ATE114813T1 - Für einmaligen gebrauch bezweckter wegwerfsensor zum nachweis von einschlüssen in geschmolzenem metall. - Google Patents

Für einmaligen gebrauch bezweckter wegwerfsensor zum nachweis von einschlüssen in geschmolzenem metall.

Info

Publication number
ATE114813T1
ATE114813T1 AT90906793T AT90906793T ATE114813T1 AT E114813 T1 ATE114813 T1 AT E114813T1 AT 90906793 T AT90906793 T AT 90906793T AT 90906793 T AT90906793 T AT 90906793T AT E114813 T1 ATE114813 T1 AT E114813T1
Authority
AT
Austria
Prior art keywords
probe
tube
pct
molten metal
interior
Prior art date
Application number
AT90906793T
Other languages
English (en)
Inventor
Roderick I L Guthrie
Hidemasa Nakajima
Original Assignee
Guthrie Res Ass
Sumitomo Metal Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guthrie Res Ass, Sumitomo Metal Ind filed Critical Guthrie Res Ass
Application granted granted Critical
Publication of ATE114813T1 publication Critical patent/ATE114813T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0091—Powders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/202—Constituents thereof
    • G01N33/2022—Non-metallic constituents
    • G01N33/2025—Gaseous constituents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/10—Devices for withdrawing samples in the liquid or fluent state
    • G01N1/12—Dippers; Dredgers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/10—Devices for withdrawing samples in the liquid or fluent state
    • G01N1/12—Dippers; Dredgers
    • G01N1/125—Dippers; Dredgers adapted for sampling molten metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/10—Devices for withdrawing samples in the liquid or fluent state
    • G01N2001/1006—Dispersed solids

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Dispersion Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
AT90906793T 1989-04-27 1990-04-27 Für einmaligen gebrauch bezweckter wegwerfsensor zum nachweis von einschlüssen in geschmolzenem metall. ATE114813T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10887189 1989-04-27

Publications (1)

Publication Number Publication Date
ATE114813T1 true ATE114813T1 (de) 1994-12-15

Family

ID=14495703

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90906793T ATE114813T1 (de) 1989-04-27 1990-04-27 Für einmaligen gebrauch bezweckter wegwerfsensor zum nachweis von einschlüssen in geschmolzenem metall.

Country Status (10)

Country Link
US (1) US5198749A (de)
EP (1) EP0470134B1 (de)
JP (1) JP2591253B2 (de)
KR (1) KR0157222B1 (de)
AT (1) ATE114813T1 (de)
AU (1) AU647388B2 (de)
CA (1) CA2053254C (de)
DE (1) DE69014618T2 (de)
WO (1) WO1990013014A1 (de)
ZA (1) ZA903236B (de)

Families Citing this family (19)

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Publication number Priority date Publication date Assignee Title
US5669956A (en) * 1993-06-11 1997-09-23 Midwest Instrument Co., Inc. Apparatus and method for molten metal depth detection
WO1994029823A1 (en) * 1993-06-11 1994-12-22 Midwest Instrument Co., Inc. Apparatus and method for molten metal depth detection
US5584578A (en) * 1995-02-24 1996-12-17 Heraeus Electro-Nite International N.V. Drop-in immersion probe
US5834928A (en) * 1995-10-04 1998-11-10 Alcan International Limited Method and apparatus for the detection and measurement of solid particles in molten metal
US6679627B1 (en) * 1997-11-04 2004-01-20 Rdc Controle Ltee Self-floating device for measuring the temperature of liquids
US6590200B1 (en) * 1999-04-02 2003-07-08 Worcester Polytechnic Institute Systems for detecting measuring inclusions
US6693443B2 (en) 1999-04-02 2004-02-17 Worcester Polytechnic Institute Systems for detecting and measuring inclusions
US6337564B2 (en) 1999-04-13 2002-01-08 Alcoa Inc. Detecting and classifying hard and soft inclusions in liquid metal
US6959618B1 (en) * 1999-08-06 2005-11-01 Chempaq A/S Particle characterization apparatus
JP4342076B2 (ja) * 2000-03-29 2009-10-14 シスメックス株式会社 粒子測定装置
EP1354188B1 (de) * 2000-09-12 2008-05-28 Heraeus Electro-Nite International N.V. Vorrichtung zur erfassung und messung von teilchen in geschmolzenem metall
DE10161494A1 (de) * 2001-12-14 2003-07-17 Andion Gmbh Sensoreinheit, Messeinheit und Verfahren zu deren Betrieb
US7771658B2 (en) * 2002-06-11 2010-08-10 Chempaq A/S Disposable cartridge for characterizing particles suspended in a liquid
DE60305127T2 (de) * 2002-11-21 2006-11-16 Heraeus Electro-Nite International N.V. Verbesserte Vorrichtung und Verfahren zur Detektierung und Messung von Partikeln in einer Metallschmelze
MXPA06006246A (es) * 2003-12-17 2006-08-23 Heraeus Electro Nite Int Metodo para analisis de un material fundido, dispositivo y sensor de inmersion.
US8028566B2 (en) * 2005-02-10 2011-10-04 Chempaq A/S Dual sample cartridge and method for characterizing particles in liquid
EP1891413B1 (de) 2005-02-10 2018-01-24 Koninklijke Philips N.V. Doppelprobenkassette und verfahren zur charakterisierung von partikeln in flüssigkeit
AU2011245743C1 (en) 2010-04-30 2015-04-23 Refractory Intellectual Property Gmbh & Co. Kg Measurements in metallurgical vessels
US9958427B2 (en) * 2015-01-21 2018-05-01 Heraeus Electro-Nite International N.V. Reverse filling carbon and temperature drop-in sensor

