WO2021260807A1

WO2021260807A1 - Imaging device failure diagnosis system

Info

Publication number: WO2021260807A1
Application number: PCT/JP2020/024657
Authority: WO
Inventors: 稔康新保
Original assignee: 三菱電機株式会社
Priority date: 2020-06-23
Filing date: 2020-06-23
Publication date: 2021-12-30
Also published as: JPWO2021260807A1; JP7118318B2

Abstract

An imaging device failure diagnosis system (100) is provided with: a switching control unit (10) that controls switching between a first mode in which a subject irradiation light-emission device (1) applies light to a subject and a second mode in which a test chart irradiation light-emission device (3) applies light to a test chart (2).

Description

Imaging device failure diagnosis system

This disclosure relates to an image pickup device failure diagnosis system.

Patent Document 1 describes a color image pickup device provided with a test pattern projector. The color image pickup device reflects a test pattern, a light source for illuminating the test pattern, and light that has passed through the test pattern, and transmits the light from the subject so that these lights are incident on the image pickup tube. It is equipped with a half mirror. The color image pickup device detects color shift of an image caused by a failure of the image pickup device based on an image of a photographed test pattern.

Japanese Unexamined Patent Publication No. 61-71789

With the above technology, it is necessary to prepare for shooting the subject (preparation of lighting for the subject, etc.) when shooting the subject, and preparation for shooting the test pattern when shooting the test pattern. Therefore, for example, there is a problem that it is not possible to frequently take a picture for failure diagnosis of an image pickup apparatus while taking a picture of a subject.

The present disclosure has been made in order to solve the above-mentioned problems, and an object of the present disclosure is to provide a technique capable of frequently performing imaging for failure diagnosis of an imaging device.

The image pickup device failure diagnosis system according to the present disclosure includes a subject irradiation light emitting device that irradiates a subject with light, a test chart for imaging device failure diagnosis, a test chart irradiation light emitting device that irradiates a test chart with light, and a subject. One surface from which the light emitting device for irradiation emits and transmits the first light reflected by the subject, and the other surface from which the light emitting device for test chart emits and reflects the second light that has passed through the test chart. A half mirror having a surface, an image pickup device that images a subject by receiving a first light transmitted through the half mirror, and an image pickup device that captures a test chart by receiving a second light reflected by the half mirror. A switching control unit that controls switching between a first mode in which the light emitting device for subject irradiation illuminates the subject and a second mode in which the light emitting device for test chart illuminates the test chart. I have.

According to the present disclosure, it is possible to frequently take pictures for failure diagnosis of an imaging device.

It is a block diagram which shows the structure of the image pickup apparatus failure diagnosis system which concerns on Embodiment 1. FIG. It is a flowchart which shows the image pickup apparatus failure diagnosis method by the image pickup apparatus failure diagnosis system which concerns on Embodiment 1 at the time of production and inspection. It is a flowchart which shows the image pickup apparatus failure diagnosis method by the image pickup apparatus failure diagnosis system 100 which concerns on Embodiment 1 at the time of activation. It is a flowchart which shows the image pickup apparatus failure diagnosis method by the image pickup apparatus failure diagnosis system which concerns on Embodiment 1 at the time of a normal operation. It is a schematic diagram for demonstrating the specific example of the half mirror which concerns on Embodiment 1. FIG. It is a schematic diagram for demonstrating the image pickup apparatus failure diagnosis method by the image pickup apparatus failure diagnosis system which concerns on Embodiment 1. FIG. It is a schematic diagram which shows the structure which further includes the specific wavelength cutoff device in the image pickup apparatus failure diagnosis system which concerns on Embodiment 1. FIG. It is a figure for demonstrating the reflection of the test chart in the subject image in the specific example of Embodiment 1. FIG. It is a figure for demonstrating the reflection data in the specific example of Embodiment 1. FIG. FIG. 5 is a schematic diagram showing a configuration in which the test chart according to the first embodiment has a marker for alignment. It is a figure for demonstrating the reflection correction method which concerns on the specific example of Embodiment 1. FIG. It is a schematic diagram for demonstrating the configuration which includes the image pickup apparatus failure diagnosis system 100 which concerns on Embodiment 1, a plurality of test charts, a plurality of test chart irradiation light emitting devices, and a plurality of half mirrors. FIG. 13A is a block diagram showing a hardware configuration that realizes the function of the image pickup apparatus failure diagnosis control unit according to the first embodiment. FIG. 13B is a block diagram showing a hardware configuration for executing software that realizes the function of the image pickup apparatus failure diagnosis control unit according to the first embodiment.

Hereinafter, in order to explain the present disclosure in more detail, a mode for carrying out the present disclosure will be described with reference to the accompanying drawings.
Embodiment 1.
FIG. 1 is a block diagram showing a configuration of an image pickup apparatus failure diagnosis system 100 according to the first embodiment. As shown in FIG. 1, the image pickup device failure diagnosis system 100 includes a subject irradiation light emitting device 1, a test chart 2, a test chart irradiation light emitting device 3, a half mirror 4, an image pickup device 5, a storage device 6, and an image pickup device failure. A diagnostic control unit 7 is provided.

The subject irradiation light emitting device 1 irradiates the subject with light. The light emitted by the light emitting device 1 for illuminating the subject is reflected by the subject and propagates toward the half mirror 4. More specifically, in the first embodiment, the subject irradiation light emitting device 1 is an LED that irradiates the driver of the vehicle with light.

The test chart 2 is a test chart for diagnosing an image pickup device failure. More specifically, in the first embodiment, the test chart 2 is a transmission type test chart for diagnosing an image pickup device failure. Examples of test chart 2 include a test chart for resolution check, a test chart for uniformity check, a test chart for color reproducibility check (for example, Macbeth chart), a test chart for gradation check, or a human figure. Alternatively, a test chart showing a face can be mentioned.

The light emitting device 3 for irradiating the test chart irradiates the test chart 2 with light. The light emitted by the light emitting device 3 for irradiating the test chart passes through the test chart 2 and propagates toward the half mirror 4. In the first embodiment, the light emitting device 3 for irradiating the test chart is an LED that irradiates the test chart 2 with light.

The half mirror 4 was emitted by the light emitting device 1 for irradiating the subject, one surface through which the first light reflected by the subject was transmitted, and the light emitting device 3 for irradiating the test chart were emitted and passed through the test chart 2. It has the other surface, which reflects a second light. The first light and the second light emitted from the half mirror 4 propagate toward the image pickup apparatus 5, respectively. The detailed structure of the half mirror 4 will be described later.

The image pickup apparatus 5 captures the subject by receiving the first light transmitted through the half mirror 4, and captures the test chart 2 by receiving the second light reflected by the half mirror 4. An example of the image pickup apparatus 5 is a camera module or the like. The image pickup apparatus 5 includes, for example, a lens, an image sensor, or the like. That is, in that case, the failure diagnosis of the image pickup apparatus 5 is, for example, a failure diagnosis of a lens, an image sensor, or the like. The subject image obtained by the image pickup device 5 taking an image of the subject and the test chart image obtained by the image pickup device 5 taking an image of the test chart 2 are output to the image pickup device failure diagnosis control unit 7. In the present specification, the image is a moving image or a still image.
The storage device 6 stores the expected value of the test chart image. The storage device 6 outputs the expected value of the test chart image to be stored to the image pickup device failure diagnosis control unit 7.

The image pickup device failure diagnosis control unit 7 includes a switching control unit 10, a failure diagnosis unit 11, and a subject image correction unit 12. In the first embodiment, the image pickup device failure diagnosis control unit 7 is a CPU.
The switching control unit 10 controls light emission and extinguishing of the subject irradiation light emitting device 1, respectively, and controls light emission and extinguishing of the test chart irradiation light emitting device 3. The switching control unit 10 switches between a first mode in which the light emitting device 1 for irradiating the subject irradiates the subject with light and a second mode in which the light emitting device 3 for irradiating the test chart irradiates the test chart 2 with light. To control. Details will be described later.

The failure diagnosis unit 11 diagnoses the failure of the image pickup device 5 based on the test chart image obtained by the image pickup device 5 taking an image of the test chart 2. More specifically, in the first embodiment, the failure diagnosis unit 11 compares the test chart image obtained by the image pickup device 5 with the test chart 2 with the expected value stored in the storage device 6. Therefore, the failure of the image pickup apparatus 5 is diagnosed. Details will be described later.
The subject image correction unit 12 corrects the reflection of the test chart 2 in the subject image obtained by the image pickup device 5 taking an image of the subject. Details will be described later.

Hereinafter, the operation of the image pickup apparatus failure diagnosis system 100 according to the first embodiment will be described with reference to the drawings. FIG. 2 is a flowchart showing a method of diagnosing an image pickup device failure by the image pickup device failure diagnosis system 100 at the time of production and inspection. FIG. 3 is a flowchart showing a method of diagnosing an image pickup device failure by the image pickup device failure diagnosis system 100 at the time of startup. FIG. 4 is a flowchart showing a method of diagnosing an image pickup device failure by the image pickup device failure diagnosis system 100 during normal operation (in a steady state). The Main Function in FIGS. 2, 3 and 4 indicates the function of the image pickup device failure diagnosis control unit 7 or the function of the switching control unit 10 of the image pickup device failure diagnosis control unit 7, and is a Test Chart LED. (Test chart LED) indicates the function of the test chart irradiation light emitting device 3, Driver LED (driver LED) indicates the function of the subject irradiation light emitting device 1, Expect Data (expected value data), Initial Data (initial value data). Data), StartupData (startup data) and CyclicData (cyclic data) indicate the data stored in the storage device 6, respectively, and Initial Check (initial check) and Cyclic Check (cycle check) respectively indicate a failure diagnosis. The function of the subject image correction unit 12 or the function of the subject image correction unit 12 is shown, the Reflect Correction (reflection correction) shows the function of the subject image correction unit 12, and the Sub CPU (sub CPU) is a sub CPU (not shown). Shows the function of.

First, a method of diagnosing an image pickup device failure by the image pickup device failure diagnosis system 100 at the time of production and inspection will be described below.
As shown in FIG. 2, at the time of production of the image pickup device failure diagnosis system 100, the expected value of the test chart image is written in advance in the storage device 6 from an external device (not shown). Alternatively, the storage device 6 stores the expected value of the test chart image in advance. The expected value is, for example, a theoretical value, digital data that is the basis of the test chart 2, data obtained by photographing the test chart 2 with a reference machine, and the like.

At the time of inspection of the image pickup device failure diagnosis system 100, the switching control unit 10 of the image pickup device failure diagnosis control unit 7 controls the light emitting device 3 for irradiating the test chart to irradiate the test chart 2 with light (step ST1). As a result, the light (second light) emitted by the light emitting device 3 for irradiating the test chart passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. Then, the image pickup apparatus 5 takes an image of the test chart 2 by receiving the light. When the light emitting device 3 for irradiating the test chart emits light, light enters from the outside of the image pickup device failure diagnosis system 100 in front of the surface of the half mirror 4 on the subject side (for example, the screen surface of the driver monitoring system). It may be shielded from light so as not to be shielded, or it may not be shielded from light assuming normal operation.

Next, the image pickup device failure diagnosis control unit 7 writes the test chart image obtained by the image pickup device 5 taking an image of the test chart 2 into the storage device 6 as the test chart image pickup data at the time of shipping inspection (step ST2). ..

Next, the failure diagnosis unit 11 reads the expected value of the test chart image stored in the storage device 6 (step ST3).
Next, the failure diagnosis unit 11 reads the test chart imaging data stored in step ST2 by the storage device 6 (step ST4).

Next, the failure diagnosis unit 11 diagnoses the failure of the image pickup device 5 by comparing the read test chart imaging data (test chart image) with the read expected value (step ST5). In the first embodiment, the failure diagnosis unit 11 diagnoses the soundness of the image sensor of the image pickup apparatus 5 in step ST5.

When the failure diagnosis unit 11 diagnoses that the image pickup device 5 is normal in step ST5, the failure diagnosis unit 11 sets the expected value of the test chart image stored in the storage device 6 as the expected value of the test chart image in the image pickup device 5 as a test chart. Replace with imaged data (step ST6). That is, the failure diagnosis unit 11 updates the expected value of the test chart 2 stored in the storage device 6.

When the failure diagnosis unit 11 diagnoses that the image pickup device 5 is abnormal in step ST5, the failure diagnosis unit 11 notifies a sub CPU (not shown) that the image pickup device 5 is abnormal (step ST7). The sub CPU notifies an external ECU (Electronic Control Unit) (not shown) of an abnormality in the image pickup device 5.

Further, when the function of correcting the reflection of the test chart 2 in the subject image is turned on, the image pickup apparatus failure diagnosis control unit 7 executes each of the following steps.
First, the switching control unit 10 controls so that the light emitting device 3 for irradiating the test chart is turned off (step ST8). Then, the faint light emitted when the light emitting device 3 for irradiating the test chart is not completely turned off passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. The image pickup apparatus 5 takes an image of the test chart 2 by receiving the light. The test chart image thus obtained is used as reflection data of the test chart 2 in the subject image.

Next, the image pickup device failure diagnosis control unit 7 writes the reflection data obtained by the image pickup of the image pickup device 5 into the storage device 6 (step ST9).
Next, the subject image correction unit 12 reads the reflection data stored in the storage device 6 (step ST10).

Next, the subject image correction unit 12 creates reflection mask data based on the read reflection data (step ST11). The reflection mask data is data used by the subject image correction unit 12 to correct the reflection of the test chart 2 in the subject image.
Next, the subject image correction unit 12 writes the created reflection mask data in the storage device 6 (step ST12).

Hereinafter, a method for diagnosing an image pickup device failure by the image pickup device failure diagnosis system 100 at the time of startup will be described.
As shown in FIG. 3, when the image pickup device failure diagnosis system 100 is started, the switching control unit 10 of the image pickup device failure diagnosis control unit 7 causes the test chart irradiation light emitting device 3 to irradiate the test chart 2 with light. Control (step ST20). As a result, the light (second light) emitted by the light emitting device 3 for irradiating the test chart passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. Then, the image pickup apparatus 5 takes an image of the test chart 2 by receiving the light.

Next, the image pickup device failure diagnosis control unit 7 writes the test chart image obtained by the image pickup device 5 taking an image of the test chart 2 into the storage device 6 as the test chart image pickup data at the time of startup (step ST21).
Next, the failure diagnosis unit 11 reads the test chart imaging data stored in step ST21 by the storage device 6 (step ST22).

Next, the failure diagnosis unit 11 reads the expected value of the test chart image stored in the storage device 6 (step ST23). The expected value may be the expected value updated by the failure diagnosis unit 11 in step ST6, or as described above, the theoretical value, the digital data that is the basis of the test chart 2, or the test chart by the reference machine. It may be data or the like obtained by photographing 2.

Next, the failure diagnosis unit 11 diagnoses the failure of the image pickup device 5 by comparing the read test chart imaging data (test chart image) with the read expected value (step ST24). Here, too, the failure diagnosis unit 11 shall diagnose the soundness of the image sensor of the image pickup apparatus 5.

When the image pickup device failure diagnosis control unit 7 diagnoses that the image pickup device 5 is normal in step ST24 and the function of correcting the reflection of the test chart 2 in the subject image is turned on, the steps from the following steps ST25 are taken. Each step up to ST29 is executed.

First, the switching control unit 10 controls so that the light emitting device 3 for irradiating the test chart is turned off (step ST25). Then, the faint light emitted when the light emitting device 3 for irradiating the test chart is not completely turned off passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. The image pickup apparatus 5 takes an image of the test chart 2 by receiving the light. The test chart image thus obtained is used as reflection data of the test chart 2 in the subject image.

Next, the image pickup device failure diagnosis control unit 7 writes the reflection data obtained by the image pickup of the image pickup device 5 into the storage device 6 (step ST26).
Next, the subject image correction unit 12 reads the reflection data stored in step ST26 by the storage device 6 (step ST27).

Next, the subject image correction unit 12 creates reflection mask data based on the read reflection data (step ST28).
Next, the subject image correction unit 12 writes the created reflection mask data in the storage device 6 (step ST29). As described above, the subject image correction unit 12 may create reflection mask data at each startup.

On the other hand, when the failure diagnosis unit 11 diagnoses that the image pickup device 5 is abnormal in step ST24, the failure diagnosis unit 11 notifies a sub CPU (not shown) that the image pickup device 5 is abnormal (step ST30). The sub CPU notifies an external ECU (Electronic Control Unit) (not shown) of an abnormality in the image pickup device 5.

Hereinafter, a method for diagnosing an image pickup device failure by the image pickup device failure diagnosis system 100 during normal operation will be described.
As shown in FIG. 4, during the normal operation of the image pickup device failure diagnosis system 100, the switching control unit 10 of the image pickup device failure diagnosis control unit 7 controls the subject irradiation light emitting device 1 to irradiate the subject with light. (Step ST40). As a result, the light (first light) emitted by the subject irradiation light emitting device 1 is reflected by the subject, propagates toward the half mirror 4, and passes through the half mirror 4.
Next, the image pickup device failure diagnosis control unit 7 controls the image pickup device 5 to take an image of the subject by receiving the light (step ST41).

Next, when the function of correcting the reflection of the test chart 2 in the subject image is turned on, the following steps ST42 to ST45 are executed.
First, the subject image correction unit 12 acquires a subject image (imaging data) obtained by the imaging device 5 imaging the subject in step ST41 (step ST42).

Next, the subject image correction unit 12 acquires the reflection mask data written in the storage device 6 in step ST29 described above (step ST43).
Next, the subject image correction unit 12 corrects the reflection of the test chart 2 in the subject image based on the acquired reflection mask data (step ST44).

Next, the subject image correction unit 12 outputs the subject image after the reflection correction to a mechanism (not shown) that detects the state of the subject (driver) (step ST45). The mechanism detects the state of the subject based on the subject image after the reflection correction.

As the next step of step ST41 or step ST45, the switching control unit 10 controls the light emitting device 3 for irradiating the test chart to irradiate the test chart 2 with light (step ST46). As a result, the light (second light) emitted by the light emitting device 3 for irradiating the test chart passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. Then, the image pickup apparatus 5 takes an image of the test chart 2 by receiving the light. At the time of step ST46, the light emitting device 1 for irradiating the subject is turned off.

Next, the image pickup device failure diagnosis control unit 7 writes the test chart image obtained by the image pickup device 5 taking an image of the test chart 2 into the storage device 6 as test chart image pickup data (step ST47).

Next, the failure diagnosis unit 11 reads the test chart imaging data stored in step ST47 by the storage device 6 (step ST48).
Next, the failure diagnosis unit 11 reads the expected value of the test chart image stored in the storage device 6 (step ST49). The expected value may be the expected value updated by the failure diagnosis unit 11 in step ST6, or as described above, the theoretical value, the digital data that is the basis of the test chart 2, or the test chart by the reference machine. It may be data or the like obtained by photographing 2.

Next, the failure diagnosis unit 11 diagnoses the failure of the image pickup device 5 by comparing the read test chart imaging data (test chart image) with the read expected value (step ST50). Here, too, the failure diagnosis unit 11 shall diagnose the soundness of the image sensor of the image pickup apparatus 5.

When the image pickup device failure diagnosis control unit 7 diagnoses that the image pickup device 5 is normal in step ST50, the image pickup device failure diagnosis control unit 7 returns to the process of step ST40 and repeatedly executes each step from step ST40 to step ST50.

When the image pickup device failure diagnosis control unit 7 diagnoses that the image pickup device 5 is abnormal in step ST50, the image pickup device failure diagnosis control unit 7 notifies a sub CPU (not shown) that the image pickup device 5 is abnormal (step ST51). The sub CPU notifies an external ECU (Electronic Control Unit) (not shown) of an abnormality in the image pickup device 5.

Hereinafter, a specific example of the half mirror 4 according to the first embodiment will be described with reference to the drawings. FIG. 5 is a schematic diagram for explaining a specific example of the half mirror 4. The figure on the left side of FIG. 5 shows the function of one surface emitted by the light emitting device 1 for subject irradiation and transmitting the first light reflected by the subject, and the figure on the right side of FIG. 5 is for test chart irradiation. The function of the other surface from which the light emitting device 3 emits and reflects the second light that has passed through the test chart 2 is shown.

As shown in FIG. 5, the incident direction of the first light on the half mirror 4 and the incident direction of the second light on the half mirror 4 are orthogonal to each other, and the half mirror 4 has one surface and the first one. The angle formed by the incident direction of the light is an acute angle, and the angle formed by the other surface and the incident direction of the second light is an acute angle.

In the example of the figure on the left side of FIG. 5, a light emitting device 1 for subject irradiation (not shown) emits light, and the first light reflected by the subject is incident on one surface of the half mirror 4, and a part of the light is incident on one surface of the half mirror 4. It is absorbed by the half mirror 4, part of it is reflected by the half mirror 4, and most of it is transmitted through the half mirror 4.

In the example of the figure on the right side of FIG. 5, the light emitting device 3 for irradiating the test chart (not shown) emits light, and the second light passing through the test chart 2 (not shown) is incident on the other surface of the half mirror 4 and partially. Is absorbed by the half mirror 4, a part of the light is transmitted through the half mirror 4, and most of the light is reflected by the half mirror 4.
As a result, the first light transmitted through the half mirror 4 and the second light reflected by the half mirror 4 propagate toward the image pickup apparatus 5, respectively.

In this way, by using the characteristics of one surface and the other surface of the half mirror 4 to control the light emission and extinguishing of the subject irradiation light emitting device 1 and the light emission and extinguishing of the test chart 2, the subject or the test chart can be controlled. It is possible to selectively shoot any one of the two.

Hereinafter, a specific example of the image pickup device failure diagnosis method by the image pickup device failure diagnosis system 100 according to the first embodiment will be described with reference to the drawings. FIG. 6 is a schematic diagram for explaining an image pickup device failure diagnosis method by the image pickup device failure diagnosis system 100 (the storage device 6 and the image pickup device failure diagnosis control unit 7 are not shown). In the specific example, the image pickup apparatus 5 includes a lens 20 and an image sensor 21. Further, in the specific example, it is assumed that the function of correcting the reflection of the test chart 2 in the subject image is turned off.

As shown in FIG. 6, the test chart 2 is installed in the emission direction of the first light by the light emitting device 3 for irradiating the test chart. The half mirror 4 is installed at a position where the first light that has passed through the test chart 2 and the second light emitted by the subject irradiation light emitting device 1 and reflected by a subject (not shown) are orthogonal to each other.

The lens 20 of the image pickup apparatus 5 is installed at a position in a common propagation direction of the first light transmitted through one surface of the half mirror 4 and the second light reflected by the other surface of the half mirror 4. There is. The image sensor 21 of the image pickup apparatus 5 is installed at a position in the propagation direction of the first light and the second light transmitted through the lens 20.

First, in step ST40 described above, the switching control unit 10 controls the subject irradiation light emitting device 1 to irradiate the subject with light. As a result, the first light emitted by the subject irradiation light emitting device 1 is reflected by a subject (not shown), propagates toward the half mirror 4, and passes through the half mirror 4. The first light transmitted through the half mirror 4 passes through the lens 20 and is received by the image sensor 21. Then, in step ST41 described above, the image pickup device failure diagnosis control unit 7 controls the image pickup device 5 to take an image of the subject. In the specific example, the image pickup device failure diagnosis control unit 7 monitors whether the driver is looking away or falling asleep based on the subject image obtained by the image pickup device 5 taking an image of the driver of the subject. , It shall be controlled to issue a warning as needed through a speaker (not shown). Since the light emitting device 3 for irradiating the test chart is turned off here, the test chart 2 is not reflected in the subject image.

Next, in step ST46 described above, the switching control unit 10 controls the test chart irradiation light emitting device 3 to irradiate the test chart 2 with light. As a result, the second light emitted by the light emitting device 3 for irradiating the test chart passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. Then, the image pickup apparatus 5 takes an image of the test chart 2 by receiving the light. Here, since the light emitting device 1 for illuminating the subject is turned off, the subject is not reflected in the test chart image obtained by the image pickup device 5 taking an image of the test chart 2.

Next, in step ST47 described above, the image pickup device failure diagnosis control unit 7 writes the test chart image obtained by the image pickup device 5 taking an image of the test chart 2 into the storage device 6 as test chart image pickup data. Next, in step ST48, the failure diagnosis unit 11 reads the test chart imaging data stored in step ST47 by the storage device 6. Next, in step ST49, the failure diagnosis unit 11 reads the expected value of the test chart image stored in the storage device 6.

Next, in step ST50, the failure diagnosis unit 11 diagnoses the failure of the image pickup device 5 by comparing the read test chart image data (test chart image) with the read expected value.

