WO2017016054A1 - Device for automatically testing electrical-control characteristics of microring chip - Google Patents
Device for automatically testing electrical-control characteristics of microring chip Download PDFInfo
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- WO2017016054A1 WO2017016054A1 PCT/CN2015/089226 CN2015089226W WO2017016054A1 WO 2017016054 A1 WO2017016054 A1 WO 2017016054A1 CN 2015089226 W CN2015089226 W CN 2015089226W WO 2017016054 A1 WO2017016054 A1 WO 2017016054A1
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- the invention belongs to the technical field of optical communication, and particularly relates to a device for automatically testing the electronic control characteristics of a micro ring chip.
- micro-ring resonators can realize the functions of wavelength division multiplexer and optical filter by virtue of its good wavelength selection characteristics and easy integration processing, which has stimulated the development of corresponding photonic integrated chips.
- the operating state of the microring resonator can be adjusted by controlling the carrier concentration of the injected waveguide or by physical effects such as thermal light, and implementing an optical switch and a tunable filter by applying an appropriate voltage or current.
- the electronic control characteristics of the micro-ring chip must be measured to determine the optimal driving voltage or current of the functional chip; however, due to the design error of the waveguide structure, imperfect chip processing technology and other limiting factors, the actual micro-ring chip is fabricated.
- the performance is random and the initial working state is also uncertain, that is, the electronic control characteristics of each micro-ring unit are not the same.
- people use manual debugging to obtain electronic control information of some simple structure micro-ring chips, but for a large number of micro-ring chips, such as micro-ring array-based optical switch chips, manual debugging will become There is no way to do it, because the micro-ring is susceptible to the external environment. In this case, a slight change in the state of the previously adjusted micro-ring may affect the functional state of the currently adjusted micro-ring, and may even fail to achieve the goal. Therefore, it is difficult to obtain a sufficiently accurate micro-ring chip electronic control characteristic curve by manual method, and it takes a very long time and low efficiency to debug the optimal working state.
- the object of the present invention is to provide an apparatus for automatically testing the electronic control characteristics of a microring chip for the disadvantages of manually commissioning a microring chip.
- the invention can automatically and quickly determine the relationship between the resonant wavelength of the microring chip and the output optical power as a function of the control signal strength, thereby quickly determining the electronic control characteristics of the microring chip; Compared with manual debugging, the test time is greatly reduced and the test efficiency is improved.
- An apparatus for automatically testing an electronic control characteristic of a micro ring chip comprising an automatic test analysis platform, a chip controller, a scanning laser, a photoelectric conversion module, and a switch group, wherein
- the scanning laser is used to provide a scanning optical signal, and the scanning optical signal is input to the microring chip to be tested through a switch.
- the switch group is used for switching the optical path in the micro ring chip to be tested
- the chip controller is configured to adjust an operating state of the micro ring unit in the micro ring chip to be tested
- the photoelectric conversion module is configured to convert the output optical signal of the output end of the micro ring chip to be tested into an electrical signal
- the automated test analysis platform is used to control the scanning laser, the switch block, the chip controller, and the acquisition and processing of electrical signals.
- the automatic test analysis platform includes a data acquisition module, a scan laser control module, a chip controller drive module, a switch switch group control module, and a data processing module;
- the data acquisition module is configured to collect an electrical signal converted by the photoelectric conversion module, and
- the data processing module is sent to the data processing to obtain the electronic control characteristics of the micro ring chip to be tested;
- the scanning laser control module, the chip controller driving module, and the switching switch group control module are respectively used to control the scanning laser, the chip controller, and the switch group.
- testing process of the device for automatically testing the electronic control characteristics of the micro ring chip is:
- the test process for the single micro ring unit in the optical path is: the chip controller driving module sends a periodic chip control with a fixed step size of the signal level to the chip controller Signal, each period of scanning laser control module triggers a multi-level ladder-type control signal to the scanning laser under the trigger of the chip control signal; thereby realizing the adjustment of the working state of the micro-ring unit to be tested by the chip controller, and the scanning laser transmitting the corresponding scanning optical signal
- the micro-ring unit is input, and the output optical signal of the micro-ring unit is converted into an electrical signal by the photoelectric conversion module, and the electrical signal is subjected to data acquisition and data processing to obtain an electronic control characteristic of the micro-ring unit;
- the switch switch group includes a 1 ⁇ N switch connected to the input end of the micro ring chip to be tested and an N ⁇ 1 switch connected to the output end of the micro ring chip to be tested, and the combination of the input end and the output end of the micro ring chip to be tested is tested. Choose to switch the optical path.
- the data processing process of the data processing module in the present invention includes system error compensation, wavelength dependent loss curve calculation, determining the extreme point of the curve and calculating the variation of the microring resonance wavelength and the output optical power, and finally outputting the microring chip.
- Electronic control characteristic curve
- the invention provides a device for automatically testing the electronic control characteristics of a microring chip, and uses the calculation method of the wavelength dependent loss curve to determine the information of the resonant wavelength of the microring to be tested and the output optical power with the driving voltage, and achieves fast through strict timing control. Scanning the working state of the micro-ring chip, obtaining the electronic control characteristic curve of the micro-ring chip to be tested, and realizing the automatic test of the electronic control characteristics of the micro-ring chip.
- the invention is applicable to micro-ring chips with various functional structures or integrated scales, and can automatically test and analyze electronic control modes of different physical effects, including temperature control based on integrated heating resistors, carrier injection control based on various electrodes, etc. It is especially suitable for determining the initial switching state and the optimal operating wavelength of each micro-ring optical switch inside the large-scale optical switching integrated chip based on the micro-ring optical switch unit, and quickly makes the switching chip in a stable switching function state.
- FIG. 1 is a schematic block diagram of an apparatus for automatically testing an electronic control characteristic of a microring chip in a specific embodiment
- FIG. 2 is a timing diagram of a scanning laser control signal and a chip controller control signal in a specific embodiment
- FIG. 3 is a schematic diagram of a calculated wavelength dependent loss in a specific embodiment
- FIG. 4 is a schematic diagram of an electrical control characteristic curve of a microring unit tested in a specific embodiment.
- a 4 ⁇ 4 optical switching integrated chip used in an optical communication network is used as a micro ring chip to be tested, that is, there are four input ports and four output ports; the switching chip is based on a micro ring resonator (MRR).
- MRR micro ring resonator
- a 2 ⁇ 2 Mach-Zehnder interference (MZI) optical switch unit in which a microring resonator is coupled to the MZI interference arm, and any one of the input signals can be switched by changing the driving voltage or current on the microring resonator. Any one of the output ports for non-blocking optical switching.
- the principle of driving the optical switch unit is to change the carrier concentration in the doped region of the micro-ring waveguide by applying a bias voltage to the electrodes at both ends of the pin in the micro-ring unit, thereby changing the resonant wavelength of the micro-ring unit.
- the purpose of controlling the state of the optical switch is to change the carrier concentration in the doped region of the micro-ring waveguide by applying a bias voltage to the electrodes at both ends of the pin in the micro-ring unit, thereby changing the resonant wavelength of the micro-ring unit.
- FIG. 1 is a schematic frame diagram of an apparatus for automatically testing the electronic control characteristics of the micro-ring chip, including an automatic test analysis platform, a chip controller, a scanning laser, a photoelectric conversion module, and a switch group, and an automatic test.
- the analysis platform includes a data acquisition card, a scanning laser control program, a chip controller driver, and a data processing program.
- Matlab software is mainly used for data analysis and processing (data processing module), corresponding The signal processing module processes the spectral data transmitted by the data acquisition card (data acquisition module) in real time;
- the LabVIEW software is mainly used to control the scanning laser and the chip controller, that is, the scanning laser control module and the chip controller driving module, and the corresponding control program Work with Matlab program to realize automatic test of the electronic control characteristics of the micro ring chip to be tested.
- the 1 ⁇ N and N ⁇ 1 switchers respectively connected to the input end and the output end of the micro ring chip to be tested constitute a switch switch group, and are used for changing the input and output ports of the optical signal connected to the chip to be tested, and two switches.
- the switches can also be directly connected without the microring chip to be tested, and are used to compensate for systematic errors caused by the scanning laser or the photoelectric conversion module.
- the micro ring chip to be tested has 4 input ports and 4 output ports, so the 1 ⁇ 5 and 5 ⁇ 1 switchers can be used.
- the following test procedure is only described for the special optical path, and the electronic control performance test of all the micro-ring units in the micro-ring chip to be tested can be realized by switching the optical path of the switching group.
- the chip controller driver sends a periodic chip control signal to the chip controller.
- the level of the control signal sent by the chip controller driver is kept constant to stably maintain the current working state of the micro-ring chip.
- the level of the control signal sent by the chip controller driver during each test cycle is incremented by a fixed step size, and the amplitude of the incremental control signal level causes the chip controller to output an increasing bias voltage to drive the microring chip to be tested, that is, the adjustment
- the micro-ring chip is in a working state; the scanning laser control program emits a multi-level step-type control signal to the scanning laser under the excitation of the chip control signal, each level amplitude corresponding to one light wavelength, and the scanning laser according to the received control
- the amplitude of the signal level and the constant optical power signal of the corresponding wavelength are input to the micro-ring chip; the timing logic of the two control signals is as shown in FIG. 2 .
- the scanning laser After the chip controller adjusts the bias voltage u i of the micro ring chip, the scanning laser starts to output the wavelength scanning optical signal, and the photoelectric conversion module outputs the output optical power P(u i , ⁇ j ) of the chip under the specific bias voltage u i .
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Abstract
Disclosed is a device for automatically testing electrical-control characteristics of a microring chip. The device comprises an automatic test and analysis platform, a chip controller, a scanning laser, a photoelectric conversion module and a change-over switch set. The chip controller adjusts a working state of the microring chip under test under the control of the automatic test and analysis platform, then the scanning laser emits a scanning optical signal and inputs the signal to the microring chip under test, the photoelectric conversion module then converts the output optical signal into an electrical signal and sending the same to the automatic test and analysis platform for data processing to obtain the electrical-control characteristics of the microring chip. The device can automatically and quickly measure a variation relation curve of a resonant wavelength and output optical power of the microring chip as a function of the strength of a control signal, therefore enabling fast determination of the electrical-control characteristics of the microring chip. Compared to manual debugging, the testing time is greatly reduced, thus improving the testing efficiency.
Description
本发明属于光通信技术领域，具体涉及一种自动测试微环芯片电控特性的装置。The invention belongs to the technical field of optical communication, and particularly relates to a device for automatically testing the electronic control characteristics of a micro ring chip.
随着信息化进程的推进，相比以往人们所需要传递的信息量逐日剧增，如何高效地、高速地传递信息成为了人们研究的热点之一。光作为信息的载体，在光纤通信领域发挥了巨大作用，使光纤通信网络不断地向更高速、更大带宽、更低功耗的方向发展，网络节点设备更加依赖于光子集成芯片的商业化。With the advancement of the informationization process, the amount of information that people need to transmit has increased dramatically compared with the past. How to transmit information efficiently and at high speed has become one of the hotspots of people's research. As the carrier of information, light plays a huge role in the field of optical fiber communication, which makes optical fiber communication networks continue to develop toward higher speed, larger bandwidth and lower power consumption. Network node devices are more dependent on the commercialization of photonic integrated chips.
微环谐振器作为许多光子集成芯片的基本结构，利用其良好的波长选择特性和易于集成加工的特性，可以实现波分复用器和光滤波器等功能，激发了人们对相应光子集成芯片的研发。微环谐振器的工作状态可以通过控制注入波导的载流子浓度或者通过热光等物理效应进行调整，并通过施加适当的电压或电流实现光开关、可调滤波器。工作中必须测量微环芯片的电控特性，才能确定功能芯片的最佳驱动电压或电流；然而，由于波导结构的设计误差，芯片加工工艺的不完善等一些限制因素，实际制作的微环芯片的性能随机性较大、初始工作状态也不确定，即每个微环单元的电控特性不尽相同。目前，人们采用手动调测方式获得一些简单结构的微环芯片的电控信息，但对于大量微环组成的芯片而言，如基于微环阵列的光开关芯片，采用手动方式进行调试会变得束手无策，因为微环易受外界环境的影响，在这种情形下，之前调好的微环状态的稍微改变，可能就会影响到当前调节的微环的功能状态，甚至始终达不到目的。因此，采用人工方法很难获得足够精确的微环芯片电控特性曲线，而且调测到最佳工作状态所花费的时间极长、效率低。As the basic structure of many photonic integrated chips, micro-ring resonators can realize the functions of wavelength division multiplexer and optical filter by virtue of its good wavelength selection characteristics and easy integration processing, which has stimulated the development of corresponding photonic integrated chips. . The operating state of the microring resonator can be adjusted by controlling the carrier concentration of the injected waveguide or by physical effects such as thermal light, and implementing an optical switch and a tunable filter by applying an appropriate voltage or current. In the work, the electronic control characteristics of the micro-ring chip must be measured to determine the optimal driving voltage or current of the functional chip; however, due to the design error of the waveguide structure, imperfect chip processing technology and other limiting factors, the actual micro-ring chip is fabricated. The performance is random and the initial working state is also uncertain, that is, the electronic control characteristics of each micro-ring unit are not the same. At present, people use manual debugging to obtain electronic control information of some simple structure micro-ring chips, but for a large number of micro-ring chips, such as micro-ring array-based optical switch chips, manual debugging will become There is no way to do it, because the micro-ring is susceptible to the external environment. In this case, a slight change in the state of the previously adjusted micro-ring may affect the functional state of the currently adjusted micro-ring, and may even fail to achieve the goal. Therefore, it is difficult to obtain a sufficiently accurate micro-ring chip electronic control characteristic curve by manual method, and it takes a very long time and low efficiency to debug the optimal working state.
发明内容Summary of the invention
本发明的目的在于针对手动调测微环芯片的缺点，提供一种自动测试微环芯片电控特性的装置。本发明能够自动、快速地测定微环芯片谐振波长和输出光功率随控制信号强度的变化关系曲线，从而快速确定微环芯片的电控特性；相
比人工调试大大减少了测试时间，提高了测试效率。The object of the present invention is to provide an apparatus for automatically testing the electronic control characteristics of a microring chip for the disadvantages of manually commissioning a microring chip. The invention can automatically and quickly determine the relationship between the resonant wavelength of the microring chip and the output optical power as a function of the control signal strength, thereby quickly determining the electronic control characteristics of the microring chip;
Compared with manual debugging, the test time is greatly reduced and the test efficiency is improved.