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259841A (en) * 1963-05-15 1966-07-05 Electric Engineering Company O Negative-feedback transistorized electrical continuity tester
US3395343A (en) * 1964-07-21 1968-07-30 Coulter Electronics Electronic particle study apparatus and vessel construction therefor
US3963984A (en) * 1974-11-04 1976-06-15 Coulter Electronics, Inc. Method and system for cleaning an aperture in a particle study device
JPS568527A (en) * 1979-07-02 1981-01-28 Toa Medical Electronics Co Ltd Particle analyzing device
JPS5619006U (de) * 1979-07-23 1981-02-19
CH625670B (de) * 1980-01-10 Suisse Horlogerie Oszillator mit digitaler temperaturkompensation.
CH626500B (de) * 1980-01-10 Suisse Horlogerie Oszillator mit digitaler temperaturkompensation.
JPS56107541A (en) * 1980-01-30 1981-08-26 Mitsubishi Electric Corp Electromagnetic induction equipment
DE3133182C1 (de) * 1981-08-19 1983-01-13 Mannesmann AG, 4000 Düsseldorf Einrichtung zur Ermittlung des Metallbadspiegels in Schlacke-Metall-Baedern
JPS58156262U (ja) * 1982-04-14 1983-10-19 日立化成工業株式会社 消耗型プロ−ブ
US4555662A (en) * 1983-03-03 1985-11-26 Limca Research Inc. Method and apparatus for the detection and measurement of particulates in molten metal
US4600880A (en) * 1983-03-03 1986-07-15 Limca Research Inc. Apparatus for the detection and measurement of particulates in molten metal
GB8414856D0 (en) * 1984-06-11 1984-07-18 Alcan Int Ltd Detection and measurement of suspended particles in molten metal
CS259738B1 (en) * 1986-04-30 1988-10-14 Rudolf Hendrich Dipping probe for single temperature measuring
BR9007333A (pt) * 1989-04-27 1992-04-21 Guthrie Res Ass Sensor de inclusao de metal fundido

Also Published As

Publication number Publication date
DE69014618D1 (de) 1995-01-12
EP0470134B1 (de) 1994-11-30
KR0157222B1 (ko) 1999-03-30
EP0470134A1 (de) 1992-02-12
CA2053254C (en) 2001-03-20
JP2591253B2 (ja) 1997-03-19
JPH0348145A (ja) 1991-03-01
ZA903236B (en) 1991-04-24
KR920701810A (ko) 1992-08-12
CA2053254A1 (en) 1990-10-28
WO1990013014A1 (en) 1990-11-01
AU5548590A (en) 1990-11-16
DE69014618T2 (de) 1995-04-13
US5198749A (en) 1993-03-30
AU647388B2 (en) 1994-03-24

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee