JP2001261941A - Tablet and semiconductor device - Google Patents

Tablet and semiconductor device

Info

Publication number
JP2001261941A
JP2001261941A JP2000070268A JP2000070268A JP2001261941A JP 2001261941 A JP2001261941 A JP 2001261941A JP 2000070268 A JP2000070268 A JP 2000070268A JP 2000070268 A JP2000070268 A JP 2000070268A JP 2001261941 A JP2001261941 A JP 2001261941A
Authority
JP
Japan
Prior art keywords
resin composition
tablet
resin
carbon black
epoxy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000070268A
Other languages
Japanese (ja)
Inventor
Shigehisa Ueda
茂久 上田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Bakelite Co Ltd
Original Assignee
Sumitomo Bakelite Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co Ltd filed Critical Sumitomo Bakelite Co Ltd
Priority to JP2000070268A priority Critical patent/JP2001261941A/en
Publication of JP2001261941A publication Critical patent/JP2001261941A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a tablet capable of reducing the formation of leek defect, and excellent in properties to be stamped by YAG laser. SOLUTION: This tablet for sealing a semiconductor is characterized in that a resin composition (I) comprising (A) an epoxy resin, (B) a phenol resin, (C) a curing accelerator, (D) a fused silica powder and (E) a carbon black, and a resin composition (II) not containing (A) the epoxy resin, (B) the phenol resin, (C) the curing accelerator, (D) the fused silica powder and (E) the carbon black are present in the same tablet.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、配線間やボンディ
ングワイヤー間、ボンディングパッド間のリーク不良が
少なく、YAGレーザー捺印性に優れた半導体封止用タ
ブレット及びそれによって封止された半導体装置に関す
るものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tablet for semiconductor encapsulation which has less leakage defects between wirings, bonding wires, and bonding pads and has excellent YAG laser printing properties, and a semiconductor device sealed thereby. It is.

【0002】[0002]

【従来の技術】IC本体を機械的、化学的作用から保護
するために、エポキシ樹脂、フェノール樹脂、硬化促進
剤、溶融シリカ粉末、着色剤としてのカーボンブラック
等からなるエポキシ樹脂組成物が開発、生産されてき
た。この樹脂組成物に要求される項目は、ICチップの
種類、封止されるパッケージの構造、使用される環境等
によって変化しつつあるが、最近多ピン化、半導体素子
の集積度向上によりボンディングパッド間の距離が狭く
なっており、狭ピッチ対応が必要となってきている。と
ころが着色剤として配合されているカーボンブラック
は、粒子径が非常に小さいが凝集し易く導電性があるた
め、パッドの狭ピッチ化に伴いリーク不良の原因と考え
られている。この問題を解決するために、カーボンブラ
ックの凝集の低減量や添加量の低減等が検討されている
が、カーボンブラックの凝集の低減には限界があり、又
添加量を低減すれば捺印性が低下する問題がある。更に
カーボンブラックの代替の着色剤が検討されているが、
樹脂組成物の硬化性に影響を及ぼしたり、あるいは捺印
性の悪化等もあり、実用化には至っていない。
2. Description of the Related Art In order to protect an IC body from mechanical and chemical actions, an epoxy resin composition comprising an epoxy resin, a phenol resin, a curing accelerator, a fused silica powder, and a carbon black as a coloring agent has been developed. Has been produced. Items required for this resin composition are changing according to the type of IC chip, the structure of the package to be sealed, the environment in which it is used, and the like. The distance between them is becoming narrower, and it is necessary to cope with a narrow pitch. However, carbon black compounded as a colorant has a very small particle diameter but is easily aggregated and has electrical conductivity, and is considered to be a cause of leak failure due to the narrow pitch of the pads. In order to solve this problem, reductions in the amount of carbon black agglomeration and the amount of carbon black added have been studied. However, there is a limit to reducing the amount of carbon black agglomeration. There is a problem of decline. Further alternative colorants for carbon black are being studied,
There is an effect on the curability of the resin composition or deterioration of the printability, and the resin composition has not been put to practical use.

【0003】[0003]

【発明が解決しようとする課題】本発明は、これらの問
題を解決するために種々の検討の結果、カーボンブラッ
クを含む樹脂組成物とカーボンブラックを含まない樹脂
組成物とが同一のタブレット中にある存在するタブレッ
トを用いて、半導体素子を封止して得られる半導体装置
が、YAGレーザー捺印性を維持し、リーク不良を改善
できることを見出しなされたものである。
According to the present invention, as a result of various studies to solve these problems, a resin composition containing carbon black and a resin composition containing no carbon black are contained in the same tablet. It has been found that a semiconductor device obtained by encapsulating a semiconductor element using a certain existing tablet can maintain YAG laser printability and improve leakage defects.

【0004】[0004]

【課題を解決するための手段】本発明は、(A)エポキ
シ樹脂、(B)フェノール樹脂、(C)硬化促進剤、
(D)溶融シリカ粉末、及び(E)カーボンブラックを
含む樹脂組成物(I)と、(A)エポキシ樹脂、(B)
フェノール樹脂、(C)硬化促進剤、(D)溶融シリカ
粉末、(E)カーボンブラックを含まない樹脂組成物
(II)とが同一のタブレット中にあることを特徴とする
半導体封止用タブレットで、特に樹脂組成物(I)の軟
化点が、樹脂組成物(II)の軟化点よりも10℃低い樹
脂組成物及びこのタブレットの硬化物で半導体素子が封
止されてなることを特徴とする半導体装置である。
The present invention provides (A) an epoxy resin, (B) a phenolic resin, (C) a curing accelerator,
(D) a resin composition (I) containing fused silica powder and (E) carbon black, (A) an epoxy resin, and (B)
A tablet for semiconductor encapsulation wherein the phenolic resin, (C) a curing accelerator, (D) fused silica powder, and (E) a resin composition containing no carbon black (II) are in the same tablet. In particular, the semiconductor element is sealed with a resin composition in which the softening point of the resin composition (I) is lower by 10 ° C. than the softening point of the resin composition (II) and a cured product of the tablet. It is a semiconductor device.

【0005】[0005]

【発明の実施の形態】以下に本発明を詳細に説明する。
本発明に用いられるエポキシ樹脂は、1分子中にエポキ
シ基を2個以上有するモノマー、オリゴマー、ポリマー
全般を言い、例えばビフェニル型エポキシ樹脂、ビスフ
ェノール型エポキシ樹脂、フェノールノボラック型エポ
キシ樹脂、クレゾールノボラック型エポキシ樹脂、トリ
フェノールメタン型エポキシ樹脂、ジシクロペンタジエ
ン変性エポキシ樹脂等が挙げられ、これらは単独でも混
合しても差し支えない。本発明に用いられるフェノール
樹脂は、フェノールノボラック樹脂、キシリレン変性フ
ェノール樹脂、テルペン変性フェノール樹脂、トリフェ
ノールメタン型樹脂等が挙げられ、、これらは単独でも
混合しても差し支えない。これらフェノール樹脂の配合
量は、エポキシ樹脂のエポキシ基数とフェノール樹脂の
水酸基数の比が0.8〜1.2が好ましい。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail.
The epoxy resin used in the present invention refers to all monomers, oligomers and polymers having two or more epoxy groups in one molecule, such as biphenyl epoxy resin, bisphenol epoxy resin, phenol novolak epoxy resin, and cresol novolak epoxy. Resins, triphenolmethane-type epoxy resins, dicyclopentadiene-modified epoxy resins, and the like, may be used alone or in combination. Examples of the phenol resin used in the present invention include a phenol novolak resin, a xylylene-modified phenol resin, a terpene-modified phenol resin, and a triphenolmethane-type resin. These may be used alone or in combination. The ratio of the number of epoxy groups in the epoxy resin to the number of hydroxyl groups in the phenol resin is preferably 0.8 to 1.2.

