AT317573B - Längenmeßgerät - Google Patents

Längenmeßgerät

Info

Publication number
AT317573B
AT317573B AT793270A AT793270A AT317573B AT 317573 B AT317573 B AT 317573B AT 793270 A AT793270 A AT 793270A AT 793270 A AT793270 A AT 793270A AT 317573 B AT317573 B AT 317573B
Authority
AT
Austria
Prior art keywords
measuring device
length measuring
length
measuring
Prior art date
Application number
AT793270A
Other languages
English (en)
Original Assignee
Johann Meier Ing
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johann Meier Ing filed Critical Johann Meier Ing
Application granted granted Critical
Publication of AT317573B publication Critical patent/AT317573B/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0566—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction analysing diffraction pattern

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AT793270A 1970-06-04 1970-09-01 Längenmeßgerät AT317573B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH835770A CH509567A (de) 1970-06-04 1970-06-04 Längenmessgerät zur Bestimmung des Abstandes von auf einem durchsichtigen Aufzeichnungsträger befindlichen Markierungen längs einer Geraden

Publications (1)

Publication Number Publication Date
AT317573B true AT317573B (de) 1974-09-10

Family

ID=4339086

Family Applications (1)

Application Number Title Priority Date Filing Date
AT793270A AT317573B (de) 1970-06-04 1970-09-01 Längenmeßgerät

Country Status (3)

Country Link
AT (1) AT317573B (de)
CH (1) CH509567A (de)
DE (1) DE2127627A1 (de)

Also Published As

Publication number Publication date
CH509567A (de) 1971-06-30
DE2127627A1 (de) 1972-01-27

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Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee