WO2018001374A1 - Heater-based method and apparatus for temperature control and optical module - Google Patents

Heater-based method and apparatus for temperature control and optical module Download PDF

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Publication number
WO2018001374A1
WO2018001374A1 PCT/CN2017/091293 CN2017091293W WO2018001374A1 WO 2018001374 A1 WO2018001374 A1 WO 2018001374A1 CN 2017091293 W CN2017091293 W CN 2017091293W WO 2018001374 A1 WO2018001374 A1 WO 2018001374A1
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Prior art keywords
temperature
awg
die
heater
die temperature
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PCT/CN2017/091293
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French (fr)
Chinese (zh)
Inventor
张亚静
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中兴通讯股份有限公司
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Publication of WO2018001374A1 publication Critical patent/WO2018001374A1/en

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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00Control of temperature
    • G05D23/19Control of temperature characterised by the use of electric means
    • G05D23/20Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • G05D23/24Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor

Definitions

  • the present disclosure relates to the field of optical communication technologies, for example, to a heater-based temperature control method and apparatus, and an optical module.
  • the optical module is mainly composed of a light receiving portion and a light transmitting portion, and further includes a Micro Controller Unit (MCU), a Field Programmable Gate Array (FPGA) control unit, and a power supply unit.
  • the light receiving side device is integrated with an Arrayed Waveguide Grating (AWG) to perform splitting processing on the 10 ⁇ 10 Gb/s combined optical signal, so that different wavelengths correspond to a unique channel center.
  • AWG Arrayed Waveguide Grating
  • the wavelengths of the corresponding channel centers of the AWG will vary with the temperature of the AWG. For every 1 degree Celsius change in temperature, the channel center of the AWG will drift by 11 pm.
  • this temperature drift is suppressed by an active temperature control system to ensure that the AWG's channel matches the International Telecommunication Union (ITU) standard.
  • ITU International Telecommunication Union
  • the temperature change of the AWG chip must be kept within ⁇ 0.5 °C, and the temperature control of the AWG is usually achieved by a heater control circuit.
  • the hardware circuit on the receiver side controls the temperature of the receiver through the heater, and the heater can heat the receiver but cannot cool.
  • the heater control circuit controls the heater to heat the electrode, reducing the heater current and reducing the AWG temperature; when the AWG temperature is lower than the design working temperature, the heater control circuit controls the heater to heat the electrode and increase The amount of heater current, the refrigerator heats the die, and the AWG temperature will rise, which will stabilize the operating temperature of the AWG.
  • the implementation of the heater hardware circuit function is accomplished by forming a negative feedback loop through the AWG component's thermistor (R th ), the semiconductor cooler, and the hardware control circuitry to stabilize multiple corresponding channel center wavelengths of the AWG.
  • FIG. 1 is a circuit diagram of the analog heater control loop in the related art according to the present disclosure, as shown in FIG. 1:
  • V set is the operating temperature of the AWG
  • V REF 2.5V
  • R 1 10K ⁇
  • V EE 3.3V
  • R H 5 ⁇
  • R 430 10K ⁇
  • C 323 1 ⁇ F
  • R 431 221K ⁇ .
  • Vset 0.5V
  • Th 1.25V
  • the temperature of the AWG will slowly lock to the temperature of the working point; continue to change the operating temperature of the AWG.
  • V set 0.3V
  • the drain voltage V D will appear to oscillate again, and the heater current is instantaneous. It becomes larger, but the temperature of the AWG is slowly locked to the temperature of the working point.
  • the heater current will become instantaneously large.
  • the embodiment provides a heater-based temperature control method and device, and an optical module, to solve the problem that the heater current is instantaneously increased when the temperature of the AWG is adjusted in the related art.
  • the embodiment provides a heater-based temperature control method, including:
  • the die temperature of the AWG is adjusted based on the temperature difference.
  • detecting a die temperature of the laser in the AWG includes: acquiring a voltage value of the thermistor in the AWG; converting the voltage value into a corresponding temperature value according to a preset correspondence between the voltage value and the temperature value Determining that the temperature value obtained by the conversion is the current die temperature.
  • adjusting the die temperature of the AWG according to the temperature difference comprises: generating a first voltage signal for controlling a voltage controlled current source in the AWG according to the temperature difference;
  • the die temperature is adjusted by heating control the die of the laser in accordance with the first voltage signal.
  • adjusting a die temperature of the AWG according to the temperature difference including:
  • the die temperature is adjusted based on the integration result.
  • adjusting the die temperature according to the integration result includes: generating a first voltage signal for controlling a voltage controlled current source in the AWG according to the integration result;
  • the die temperature is adjusted by heating control the die of the laser in accordance with the first voltage signal.
  • the method for heating and controlling the die of the laser according to the first voltage signal comprises: controlling a magnitude of a resistance of the thermistor in the AWG according to the first voltage signal, The die of the laser is heated for control.
  • the embodiment further provides an optical module, including: a light receiving device and a field programmable gate array FPGA control unit, the light receiving device includes an arrayed waveguide grating AWG, the optical module further includes: a heater control device, configured to The die temperature of the AWG is controlled by the FPGA control unit.
  • an optical module including: a light receiving device and a field programmable gate array FPGA control unit, the light receiving device includes an arrayed waveguide grating AWG, the optical module further includes: a heater control device, configured to The die temperature of the AWG is controlled by the FPGA control unit.
  • the heater control device further includes: a detecting device connected to the thermistor in the AWG, configured to detect a die temperature of the laser in the AWG; and a calculation circuit integrated in the FPGA control unit Connected to the detecting device, configured to calculate a temperature difference between the die temperature and the set temperature; and an adjustment circuit coupled to the calculation circuit, configured to adjust the tube of the AWG according to the temperature difference Core temperature.
  • a detecting device connected to the thermistor in the AWG, configured to detect a die temperature of the laser in the AWG
  • a calculation circuit integrated in the FPGA control unit Connected to the detecting device, configured to calculate a temperature difference between the die temperature and the set temperature
  • an adjustment circuit coupled to the calculation circuit, configured to adjust the tube of the AWG according to the temperature difference Core temperature.
  • the detecting device further comprises: a detecting circuit configured to detect an analog voltage signal of the thermistor in the AWG; an analog-to-digital converter ADC configured to convert the analog voltage signal into a digital voltage signal; and a processing unit And being configured to convert the digital voltage signal into a corresponding temperature value according to a correspondence between the voltage value and the temperature value.
  • the calculation circuit further includes: a calculation module configured to calculate a temperature difference between the die temperature and the set temperature; and a proportional integration module configured to perform proportional integration on the temperature difference to obtain an integration result .
  • the adjustment circuit further includes: a digital-to-analog converter connected to the proportional integration module, configured to convert the integration result into a corresponding analog signal; and an adjustment unit configured to be controlled according to the analog signal The magnitude of the resistance of the thermistor in the AWG.
  • the embodiment further provides a heater-based temperature control device, comprising: a detection module configured to detect a die temperature of a laser in the arrayed waveguide grating AWG; and a calculation module configured to calculate the die temperature and the set temperature a temperature difference between the electrodes; and an adjustment module configured to adjust a die temperature of the AWG based on the temperature difference.
  • a heater-based temperature control device comprising: a detection module configured to detect a die temperature of a laser in the arrayed waveguide grating AWG; and a calculation module configured to calculate the die temperature and the set temperature a temperature difference between the electrodes; and an adjustment module configured to adjust a die temperature of the AWG based on the temperature difference.
  • This embodiment also provides a storage medium.
  • the storage medium is arranged to store program code for performing the following steps:
  • the die temperature of the AWG is adjusted based on the temperature difference.
  • the embodiment further provides a computer readable storage medium storing computer executable instructions for performing any of the above methods.
  • the embodiment further provides an optical module device, the optical module device comprising one or more processors, a memory and one or more programs, the one or more programs being stored in the memory when being processed by one or more When the device is executed, perform any of the above methods.
  • the optical module device comprising one or more processors, a memory and one or more programs, the one or more programs being stored in the memory when being processed by one or more When the device is executed, perform any of the above methods.
  • the embodiment further provides a computer program product comprising a computer program stored on a non-transitory computer readable storage medium, the computer program comprising program instructions, when the program instructions are executed by a computer Having the computer perform any of the methods described above.
  • the temperature difference between the die temperature and the set temperature is calculated, and the die temperature of the AWG is adjusted according to the temperature difference, and the die temperature is
  • the working temperature of the AWG can be used to change the temperature of the die by using digital calculation and feedback. It can change the locking time with more flexibility. It can solve the problem that the heater current is easily increased when the temperature of the AWG is adjusted in the related art. The problem is flexible and convenient.
  • FIG. 1 is a circuit diagram of an analog heater control loop in accordance with the related art of the present disclosure
  • FIG. 2 is a flowchart of a heater-based temperature control method according to the present embodiment 1;
  • Figure 3 is a block diagram showing the structure of a heater-based temperature control device according to the second embodiment
  • FIG. 4 is a block diagram showing the structure of an optical module according to the second embodiment
  • Figure 5 is a block diagram of a heater modulus combining control loop according to the third embodiment
  • Figure 6 is a graph showing the relationship between voltage and temperature of the thermistor according to the third embodiment.
  • Figure 7 is a graph showing the relationship between power and temperature according to the present embodiment 3.
  • Figure 8 is a block diagram of a heater digital control according to the present embodiment 3.
  • Figure 9 is a block diagram of a heater simulation control according to the present embodiment 3.
  • Figure 10 is a block diagram showing the control of the AWG heater in the 100G module according to the third embodiment.
  • FIG. 11 is a schematic diagram showing the hardware structure of an optical module device according to Embodiment 3.
  • FIG. 2 is a flowchart of a heater-based temperature control method according to the present embodiment. As shown in FIG. 2, the flow may include S202-S206. .
  • the die temperature of the AWG is adjusted according to the temperature difference.
  • the die temperature is the operating temperature of the AWG
  • the execution body of the above steps may be a temperature control device of a heater, such as a heater control device of an AWG, etc., but is not limited thereto.
  • the die temperature of the AWG is adjusted according to the temperature difference, including S12-S14.
  • the die temperature is adjusted by heating the die of the laser according to the first voltage signal.
  • detecting the die temperature of the laser in the AWG includes S22-S26.
  • the voltage value is converted into a corresponding temperature value according to a preset correspondence between the voltage value and the temperature value.
  • adjusting the die temperature of the AWG based on the temperature difference includes S32-S34.
  • the die temperature is adjusted in accordance with the integration result.
  • the integration result can be given to a digital to analog converter (DAC) or the integration result can be given to the open module before being given to the DAC.
  • DAC digital to analog converter
  • adjusting the die temperature based on the integration result includes S42-S44.
  • a first voltage signal for controlling the voltage controlled current source in the AWG is generated based on the integration result.
  • the integration result is converted by the DAC into the above first voltage signal.
  • the die temperature is adjusted by heating the die of the laser according to the first voltage signal.
  • the method of heating and controlling the die of the laser according to the first voltage signal comprises: controlling the magnitude of the resistance of the thermistor in the AWG according to the first voltage signal to perform heating control on the die of the laser.
  • the manner of heating control of the dies of the laser according to the first voltage signal comprises: The magnitude of the resistance of the thermistor in the AWG is controlled according to the first voltage signal to heat the die of the laser.
  • the method of the foregoing embodiment may be implemented by means of software and a general hardware platform, or may be implemented by hardware.
  • the method provided in this embodiment may be embodied in the form of a computer software product, which may be stored in a storage medium (such as a ROM/RAM, a magnetic disk, an optical disk), and includes a plurality of instructions for causing a terminal device ( Any method of this embodiment can be performed by a mobile phone, a computer, a server, or a network device.
  • a heater-based temperature control device and a physical device optical module are provided, and the method provided by the above implementation may be performed, and the description has been omitted.
  • the device may include:
  • the detection module 30 is configured to detect the die temperature of the laser in the arrayed waveguide grating AWG.
  • a calculation module 32 is provided to calculate a temperature difference between the die temperature and the set temperature.
  • the adjustment module 34 is configured to adjust the die temperature of the AWG based on the temperature difference.
  • the optical module is a physical device provided by the embodiment, and the heater control device can be applied to the optical module, and the heater control device can be applied to other devices.
  • the optical module is taken as an example here, and other devices are also applicable.
  • the optical module may include: a light receiving device 40 and a field programmable gate array FPGA control unit 42.
  • the light receiving device 40 may include an arrayed waveguide grating AWG 402, and the optical module may further include: a heater control device 44. Set to control the die temperature of the AWG through the FPGA control unit.
  • the heater control device 44 further includes: a detecting device connected to the thermistor in the AWG Connected, set to detect the die temperature of the laser in the AWG; the calculation circuit is integrated in the FPGA control unit, connected to the detecting device, set to calculate the temperature difference between the die temperature and the set temperature; the adjustment circuit, and the calculation circuit Connect, set to adjust the die temperature of the AWG based on the temperature difference.
  • the detecting device further includes: a detecting circuit configured to detect an analog voltage signal of the thermistor in the AWG; and an analog to digital converter (ADC) configured to convert the analog voltage signal into a digital voltage signal;
  • the processing unit is configured to convert the digital voltage signal into a corresponding temperature value according to a preset correspondence between the voltage value and the temperature value, and determine the temperature value as the die temperature.
  • the calculation circuit further includes: a calculation module configured to calculate a temperature difference between the die temperature and the set temperature; and a proportional integration module configured to perform proportional integration on the temperature difference to obtain an integration result.
  • the adjusting circuit further comprises: a digital-to-analog converter connected to the proportional-integral module, configured to convert the integrated result into a corresponding analog signal; and an adjusting unit configured to control the resistance of the thermistor in the AWG according to the analog signal. size.
  • Each of the above modules may be implemented by software or hardware.
  • the above modules may be disposed in the same processor, or may be respectively disposed in different processors in any combination.
  • the embodiment provides a dynamic adjustable heater current control device, which can change the lock time by modifying the parameter setting, and solve the problem that the instantaneous heater current becomes large, so as to meet the working temperature requirement of the AWG in different receiver devices.
  • the digital feedback can eliminate the instantaneous heater current and can flexibly change the locking time.
  • the system has the characteristics of flexibility, convenience and practicality.
  • FIG. 5 is a block diagram of a heater modulus combined control loop according to the present embodiment, as shown in FIG. 5:
  • the workflow of the heater current control algorithm is as follows:
  • the voltage value V th of the thermistor is collected by the ADC, and the voltage value of the thermistor is converted into a corresponding temperature value T H according to the following formula (1):
  • T 0 25 ° C, representing the reference temperature
  • FIG. 6 is a graph showing the relationship between the voltage and the temperature of the thermistor according to the present embodiment, which is based on data obtained by a plurality of tests, as can be seen from FIG.
  • the converted temperature value becomes larger; when the voltage of the thermistor becomes larger, the converted temperature value becomes smaller; since the formula for converting the voltage into temperature is complicated, a lookup table can be used. To determine the temperature value obtained by voltage conversion.
  • the converted temperature value T H is subtracted from the set operating temperature T set to obtain a temperature difference T err , and the result T err is proportionally integrated to obtain an integration result X, which is combined with FIG. 6 , the heater power P H
  • the calculation formula is as shown in formula (2):
  • I H is the current of the heater
  • R H is the resistance of the heater
  • R 2 is the second resistance
  • Fig. 7 is a graph showing the relationship between power and temperature according to the present embodiment. As shown in Fig. 7, the power of the heater is proportional to the temperature of the heater.
  • the data output from the DAC becomes larger, the power of the heater becomes larger, and the temperature of the heater rises.
  • the temperature of the thermistor senses the heater, and the resistance of the thermistor becomes smaller.
  • the voltage of the thermistor also becomes smaller; when the data output from the DAC becomes smaller, the power of the heater becomes smaller, then the temperature of the heater decreases, the temperature of the thermistor senses the temperature of the heater, and the resistance of the thermistor changes. Large, the voltage of the thermistor also becomes larger.
  • the digital portion includes the following process:
  • Figure 8 is a block diagram of the heater digital control according to the present embodiment, the functional block diagram of the digital portion of the heater control loop is as shown in Figure 8:
  • 101 is an ADC chip, performs data acquisition, and converts the analog voltage signal into a digital signal as input data of the heater control loop
  • 102 is an implementation module of the lookup table, which converts the input voltage Vth into temperature T. TH; temperature 103 converts the temperature value T th AWG set operating point T set values taking the difference T err; 104 results difference T err performs a proportional integral; 105 sum the integration result to the external DAC chip.
  • Step 1 Set the working temperature value T set of the AWG and the proportional coefficient ki, kp of the proportional integral;
  • the step size of the proportional integral is variable.
  • Step two through the ADC acquisition chip, the input analog voltage is converted into a digital voltage Vth;
  • Step 3 According to the ROM lookup table, find the corresponding temperature value by inputting the voltage value.
  • the use of FPGA resources needs to be considered when making the voltage conversion temperature into a ROM lookup table according to formula (1).
  • the ADC is a 16-bit precision chip, the ADC range is 0 to 65535, and the operating temperature of the AWG is mostly around 75 °C, which can reduce the addressing range of the lookup table, such as between 65 ° C and 85 ° C.
  • a fixed temperature value can be output.
  • Step 4 Take the difference between the result of the lookup table and the set temperature value T set .
  • the difference is positive, it means that it is higher than the set temperature T set and needs to be cooled.
  • the difference is negative, it means that it is lower than the set temperature T set and needs to be warmed up.
  • the result Terr is integrated into the proportional integration module, and the result of the integration is output to the DAC for subsequent processing.
  • the implementation of the analog portion includes the following:
  • FIG. 9 is a block diagram of a heater analog control according to the present embodiment, which converts an input voltage value into a current.
  • the current I d becomes large, the heater power becomes large, and the heater temperature increases, and the thermistor senses.
  • the temperature of the heater, the resistance of the thermistor is reduced, and the voltage of the thermistor is also reduced;
  • the current I d becomes smaller, the power of the heater becomes smaller, and the temperature of the heater decreases, and the temperature of the thermistor senses the heater.
  • the resistance of the thermistor increases, and the voltage of the thermistor also increases.
  • the voltage of the thermistor is obtained according to the following formula (3):
  • R th is the resistance of the thermistor.
  • first resistor R 1 10K ⁇
  • R 2 10k ⁇
  • V CC 2.5V
  • R H 5 ⁇
  • V REF 2.5V.
  • FIG. 10 is a block diagram of the AWG heater control in the 100G module according to the embodiment, including: an analog control circuit and a digital feedback part, which together constitute a control circuit of the AWG heater current, as shown in FIG. Shown.
  • each optical receiver component Receiveiver Optical Subassembly, ROSA
  • the own grid, the 100Gb / s optical signal sent from the receiving end, is divided into 10 parallel 10Gb / s optical signals by the AWG.
  • the thermistor is used to detect the change of the die temperature of the AWG laser. When the temperature rises, the resistance of the thermistor becomes smaller, and the voltage of the thermistor becomes smaller. The change of the voltage is collected by the ADC. After converting the voltage into temperature, the corresponding difference is obtained by comparing with the set temperature value, and the difference of the output is integrated to generate a voltage signal for controlling the voltage control current source of the heater.
  • the heater heats the die of the laser according to the magnitude of the current flowing in, thereby controlling the temperature of the receiver, so that the heater control circuit is a negative feedback temperature control loop, which can achieve temperature stability of the receiver.
  • This embodiment provides a storage medium.
  • the foregoing storage medium may be configured to store program code for performing the following steps:
  • the die temperature of the AWG is adjusted according to the temperature difference.
  • the foregoing storage medium may include, but not limited to, a USB flash drive, a Read-Only Memory (ROM), a Random Access Memory (RAM), a mobile hard disk, and a magnetic memory.
  • ROM Read-Only Memory
  • RAM Random Access Memory
  • a mobile hard disk e.g., a hard disk
  • magnetic memory e.g., a hard disk
  • the processor performs, according to the stored program code in the storage medium, detecting a die temperature of the laser in the arrayed waveguide grating AWG;
  • the processor performs a calculation of a temperature difference between the die temperature and the set temperature according to the stored program code in the storage medium;
  • the processor performs to adjust the die temperature of the AWG according to the temperature difference according to the stored program code in the storage medium.
  • FIG. 11 is a schematic diagram of a hardware structure of an optical module device according to the embodiment.
  • the optical module device may include one or more processes in addition to the components of the optical module provided in the foregoing embodiment.
  • the processor 510, the memory 520, the input device 530, and the output device 540 are exemplified by a processor 510 in FIG.
  • the processor 510, the memory 520, the input device 530, and the output device 540 in the optical module device may be connected by a bus or other manner, and the connection through the bus is taken as an example in FIG.
  • the input device 530 can receive input numeric or character information
  • the output device 540 can include a display device such as a display screen.
  • the memory 520 is a computer readable storage medium that can be used to store software programs, computer executable programs, and modules.
  • the processor 510 executes various functional applications and data processing by executing software programs, instructions, and modules stored in the memory 520 to implement any of the above embodiments.
  • the memory 520 may include a storage program area and an storage data area, wherein the storage program area may store an operating system, an application required for at least one function; the storage data area may store data created according to usage of the optical module device, and the like.
  • the memory may include volatile memory such as random access memory (RAM), and may also include non-volatile memory such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device.
  • Memory 520 can be a non-transitory computer storage medium or a transitory computer storage medium.
  • the non-transitory computer storage medium such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device.
  • memory 520 can optionally include memory remotely located relative to processor 510, which can be connected to the optical module device over a network. Examples of the above networks may include the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.
  • Input device 530 can be configured to receive input digital or character information and to generate key signal inputs related to user settings and function control of the optical module device.
  • the output device 540 can include a display device such as a display screen.
  • a person skilled in the art can understand that all or part of the process of implementing the above embodiment method can be completed by executing related hardware by a computer program, and the program can be stored in a non-transitory computer readable storage medium.
  • the program when executed, may include the flow of an embodiment of the method as described above, wherein the non-transitory computer readable storage medium may be a magnetic disk, an optical disk, a read only memory (ROM), or a random access memory (RAM). Wait.
  • a heater-based temperature control method and device, and an optical module can change the locking time more flexibly, and solve the problem that the heater current is instantaneously enlarged when adjusting the die temperature of the AWG in the related art, and is flexible and convenient. The effect of using.

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
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  • Semiconductor Lasers (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)

Abstract

A heater-based method and apparatus for temperature control and an optical module. The heater-based temperature control method comprises: detecting the die temperature of a laser in an array waveguide grating (AWG) (S202); calculating the temperature difference between the die temperature and a set temperature (S204); and adjusting the die temperature of the AWG on the basis of the temperature difference (S206). The heater-based method for temperature control solves the problem of a heater being prone to an instantaneous current spike when adjusting the die temperature of the AWG.

Description

基于加热器的温度控制方法及装置、光模块Heater-based temperature control method and device, optical module 技术领域Technical field
本公开涉及光通信技术领域,例如涉及一种基于加热器的温度控制方法及装置、光模块。The present disclosure relates to the field of optical communication technologies, for example, to a heater-based temperature control method and apparatus, and an optical module.
背景技术Background technique
相关技术中,光模块主要由光接收部分和光发送部分组成,此外还包括微控制单元(Micro Controller Unit,MCU)、现场可编程门阵列(Field Programmable Gate Array,FPGA)控制单元和电源单元。其中光接收侧器件集成有阵列波导光栅(Arrayed Waveguide Grating,AWG),实现对10×10Gb/s的合波光信号进行分光处理,使不同的波长对应唯一的信道中心。对于AWG而言,由于玻璃材料反射系数的原因,AWG的多个相应信道中心的波长会随着AWG温度的不同有所变化,温度每变化1摄氏度,AWG的信道中心将会漂移11pm。在标准的AWG中,这种温漂是靠有源温度控制系统来抑制的,以保证AWG的信道与国际电信同盟(International Telecommunication Union,ITU)标准相符。为了不影响系统的性能,AWG芯片的温度变化必须保持在±0.5℃之内,通常通过加热器(heater)控制电路实现对AWG的温度控制。In the related art, the optical module is mainly composed of a light receiving portion and a light transmitting portion, and further includes a Micro Controller Unit (MCU), a Field Programmable Gate Array (FPGA) control unit, and a power supply unit. The light receiving side device is integrated with an Arrayed Waveguide Grating (AWG) to perform splitting processing on the 10×10 Gb/s combined optical signal, so that different wavelengths correspond to a unique channel center. For the AWG, due to the reflection coefficient of the glass material, the wavelengths of the corresponding channel centers of the AWG will vary with the temperature of the AWG. For every 1 degree Celsius change in temperature, the channel center of the AWG will drift by 11 pm. In a standard AWG, this temperature drift is suppressed by an active temperature control system to ensure that the AWG's channel matches the International Telecommunication Union (ITU) standard. In order not to affect the performance of the system, the temperature change of the AWG chip must be kept within ±0.5 °C, and the temperature control of the AWG is usually achieved by a heater control circuit.
接收机侧的硬件电路通过heater来控制接收机的温度,heater能够对接收机进行加热,但不能制冷。当AWG温度高于设定工作温度时,heater控制电路控制heater加热电极,减少heater电流的大小,使AWG温度降低;当AWG温度低于设计工作温度时,heater控制电路控制heater加热电极,增大heater电流的大小,致冷器对管芯加热,AWG温度将升高,从而使AWG的工作温度趋于稳 定。heater硬件电路功能的实现是通过AWG组件内热敏电阻(Rth)、半导体致冷器和硬件控制电路形成负反馈环路来完成,从而稳定AWG的多个相应信道中心波长。The hardware circuit on the receiver side controls the temperature of the receiver through the heater, and the heater can heat the receiver but cannot cool. When the AWG temperature is higher than the set working temperature, the heater control circuit controls the heater to heat the electrode, reducing the heater current and reducing the AWG temperature; when the AWG temperature is lower than the design working temperature, the heater control circuit controls the heater to heat the electrode and increase The amount of heater current, the refrigerator heats the die, and the AWG temperature will rise, which will stabilize the operating temperature of the AWG. The implementation of the heater hardware circuit function is accomplished by forming a negative feedback loop through the AWG component's thermistor (R th ), the semiconductor cooler, and the hardware control circuitry to stabilize multiple corresponding channel center wavelengths of the AWG.
相关技术中接收机侧的heater控制电路设计方案中只有模拟电路,图1是根据本公开的相关技术中的模拟heater控制环电路图,如图1所示:In the related art, only the analog circuit is included in the design of the heater control circuit on the receiver side, and FIG. 1 is a circuit diagram of the analog heater control loop in the related art according to the present disclosure, as shown in FIG. 1:
其中:Vset是AWG的工作温度,VREF=2.5V、R1=10KΩ、VEE=3.3V、RH=5Ω、R430=10KΩ、C323=1μF和R431=221KΩ。Where: V set is the operating temperature of the AWG, V REF = 2.5V, R 1 = 10KΩ, V EE = 3.3V, R H = 5Ω, R 430 = 10KΩ, C 323 = 1μF and R 431 = 221KΩ.
为了测试控制环的稳定性,需要不断的改变AWG的工作温度Vset,当设置Vset=0.5V时,在漏极电压VD上有震荡,瞬间产生一个大的heater电流,此时调整Vth=1.25V,AWG的温度会慢慢锁定到工作点的温度;继续对AWG的工作温度进行改变,当设置Vset=0.3V时,漏极电压VD上又出现震荡,heater电流还是瞬间变大,但AWG的温度慢慢地还会锁定到工作点的温度,在改变AWG的工作温度时,heater电流就会出现瞬间变大的现象。In order to test the stability of the control loop, it is necessary to constantly change the operating temperature Vset of the AWG. When Vset = 0.5V is set , there is oscillation on the drain voltage V D to instantaneously generate a large heater current. Th = 1.25V, the temperature of the AWG will slowly lock to the temperature of the working point; continue to change the operating temperature of the AWG. When V set = 0.3V is set , the drain voltage V D will appear to oscillate again, and the heater current is instantaneous. It becomes larger, but the temperature of the AWG is slowly locked to the temperature of the working point. When the operating temperature of the AWG is changed, the heater current will become instantaneously large.
由此可以得出:瞬间产生一个大的heater电流是硬件电路设计缺陷所导致,接收侧heater控制电路的响应随着接收侧AWG温度的改变而变化,并且只能通过调整heater控制电路中电阻和电容值的大小来实现对锁定时间的改变,造成heater控制电路的可移植性差,控制不精准等等问题。It can be concluded that the instantaneous generation of a large heater current is caused by a defect in the hardware circuit design. The response of the receiver side heater control circuit changes with the temperature of the receiving side AWG, and can only be adjusted by adjusting the resistance of the heater control circuit. The size of the capacitor is used to change the lock time, resulting in poor portability of the heater control circuit, inaccurate control, and the like.
针对相关技术中存在的上述问题,目前尚未发现有效的解决方案。In view of the above problems in the related art, no effective solution has been found yet.
发明内容Summary of the invention
本实施例提供了一种基于加热器的温度控制方法及装置、光模块,以解决相关技术中在调整AWG的管芯温度时容易导致加热器电流瞬间变大的问题。The embodiment provides a heater-based temperature control method and device, and an optical module, to solve the problem that the heater current is instantaneously increased when the temperature of the AWG is adjusted in the related art.
本实施例提供了一种基于加热器的温度控制方法,包括: The embodiment provides a heater-based temperature control method, including:
检测阵列波导光栅AWG中激光器的管芯温度;Detecting a die temperature of a laser in an arrayed waveguide grating AWG;
计算所述管芯温度和设定温度之间的温度差;以及Calculating a temperature difference between the die temperature and a set temperature;
根据所述温度差调整所述AWG的管芯温度。The die temperature of the AWG is adjusted based on the temperature difference.
可选地,检测AWG中激光器的管芯温度包括:获取所述AWG中热敏电阻的电压值;依据电压值与温度值之间的预设对应关系将所述电压值转换为对应的温度值;确定转换得到的所述温度值为当前的管芯温度。Optionally, detecting a die temperature of the laser in the AWG includes: acquiring a voltage value of the thermistor in the AWG; converting the voltage value into a corresponding temperature value according to a preset correspondence between the voltage value and the temperature value Determining that the temperature value obtained by the conversion is the current die temperature.
可选地,根据所述温度差调整所述AWG的管芯温度包括:根据所述温度差生成用于控制所述AWG中的压控电流源的第一电压信号;以及Optionally, adjusting the die temperature of the AWG according to the temperature difference comprises: generating a first voltage signal for controlling a voltage controlled current source in the AWG according to the temperature difference;
通过根据所述第一电压信号对所述激光器的管芯进行加热控制的方式,调整所述管芯温度。The die temperature is adjusted by heating control the die of the laser in accordance with the first voltage signal.
可选地,根据所述温度差调整所述AWG的管芯温度,包括:Optionally, adjusting a die temperature of the AWG according to the temperature difference, including:
对所述温度差进行比例积分得到积分结果;以及Proportional integration of the temperature difference to obtain an integration result;
根据所述积分结果调整所述管芯温度。The die temperature is adjusted based on the integration result.
可选地,根据所述积分结果调整所述管芯温度包括:根据所述积分结果生成用于控制所述AWG中的压控电流源的第一电压信号;以及Optionally, adjusting the die temperature according to the integration result includes: generating a first voltage signal for controlling a voltage controlled current source in the AWG according to the integration result;
通过根据所述第一电压信号对所述激光器的管芯进行加热控制的方式,调整所述管芯温度。The die temperature is adjusted by heating control the die of the laser in accordance with the first voltage signal.
可选地,根据所述第一电压信号对所述激光器的管芯进行加热控制的方式包括:根据所述第一电压信号控制所述AWG中热敏电阻的阻值的大小,来对所述激光器的管芯进行加热控制。Optionally, the method for heating and controlling the die of the laser according to the first voltage signal comprises: controlling a magnitude of a resistance of the thermistor in the AWG according to the first voltage signal, The die of the laser is heated for control.
本实施例还提供了一种光模块,包括:光接收器件和现场可编程门阵列FPGA控制单元,所述光接收器件包括阵列波导光栅AWG,所述光模块还包括:heater控制装置,设置为通过所述FPGA控制单元来控制所述AWG的管芯温度。 The embodiment further provides an optical module, including: a light receiving device and a field programmable gate array FPGA control unit, the light receiving device includes an arrayed waveguide grating AWG, the optical module further includes: a heater control device, configured to The die temperature of the AWG is controlled by the FPGA control unit.
可选地,所述heater控制装置还包括:检测器件,与所述AWG中的热敏电阻连接,设置为检测所述AWG中激光器的管芯温度;计算电路,集成在所述FPGA控制单元中,与所述检测器件连接,设置为计算所述管芯温度和设定温度之间的温度差;以及调整电路,与所述计算电路连接,设置为根据所述温度差调整所述AWG的管芯温度。Optionally, the heater control device further includes: a detecting device connected to the thermistor in the AWG, configured to detect a die temperature of the laser in the AWG; and a calculation circuit integrated in the FPGA control unit Connected to the detecting device, configured to calculate a temperature difference between the die temperature and the set temperature; and an adjustment circuit coupled to the calculation circuit, configured to adjust the tube of the AWG according to the temperature difference Core temperature.
可选地,检测器件还包括:检测电路,设置为检测所述AWG中热敏电阻的模拟电压信号;模数转换器ADC,设置为将所述模拟电压信号转换为数字电压信号;以及处理单元,设置为依据电压值与温度值之间的对应关系将所述数字电压信号转换为对应的温度值。Optionally, the detecting device further comprises: a detecting circuit configured to detect an analog voltage signal of the thermistor in the AWG; an analog-to-digital converter ADC configured to convert the analog voltage signal into a digital voltage signal; and a processing unit And being configured to convert the digital voltage signal into a corresponding temperature value according to a correspondence between the voltage value and the temperature value.
可选地,所述计算电路还包括:计算模块,设置为计算所述管芯温度和设定温度之间的温度差;以及比例积分模块,设置为对所述温度差进行比例积分得到积分结果。Optionally, the calculation circuit further includes: a calculation module configured to calculate a temperature difference between the die temperature and the set temperature; and a proportional integration module configured to perform proportional integration on the temperature difference to obtain an integration result .
可选地,所述调整电路还包括:数模转换器,与所述比例积分模块连接,设置为将所述积分结果转换为对应的模拟信号;以及调整单元,设置为根据所述模拟信号控制所述AWG中热敏电阻的阻值的大小。Optionally, the adjustment circuit further includes: a digital-to-analog converter connected to the proportional integration module, configured to convert the integration result into a corresponding analog signal; and an adjustment unit configured to be controlled according to the analog signal The magnitude of the resistance of the thermistor in the AWG.
本实施例还提供了一种基于加热器的温度控制装置,包括:检测模块,设置为检测阵列波导光栅AWG中激光器的管芯温度;计算模块,设置为计算所述管芯温度和设定温度之间的温度差;以及调整模块,设置为根据所述温度差调整所述AWG的管芯温度。The embodiment further provides a heater-based temperature control device, comprising: a detection module configured to detect a die temperature of a laser in the arrayed waveguide grating AWG; and a calculation module configured to calculate the die temperature and the set temperature a temperature difference between the electrodes; and an adjustment module configured to adjust a die temperature of the AWG based on the temperature difference.
本实施例还提供了一种存储介质。该存储介质设置为存储用于执行以下步骤的程序代码:This embodiment also provides a storage medium. The storage medium is arranged to store program code for performing the following steps:
检测阵列波导光栅AWG中激光器的管芯温度;Detecting a die temperature of a laser in an arrayed waveguide grating AWG;
计算所述管芯温度和设定温度之间的温度差;以及 Calculating a temperature difference between the die temperature and a set temperature;
根据所述温度差调整所述AWG的管芯温度。The die temperature of the AWG is adjusted based on the temperature difference.
本实施例还提供一种计算机可读存储介质,存储有计算机可执行指令,所述计算机可执行指令用于执行上述任意一种方法。The embodiment further provides a computer readable storage medium storing computer executable instructions for performing any of the above methods.
本实施例还提供一种光模块设备,该光模块设备包括一个或多个处理器、存储器以及一个或多个程序,所述一个或多个程序存储在存储器中,当被一个或多个处理器执行时,执行上述任意一种方法。The embodiment further provides an optical module device, the optical module device comprising one or more processors, a memory and one or more programs, the one or more programs being stored in the memory when being processed by one or more When the device is executed, perform any of the above methods.
本实施例还提供了一种计算机程序产品,所述计算机程序产品包括存储在非暂态计算机可读存储介质上的计算机程序,所述计算机程序包括程序指令,当所述程序指令被计算机执行时,使所述计算机执行上述任意一种方法。The embodiment further provides a computer program product comprising a computer program stored on a non-transitory computer readable storage medium, the computer program comprising program instructions, when the program instructions are executed by a computer Having the computer perform any of the methods described above.
本实施例通过检测阵列波导光栅AWG中激光器的管芯温度,计算所述管芯温度和设定温度之间的温度差,根据所述温度差调整所述AWG的管芯温度,管芯温度是AWG的工作温度,通过使用数字计算并反馈调整管芯温度的方式,,可以较灵活性来改变锁定时间,可以解决相关技术中在调整AWG的管芯温度时容易导致加热器电流瞬间变大的问题,具有灵活方便的使用效果。In this embodiment, by detecting the die temperature of the laser in the arrayed waveguide grating AWG, the temperature difference between the die temperature and the set temperature is calculated, and the die temperature of the AWG is adjusted according to the temperature difference, and the die temperature is The working temperature of the AWG can be used to change the temperature of the die by using digital calculation and feedback. It can change the locking time with more flexibility. It can solve the problem that the heater current is easily increased when the temperature of the AWG is adjusted in the related art. The problem is flexible and convenient.
附图说明DRAWINGS
图1是根据本公开相关技术中的模拟heater控制环电路图;1 is a circuit diagram of an analog heater control loop in accordance with the related art of the present disclosure;
图2是根据本实施例1的基于加热器的温度控制方法的流程图;2 is a flowchart of a heater-based temperature control method according to the present embodiment 1;
图3是根据本实施例2的基于加热器的温度控制装置的结构框图;Figure 3 is a block diagram showing the structure of a heater-based temperature control device according to the second embodiment;
图4是根据本实施例2的光模块的结构框图;4 is a block diagram showing the structure of an optical module according to the second embodiment;
图5是根据本实施例3的heater模数结合控制环框图;Figure 5 is a block diagram of a heater modulus combining control loop according to the third embodiment;
图6是根据本实施例3的热敏电阻的电压与温度的关系图;Figure 6 is a graph showing the relationship between voltage and temperature of the thermistor according to the third embodiment;
图7是根据本实施例3的功率和温度的关系图; Figure 7 is a graph showing the relationship between power and temperature according to the present embodiment 3;
图8是根据本实施例3的heater数字控制框图;Figure 8 is a block diagram of a heater digital control according to the present embodiment 3;
图9是根据本实施例3的heater模拟控制框图;Figure 9 is a block diagram of a heater simulation control according to the present embodiment 3;
图10是根据本实施例3的100G模块中AWG heater控制框图;Figure 10 is a block diagram showing the control of the AWG heater in the 100G module according to the third embodiment;
图11是根据本实施例3提供的一种光模块设备的硬件结构示意图。FIG. 11 is a schematic diagram showing the hardware structure of an optical module device according to Embodiment 3.
具体实施方式detailed description
本公开的说明书和权利要求书及上述附图中的术语“第一”、“第二”等是用于区别类似的对象,而不必用于描述特定的顺序或先后次序。The terms "first", "second" and the like in the specification and claims of the present disclosure and the above-mentioned figures are used to distinguish similar objects, and are not necessarily used to describe a particular order or order.
实施例1Example 1
在本实施例中,提供了一种基于加热器的温度控制方法,图2是根据本实施例的基于加热器的温度控制方法的流程图,如图2所示,该流程可以包括S202-S206。In the present embodiment, a heater-based temperature control method is provided, and FIG. 2 is a flowchart of a heater-based temperature control method according to the present embodiment. As shown in FIG. 2, the flow may include S202-S206. .
在S202中,检测阵列波导光栅AWG中激光器的管芯温度。In S202, the die temperature of the laser in the arrayed waveguide grating AWG is detected.
在S204中,计算管芯温度和设定温度之间的温度差。In S204, a temperature difference between the die temperature and the set temperature is calculated.
在S206中,根据温度差调整AWG的管芯温度。In S206, the die temperature of the AWG is adjusted according to the temperature difference.
通过上述步骤,检测阵列波导光栅AWG中激光器的管芯温度,计算管芯温度和设定温度之间的温度差,并根据温度差调整AWG的管芯温度,管芯温度是AWG的工作温度,通过使用数字计算并反馈调整管芯温度的方式,来较灵活地改变锁定时间,解决相关技术中的在调整AWG的管芯温度时容易导致加热器电流瞬间变大的问题,具有灵活方便的使用效果。Through the above steps, detecting the die temperature of the laser in the arrayed waveguide grating AWG, calculating the temperature difference between the die temperature and the set temperature, and adjusting the die temperature of the AWG according to the temperature difference, the die temperature is the operating temperature of the AWG, By using the digital calculation and feedback to adjust the temperature of the die, the locking time can be changed flexibly, and the problem that the heater current is instantaneously increased when adjusting the die temperature of the AWG in the related art is solved, and the utility model has the advantages of flexible and convenient use. effect.
可选地,上述步骤的执行主体可以为heater的温度控制装置,如AWG的加热器控制装置等,但不限于此。Alternatively, the execution body of the above steps may be a temperature control device of a heater, such as a heater control device of an AWG, etc., but is not limited thereto.
可选的,根据温度差调整AWG的管芯温度包括S12-S14。 Optionally, the die temperature of the AWG is adjusted according to the temperature difference, including S12-S14.
在S12中,根据温度差生成用于控制AWG中的压控电流源的第一电压信号;In S12, generating a first voltage signal for controlling a voltage controlled current source in the AWG according to the temperature difference;
在S14中,通过根据第一电压信号对激光器的管芯进行加热控制的方式,调整管芯温度。In S14, the die temperature is adjusted by heating the die of the laser according to the first voltage signal.
可选的,检测AWG中激光器的管芯温度包括S22-S26。Optionally, detecting the die temperature of the laser in the AWG includes S22-S26.
在S22中,获取AWG中热敏电阻的电压值。In S22, the voltage value of the thermistor in the AWG is obtained.
在S24中,依据电压值与温度值之间的预设对应关系将电压值转换为对应的温度值。In S24, the voltage value is converted into a corresponding temperature value according to a preset correspondence between the voltage value and the temperature value.
在S26中,确定转换得到的所述温度值为当前的管芯温度。In S26, it is determined that the temperature value obtained by the conversion is the current die temperature.
可选地,根据温度差调整AWG的管芯温度包括S32-S34。Optionally, adjusting the die temperature of the AWG based on the temperature difference includes S32-S34.
在S32中,对温度差进行比例积分得到积分结果。In S32, the temperature difference is proportionally integrated to obtain an integration result.
在S34中,根据积分结果调整管芯温度。In S34, the die temperature is adjusted in accordance with the integration result.
可以将积分结果给数模转换器(Digital to Analog Converter,DAC)或者将积分结果给开方模块后,再给DAC。The integration result can be given to a digital to analog converter (DAC) or the integration result can be given to the open module before being given to the DAC.
可选地,根据积分结果调整管芯温度包括S42-S44。Optionally, adjusting the die temperature based on the integration result includes S42-S44.
在S42中,根据积分结果生成用于控制AWG中的压控电流源的第一电压信号。In S42, a first voltage signal for controlling the voltage controlled current source in the AWG is generated based on the integration result.
由DAC将积分结果转换成上述第一电压信号。The integration result is converted by the DAC into the above first voltage signal.
在S44中,通过根据第一电压信号对激光器的管芯进行加热控制的方式,调整管芯温度。In S44, the die temperature is adjusted by heating the die of the laser according to the first voltage signal.
可选的,通过根据第一电压信号对激光器的管芯进行加热控制的方式包括:根据第一电压信号控制AWG中热敏电阻的阻值的大小,以对激光器的管芯进行加热控制。Optionally, the method of heating and controlling the die of the laser according to the first voltage signal comprises: controlling the magnitude of the resistance of the thermistor in the AWG according to the first voltage signal to perform heating control on the die of the laser.
可选地,通过根据第一电压信号对激光器的管芯进行加热控制的方式包括: 根据第一电压信号控制AWG中热敏电阻的阻值的大小,以对激光器的管芯进行加热。Optionally, the manner of heating control of the dies of the laser according to the first voltage signal comprises: The magnitude of the resistance of the thermistor in the AWG is controlled according to the first voltage signal to heat the die of the laser.
上述实施例的方法可借助软件和通用硬件平台的方式来实现,也可以通过硬件来实现。本实施例提供的方法可以以计算机软件产品的形式体现出来,该计算机软件产品可以存储在一个存储介质(如ROM/RAM、磁碟、光盘)中,包括若干指令用以使得一台终端设备(可以是手机,计算机,服务器,或者网络设备等)执行本实施例的任意方法。The method of the foregoing embodiment may be implemented by means of software and a general hardware platform, or may be implemented by hardware. The method provided in this embodiment may be embodied in the form of a computer software product, which may be stored in a storage medium (such as a ROM/RAM, a magnetic disk, an optical disk), and includes a plurality of instructions for causing a terminal device ( Any method of this embodiment can be performed by a mobile phone, a computer, a server, or a network device.
实施例2Example 2
在本实施例中,提供了一种基于加热器的温度控制装置及实体设备光模块,可以执行上述实施提供的方法,已经进行过说明的不再赘述。In this embodiment, a heater-based temperature control device and a physical device optical module are provided, and the method provided by the above implementation may be performed, and the description has been omitted.
图3是根据本实施例的基于加热器的温度控制装置的结构框图,如图3所示,该装置可以包括:3 is a block diagram showing the structure of a heater-based temperature control device according to the present embodiment. As shown in FIG. 3, the device may include:
检测模块30,设置为检测阵列波导光栅AWG中激光器的管芯温度。The detection module 30 is configured to detect the die temperature of the laser in the arrayed waveguide grating AWG.
计算模块32,设置为计算管芯温度和设定温度之间的温度差。A calculation module 32 is provided to calculate a temperature difference between the die temperature and the set temperature.
调整模块34,设置为根据温度差调整AWG的管芯温度。The adjustment module 34 is configured to adjust the die temperature of the AWG based on the temperature difference.
图4是根据本实施例的光模块的结构框图,光模块是本实施例提供的一种实体设备,可以将heater控制装置应用在光模块中,也可以将heater控制装置应用在其他设备中,在此以光模块为例进行说明,其他设备同样适用。如图4所示,该光模块可以包括:光接收器件40和现场可编程门阵列FPGA控制单元42,光接收器件40可以包括阵列波导光栅AWG402,光模块还可以包括:加热器控制装置44,设置为通过FPGA控制单元来控制AWG的管芯温度。4 is a structural block diagram of an optical module according to the embodiment. The optical module is a physical device provided by the embodiment, and the heater control device can be applied to the optical module, and the heater control device can be applied to other devices. The optical module is taken as an example here, and other devices are also applicable. As shown in FIG. 4, the optical module may include: a light receiving device 40 and a field programmable gate array FPGA control unit 42. The light receiving device 40 may include an arrayed waveguide grating AWG 402, and the optical module may further include: a heater control device 44. Set to control the die temperature of the AWG through the FPGA control unit.
可选的,加热器控制装置44还包括:检测器件,与AWG中的热敏电阻连 接,设置为检测AWG中激光器的管芯温度;计算电路,集成在FPGA控制单元中,与检测器件连接,设置为计算管芯温度和设定温度之间的温度差;调整电路,与计算电路连接,设置为根据温度差调整AWG的管芯温度。Optionally, the heater control device 44 further includes: a detecting device connected to the thermistor in the AWG Connected, set to detect the die temperature of the laser in the AWG; the calculation circuit is integrated in the FPGA control unit, connected to the detecting device, set to calculate the temperature difference between the die temperature and the set temperature; the adjustment circuit, and the calculation circuit Connect, set to adjust the die temperature of the AWG based on the temperature difference.
可选的,检测器件还包括:检测电路,设置为检测AWG中热敏电阻的模拟电压信号;模数转换器(Analog to Digital Converter,ADC),设置为将模拟电压信号转换为数字电压信号;处理单元,设置为依据电压值与温度值之间的预设对应关系将数字电压信号转换为对应的温度值,并确定温度值为管芯温度。Optionally, the detecting device further includes: a detecting circuit configured to detect an analog voltage signal of the thermistor in the AWG; and an analog to digital converter (ADC) configured to convert the analog voltage signal into a digital voltage signal; The processing unit is configured to convert the digital voltage signal into a corresponding temperature value according to a preset correspondence between the voltage value and the temperature value, and determine the temperature value as the die temperature.
可选的,计算电路还包括:计算模块,设置为计算管芯温度和设定温度之间的温度差;比例积分模块,设置为对温度差进行比例积分得到积分结果。Optionally, the calculation circuit further includes: a calculation module configured to calculate a temperature difference between the die temperature and the set temperature; and a proportional integration module configured to perform proportional integration on the temperature difference to obtain an integration result.
可选的,调整电路还包括:数模转换器,与比例积分模块连接,设置为将积分结果转换为对应的模拟信号;调整单元,设置为根据模拟信号控制AWG中热敏电阻的阻值的大小。Optionally, the adjusting circuit further comprises: a digital-to-analog converter connected to the proportional-integral module, configured to convert the integrated result into a corresponding analog signal; and an adjusting unit configured to control the resistance of the thermistor in the AWG according to the analog signal. size.
上述各个模块是可以通过软件或硬件来实现的,例如,上述模块可以设置在同一处理器中,也可以以任意组合的形式分别设置在不同的处理器中。Each of the above modules may be implemented by software or hardware. For example, the above modules may be disposed in the same processor, or may be respectively disposed in different processors in any combination.
实施例3Example 3
本实施例提供一种动态可调heater电流的控制装置,可以通过修改参数设置,来改变锁定时间,解决瞬间heater电流变大的问题,来满足不同的接收机器件中AWG的工作温度需求。与相关技术相比,本实施例采用数字反馈可以消除瞬间heater电流变大,且可以灵活地改变锁定时间,本系统具有灵活、方便实用的特点。The embodiment provides a dynamic adjustable heater current control device, which can change the lock time by modifying the parameter setting, and solve the problem that the instantaneous heater current becomes large, so as to meet the working temperature requirement of the AWG in different receiver devices. Compared with the related art, the digital feedback can eliminate the instantaneous heater current and can flexibly change the locking time. The system has the characteristics of flexibility, convenience and practicality.
图5是根据本实施例的heater模数结合控制环框图,如图5所示:FIG. 5 is a block diagram of a heater modulus combined control loop according to the present embodiment, as shown in FIG. 5:
heater电流控制算法的工作流程如下: The workflow of the heater current control algorithm is as follows:
通过ADC采集热敏电阻的电压值Vth,依据如下公式(1),将热敏电阻的电压值转化为对应的温度值THThe voltage value V th of the thermistor is collected by the ADC, and the voltage value of the thermistor is converted into a corresponding temperature value T H according to the following formula (1):
Figure PCTCN2017091293-appb-000001
Figure PCTCN2017091293-appb-000001
其中:T0=25℃,代表参考温度;Where: T 0 = 25 ° C, representing the reference temperature;
R0=10KΩ,代表在25℃时热敏电阻的阻值,β=3475K,代表热敏电阻的温度系数;摄氏温度和绝对温度的转化公式为:T(K)=T[℃]+273.15,VREF为参考电压。R 0 =10KΩ, which represents the resistance of the thermistor at 25°C, β=3475K, which represents the temperature coefficient of the thermistor; the conversion formula of Celsius and absolute temperature is: T(K)=T[°C]+273.15 , VREF is the reference voltage.
热敏电阻的电压值和温度的关系如下图6所示,图6是根据本实施例的热敏电阻的电压与温度的关系图,是根据多次测试得到的数据,由图6可以看出,当热敏电阻的电压变小时,转化的温度值变大;当热敏电阻的电压变大时,转化的温度值则变小;由于电压转化为温度的公式比较复杂,因此可以采用查找表来确定电压转化得到的温度值。The relationship between the voltage value of the thermistor and the temperature is as shown in FIG. 6. FIG. 6 is a graph showing the relationship between the voltage and the temperature of the thermistor according to the present embodiment, which is based on data obtained by a plurality of tests, as can be seen from FIG. When the voltage of the thermistor becomes small, the converted temperature value becomes larger; when the voltage of the thermistor becomes larger, the converted temperature value becomes smaller; since the formula for converting the voltage into temperature is complicated, a lookup table can be used. To determine the temperature value obtained by voltage conversion.
转化后的温度值TH与设定的工作温度Tset进行相减得到温度差值Terr,并将结果Terr进行比例积分,得到积分结果X,结合附图6,heater的功率PH的计算公式如公式(2)所示:The converted temperature value T H is subtracted from the set operating temperature T set to obtain a temperature difference T err , and the result T err is proportionally integrated to obtain an integration result X, which is combined with FIG. 6 , the heater power P H The calculation formula is as shown in formula (2):
Figure PCTCN2017091293-appb-000002
Figure PCTCN2017091293-appb-000002
其中,IH为heater的电流,RH为heater的电阻,R2为第二电阻。Wherein, I H is the current of the heater, R H is the resistance of the heater, and R 2 is the second resistance.
根据公式(2)可见heater的功率PH与输出的积分结果X呈线性关系。X值越大,heater的功率值就变大;图7是根据本实施例的功率和温度的关系图,如图7所示,heater的功率与heater的温度呈正比例关系。According to formula (2), it can be seen that the power P H of the heater is linear with the integral result X of the output. The larger the value of X, the larger the power value of the heater; Fig. 7 is a graph showing the relationship between power and temperature according to the present embodiment. As shown in Fig. 7, the power of the heater is proportional to the temperature of the heater.
故可以得出结论:当DAC输出的数据变大时,heater的功率就变大,那么heater的温度就升高,热敏电阻感应heater的温度,热敏电阻的阻值就会变小, 热敏电阻的电压也随之变小;当DAC输出的数据变小时,heater的功率就变小,那么heater的温度就降低,热敏电阻感应heater的温度,热敏电阻的阻值就会变大,热敏电阻的电压也随之变大。Therefore, it can be concluded that when the data output from the DAC becomes larger, the power of the heater becomes larger, and the temperature of the heater rises. The temperature of the thermistor senses the heater, and the resistance of the thermistor becomes smaller. The voltage of the thermistor also becomes smaller; when the data output from the DAC becomes smaller, the power of the heater becomes smaller, then the temperature of the heater decreases, the temperature of the thermistor senses the temperature of the heater, and the resistance of the thermistor changes. Large, the voltage of the thermistor also becomes larger.
在本实施例中,数字部分包括如下过程:In this embodiment, the digital portion includes the following process:
图8是根据本实施例的heater数字控制框图,heater控制环的数字部分的功能框图如图8所示:Figure 8 is a block diagram of the heater digital control according to the present embodiment, the functional block diagram of the digital portion of the heater control loop is as shown in Figure 8:
图8中101为ADC芯片,进行数据采集,并将模拟的电压信号转化为数字信号,作为heater控制环的输入数据,102为查找表的实现模块,实现将输入的电压Vth转化为温度Tth;103将转化的温度值Tth与设定的AWG工作点的温度值Tset取差值Terr;104将差值的结果Terr进行比例积分;105将积分的结果sum送给外部DAC芯片。In Fig. 8, 101 is an ADC chip, performs data acquisition, and converts the analog voltage signal into a digital signal as input data of the heater control loop, and 102 is an implementation module of the lookup table, which converts the input voltage Vth into temperature T. TH; temperature 103 converts the temperature value T th AWG set operating point T set values taking the difference T err; 104 results difference T err performs a proportional integral; 105 sum the integration result to the external DAC chip.
本实施例的heater电流的数字控制环的工作步骤如下:The working steps of the digital control loop of the heater current of this embodiment are as follows:
步骤一:设置AWG的工作温度值Tset以及比例积分的比例系数ki、kp;Step 1: Set the working temperature value T set of the AWG and the proportional coefficient ki, kp of the proportional integral;
由于ki、kp的系数是可设,故比例积分的步长是可变的。Since the coefficients of ki and kp are configurable, the step size of the proportional integral is variable.
步骤二:通过ADC采集芯片,将输入模拟电压转化为数字电压Vth;Step two: through the ADC acquisition chip, the input analog voltage is converted into a digital voltage Vth;
步骤三:依据ROM查找表,将输入的电压值找出对应的温度值。Step 3: According to the ROM lookup table, find the corresponding temperature value by inputting the voltage value.