【0006】本発明に用いられる硬化促進剤は、エポキ
シ基と水酸基との硬化反応を促進させるものであれば良
く、一般に封止材料に使用されているものを広く使用す
ることができる。例えば、1,8−ジアザビシクロ
(5,4,0)ウンデセン−7、トリフェニルホスフィ
ンや2−メチルイミダゾール等が挙げられ、単独でも混
合しても差し支えない。無機充填材としては、溶融シリ
カ粉末、結晶シリカ、アルミナ、窒化珪素等が挙げられ
るが、信頼性や膨張係数のバランスから溶融シリカ粉末
が良い。配合量としては、成形性と信頼性のバランスか
ら全エポキシ樹脂組成物中に60〜93重量%含有する
ことが好ましい。
The curing accelerator used in the present invention may be any one that promotes the curing reaction between an epoxy group and a hydroxyl group, and those generally used for a sealing material can be widely used. For example, 1,8-diazabicyclo (5,4,0) undecene-7, triphenylphosphine, 2-methylimidazole and the like can be mentioned, and they may be used alone or in combination. Examples of the inorganic filler include fused silica powder, crystalline silica, alumina, silicon nitride and the like, and the fused silica powder is preferred from the viewpoint of reliability and expansion coefficient. The compounding amount is preferably 60 to 93% by weight in the total epoxy resin composition in view of the balance between moldability and reliability.

【0007】本発明に用いられる着色剤としてのカーボ
ンブラックの一次粒子としては、5〜100nm、二次
粒子が0.1〜30μmのものが好ましい。カーボンブ
ラックの添加量は、全樹脂組成物(I)中に0.2〜1
重量%が好ましい。樹脂組成物(II)には、カーボンブ
ラックは配合されていないが、導電特性を有さないアゾ
染料等の黒色染料を配合してもよい。本発明では、成形
時の流動挙動を制御することにより、成形して得られた
半導体装置の表面と内部に異なった樹脂組成物が充填さ
れことにあり、カーボンブラックを含む樹脂組成物
(I)が、先にパッケージへ充填され、充填完了時には
樹脂組成物(I)が半導体装置の表面を、樹脂組成物(I
I)が半導体素子の周辺を構成する必要がある。このた
めタブレットとしては、図1に示すようなタブレットの
2重構造、図2に示すようなタブレットの2段構造等が
例示されるが、本発明においてはカーボンブラックを含
む樹脂組成物(I)が、先にパッケージへ充填され、充
填完了時には樹脂組成物(I)が半導体装置の表面を、
遅れて充填される樹脂組成物(II)が半導体素子の周辺
を構成するようなタブレットならば、特に限定するもの
ではない。図1に示す2重構造のタブレットでは、カー
ボンブラックを含む樹脂組成物(I)を外側に、図2に
示す2段構造では、カーボンブラックを含む樹脂組成物
(I)が成形機のランナー側(プランジャーの逆側)に
存在することが必要である。更にカーボンブラックを含
む樹脂組成物(I)の軟化点が、カーボンブラックを含
まない樹脂組成物(II)の軟化点より10℃以上低いこ
とが望ましい。10℃以上の差により、低軟化点の樹脂
組成物が素早く溶融、流動し、よりパッケージ表面を均
一に覆い、配線間やボンディングワイヤー間、ボンディ
ングパッド間のリーク不良が少なく、YAGレーザー捺
印性に優れた半導体装置を得ることができる。軟化点の
差が10℃未満では、金型内での溶融時間の差が短いた
め、得られた半導体装置表面のカーボンブラックを含む
層の均一性に欠けるおそれがある。
The primary particles of carbon black as a colorant used in the present invention preferably have a diameter of 5 to 100 nm and secondary particles of 0.1 to 30 μm. The amount of carbon black added is 0.2 to 1 in the total resin composition (I).
% By weight is preferred. The resin composition (II) does not contain carbon black, but may contain a black dye such as an azo dye having no conductive properties. In the present invention, by controlling the flow behavior at the time of molding, the surface and the inside of the semiconductor device obtained by molding are filled with different resin compositions, and the resin composition containing carbon black (I) Is filled in the package first, and when the filling is completed, the resin composition (I) rubs the surface of the semiconductor device with the resin composition (I
I) needs to constitute the periphery of the semiconductor element. Accordingly, examples of the tablet include a tablet double structure as shown in FIG. 1 and a tablet two-stage structure as shown in FIG. 2. In the present invention, the resin composition (I) containing carbon black is used. Is filled in the package first, and when the filling is completed, the resin composition (I)
There is no particular limitation as long as the resin composition (II) to be charged late is a tablet constituting the periphery of the semiconductor element. In the double structure tablet shown in FIG. 1, the resin composition (I) containing carbon black is placed on the outside, and in the two-stage structure shown in FIG. 2, the resin composition (I) containing carbon black is placed on the runner side of the molding machine. (Opposite the plunger). Further, it is desirable that the softening point of the resin composition (I) containing carbon black is lower by at least 10 ° C. than the softening point of the resin composition (II) not containing carbon black. Due to the difference of 10 ° C or more, the resin composition with a low softening point melts and flows quickly, more evenly covers the package surface, and has less leakage failure between wiring, bonding wires, and bonding pads. An excellent semiconductor device can be obtained. If the difference in the softening points is less than 10 ° C., the difference in the melting time in the mold is short, and the resulting carbon black-containing layer on the surface of the semiconductor device may lack uniformity.

【0008】本発明のタブレットに用いられる樹脂組成
物(I)と樹脂組成物(II)には、必要に応じて臭素化
エポキシ樹脂、三酸化アンチモン等の難燃剤、カップリ
ング剤、天然ワックス及び合成ワックス等の離型剤、シ
リコーンオイル、ゴム等の低応力成分を適宜配合しても
よい。樹脂組成物とするには各成分を混合後、加熱ニー
ダや熱ロールにより加熱混練し、続いて冷却、粉砕する
ことで目的とする樹脂組成物が得られる。図1の二重構
造タブレットは、樹脂組成物(II)を目的とするタブレ
ット径、高さより小さいサイズで打錠し、このタブレッ
トを所定のタブレット径の金型内に樹脂組成物(I)の
粉末を一緒に入れて打錠し作成する。図2のタブレット
は樹脂組成物(I)を所定量投入し、その上から樹脂組
成物(II)を投入し加圧打錠をにより作成する。本発明
のタブレットを用いて、半導体等の電子部品を封止し、
半導体装置を製造するには、トランスファーモールドの
成形方法が良く、特にマルチポットプランジャータイプ
が好ましい。
The resin composition (I) and the resin composition (II) used in the tablet of the present invention may contain, if necessary, a brominated epoxy resin, a flame retardant such as antimony trioxide, a coupling agent, a natural wax, A release agent such as a synthetic wax or a low-stress component such as silicone oil or rubber may be appropriately blended. In order to obtain a resin composition, the components are mixed, heated and kneaded with a heating kneader or a hot roll, and then cooled and pulverized to obtain a desired resin composition. The tablet having the dual structure shown in FIG. 1 is formed by tableting the resin composition (II) into a tablet having a size smaller than the target tablet diameter and height, and placing the tablet in a mold having a predetermined tablet diameter. The powder is put together and compressed to make a tablet. The tablet of FIG. 2 is prepared by charging a predetermined amount of the resin composition (I), then charging the resin composition (II) from above, and performing pressure tableting. Using the tablet of the present invention, electronic components such as semiconductors are sealed,
To manufacture a semiconductor device, a transfer molding method is preferable, and a multi-pot plunger type is particularly preferable.

【0009】[0009]

【実施例】以下、本発明を実施例で具体的に説明する。 《実施例1》 樹脂組成物(I) 樹脂組成物(II ) ・ビフェニル型エポキシ樹脂 12.3重量部 12.3重量部 ・フェノールノボラック樹脂 6.6重量部 6.6重量部 ・トリフェニルホスフィン 0.3重量部 0.3重量部 ・球状溶融シリカ 80.0重量部 80.3重量部 ・カルナバワックス 0.5重量部 0.5重量部 ・カーボンブラック 0.3重量部 ビフェニル型エポキシ樹脂は、油化シェルエポキシ(株)
製、YX−4000H、融点105℃、エポキシ当量1
95。フェノールノボラック樹脂は、軟化点80℃、水
酸基当量105。カーボンブラックは、一次粒子10n
m。上記の全成分をミキサーにより混合した後、表面温
度が90℃と45℃の2本ロールを用いて30回混練
し、得られた混練物シートを冷却後粉砕して、樹脂組成
物(I)(以下、組成物Aという)と樹脂組成物(II)
(以下、組成物Bという)とした。得られた2種類の樹
脂組成物を前記した図1の構成のタブレットに打錠し
た。樹脂組成物の軟化点、YAGレーザー捺印性、パッ
ケージ外観、リーク不良率について、以下の方法で評価
をした。評価結果を表1に示す。
The present invention will be specifically described below with reference to examples. << Example 1 >> Resin composition (I) Resin composition (II)-Biphenyl type epoxy resin 12.3 parts by weight 12.3 parts by weight-Phenol novolak resin 6.6 parts by weight 6.6 parts by weight-Triphenylphosphine 0.3 parts by weight 0.3 parts by weight ・ Spherical fused silica 80.0 parts by weight 80.3 parts by weight ・ Carnauba wax 0.5 parts by weight 0.5 parts by weight ・ Carbon black 0.3 parts by weight Biphenyl type epoxy resin , Yuka Shell Epoxy Co., Ltd.
YX-4000H, melting point 105 ° C, epoxy equivalent 1
95. Phenol novolak resin has a softening point of 80 ° C. and a hydroxyl equivalent of 105. Carbon black is 10n primary particles
m. After mixing all the above components with a mixer, the mixture was kneaded 30 times using two rolls having a surface temperature of 90 ° C. and 45 ° C., and the resulting kneaded material sheet was cooled and pulverized to obtain a resin composition (I). (Hereinafter referred to as composition A) and resin composition (II)
(Hereinafter, referred to as composition B). The obtained two types of resin compositions were tableted into tablets having the above-described structure shown in FIG. The following methods were used to evaluate the softening point, YAG laser printability, package appearance, and leak rate of the resin composition. Table 1 shows the evaluation results.

【0010】《評価方法》 YAGレーザー捺印性:14×20×2.7mm80p
QFPをマルチポットプランジャー金型で成形し、マス
クタイプのYAGレーザー捺印機にて評価した。 樹脂組成物の軟化点:混練後の(粉砕する前)シート状
樹脂組成物に3点曲げ測定機で荷重が、500gになる
ように歪みを加える。昇温速度5℃/分で加熱した時に
荷重が0になる温度を軟化点とした。 パッケージ外観:パッケージPKG外観を目視にて色の
ムラをチェックした。 リーク不良率:50μmピッチでボンディングした80
pQFPを上記と同方式で成形し、パッド間のリークの
有無を判定した。金線変形等の他原因の不良は除いた。
<< Evaluation Method >> YAG laser printability: 14 × 20 × 2.7 mm 80p
QFP was molded with a multi-pot plunger die and evaluated with a mask-type YAG laser marking machine. Softening point of the resin composition: A strain is applied to the sheet-like resin composition after kneading (before pulverization) so that the load becomes 500 g with a three-point bending measuring machine. The temperature at which the load became 0 when heated at a heating rate of 5 ° C./min was defined as the softening point. Package appearance: The package PKG appearance was visually checked for color unevenness. Leakage defect rate: 80 bonded at a pitch of 50 μm
pQFP was molded in the same manner as above, and the presence or absence of leakage between pads was determined. Defects of other causes such as gold wire deformation were excluded.

【0011】《実施例2〜4及び比較例1、2》実施例
2〜4については、表1に従って配合し、実施例1と同
様にして組成物Aと組成物Bを得、図1、図2の構成の
タブレットに打錠した。実施例1と同様にして評価し
た。比較例1、2については、表2に従って配合し、実
施例1と同様にして組成物Aを得、組成物Aのみからな
るタブレットに打錠した。実施例1と同様にして評価し
た。これらの評価結果を表1、表2に示す。実施例1以
外に用いたエポキシ樹脂の性状を以下に記す。オルソク
レゾールノボラック型エポキシ樹脂1は、軟化点55
℃、エポキシ当量200。オルソクレゾールノボラック
型エポキシ樹脂2は、軟化点65℃、エポキシ当量20
0。実施例3、4では組成物Aが、ランナーの近くにな
るようにポットの中へタブレットをセットした。
<< Examples 2 to 4 and Comparative Examples 1 and 2 >> Examples 2 to 4 were blended according to Table 1, and compositions A and B were obtained in the same manner as in Example 1. The tablet was compressed into a tablet having the configuration shown in FIG. Evaluation was performed in the same manner as in Example 1. Comparative Examples 1 and 2 were blended in accordance with Table 2 to obtain Composition A in the same manner as in Example 1, and tableted into a tablet consisting of Composition A alone. Evaluation was performed in the same manner as in Example 1. Tables 1 and 2 show the evaluation results. The properties of the epoxy resin used in addition to Example 1 are described below. Orthocresol novolak epoxy resin 1 has a softening point of 55
° C, epoxy equivalent 200. Orthocresol novolak type epoxy resin 2 has a softening point of 65 ° C. and an epoxy equivalent of 20.
0. In Examples 3 and 4, tablets were set in pots so that Composition A was near the runner.