本发明的技术方案为：The technical solution of the present invention is:
一种自动测试微环芯片电控特性的装置，包括自动测试分析平台、芯片控制器、扫描激光器、光电转换模块以及切换开关组，其中，An apparatus for automatically testing an electronic control characteristic of a micro ring chip, comprising an automatic test analysis platform, a chip controller, a scanning laser, a photoelectric conversion module, and a switch group, wherein
扫描激光器用于提供扫描光信号，扫描光信号通过切换开关输入待测微环芯片；The scanning laser is used to provide a scanning optical signal, and the scanning optical signal is input to the microring chip to be tested through a switch.
切换开关组用于待测微环芯片中光路的切换；The switch group is used for switching the optical path in the micro ring chip to be tested;
芯片控制器用于调节待测微环芯片中微环单元的工作状态；The chip controller is configured to adjust an operating state of the micro ring unit in the micro ring chip to be tested;
光电转换模块用于将待测微环芯片输出端输出光信号转化为电信号；The photoelectric conversion module is configured to convert the output optical signal of the output end of the micro ring chip to be tested into an electrical signal;
自动测试分析平台用于控制扫描激光器、切换开关组、芯片控制器，以及电信号的采集和处理。The automated test analysis platform is used to control the scanning laser, the switch block, the chip controller, and the acquisition and processing of electrical signals.
进一步的，所述自动测试分析平台包括数据采集模块、扫描激光器控制模块、芯片控制器驱动模块、切换开关组控制模块及数据处理模块；数据采集模块用于采集光电转换模块转换的电信号、并送入数据处理模块进行数据处理得到待测微环芯片电控特性；扫描激光器控制模块、芯片控制器驱动模块、切换开关组控制模块分别用于控制扫描激光器、芯片控制器、切换开关组。Further, the automatic test analysis platform includes a data acquisition module, a scan laser control module, a chip controller drive module, a switch switch group control module, and a data processing module; the data acquisition module is configured to collect an electrical signal converted by the photoelectric conversion module, and The data processing module is sent to the data processing to obtain the electronic control characteristics of the micro ring chip to be tested; the scanning laser control module, the chip controller driving module, and the switching switch group control module are respectively used to control the scanning laser, the chip controller, and the switch group.
更进一步的，所述一种自动测试微环芯片电控特性的装置的测试过程为：Further, the testing process of the device for automatically testing the electronic control characteristics of the micro ring chip is:
通过切换开关组选择待测微环芯片中任一光路，针对该光路中单个微环单元的测试过程为：芯片控制器驱动模块向芯片控制器发出信号电平固定步长递增的周期性芯片控制信号，每个周期内扫描激光器控制模块在芯片控制信号触发下向扫描激光器发出多电平的阶梯型控制信号；从而实现芯片控制器对待测微环单元工作状态调节，扫描激光器发射相应扫描光信号输入微环单元，微环单元输出光信号通过光电转换模块转换为电信号，电信号经过数据采集和数据处理得到微环单元电控特性；Selecting any optical path in the micro ring chip to be tested by switching the switch group, the test process for the single micro ring unit in the optical path is: the chip controller driving module sends a periodic chip control with a fixed step size of the signal level to the chip controller Signal, each period of scanning laser control module triggers a multi-level ladder-type control signal to the scanning laser under the trigger of the chip control signal; thereby realizing the adjustment of the working state of the micro-ring unit to be tested by the chip controller, and the scanning laser transmitting the corresponding scanning optical signal The micro-ring unit is input, and the output optical signal of the micro-ring unit is converted into an electrical signal by the photoelectric conversion module, and the electrical signal is subjected to data acquisition and data processing to obtain an electronic control characteristic of the micro-ring unit;
重复上述过程即可测试得对应光路中的每一个微环单元电控特性，再通过切换开关组切换待测微环芯片光路，从而实现待测微环芯片所有微环单元电控特性的测试，整个测试过程由自动测试分析平台采用时序控制自动完成。Repeating the above process can test the electronic control characteristics of each micro ring unit in the corresponding optical path, and then switch the optical path of the micro ring chip to be tested through the switch group, thereby realizing the test of the electronic control characteristics of all the micro ring units of the micro ring chip to be tested. The entire test process is automated by the automated test analysis platform using timing control.
上述切换开关组包括连接待测微环芯片输入端的1×N切换开关和连接待测微环芯片输出端的N×1切换开关，通过待测微环芯片输入端和输出端的组合
选择实现光路的切换。The switch switch group includes a 1×N switch connected to the input end of the micro ring chip to be tested and an N×1 switch connected to the output end of the micro ring chip to be tested, and the combination of the input end and the output end of the micro ring chip to be tested is tested.
Choose to switch the optical path.