According to the configuration of the specific example, failure diagnosis of the image pickup apparatus 5 including the lens 20 and the image sensor 21 (photoelectric conversion element) can be performed with high frequency. For example, in a driver monitoring product used in automatic operation, an image can be obtained. It is not necessary to incur a large cost such as mounting two sensors, and the reliability of failure diagnosis can be ensured.

Hereinafter, the configuration in which the image pickup device failure diagnosis system 100 according to the first embodiment further includes the specific wavelength cutoff device 30 will be described with reference to the drawings. FIG. 7 is a schematic diagram showing a configuration in which the image pickup device failure diagnosis system 100 according to the first embodiment further includes a specific wavelength cutoff device 30 (the storage device 6 and the image pickup device failure diagnosis control unit 7 are not shown). ).

The specific wavelength blocking device 30 is installed in front of one surface of the half mirror 4 to which the light emitting device 1 for subject irradiation emits and the first light reflected by the subject is incident. The specific wavelength blocking device 30 transmits the first light and blocks light having a wavelength other than the wavelength of the first light. An example of the specific wavelength blocking device 30 is a bandpass filter (optical filter) or the like.

In this example, for example, the subject irradiation light emitting device 1 irradiates the subject with light having a specific wavelength other than visible light, such as near-infrared light, which is not so much contained in sunlight. In that case, the specific wavelength blocking device 30 transmits light having the specific wavelength and blocks light having a wavelength other than the specific wavelength. This makes it possible to eliminate the influence of external light (sunlight, street lights, etc.) while the vehicle is running. It also has the effect of not making the driver aware of light emission and shooting.

Further, at the time of shooting the test chart, the light emitting device 3 for irradiating the test chart irradiates the test chart 2 with light, passes through the test chart 2, and the second light reflected by the half mirror 4 is captured as an image by the image sensor 21. Is done. At this time, the light emitting device 1 for irradiating the subject does not emit light, the light having a wavelength other than the specific wavelength of sunlight is blocked by the specific wavelength blocking device 30, and the light reflected by the subject is transmitted to the half mirror 4. Not reachable. This makes it possible to reduce the reflection of the subject in the test chart image.

Hereinafter, a specific example of the reflection correction method in the image pickup device failure diagnosis method by the image pickup device failure diagnosis system 100 according to the first embodiment will be described with reference to the drawings. FIG. 8 is a diagram for explaining the reflection of the test chart 2 on the subject image in the specific example of the first embodiment. In FIG. 8, from the top, a graph showing the time course of the light emitting amount of the test chart irradiation light emitting device 3, a graph showing the time passage of the light emitting amount of the subject irradiation light emitting device 1, and the light emitting amount of the test chart irradiation light emitting device 3. A graph showing the passage of time and the passage of light emission amount of the subject irradiation light emitting device 1 and the passage of time of the image obtained by the imaging of the imaging device 5 are shown in order.

First, in step ST46 described above, the switching control unit 10 controls the test chart irradiation light emitting device 3 to irradiate the test chart 2 with light. Then, after the steps ST50 are executed from the above-mentioned step ST47, the process returns to the above-mentioned step ST40, and the switching control unit 10 controls the subject irradiation light emitting device 1 to irradiate the subject with light.

As a result, as indicated by the arrow A in FIG. 8, the light emitting device 1 for subject irradiation may start emitting light before the light emitting device 3 for irradiating the test chart is turned off in time. In such a case, or when the light from the outside of the image pickup device failure diagnosis system 100 cannot be completely blocked, the test chart 2 may be reflected in the subject image obtained by the image pickup of the image pickup device 5. be. Therefore, the subject image correction unit 12 corrects the subject image as follows.

FIG. 9 is a diagram for explaining the reflection data (reference image) in the specific example. The solid line in the upper graph of FIG. 9 shows the time course of the light emission amount of the test chart irradiation light emitting device 3 (the dotted line shows the time passage of the light emission amount when the subject irradiation light emitting device 1 emits light), and the lower line shows. The figure shows the time course of the image obtained by the image pickup of the image pickup apparatus 5.

In step ST8 or step ST25 described above, the switching control unit 10 controls the test chart irradiation light emitting device 3 to turn off while the test chart irradiation light emitting device 3 is emitting light. At this time, the light emitting device 1 for irradiating the subject does not emit light. The faint light emitted when the light emitting device 3 for irradiating the test chart is not completely turned off passes through the test chart 2, propagates toward the half mirror 4, and is reflected by the half mirror 4. The image pickup apparatus 5 captures a test chart by receiving the light. The test chart image thus obtained is used as reflection data (reference image) of the test chart 2 in the subject image (the image on the lower right side of FIG. 9).

Then, in step ST11 or step ST28 described above, the subject image correction unit 12 creates reflection mask data based on the reflection data. Then, in step ST42 described above, the subject image correction unit 12 corrects the reflection of the test chart 2 in the subject image based on the reflection mask data.

It should be noted that there is a possibility that the positional relationship between the test chart 2 and the image sensor 21 may be slightly deviated due to the vibration of the vehicle during shooting while the vehicle is running. Therefore, when the subject image correction unit 12 simply subtracts the reflection mask data from the subject image, the reflection of the test chart 2 remains in the subject image, and the reflection is reflected from the portion of the subject image where the test chart 2 is not reflected. The mask data will be subtracted and the image quality will be deteriorated.

As a countermeasure, in the specific example, the test chart 2 has a marker 40 for alignment. FIG. 10 is a schematic diagram showing a configuration in which the test chart 2 has a marker 40 for alignment. As shown in FIG. 10, in the specific example, the test chart 2 has a quadrangular shape, and alignment markers 40 are provided at the four corners of the quadrangle, respectively.

FIG. 11 is a diagram for explaining a reflection correction method according to a specific example of the first embodiment. In FIG. 11, from the top, a graph showing the time course of the light emitting amount of the test chart irradiation light emitting device 3, a graph showing the time passage of the light emitting amount of the subject irradiation light emitting device 1, and the light emitting amount of the test chart irradiation light emitting device 3. A graph showing the passage of time and the passage of light emission amount of the subject irradiation light emitting device 1 and the time passage, reflection data, and reflection mask data of the image obtained by the imaging of the imaging device 5 are shown. ..

