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Publication date
Application filed by Jack HuengerlefiledCriticalJack Huengerle
Application grantedgrantedCritical
Publication of AT182237BpublicationCriticalpatent/AT182237B/en
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
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Physics & Mathematics
(AREA)
General Physics & Mathematics
(AREA)
AT182237D1951-10-301951-10-30
Measuring device for length measurements
AT182237B
(en)