需要说明的是，本发明中数据处理模块数据处理过程包括系统误差补偿、波长相关损耗曲线计算，确定曲线的极值点并计算微环谐振波长和输出光功率的变化量，最后输出微环芯片的电控特性曲线。It should be noted that the data processing process of the data processing module in the present invention includes system error compensation, wavelength dependent loss curve calculation, determining the extreme point of the curve and calculating the variation of the microring resonance wavelength and the output optical power, and finally outputting the microring chip. Electronic control characteristic curve.
本发明提供一种自动测试微环芯片电控特性的装置，采用波长相关损耗曲线的计算方法确定待测微环谐振波长和输出光功率随驱动电压的变化信息，并通过严格的时序控制实现快速扫描微环芯片的工作状态，得到待测微环芯片的电控特性曲线，实现微环芯片电控特性的自动测试。本发明适用于各种功能结构或集成规模的微环芯片，能够对不同物理效应的电控方式进行自动测试分析，包括基于集成加热电阻的温控、基于各种电极的载流子注入控制等；尤其适用于测定基于微环光开关单元的大规模光交换集成芯片内部每个微环光开关的初始开关状态和最佳工作波长，迅速使交换芯片处于稳定的交换功能状态。The invention provides a device for automatically testing the electronic control characteristics of a microring chip, and uses the calculation method of the wavelength dependent loss curve to determine the information of the resonant wavelength of the microring to be tested and the output optical power with the driving voltage, and achieves fast through strict timing control. Scanning the working state of the micro-ring chip, obtaining the electronic control characteristic curve of the micro-ring chip to be tested, and realizing the automatic test of the electronic control characteristics of the micro-ring chip. The invention is applicable to micro-ring chips with various functional structures or integrated scales, and can automatically test and analyze electronic control modes of different physical effects, including temperature control based on integrated heating resistors, carrier injection control based on various electrodes, etc. It is especially suitable for determining the initial switching state and the optimal operating wavelength of each micro-ring optical switch inside the large-scale optical switching integrated chip based on the micro-ring optical switch unit, and quickly makes the switching chip in a stable switching function state.
图1是具体实施方式中自动测试微环芯片电控特性的装置的示意框架图；1 is a schematic block diagram of an apparatus for automatically testing an electronic control characteristic of a microring chip in a specific embodiment;
图2是具体实施方式中扫描激光器控制信号和芯片控制器控制信号的时序图；2 is a timing diagram of a scanning laser control signal and a chip controller control signal in a specific embodiment;
图3是具体实施方式中波长相关损耗计算得光谱示意图；3 is a schematic diagram of a calculated wavelength dependent loss in a specific embodiment;
图4是具体实施方式中测试得微环单元的电控特性曲线示意图。4 is a schematic diagram of an electrical control characteristic curve of a microring unit tested in a specific embodiment.
下面结合附图和实施例对本发明作进一步详细说明。The present invention will be further described in detail below with reference to the accompanying drawings and embodiments.
本实施例中采用用于光通信网络中的4×4光交换集成芯片作为待测微环芯片，即有4个输入端口和4个输出端口；该交换芯片由基于微环谐振器(MRR)的2×2马赫-曾德尔干涉(MZI)光开关单元，其中MZI干涉臂上都耦合了一个微环谐振器，通过改变微环谐振器上的驱动电压或电流，能够切换任意一路输入信号到任意一路输出端口，从而实现无阻塞的光交换功能。驱动光开关单元的电控原理是：通过对微环单元中p-i-n两端的电极施加偏置电压来改变微环波导掺杂区中的载流子浓度，从而改变该微环单元的谐振波长，达到控制光开关开关状态的目的。
In this embodiment, a 4×4 optical switching integrated chip used in an optical communication network is used as a micro ring chip to be tested, that is, there are four input ports and four output ports; the switching chip is based on a micro ring resonator (MRR). A 2×2 Mach-Zehnder interference (MZI) optical switch unit in which a microring resonator is coupled to the MZI interference arm, and any one of the input signals can be switched by changing the driving voltage or current on the microring resonator. Any one of the output ports for non-blocking optical switching. The principle of driving the optical switch unit is to change the carrier concentration in the doped region of the micro-ring waveguide by applying a bias voltage to the electrodes at both ends of the pin in the micro-ring unit, thereby changing the resonant wavelength of the micro-ring unit. The purpose of controlling the state of the optical switch.