【表1】 [Table 1]

【0012】[0012]

【表2】 [Table 2]

【0013】[0013]

【発明の効果】本発明の半導体装置は、リーク不良の発
生を低減し、YAGレーザー捺印性に優れている。
The semiconductor device of the present invention reduces the occurrence of leak failure and is excellent in YAG laser marking.

【図面の簡単な説明】[Brief description of the drawings]

【図1】2重構造のタブレットの斜視図(a)とその断
面図(b)を示す。
FIG. 1 shows a perspective view (a) and a sectional view (b) of a tablet having a double structure.

【図2】2段構造のタブレットの斜視図(a)とその断
面図(b)を示す。
FIG. 2 shows a perspective view (a) and a sectional view (b) of a two-stage tablet.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) C08J 3/20 CFC C08J 3/20 CFCD C08K 3/04 C08K 3/04 3/36 3/36 5/00 5/00 7/18 7/18 C08L 61/08 C08L 61/08 H01L 21/56 H01L 21/56 C 23/29 23/30 R 23/31 Fターム(参考) 4F070 AA46 AB10 AB23 AC11 AC23 AC87 AE01 AE04 FA03 FA17 FB06 4J002 CC04Y CD00W CD00X DA038 DJ017 FD140 FD156 GQ05 HA09 4J036 AA01 AA05 DA04 FA02 FA05 FB07 JA07 4M109 AA02 CA03 CA21 EA03 EB03 EB04 EB06 EB07 EB08 EB09 EB12 EB13 EB19 EC07 EC20 EE15 GA08 5F061 AA02 CA03 CA21 DA13 DE03 GA01 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) C08J 3/20 CFC C08J 3/20 CFCD C08K 3/04 C08K 3/04 3/36 3/36 5/00 5/00 7/18 7/18 C08L 61/08 C08L 61/08 H01L 21/56 H01L 21/56 C 23/29 23/30 R 23/31 F term (reference) 4F070 AA46 AB10 AB23 AC11 AC23 AC87 AE01 AE04 FA03 FA17 FB06 4J002 CC04Y CD04W CD00X DA038 DJ017 FD140 FD156 GQ05 HA09 4J036 AA01 AA05 DA04 FA02 FA05 FB07 JA07 4M109 AA02 CA03 CA21 EA03 EB03 EB04 EB06 EB07 EB08 EB09 EB12 EC01 GA13

