ATA65289A - INTERFEROMETER ARRANGEMENT, ESPECIALLY FOR DISTANCE OR DETERMINATION OF A MOVING COMPONENT - Google Patents

INTERFEROMETER ARRANGEMENT, ESPECIALLY FOR DISTANCE OR DETERMINATION OF A MOVING COMPONENT

Info

Publication number
ATA65289A
ATA65289A AT65289A AT65289A ATA65289A AT A65289 A ATA65289 A AT A65289A AT 65289 A AT65289 A AT 65289A AT 65289 A AT65289 A AT 65289A AT A65289 A ATA65289 A AT A65289A
Authority
AT
Austria
Prior art keywords
determination
distance
moving component
interferometer arrangement
interferometer
Prior art date
Application number
AT65289A
Other languages
German (de)
Other versions
AT392537B (en
Original Assignee
Tabarelli Werner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tabarelli Werner filed Critical Tabarelli Werner
Priority to AT65289A priority Critical patent/AT392537B/en
Priority to JP50454490A priority patent/JPH03504768A/en
Priority to EP19900904355 priority patent/EP0422143A1/en
Priority to PCT/EP1990/000423 priority patent/WO1990011484A1/en
Publication of ATA65289A publication Critical patent/ATA65289A/en
Application granted granted Critical
Publication of AT392537B publication Critical patent/AT392537B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02049—Interferometers characterised by particular mechanical design details
    • G01B9/02051—Integrated design, e.g. on-chip or monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
AT65289A 1989-03-21 1989-03-21 INTERFEROMETER ARRANGEMENT, ESPECIALLY FOR DISTANCE OR DETERMINATION OF A MOVING COMPONENT AT392537B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
AT65289A AT392537B (en) 1989-03-21 1989-03-21 INTERFEROMETER ARRANGEMENT, ESPECIALLY FOR DISTANCE OR DETERMINATION OF A MOVING COMPONENT
JP50454490A JPH03504768A (en) 1989-03-21 1990-03-15 Interferometer system for measuring distance and shift movements, especially of moving components
EP19900904355 EP0422143A1 (en) 1989-03-21 1990-03-15 Interferometer arrangement in particular for determinig the distance or the displacement path of a mobile component
PCT/EP1990/000423 WO1990011484A1 (en) 1989-03-21 1990-03-15 Interferometer arrangement for determining the distance or the displacement path of a mobile component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT65289A AT392537B (en) 1989-03-21 1989-03-21 INTERFEROMETER ARRANGEMENT, ESPECIALLY FOR DISTANCE OR DETERMINATION OF A MOVING COMPONENT

Publications (2)

Publication Number Publication Date
ATA65289A true ATA65289A (en) 1990-09-15
AT392537B AT392537B (en) 1991-04-25

Family

ID=3496240

Family Applications (1)

Application Number Title Priority Date Filing Date
AT65289A AT392537B (en) 1989-03-21 1989-03-21 INTERFEROMETER ARRANGEMENT, ESPECIALLY FOR DISTANCE OR DETERMINATION OF A MOVING COMPONENT

Country Status (4)

Country Link
EP (1) EP0422143A1 (en)
JP (1) JPH03504768A (en)
AT (1) AT392537B (en)
WO (1) WO1990011484A1 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0526547B1 (en) * 1990-04-23 1995-12-13 Commonwealth Scientific And Industrial Research Organisation Interferometry system and method
CA2090682A1 (en) * 1990-08-31 1992-03-01 Timothy Peter Dabbs Interference microscope
FR2676808B1 (en) * 1991-05-21 1993-08-13 Commissariat Energie Atomique DEVICE FOR MEASURING A CHARACTERISTIC OF AN OBJECT IN INTEGRATED OPTICS, BY INTERFEROMETRY.
US5291267A (en) * 1992-01-22 1994-03-01 Hewlett-Packard Company Optical low-coherence reflectometry using optical amplification
FR2696546B1 (en) * 1992-10-06 1994-12-30 Suisse Electronique Microtech Interferometer comprising an integrated assembly and a mirror separated from each other by a measurement region.
FR2696545B1 (en) * 1992-10-06 1994-12-30 Suisse Electronique Microtech Interferometer comprising an integrated assembly and a reflecting unit separated from each other by a measurement region.
FR2699269B1 (en) * 1992-12-10 1995-01-13 Merlin Gerin Interferrometric measurement device.
DE102011005937B4 (en) * 2011-03-23 2020-10-22 Dr. Johannes Heidenhain Gmbh Device for interferential distance measurement
DE102013209833A1 (en) * 2013-05-27 2014-11-27 Polytec Gmbh Optical interferometer and vibrometer with such an optical interferometer
JP6204272B2 (en) * 2014-06-05 2017-09-27 日本電信電話株式会社 Distance measuring device
EP3415874A1 (en) * 2017-06-14 2018-12-19 IMEC vzw A sensing device, a sensing system and a method for sensing an external influence
EP3415887B1 (en) 2017-06-14 2020-03-18 IMEC vzw A force sensing device and a force sensing system
CN115039022A (en) * 2019-12-11 2022-09-09 洛克利光子有限公司 Frequency shifter for heterodyne interferometry and device for heterodyne interferometry having such a frequency shifter

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4609290A (en) * 1983-06-06 1986-09-02 Mcdonnell Douglas Corporation Passive homodyne demodulator and sensor system
US4522495A (en) * 1983-06-13 1985-06-11 The United States Of America As Represented By The Secretary Of The Navy Optical sensing devices
SE447601B (en) * 1985-04-04 1986-11-24 Ericsson Telefon Ab L M FIBEROPTIC INTERFEROMETER
GB2182223A (en) * 1985-10-23 1987-05-07 Stc Plc Optical fibre reflectometer
DE3616393C1 (en) * 1986-05-15 1987-07-02 Daimler Benz Ag Two-frequency laser interferometer
JPS6412204A (en) * 1987-07-07 1989-01-17 Topcon Corp Optical ic interferometer
CH678109A5 (en) * 1988-06-13 1991-07-31 Althis Ag
DE3918812A1 (en) * 1988-06-13 1989-12-28 Kerner Anna Distance-measuring heterodyne interferometer

Also Published As

Publication number Publication date
WO1990011484A1 (en) 1990-10-04
JPH03504768A (en) 1991-10-17
EP0422143A1 (en) 1991-04-17
AT392537B (en) 1991-04-25

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties
ELJ Ceased due to non-payment of the annual fee