在本实施例中，如图1所示为自动测试微环芯片电控特性的装置的示意框架图，包括自动测试分析平台、芯片控制器、扫描激光器、光电转换模块以及切换开关组，自动测试分析平台包括数据采集卡、扫描激光器控制程序、芯片控制器驱动程序及数据处理程序。通过使用运行于计算机平台上的Matlab软件和LabVIEW软件来完成数据处理、扫描激光器和芯片控制器的控制，即为自动测试分析平台；Matlab软件主要用于数据的分析处理(数据处理模块)，相应的信号处理模块实时处理数据采集卡(数据采集模块)传送过来的光谱数据；LabVIEW软件主要用于控制扫描激光器和芯片控制器，即为扫描激光器控制模块和芯片控制器驱动模块，相应的控制程序和Matlab程序协同工作，实现待测微环芯片电控特性的自动测试。In this embodiment, as shown in FIG. 1 is a schematic frame diagram of an apparatus for automatically testing the electronic control characteristics of the micro-ring chip, including an automatic test analysis platform, a chip controller, a scanning laser, a photoelectric conversion module, and a switch group, and an automatic test. The analysis platform includes a data acquisition card, a scanning laser control program, a chip controller driver, and a data processing program. By using Matlab software and LabVIEW software running on the computer platform to complete the data processing, scanning laser and chip controller control, it is the automatic test analysis platform; Matlab software is mainly used for data analysis and processing (data processing module), corresponding The signal processing module processes the spectral data transmitted by the data acquisition card (data acquisition module) in real time; the LabVIEW software is mainly used to control the scanning laser and the chip controller, that is, the scanning laser control module and the chip controller driving module, and the corresponding control program Work with Matlab program to realize automatic test of the electronic control characteristics of the micro ring chip to be tested.
本实施例中，分布连接于待测微环芯片输入端和输出端的1×N和N×1切换开关构成切换开关组，用于改变光信号连接待测芯片的输入、输出端口，两个切换开关之间也可不经过待测微环芯片直接相连，用于补偿扫描激光器或光电转换模块带来的系统误差。待测微环芯片有4个输入端口和4个输出端口，因此采用1×5和5×1切换开关即可。另外说明的是：以下测试过程仅针对特一光路进行说明，通过开关切换组切换光路即可实现待测微环芯片中所有微环单元电控性能测试。In this embodiment, the 1×N and N×1 switchers respectively connected to the input end and the output end of the micro ring chip to be tested constitute a switch switch group, and are used for changing the input and output ports of the optical signal connected to the chip to be tested, and two switches. The switches can also be directly connected without the microring chip to be tested, and are used to compensate for systematic errors caused by the scanning laser or the photoelectric conversion module. The micro ring chip to be tested has 4 input ports and 4 output ports, so the 1×5 and 5×1 switchers can be used. In addition, the following test procedure is only described for the special optical path, and the electronic control performance test of all the micro-ring units in the micro-ring chip to be tested can be realized by switching the optical path of the switching group.
测试过程中，芯片控制器驱动程序向芯片控制器发出周期性芯片控制信号，在一个测试周期内，芯片控制器驱动程序发出的控制信号电平维持恒定，以稳定保持当前微环芯片的工作状态；每个测试周期间芯片控制器驱动程序发出的控制信号电平呈固定步长递增，递增的控制信号电平幅度使芯片控制器输出递增的偏置电压来驱动待测微环芯片，即调节微环芯片工作状态；扫描激光器控制程序在芯片控制信号激发下，向扫描激光器发出一种多电平的阶梯型控制信号，每一个电平幅度对应于一个光波长，扫描激光器根据接收到的控制信号电平幅度大小发射出相应波长的恒定光功率信号输入微环芯片；两种控制信号的时序逻辑如图2所示。During the test, the chip controller driver sends a periodic chip control signal to the chip controller. During a test cycle, the level of the control signal sent by the chip controller driver is kept constant to stably maintain the current working state of the micro-ring chip. The level of the control signal sent by the chip controller driver during each test cycle is incremented by a fixed step size, and the amplitude of the incremental control signal level causes the chip controller to output an increasing bias voltage to drive the microring chip to be tested, that is, the adjustment The micro-ring chip is in a working state; the scanning laser control program emits a multi-level step-type control signal to the scanning laser under the excitation of the chip control signal, each level amplitude corresponding to one light wavelength, and the scanning laser according to the received control The amplitude of the signal level and the constant optical power signal of the corresponding wavelength are input to the micro-ring chip; the timing logic of the two control signals is as shown in FIG. 2 .
当芯片控制器调节微环芯片的偏置电压ui后，扫描激光器开始输出波长扫描光信号，光电转换模块将该特定偏置电压ui下芯片的输出光功率P(ui,λj)转换为电信号，经数据采集卡变为数字信号储存在计算机里，计算机中的Matlab信号处
理程序对其进行数据处理，系统误差补偿后进行波长相关损耗计算，即ΔP(ui,λj)＝P(ui,λj)/P(u0,λj)；在特定的两个偏置电压下，典型的波长相关损耗曲线如图3所示；通过确定曲线的极大值和极小值及其对应的波长位置，计算得到偏置电压改变Δui＝ui-ui-1时微环谐振波长的改变量Δλ(Δui)和微环谐振峰透射功率的改变量ΔP(Δui)；在一定范围内对待测交换芯片的所有偏置电压进行扫描，即得到该微环谐振器的电控特性曲线，如图4所示。After the chip controller adjusts the bias voltage u i of the micro ring chip, the scanning laser starts to output the wavelength scanning optical signal, and the photoelectric conversion module outputs the output optical power P(u i , λ j ) of the chip under the specific bias voltage u i . Converted into an electrical signal, converted into a digital signal by a data acquisition card stored in a computer, the Matlab signal processing program in the computer performs data processing, and the wavelength error is calculated after the system error is compensated, that is, ΔP(u i , λ j ) =P(u i ,λ j )/P(u 0 ,λ j ); at a particular two bias voltages, a typical wavelength dependent loss curve is shown in Figure 3; by determining the maximum and pole of the curve The small value and its corresponding wavelength position, the change amount Δλ(Δu i ) of the microring resonance wavelength and the change amount ΔP of the microring resonance peak transmission power when the bias voltage change Δu i =u i -u i-1 is calculated Δu i ); scanning all the bias voltages of the switch chip to be tested within a certain range, that is, obtaining an electronic control characteristic curve of the micro ring resonator, as shown in FIG. 4 .
