AT266993B - Einrichtung zur Auswahl von Transistorpaaren - Google Patents

Einrichtung zur Auswahl von Transistorpaaren

Info

Publication number
AT266993B
AT266993B AT396365A AT396365A AT266993B AT 266993 B AT266993 B AT 266993B AT 396365 A AT396365 A AT 396365A AT 396365 A AT396365 A AT 396365A AT 266993 B AT266993 B AT 266993B
Authority
AT
Austria
Prior art keywords
selection
transistor pairs
transistor
pairs
Prior art date
Application number
AT396365A
Other languages
English (en)
Inventor
Ferenc Gajer
Erika Lazar
Original Assignee
Egyesuelt Izzolampa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Egyesuelt Izzolampa filed Critical Egyesuelt Izzolampa
Application granted granted Critical
Publication of AT266993B publication Critical patent/AT266993B/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
AT396365A 1964-05-04 1965-04-30 Einrichtung zur Auswahl von Transistorpaaren AT266993B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HUEE001092 1964-05-04

Publications (1)

Publication Number Publication Date
AT266993B true AT266993B (de) 1968-12-10

Family

ID=10995170

Family Applications (1)

Application Number Title Priority Date Filing Date
AT396365A AT266993B (de) 1964-05-04 1965-04-30 Einrichtung zur Auswahl von Transistorpaaren

Country Status (1)

Country Link
AT (1) AT266993B (de)

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