structural integrity verification
DE2428992A1 (de) * 1974-06-15 1976-01-02 Metzeler Gummitechnik Verfahren zum zerstoerungsfreien pruefen von elastischen und/oder visco-elastischen bauteilen mittels holografischer interferometrie
US4702594A (en) * 1982-11-15 1987-10-27 Industrial Holographics, Inc. Double exposure interferometric analysis of structures and employing ambient pressure stressing
DE3303876A1 (de) * 1983-02-05 1984-08-09 M.A.N. Maschinenfabrik Augsburg-Nürnberg AG, 8000 München Holografisches differenzverfahren
US4999681A (en) * 1988-06-24 1991-03-12 Mader David L Real-time halographic interferometry with a pulsed laser and flicker-free viewing
JPH0240501A (ja) * 1988-08-01 1990-02-09 Mitsubishi Heavy Ind Ltd レーザスペックル変位計測装置
JPH04186106A (ja) * 1990-11-21 1992-07-02 Kowa Co 光学測定方法および装置

Also Published As

Publication number Publication date
DE69324360D1 (de) 1999-05-12
EP0646770A4 (de) 1997-01-15
EP0646770B1 (de) 1999-04-07
AU4835093A (en) 1994-08-15
KR100297518B1 (ko) 2001-11-22
US5508801A (en) 1996-04-16
WO1994017362A1 (en) 1994-08-04
DE69324360T2 (de) 1999-11-04
EP0646770A1 (de) 1995-04-05

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