First, the subject image correction unit 12 determines the test chart 2 based on the marker 40 of the test chart image obtained by the image pickup device 5 taking an image of the test chart 2 immediately before the reflection correction (immediately before the step ST42). (Position deviation detection in FIG. 11). Next, the subject image correction unit 12 aligns the reflection mask data based on the specified installation position of the test chart 2, and aligns the reflection from the subject image in which the reflection of the test chart 2 occurs. Subtract the performed reflection mask data (subtraction of the reflection mask data in FIG. 11). This makes it possible to reduce the influence of the deviation of the installation position of the test chart 2 on the reflection correction.

Hereinafter, a configuration in which the image pickup device failure diagnosis system 100 according to the first embodiment includes a plurality of test charts 2, a plurality of test chart irradiation light emitting devices 3, and a plurality of half mirrors 4 will be described with reference to the drawings. .. FIG. 12 is a schematic diagram for explaining a configuration in which the image pickup device failure diagnosis system 100 according to the first embodiment includes a plurality of test charts 2, a plurality of test chart irradiation light emitting devices 3, and a plurality of half mirrors 4. (The storage device 6 and the image pickup device failure diagnosis control unit 7 are not shown).

The configuration of the image pickup device failure diagnosis system 100 shown in FIG. 12B is the same as the configuration of the image pickup device failure diagnosis system 100 further including the specific wavelength cutoff device 30 in FIG. 7. The configuration of the image pickup device failure diagnosis system 100 shown in FIG. 12C is a configuration in which the light-shielding plate 53 is installed in the image pickup device 5 in the image pickup device failure diagnosis system 100 shown in FIG. 12B. The light-shielding plate 53 shown by C in FIG. 12 blocks light other than the first light transmitted through the half mirror 4 and the second light reflected by the half mirror 4. More specifically, for example, the shading plate 53 shown by C in FIG. 12 blocks the light emitted by the light emitting device 3 for irradiating the test chart, which did not pass through the test chart 2.

In the example of C in FIG. 12, due to the configuration of the light-shielding plate 53, the influence of light other than the first light transmitted through the half mirror 4 and the second light reflected by the half mirror 4 in the image pickup by the image pickup apparatus 5 is affected. It can be suppressed.

In each configuration of the image pickup device failure diagnosis system 100 shown by D, E, and F of FIG. 12, the image pickup device failure diagnosis system 100 includes a plurality of test charts 2, a plurality of test chart irradiation light emitting devices 3, and a plurality of half mirrors 4. It is a equipped configuration.

More specifically, in each of the examples D, E, and F of FIG. 12, the image pickup apparatus failure diagnosis system 100 further includes a test chart 50 different from the test chart 2. Further, the image pickup device failure diagnosis system 100 further includes another test chart irradiation light emitting device 51 that irradiates another test chart 50 with light. Further, in the image pickup device failure diagnosis system 100, the test chart irradiation light emitting device 3 emits light, one surface that transmits the second light that has passed through the test chart 2, and another test chart irradiation light emitting device 51 emits light. And further comprises another half mirror 52 having another surface, which reflects a third light that has passed through another test chart 50.

Further, the other surface of the half mirror 4 in each of the examples D, E, and F of FIG. 12 has a second light transmitted through another half mirror 52 and a third light reflected by another half mirror 52. Reflect each. Further, the image pickup apparatus 5 in each of the examples D, E, and F of FIG. 12 further takes an image of another test chart 50 by further receiving the third light reflected by the half mirror 4.

Further, the switching control unit 10 (not shown) in each of the examples D, E, and F of FIG. 12 has a first mode in which the subject irradiation light emitting device 1 irradiates the subject with light, and a test chart irradiation light emitting device. 3 controls switching between a second mode in which the test chart 2 is illuminated with light and a third mode in which another test chart irradiation light emitting device 51 irradiates another test chart 50 with light.

As shown by the examples of D, E, and F in FIG. 12, the arrangement of the combination of another test chart 50, another test chart irradiation light emitting device 51, and another half mirror is as described above. As long as it functions, it is not particularly limited.

Further, in each of the examples D, E, and F of FIG. 12, the image pickup device failure diagnosis system 100 is a set of a combination of another test chart 50, another test chart irradiation light emitting device 51, and another half mirror 52. I explained the configuration that only has. However, the image pickup apparatus failure diagnosis system 100 may include a plurality of combinations of another test chart 50, another test chart irradiation light emitting device 51, and another half mirror 52. In that case, the light emitting device for irradiating the test chart further irradiates the light emitting device for irradiating the test chart with the light emitting device 3 for irradiating the test chart, and the light emitting device for irradiating the test chart passes through the test chart 2. It has one surface that allows the second light to pass through, and another surface that the light emitting device for still another test chart emits and reflects further light that has passed through yet another test chart. Further, in that case, the half mirror 4 further reflects the additional light reflected by the further another half mirror. Further, in that case, the image pickup apparatus 5 further captures another test chart by further receiving the further light reflected by the half mirror 4. Further, in that case, the switching control unit 10 (not shown) switches from the further mode in which the light emitting device for irradiating the further another test chart irradiates the light to the further another test chart, or switches to the further mode. Further control.

According to the above configuration, it is possible to change the content of the image quality evaluation by appropriately using a plurality of types of test charts as each of the above test charts, and the optimum chart is used according to the items to be evaluated. Therefore, the performance of the diagnostic function can be improved.

In the configuration where the image pickup device failure diagnosis system 100 is provided with a plurality of light emitting devices as described above, it is conceivable that the light emitted by each light emitting device is reflected in the image sensor in a different optical path instead of the intended optical path. Be done. Therefore, the image pickup device failure diagnosis system 100 in each of the examples D, E, and F of FIG. 12 may further include the above-mentioned light-shielding plate 53. The configuration of the image pickup device failure diagnosis system 100 shown by G in FIG. 12 is such that the light-shielding plate 53 is installed in the image pickup device 5 in the image pickup device failure diagnosis system 100 shown by D in FIG. The configuration of the image pickup device failure diagnosis system 100 shown by H in FIG. 12 is such that the light-shielding plate 53 is installed in the image pickup device 5 in the image pickup device failure diagnosis system 100 shown by E in FIG.

The shading plate 53 shown by G and H in FIG. 12 blocks light other than the first light transmitted through the half mirror 4 and the second light and the third light reflected by the half mirror 4. More specifically, for example, the shading plate 53 shown by G and H in FIG. 12 blocks the light emitted by another test chart irradiation light emitting device 51 that did not pass through another test chart 50. When the image pickup device failure diagnosis system 100 includes a plurality of combinations of another test chart 50, another test chart irradiation light emitting device 51, and another half mirror 52, the image pickup device failure diagnosis system 100 blocks light. A light-shielding plate different from the plate 53 may be further provided. In that case, for example, the other light-shielding plate blocks the light emitted by the light-emitting device for irradiating another test chart, which has not passed through another test chart.
According to the above configuration, it is possible to suppress reflection on the subject image or the test chart image due to unintended light leakage.