依据公式(1)将电压转化温度做成ROM查找表时需要考虑FPGA资源的使用率。由于ADC是16位精度的芯片,ADC取值范围0~65535,而AWG的工作温度绝大多数在75℃附近,可以将查找表的寻址范围变小,如在65℃~85℃之间进行细查,当高于85℃和低于65℃时,可以输出一个固定温度值。The use of FPGA resources needs to be considered when making the voltage conversion temperature into a ROM lookup table according to formula (1). Since the ADC is a 16-bit precision chip, the ADC range is 0 to 65535, and the operating temperature of the AWG is mostly around 75 °C, which can reduce the addressing range of the lookup table, such as between 65 ° C and 85 ° C. For detailed investigation, when it is higher than 85 ° C and lower than 65 ° C, a fixed temperature value can be output.
步骤四:将查找表的结果与设定的温度值Tset取差值。当差值为正,说明高于设定的温度Tset,需要降温,当差值为负,说明低于设定的温度Tset,需要升温。 Step 4: Take the difference between the result of the lookup table and the set temperature value T set . When the difference is positive, it means that it is higher than the set temperature T set and needs to be cooled. When the difference is negative, it means that it is lower than the set temperature T set and needs to be warmed up.
将结果Terr给比例积分模块进行积分,将积分结果result输出给DAC,以进行后续处理。The result Terr is integrated into the proportional integration module, and the result of the integration is output to the DAC for subsequent processing.
在本实施例中,模拟部分的实现包括如下:In this embodiment, the implementation of the analog portion includes the following:
图9是根据本实施例的heater模拟控制框图,该模拟电路将输入的电压值转化为电流,当电流Id变大时,heater的功率变大,随之heater温度升高,热敏电阻感应heater的温度,热敏电阻的阻值减小,热敏电阻的电压也随之变小;当电流Id变小时,heater的功率变小,随之heater温度降低,热敏电阻感应heater的温度,热敏电阻的阻值增大,热敏电阻的电压也随之变大。依据下列公式(3)得出热敏电阻的电压:9 is a block diagram of a heater analog control according to the present embodiment, which converts an input voltage value into a current. When the current I d becomes large, the heater power becomes large, and the heater temperature increases, and the thermistor senses. The temperature of the heater, the resistance of the thermistor is reduced, and the voltage of the thermistor is also reduced; when the current I d becomes smaller, the power of the heater becomes smaller, and the temperature of the heater decreases, and the temperature of the thermistor senses the heater. The resistance of the thermistor increases, and the voltage of the thermistor also increases. The voltage of the thermistor is obtained according to the following formula (3):
Figure PCTCN2017091293-appb-000003
Figure PCTCN2017091293-appb-000003
其中,Rth为热敏电阻的阻值。Where R th is the resistance of the thermistor.
模拟电路选取的器件参数如下所示:第一电阻R1=10KΩ、R2=10kΩ、VCC=2.5V、RH=5Ω、VREF=2.5V。The device parameters selected for the analog circuit are as follows: first resistor R 1 =10KΩ, R 2 =10kΩ, V CC =2.5V, R H =5Ω, V REF =2.5V.
下面结合模拟部分和数字部分进行整体说明,图10是根据本实施例的100G模块中AWG heater控制框图,包括:模拟控制电路和数字反馈部分,共同构成了AWG heater电流的控制电路,如图10所示。在光模块的接收侧中,每个光接收器组件(Receiver Optical Subassembly,ROSA)内部都集成了AWG,而只有每一个ROSA器件对应的AWG工作在合适的温度下,才能让每一路光信号通过自己的栅格,将接收端送来的100Gb/s光信号,经AWG分波为10路并行的10Gb/s光信号。使用热敏电阻来检测AWG的激光器的管芯温度变化,当温度升高时,热敏电阻的阻值变小,那么热敏电阻的电压也随之变小,通过ADC采集该电压的变化,将该电压转化为温度后,与设定温度值进行比较得到相应的差值,将输出的差值通过积分,产生用于控制heater的压控电流源的电压信号, heater根据流入的电流的大小对激光器的管芯进行加热,从而控制接收机的温度,使得heater控制电路是一个负反馈温度控制环路,可以实现接收机的温度稳定。The following is a general description of the analog part and the digital part. FIG. 10 is a block diagram of the AWG heater control in the 100G module according to the embodiment, including: an analog control circuit and a digital feedback part, which together constitute a control circuit of the AWG heater current, as shown in FIG. Shown. In the receiving side of the optical module, each optical receiver component (Receiver Optical Subassembly, ROSA) integrates an AWG inside, and only the AWG corresponding to each ROSA device works at a suitable temperature to allow each optical signal to pass. The own grid, the 100Gb / s optical signal sent from the receiving end, is divided into 10 parallel 10Gb / s optical signals by the AWG. The thermistor is used to detect the change of the die temperature of the AWG laser. When the temperature rises, the resistance of the thermistor becomes smaller, and the voltage of the thermistor becomes smaller. The change of the voltage is collected by the ADC. After converting the voltage into temperature, the corresponding difference is obtained by comparing with the set temperature value, and the difference of the output is integrated to generate a voltage signal for controlling the voltage control current source of the heater. The heater heats the die of the laser according to the magnitude of the current flowing in, thereby controlling the temperature of the receiver, so that the heater control circuit is a negative feedback temperature control loop, which can achieve temperature stability of the receiver.
上述对接收机heater的工作温度进行控制的场景中,可以实现采用数字和模拟相结合的控制方式来稳定AWG的工作点温度。In the above scenario where the operating temperature of the receiver heater is controlled, a combination of digital and analog control can be implemented to stabilize the operating temperature of the AWG.
实施例4Example 4
本实施例提供了一种存储介质。可选地,在本实施例中,上述存储介质可以被设置为存储用于执行以下步骤的程序代码:This embodiment provides a storage medium. Optionally, in the embodiment, the foregoing storage medium may be configured to store program code for performing the following steps:
在S1中,检测阵列波导光栅AWG中激光器的管芯温度;In S1, detecting a die temperature of a laser in the arrayed waveguide grating AWG;
在S2中,计算管芯温度和设定温度之间的温度差;In S2, calculating a temperature difference between the die temperature and the set temperature;
在S3中,根据温度差调整AWG的管芯温度。In S3, the die temperature of the AWG is adjusted according to the temperature difference.
可选地,在本实施例中,上述存储介质可以包括但不限于:U盘、只读存储器(ROM,Read-Only Memory)、随机存取存储器(RAM,Random Access Memory)、移动硬盘、磁碟或者光盘等各种可以存储程序代码的介质。Optionally, in this embodiment, the foregoing storage medium may include, but not limited to, a USB flash drive, a Read-Only Memory (ROM), a Random Access Memory (RAM), a mobile hard disk, and a magnetic memory. A variety of media that can store program code, such as a disc or a disc.
可选地,在本实施例中,处理器根据存储介质中已存储的程序代码执行检测阵列波导光栅AWG中激光器的管芯温度;Optionally, in this embodiment, the processor performs, according to the stored program code in the storage medium, detecting a die temperature of the laser in the arrayed waveguide grating AWG;
可选地,在本实施例中,处理器根据存储介质中已存储的程序代码执行计算管芯温度和设定温度之间的温度差;Optionally, in this embodiment, the processor performs a calculation of a temperature difference between the die temperature and the set temperature according to the stored program code in the storage medium;
可选地,在本实施例中,处理器根据存储介质中已存储的程序代码执行根据温度差调整AWG的管芯温度。Optionally, in the embodiment, the processor performs to adjust the die temperature of the AWG according to the temperature difference according to the stored program code in the storage medium.
图11是根据本实施例提供的一种光模块设备的硬件结构示意图,光模块设备除包括上述实施例提供的光模块的部件之外,还可以包括:一个或多个处理 器510、存储器520、输入装置530和输出装置540,在图11中以一个处理器510为例。FIG. 11 is a schematic diagram of a hardware structure of an optical module device according to the embodiment. The optical module device may include one or more processes in addition to the components of the optical module provided in the foregoing embodiment. The processor 510, the memory 520, the input device 530, and the output device 540 are exemplified by a processor 510 in FIG.
所述光模块设备中的处理器510、存储器520、输入装置530和输出装置540可以通过总线或者其他方式连接,图11中以通过总线连接为例。The processor 510, the memory 520, the input device 530, and the output device 540 in the optical module device may be connected by a bus or other manner, and the connection through the bus is taken as an example in FIG.
输入装置530可以接收输入的数字或字符信息,输出装置540可以包括显示屏等显示设备。The input device 530 can receive input numeric or character information, and the output device 540 can include a display device such as a display screen.
存储器520作为一种计算机可读存储介质,可用于存储软件程序、计算机可执行程序以及模块。处理器510通过运行存储在存储器520中的软件程序、指令以及模块,从而执行多种功能应用以及数据处理,以实现上述实施例中的任意一种方法。The memory 520 is a computer readable storage medium that can be used to store software programs, computer executable programs, and modules. The processor 510 executes various functional applications and data processing by executing software programs, instructions, and modules stored in the memory 520 to implement any of the above embodiments.
存储器520可以包括存储程序区和存储数据区,其中,存储程序区可存储操作系统、至少一个功能所需要的应用程序;存储数据区可存储根据光模块设备的使用所创建的数据等。此外,存储器可以包括随机存取存储器(Random Access Memory,RAM)等易失性存储器,还可以包括非易失性存储器,例如至少一个磁盘存储器件、闪存器件或者其他非暂态固态存储器件。The memory 520 may include a storage program area and an storage data area, wherein the storage program area may store an operating system, an application required for at least one function; the storage data area may store data created according to usage of the optical module device, and the like. In addition, the memory may include volatile memory such as random access memory (RAM), and may also include non-volatile memory such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device.