重复上述过程，自动完成该光交换芯片内所有微环谐振器电控特性曲线的测试，综合分析能够快速确定每个MZI光开关单元的初始状态和所对应的开关驱动电压，从而对微环交换芯片精确控制，实现芯片交换功能。Repeat the above process to automatically complete the test of the electronic control characteristic curve of all the micro-ring resonators in the optical switch chip. The comprehensive analysis can quickly determine the initial state of each MZI optical switch unit and the corresponding switch drive voltage, thereby switching the micro-ring The chip is precisely controlled to implement chip switching functions.
以上所述，仅为本发明的具体实施方式，本说明书中所公开的任一特征，除非特别叙述，均可被其他等效或具有类似目的的替代特征加以替换；所公开的所有特征、或所有方法或过程中的步骤，除了互相排斥的特征和/或步骤以外，均可以任何方式组合。
The above description is only a specific embodiment of the present invention, and any feature disclosed in the specification may be replaced by other equivalent or similarly substituted features unless specifically stated; all the features disclosed, or All methods or steps in the process can be combined in any manner other than mutually exclusive features and/or steps.
Claims (4)
- 一种自动测试微环芯片电控特性的装置，包括自动测试分析平台、芯片控制器、扫描激光器、光电转换模块以及切换开关组，其中，An apparatus for automatically testing an electronic control characteristic of a micro ring chip, comprising an automatic test analysis platform, a chip controller, a scanning laser, a photoelectric conversion module, and a switch group, wherein扫描激光器用于提供扫描光信号，扫描光信号通过切换开关输入待测微环芯片；The scanning laser is used to provide a scanning optical signal, and the scanning optical signal is input to the microring chip to be tested through a switch.切换开关组用于待测微环芯片中光路的切换；The switch group is used for switching the optical path in the micro ring chip to be tested;芯片控制器用于调节待测微环芯片中各微环单元的工作状态；The chip controller is configured to adjust an operating state of each micro ring unit in the micro ring chip to be tested;光电转换模块用于将待测微环芯片输出端输出光信号转化为电信号；The photoelectric conversion module is configured to convert the output optical signal of the output end of the micro ring chip to be tested into an electrical signal;自动测试分析平台用于控制扫描激光器、切换开关组、芯片控制器，以及电信号的采集和处理。The automated test analysis platform is used to control the scanning laser, the switch block, the chip controller, and the acquisition and processing of electrical signals.
- 按权利要求1所述自动测试微环芯片电控特性的装置，其特征在于，所述自动测试分析平台包括数据采集模块、扫描激光器控制模块、芯片控制器驱动模块、切换开关组控制模块及数据处理模块；数据采集模块用于采集光电转换模块转换的电信号、并送入数据处理模块进行数据处理得到待测微环芯片电控特性；扫描激光器控制模块、芯片控制器驱动模块、切换开关组控制模块分别用于控制扫描激光器、芯片控制器、切换开关组。The apparatus for automatically testing the electronic control characteristics of a microring chip according to claim 1, wherein the automatic test and analysis platform comprises a data acquisition module, a scanning laser control module, a chip controller driving module, a switching switch group control module, and data. Processing module; the data acquisition module is used to collect the electrical signal converted by the photoelectric conversion module, and is sent to the data processing module for data processing to obtain the electronic control characteristics of the micro ring chip to be tested; the scanning laser control module, the chip controller driving module, and the switch group The control module is respectively used to control the scanning laser, the chip controller, and the switch group.