Each function of the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup device failure diagnosis control unit 7 is realized by a processing circuit. That is, the image pickup apparatus failure diagnosis control unit 7 includes a processing circuit for executing the processing of each step shown in FIGS. 2, 3 and 4. This processing circuit may be dedicated hardware, or may be a CPU (Central Processing Unit) that executes a program stored in the memory.

FIG. 13A is a block diagram showing a hardware configuration that realizes the function of the image pickup device failure diagnosis control unit 7. FIG. 13B is a block diagram showing a hardware configuration for executing software that realizes the functions of the image pickup apparatus failure diagnosis control unit 7.

When the processing circuit is the processing circuit 101 of the dedicated hardware shown in FIG. 13A, the processing circuit 101 may be, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, or an ASIC (Application Specific Integrated Circuitd). Circuit), FPGA (Field-Programmable Gate Array) or a combination thereof is applicable.

The functions of the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup device failure diagnosis control unit 7 may be realized by separate processing circuits, or these functions may be combined into one processing circuit. It may be realized by.

When the processing circuit is the processor 102 shown in FIG. 13B, the functions of the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup apparatus failure diagnosis control unit 7 are software, firmware, or software and firmware. It is realized by the combination with.
The software or firmware is described as a program and stored in the memory 103.

The processor 102 realizes each function of the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup apparatus failure diagnosis control unit 7 by reading and executing the program stored in the memory 103. That is, the image pickup apparatus failure diagnosis control unit 7 stores a program in which the processing of each step shown in FIGS. 2, 3 and 4 is executed as a result when each of these functions is executed by the processor 102. A memory 103 for the purpose is provided.

These programs cause the computer to execute each procedure or method of the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup device failure diagnosis control unit 7. The memory 103 may be a computer-readable storage medium in which a program for causing the computer to function as the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup device failure diagnosis control unit 7 is stored. ..

The processor 102 corresponds to, for example, a CPU (Central Processing Unit), a processing device, a computing device, a processor, a microprocessor, a microcomputer, a DSP (Digital Signal Processor), or the like.

The memory 103 includes, for example, a RAM (Random Access Memory), a ROM (Read Only Memory), a flash memory, an EPROM (Erasable Programmable Read Only Memory), an EPROM (Electrically-Volatilizer), an EPROM (Electrically-EPROM), or the like. This includes hard disks, magnetic disks such as flexible disks, flexible disks, optical discs, compact disks, mini disks, CDs (Compact Disc), DVDs (Digital Versaille Disc), and the like.

Even if some of the functions of the switching control unit 10, the failure diagnosis unit 11, and the subject image correction unit 12 in the image pickup device failure diagnosis control unit 7 are realized by dedicated hardware, and some are realized by software or firmware. good.

For example, the function of the switching control unit 10 is realized by a processing circuit as dedicated hardware. The functions of the failure diagnosis unit 11 and the subject image correction unit 12 may be realized by the processor 102 reading and executing the program stored in the memory 103.
As described above, the processing circuit can realize each of the above functions by hardware, software, firmware, or a combination thereof.

As described above, the image pickup device failure diagnosis system 100 according to the first embodiment emits light to the subject irradiation light emitting device 1 that irradiates the subject with light, the test chart 2 for the image pickup device failure diagnosis, and the test chart 2. The test chart irradiation light emitting device 3 to be irradiated, the one surface of the subject irradiation light emitting device 1 that transmits the first light reflected by the subject, and the test chart irradiation light emitting device 3 are emitted. The subject was imaged by receiving the first light transmitted through the half mirror 4 and the half mirror 4 having the other surface that reflects the second light that passed through the test chart 2, and the half mirror 4 reflected the light. The image pickup device 5 that captures the test chart 2 by receiving the second light, the first mode in which the subject irradiation light emitting device 1 irradiates the subject with light, and the test chart irradiation light emitting device 3 is the test chart 2. A switching control unit 10 for controlling switching between the second mode and the second mode of irradiating light is provided.

According to the above configuration, by switching between the irradiation of the subject with light and the irradiation of the test chart 2 with light, the image of the subject and the image for failure diagnosis of the image pickup apparatus 5 are performed. You can switch. Therefore, it is possible to frequently take pictures for failure diagnosis of the image pickup apparatus 5.

Further, for example, in the above configuration, by capturing the test chart 2 at regular cycle intervals between the shooting of the subject, the shooting for failure diagnosis of the image pickup apparatus 5 is frequently performed without affecting the shooting of the subject. It can be carried out.

Also, for example, one of the sensors required for autonomous vehicles is an image sensor (CMOS or CCD, etc.). In order to establish automatic driving, the image sensor is required to perform high-precision imaging processing. Therefore, by adopting the above configuration, it is possible to frequently perform shooting for failure diagnosis of the image sensor, and it is possible to frequently perform failure diagnosis of the image sensor, so that the accuracy of the shooting process by the image sensor can be improved. It will also be possible to maintain.

The image pickup device failure diagnosis system 100 according to the first embodiment further includes a failure diagnosis unit 11 for diagnosing a failure of the image pickup device 5 based on a test chart image obtained by the image pickup device 5 taking an image of the test chart 2. I have.
According to the above configuration, the failure diagnosis of the image pickup apparatus 5 can be frequently performed for the above-mentioned reason.

The image pickup device failure diagnosis system 100 according to the first embodiment further includes a storage device 6 for storing the expected value of the test chart image, and the failure diagnosis unit 11 includes the test chart image and the expected value stored in the storage device 6. By comparing the above, the failure of the image pickup apparatus 5 is diagnosed.
According to the above configuration, the failure diagnosis of the image pickup apparatus 5 can be suitably performed by comparing the test chart image with the expected value.

In the image pickup apparatus failure diagnosis system 100 according to the first embodiment, a specific wavelength that transmits the first light and blocks light having a wavelength other than the wavelength of the first light in front of one surface of the half mirror 4. A blocking device 30 is installed.
According to the above configuration, it is possible to suppress the influence of light having a wavelength other than the wavelength of the first light in the shooting of the subject or the shooting of the test chart 2.