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 (A)エポキシ樹脂、(B)フェノール
樹脂、(C)硬化促進剤、(D)溶融シリカ粉末、及び
(E)カーボンブラックを含む樹脂組成物(I)と、
(A)エポキシ樹脂、(B)フェノール樹脂、(C)硬
化促進剤、(D)溶融シリカ粉末、(E)カーボンブラ
ックを含まない樹脂組成物(II)とが同一のタブレット
中にあることを特徴とする半導体封止用タブレット。
1. A resin composition (I) comprising (A) an epoxy resin, (B) a phenolic resin, (C) a curing accelerator, (D) fused silica powder, and (E) carbon black,
(A) an epoxy resin, (B) a phenolic resin, (C) a curing accelerator, (D) a fused silica powder, and (E) a resin composition containing no carbon black (II) in the same tablet. Characteristic tablet for semiconductor encapsulation.
【請求項2】 樹脂組成物(I)の軟化点が、樹脂組成
物(II)の軟化点よりも10℃以上低い特性を有する請
求項1記載の半導体封止用タブレット。
2. The tablet for semiconductor encapsulation according to claim 1, wherein the softening point of the resin composition (I) is lower than the softening point of the resin composition (II) by 10 ° C. or more.
【請求項3】 請求項1、又は2記載のタブレットの硬
化物で半導体素子が封止されてなる半導体装置であっ
て、硬化物の表面がカーボンブラックを含む樹脂組成物
(I)の硬化物で、半導体素子の周辺がカーボンブラッ
クを含まない樹脂組成物(II)の硬化物であることを特
徴とする半導体装置。
3. A cured product of the resin composition (I), wherein a semiconductor element is sealed with the cured product of the tablet according to claim 1 or 2, wherein the surface of the cured product contains carbon black. Wherein the periphery of the semiconductor element is a cured product of the resin composition (II) containing no carbon black.
JP2000070268A 2000-03-14 2000-03-14 Tablet and semiconductor device Pending JP2001261941A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000070268A JP2001261941A (en) 2000-03-14 2000-03-14 Tablet and semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000070268A JP2001261941A (en) 2000-03-14 2000-03-14 Tablet and semiconductor device

Publications (1)

Publication Number Publication Date
JP2001261941A true JP2001261941A (en) 2001-09-26

Family

ID=18589030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000070268A Pending JP2001261941A (en) 2000-03-14 2000-03-14 Tablet and semiconductor device

Country Status (1)

Country Link
JP (1) JP2001261941A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11399153B2 (en) 2009-08-26 2022-07-26 Teladoc Health, Inc. Portable telepresence apparatus

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552226A (en) * 1978-10-11 1980-04-16 Hamasawa Kogyo:Kk Pellet-like molding agent
JPS61285730A (en) * 1985-06-13 1986-12-16 Oki Electric Ind Co Ltd Manufacture of semiconductor device and resin mold member used therefor
JPH0513623A (en) * 1991-07-05 1993-01-22 Fuji Electric Co Ltd Manufacture of semiconductor device
JPH08162573A (en) * 1994-12-08 1996-06-21 Nitto Denko Corp Semiconductor device
JPH09148352A (en) * 1995-11-21 1997-06-06 Matsushita Electric Ind Co Ltd Resin sealing method, electronic element manufacturing method and electronic element
JPH10158479A (en) * 1996-11-29 1998-06-16 Sumitomo Bakelite Co Ltd Semiconductor-sealing resin composition
JPH11269248A (en) * 1998-01-26 1999-10-05 Matsushita Electric Works Ltd Epoxy resin composition for sealing discrete element and resin-sealed semiconductor device
JP2000007887A (en) * 1998-06-25 2000-01-11 Matsushita Electric Works Ltd Epoxy resin composition for sealing inner layer of multiply molded semiconductor device and semiconductor device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5552226A (en) * 1978-10-11 1980-04-16 Hamasawa Kogyo:Kk Pellet-like molding agent
JPS61285730A (en) * 1985-06-13 1986-12-16 Oki Electric Ind Co Ltd Manufacture of semiconductor device and resin mold member used therefor
JPH0513623A (en) * 1991-07-05 1993-01-22 Fuji Electric Co Ltd Manufacture of semiconductor device
JPH08162573A (en) * 1994-12-08 1996-06-21 Nitto Denko Corp Semiconductor device
JPH09148352A (en) * 1995-11-21 1997-06-06 Matsushita Electric Ind Co Ltd Resin sealing method, electronic element manufacturing method and electronic element
JPH10158479A (en) * 1996-11-29 1998-06-16 Sumitomo Bakelite Co Ltd Semiconductor-sealing resin composition
JPH11269248A (en) * 1998-01-26 1999-10-05 Matsushita Electric Works Ltd Epoxy resin composition for sealing discrete element and resin-sealed semiconductor device
JP2000007887A (en) * 1998-06-25 2000-01-11 Matsushita Electric Works Ltd Epoxy resin composition for sealing inner layer of multiply molded semiconductor device and semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11399153B2 (en) 2009-08-26 2022-07-26 Teladoc Health, Inc. Portable telepresence apparatus

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