AT280628B - Method for measuring the thickness of materials and device for carrying out the method - Google Patents

Method for measuring the thickness of materials and device for carrying out the method

Info

Publication number
AT280628B
AT280628B AT133166A AT133166A AT280628B AT 280628 B AT280628 B AT 280628B AT 133166 A AT133166 A AT 133166A AT 133166 A AT133166 A AT 133166A AT 280628 B AT280628 B AT 280628B
Authority
AT
Austria
Prior art keywords
measuring
carrying
thickness
materials
Prior art date
Application number
AT133166A
Other languages
German (de)
Original Assignee
Ceskoslovenske Zd Y Gumarenske
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ceskoslovenske Zd Y Gumarenske filed Critical Ceskoslovenske Zd Y Gumarenske
Application granted granted Critical
Publication of AT280628B publication Critical patent/AT280628B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
AT133166A 1965-06-19 1966-02-14 Method for measuring the thickness of materials and device for carrying out the method AT280628B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS397065 1965-06-19

Publications (1)

Publication Number Publication Date
AT280628B true AT280628B (en) 1970-04-27

Family

ID=5381302

Family Applications (1)

Application Number Title Priority Date Filing Date
AT133166A AT280628B (en) 1965-06-19 1966-02-14 Method for measuring the thickness of materials and device for carrying out the method

Country Status (3)

Country Link
AT (1) AT280628B (en)
DE (1) DE1548188A1 (en)
GB (1) GB1111103A (en)

Also Published As

Publication number Publication date
DE1548188A1 (en) 1969-08-21
GB1111103A (en) 1968-04-24

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Legal Events

Date Code Title Description
ELJ Ceased due to non-payment of the annual fee