The image pickup device failure diagnosis system 100 according to the first embodiment further includes a subject image correction unit 12 that corrects the reflection of the test chart 2 in the subject image obtained by the image pickup device 5 taking an image of the subject. ..
According to the above configuration, the reflection of the test chart 2 in the subject image can be removed.

The test chart 2 in the image pickup apparatus failure diagnosis system 100 according to the first embodiment has a marker 40 for alignment.
According to the above configuration, in the reflection correction, by appropriately aligning the position based on the marker 40, it is possible to reduce the influence of the deviation of the installation position of the test chart 2 on the reflection correction.

The image pickup device failure diagnosis system 100 according to the first embodiment includes a test chart 50 different from the test chart 2, another test chart irradiation light emitting device 51 that irradiates another test chart 50 with light, and a test chart irradiation. A third surface from which the light emitting device 3 emits light and transmits a second light passing through the test chart 2, and another light emitting device 51 for test chart irradiation emits light and passes through another test chart 50. Further comprising another half mirror 52 having another surface that reflects light, the other surface of the half mirror 4 is a second light that has passed through another half mirror 52 and another half mirror 52. Each of the reflected third light is reflected, the image pickup apparatus 5 further receives the third light reflected by the half mirror 4, another test chart 50 is further imaged, and the switching control unit 10 is a subject. A first mode in which the light emitting device 1 for irradiation irradiates the subject with light, a second mode in which the light emitting device 3 for irradiating the test chart irradiates the test chart 2 with light, and another light emitting device 3 for irradiating the test chart. Controls switching between a third mode of illuminating another test chart 50 with light.

According to the above configuration, by appropriately using two types of test charts, it is possible to further switch to shooting for another failure diagnosis. Therefore, two types of failure diagnosis can be performed frequently.

In the image pickup device failure diagnosis system 100 according to the first embodiment, the image pickup device 5 is provided with light other than the first light transmitted through the half mirror 4 and the second light and the third light reflected by the half mirror 4. A light-shielding plate 53 is installed to block the light.
According to the above configuration, it is possible to suppress reflection on a subject image or a test chart image due to unintended light leakage.

The image pickup device failure diagnosis system 100 according to the first embodiment includes a plurality of combinations of another test chart 50, another test chart irradiation light emitting device 51, and another half mirror 52.
According to the above configuration, by appropriately using three or more types of test charts, it is possible to switch to shooting for three or more types of failure diagnosis. Therefore, it is possible to frequently perform three or more types of failure diagnosis.
It is possible to modify any component of the embodiment or omit any component of the embodiment.

The image pickup device failure diagnosis system according to the present disclosure can be used as a technique for diagnosing a failure of an image pickup device because it can frequently take pictures for failure diagnosis of the image pickup device.

1 Subject irradiation light emitting device, 2 Test chart, 3 Test chart irradiation light emitting device, 4 Half mirror, 5 Imaging device, 6 Storage device, 7 Imaging device failure diagnosis control unit, 10 Switching control unit, 11 Failure diagnosis unit, 12 Subject image correction unit, 20 lenses, 21 image sensor, 30 specific wavelength blocking device, 40 marker, 50 different test chart, 51 different test chart irradiation light emitting device, 52 different half mirror, 53 shading plate, 100 imaging device Failure diagnosis system, 101 processing circuit, 102 processor, 103 memory.

Claims

A light emitting device for subject irradiation that irradiates the subject with light,
A test chart for diagnostic imaging equipment failure and
A test chart irradiation light emitting device that irradiates the test chart with light,
One surface from which the subject irradiation light emitting device emits and transmits the first light reflected by the subject, and the second light emitted from the test chart irradiation light emitting device and passed through the test chart. The other side, which reflects, has a half mirror,
An imaging device that images the subject by receiving the first light transmitted through the half mirror and images the test chart by receiving the second light reflected by the half mirror.
Switching control for controlling switching between a first mode in which the subject irradiation light emitting device irradiates the subject with light and a second mode in which the test chart irradiation light emitting device irradiates the test chart with light. An image pickup device failure diagnosis system characterized by having a unit and a unit.
The first aspect of claim 1, wherein the image pickup apparatus further includes a failure diagnosis unit for diagnosing a failure of the image pickup apparatus based on a test chart image obtained by imaging the test chart. Imaging device failure diagnosis system.
Further equipped with a storage device for storing the expected value of the test chart image,
The image pickup device failure according to claim 2, wherein the failure diagnosis unit diagnoses the failure of the image pickup device by comparing the test chart image with the expected value stored in the storage device. Diagnostic system.
A specific wavelength blocking device that transmits the first light and blocks light having a wavelength other than the wavelength of the first light is installed in front of the one surface of the half mirror. The imaging device failure diagnosis system according to claim 1.
The image pickup apparatus according to claim 1, wherein the image pickup apparatus further includes a subject image correction unit for correcting the reflection of the test chart in the subject image obtained by imaging the subject. Failure diagnosis system.
The imaging device failure diagnosis system according to claim 5, wherein the test chart has a marker for alignment.
A test chart different from the test chart and
Another test chart irradiation light emitting device that irradiates the other test chart with light,
The test chart irradiation light emitting device emits one surface through which the second light passing through the test chart is transmitted, and the other test chart irradiation light emitting device emits and passes through the other test chart. Further comprising another half mirror, which has the other surface, which reflects a third light.
The other surface of the half mirror reflects the second light transmitted through the other half mirror and the third light reflected by the other half mirror, respectively.
The image pickup apparatus further images the other test chart by further receiving the third light reflected by the half mirror.
The switching control unit is divided into a first mode in which the subject irradiation light emitting device irradiates the subject with light, and a second mode in which the test chart irradiation light emitting device irradiates the test chart with light. The image pickup device failure diagnosis system according to claim 1, wherein the light emitting device for irradiating the test chart controls switching between the third mode and the light emitting device for irradiating the other test chart.
The image pickup device is characterized in that a light-shielding plate that blocks light other than the first light transmitted through the half mirror and the second light and the third light reflected by the half mirror is installed. The image pickup device failure diagnosis system according to claim 7.
The imaging device failure diagnosis system according to claim 8, further comprising a plurality of combinations of the other test chart, the light emitting device for irradiating the other test chart, and the other half mirror.