存储器520可以是非暂态计算机存储介质或暂态计算机存储介质。该非暂态计算机存储介质,例如至少一个磁盘存储器件、闪存器件、或其他非易失性固态存储器件。在一些实施例中,存储器520可选包括相对于处理器510远程设置的存储器,这些远程存储器可以通过网络连接至光模块设备。上述网络的实例可以包括互联网、企业内部网、局域网、移动通信网及其组合。 Memory 520 can be a non-transitory computer storage medium or a transitory computer storage medium. The non-transitory computer storage medium, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some embodiments, memory 520 can optionally include memory remotely located relative to processor 510, which can be connected to the optical module device over a network. Examples of the above networks may include the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.
输入装置530可用于接收输入的数字或字符信息,以及产生与光模块设备的用户设置以及功能控制有关的键信号输入。输出装置540可包括显示屏等显示设备。 Input device 530 can be configured to receive input digital or character information and to generate key signal inputs related to user settings and function control of the optical module device. The output device 540 can include a display device such as a display screen.
本领域普通技术人员可理解实现上述实施例方法中的全部或部分流程,是可以通过计算机程序来执行相关的硬件来完成的,该程序可存储于一个非暂态计算机可读存储介质中,该程序在执行时,可包括如上述方法的实施例的流程,其中,该非暂态计算机可读存储介质可以为磁碟、光盘、只读存储记忆体(ROM)或随机存储记忆体(RAM)等。A person skilled in the art can understand that all or part of the process of implementing the above embodiment method can be completed by executing related hardware by a computer program, and the program can be stored in a non-transitory computer readable storage medium. The program, when executed, may include the flow of an embodiment of the method as described above, wherein the non-transitory computer readable storage medium may be a magnetic disk, an optical disk, a read only memory (ROM), or a random access memory (RAM). Wait.
工业实用性Industrial applicability
一种基于加热器的温度控制方法及装置、光模块,可以较灵活性来改变锁定时间,解决相关技术中在调整AWG的管芯温度时容易导致加热器电流瞬间变大的问题,具有灵活方便的使用效果。 A heater-based temperature control method and device, and an optical module, can change the locking time more flexibly, and solve the problem that the heater current is instantaneously enlarged when adjusting the die temperature of the AWG in the related art, and is flexible and convenient. The effect of using.

Claims (13)

  1. 一种基于加热器的温度控制方法,包括:A heater based temperature control method comprising:
    检测阵列波导光栅AWG中激光器的管芯温度;Detecting a die temperature of a laser in an arrayed waveguide grating AWG;
    计算所述管芯温度和设定温度之间的温度差;以及Calculating a temperature difference between the die temperature and a set temperature;
    根据所述温度差调整所述AWG的管芯温度。The die temperature of the AWG is adjusted based on the temperature difference.
  2. 根据权利要求1所述的方法,其中,检测AWG中激光器的管芯温度包括:The method of claim 1 wherein detecting the die temperature of the laser in the AWG comprises:
    获取所述AWG中热敏电阻的电压值;Obtaining a voltage value of the thermistor in the AWG;
    依据电压值与温度值之间的对应关系将所述电压值转换为对应的温度值;以及Converting the voltage value to a corresponding temperature value according to a correspondence between a voltage value and a temperature value;
    确定转换得到的所述温度值为当前的管芯温度。It is determined that the temperature value obtained by the conversion is the current die temperature.
  3. 根据权利要求1所述的方法,其中,根据所述温度差调整所述AWG的管芯温度包括:The method of claim 1 wherein adjusting the die temperature of the AWG based on the temperature difference comprises:
    根据所述温度差生成用于控制所述AWG中的压控电流源的第一电压信号;以及Generating a first voltage signal for controlling a voltage controlled current source in the AWG based on the temperature difference;
    通过根据所述第一电压信号对所述激光器的管芯进行加热控制的方式,调整所述管芯温度。The die temperature is adjusted by heating control the die of the laser in accordance with the first voltage signal.
  4. 根据权利要求1或3所述的方法,其中,根据所述温度差调整所述AWG的管芯温度,包括:The method of claim 1 or 3, wherein adjusting the die temperature of the AWG based on the temperature difference comprises:
    对所述温度差进行比例积分得到积分结果;以及Proportional integration of the temperature difference to obtain an integration result;
    根据所述积分结果调整所述管芯温度。The die temperature is adjusted based on the integration result.
  5. 根据权利要求4所述的方法,其中,根据所述积分结果调整所述管芯温度包括:The method of claim 4 wherein adjusting the die temperature based on the integration result comprises:
    根据所述积分结果生成用于控制所述AWG中的压控电流源的第一电压信 号;以及Generating a first voltage signal for controlling a voltage controlled current source in the AWG according to the integration result Number; and
    通过根据所述第一电压信号对所述激光器的管芯进行加热控制的方式,调整所述管芯温度。The die temperature is adjusted by heating control the die of the laser in accordance with the first voltage signal.
  6. 根据权利要求4所述的方法,其中,通过根据所述第一电压信号对所述激光器的管芯进行加热控制的方式包括:根据所述第一电压信号控制所述AWG中热敏电阻的阻值的大小,以对所述激光器的管芯进行加热控制。The method of claim 4, wherein the controlling the heating of the die of the laser according to the first voltage signal comprises: controlling the resistance of the thermistor in the AWG according to the first voltage signal The magnitude of the value is used to heat control the die of the laser.
  7. 一种光模块,包括:光接收器件和现场可编程门阵列FPGA控制单元,所述光接收器件包括阵列波导光栅AWG,其中,An optical module comprising: a light receiving device and a field programmable gate array FPGA control unit, wherein the light receiving device comprises an arrayed waveguide grating AWG, wherein
    所述光模块还包括heater控制装置,设置为通过所述FPGA控制单元来控制所述AWG的管芯温度。The light module further includes a heater control device configured to control a die temperature of the AWG by the FPGA control unit.
  8. 根据权利要求7所述的光模块,其特征在于,所述heater控制装置还包括:The optical module according to claim 7, wherein the heater control device further comprises:
    检测器件,与所述AWG中的热敏电阻连接,设置为检测所述AWG中激光器的管芯温度;Detecting a device coupled to the thermistor in the AWG, configured to detect a die temperature of a laser in the AWG;
    计算电路,集成在所述FPGA控制单元中,与所述检测器件连接,设置为计算所述管芯温度和设定温度之间的温度差;以及a calculation circuit integrated in the FPGA control unit, coupled to the detection device, configured to calculate a temperature difference between the die temperature and a set temperature;
    调整电路,与所述计算电路连接,设置为根据所述温度差调整所述AWG的管芯温度。An adjustment circuit coupled to the calculation circuit is configured to adjust a die temperature of the AWG based on the temperature difference.
  9. 根据权利要求8所述的光模块,其中,检测器件还包括:The optical module of claim 8, wherein the detecting device further comprises:
    检测电路,设置为检测所述AWG中热敏电阻的模拟电压信号;a detection circuit configured to detect an analog voltage signal of the thermistor in the AWG;
    模数转换器ADC,设置为将所述模拟电压信号转换为数字电压信号;以及An analog to digital converter ADC configured to convert the analog voltage signal to a digital voltage signal;
    处理单元,设置为依据电压值与温度值之间的对应关系将所述数字电压信号转换为对应的温度值。 The processing unit is configured to convert the digital voltage signal into a corresponding temperature value according to a correspondence between the voltage value and the temperature value.
  10. 根据权利要求8所述的光模块,其中,所述计算电路还包括:The optical module of claim 8, wherein the calculation circuit further comprises:
    计算模块,设置为计算所述管芯温度和设定温度之间的温度差;以及a calculation module configured to calculate a temperature difference between the die temperature and the set temperature;
    比例积分模块,设置为对所述温度差进行比例积分得到积分结果。The proportional integration module is configured to perform proportional integration on the temperature difference to obtain an integration result.
  11. 根据权利要求10所述的光模块,其中,所述调整电路还包括:The optical module of claim 10, wherein the adjustment circuit further comprises:
    数模转换器,与所述比例积分模块连接,设置为将所述积分结果转换为对应的模拟信号;以及a digital to analog converter coupled to the proportional integral module, configured to convert the integrated result to a corresponding analog signal;
    调整单元,设置为根据所述模拟信号控制所述AWG中热敏电阻的阻值的大小。And an adjusting unit configured to control a magnitude of a resistance of the thermistor in the AWG according to the analog signal.
  12. 一种基于加热器的温度控制装置,包括:A heater based temperature control device comprising:
    检测模块,设置为检测阵列波导光栅AWG中激光器的管芯温度;a detection module configured to detect a die temperature of a laser in the arrayed waveguide grating AWG;
    计算模块,设置为计算所述管芯温度和设定温度之间的温度差;以及a calculation module configured to calculate a temperature difference between the die temperature and the set temperature;
    调整模块,设置为根据所述温度差调整所述AWG的管芯温度。The adjustment module is configured to adjust a die temperature of the AWG according to the temperature difference.
  13. 一种计算机可读存储介质,存储有计算机可执行指令,所述计算机可执行指令用于执行权利要求1-6任一项的方法。 A computer readable storage medium storing computer executable instructions for performing the method of any of claims 1-6.
PCT/CN2017/091293 2016-06-30 2017-06-30 Heater-based method and apparatus for temperature control and optical module WO2018001374A1 (en)

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