- 按权利要求2所述自动测试微环芯片电控特性的装置，其特征在于，该装置的测试过程为：The apparatus for automatically testing the electronic control characteristics of a microring chip according to claim 2, wherein the testing process of the device is:通过切换开关组选择待测微环芯片中任一光路，针对该光路中单个微环单元的测试过程为：芯片控制器驱动模块向芯片控制器发出信号电平固定步长递增的周期性芯片控制信号，每个周期内扫描激光器控制模块在芯片控制信号触发下向扫描激光器发出多电平的阶梯型控制信号；从而实现芯片控制器对待测微环单元工作状态调节，扫描激光器发射相应扫描光信号输入微环单元，微环单元输出光信号通过光电转换模块转换为电信号，电信号经过数据采集和数据处理得到微环单元电控特性；Selecting any optical path in the micro ring chip to be tested by switching the switch group, the test process for the single micro ring unit in the optical path is: the chip controller driving module sends a periodic chip control with a fixed step size of the signal level to the chip controller Signal, each period of scanning laser control module triggers a multi-level ladder-type control signal to the scanning laser under the trigger of the chip control signal; thereby realizing the adjustment of the working state of the micro-ring unit to be tested by the chip controller, and the scanning laser transmitting the corresponding scanning optical signal The micro-ring unit is input, and the output optical signal of the micro-ring unit is converted into an electrical signal by the photoelectric conversion module, and the electrical signal is subjected to data acquisition and data processing to obtain an electronic control characteristic of the micro-ring unit;重复上述过程即可测试得对应光路中的每一个微环单元电控特性，再通过切换开关组切换待测微环芯片光路，从而实现待测微环芯片所有微环单元电控特性的测试，整个测试过程由自动测试分析平台采用时序控制自动完成。Repeating the above process can test the electronic control characteristics of each micro ring unit in the corresponding optical path, and then switch the optical path of the micro ring chip to be tested through the switch group, thereby realizing the test of the electronic control characteristics of all the micro ring units of the micro ring chip to be tested. The entire test process is automated by the automated test analysis platform using timing control.
- 按权利要求1所述自动测试微环芯片电控特性的装置，其特征在于，所 述切换开关组包括连接待测微环芯片输入端的1×N切换开关和连接待测微环芯片输出端的N×1切换开关，通过待测微环芯片输入端和输出端的组合选择实现光路的切换。 The apparatus for automatically testing the electronic control characteristics of a microring chip according to claim 1, wherein The switch group includes a 1×N switch connected to the input end of the micro ring chip to be tested and an N×1 switch connected to the output end of the micro ring chip to be tested, and the optical path is switched through the combination of the input end and the output end of the micro ring chip to be tested. .
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112084653A (en) * | 2020-09-07 | 2020-12-15 | 西安电子科技大学 | On-chip optical interconnection analysis graphical method and device, router and evaluation platform |
| CN112087259A (en) * | 2019-06-12 | 2020-12-15 | 中兴通讯股份有限公司 | Detection method for optical switching network |
| CN114279681A (en) * | 2021-12-31 | 2022-04-05 | 深圳光泰通信设备有限公司 | Multi-station parallel scanning test method and system for planar waveguide chip |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113484735B (en) * | 2021-07-30 | 2022-11-08 | 锐石创芯(深圳)科技股份有限公司 | Chip test gating module and chip test system |
| CN115078967B (en) * | 2022-06-15 | 2024-02-20 | 上海类比半导体技术有限公司 | Pattern generation method, generator and test circuit for chip test |
| CN116203288B (en) * | 2023-02-13 | 2024-01-12 | 成都光创联科技有限公司 | Testing device and testing method for static performance of optical device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7154287B2 (en) * | 2005-01-27 | 2006-12-26 | International Business Machines Corporation | Method and apparatus for light-controlled circuit characterization |
| JP2008116420A (en) * | 2006-11-08 | 2008-05-22 | Yokogawa Electric Corp | Test module |
| US20110279109A1 (en) * | 2010-05-17 | 2011-11-17 | Advantest Corporation | Test apparatus and test method |
| CN103364179A (en) * | 2013-07-18 | 2013-10-23 | 湖南师范大学 | Device and method for detecting optical parameters of optoelectronic device |
| CN103955147A (en) * | 2014-04-24 | 2014-07-30 | 电子科技大学 | Control device of micro-ring optical switch |
| CN104597394A (en) * | 2015-02-05 | 2015-05-06 | 电子科技大学 | Microannulus chip drive circuit performance testing device |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102761053A (en) * | 2011-04-26 | 2012-10-31 | 厦门优迅高速芯片有限公司 | Automatic power control method and device of laser |
| CN202143068U (en) * | 2011-06-21 | 2012-02-08 | 电子科技大学 | Fiber parameter oscillator chamber length real-time monitoring and compensation arrangement based on frequency sweep feedback mechanism |
| CN102314002B (en) * | 2011-09-06 | 2013-04-03 | 电子科技大学 | Polarization controller |
| TWM445178U (en) * | 2012-06-25 | 2013-01-11 | Chin-Feng Wan | Microfluidic chip automatic system with optical platform |
| CN103648216B (en) * | 2013-12-06 | 2015-12-09 | 武汉精立电子技术有限公司 | A kind of Intelligent constant flow drives the method for great power LED |
| CN203942530U (en) * | 2014-03-19 | 2014-11-12 | 上海光维通信技术股份有限公司 | Optical power measuring device |
| CN103955247B (en) * | 2014-04-24 | 2015-12-02 | 电子科技大学 | A kind of device of stable micro-ring resonator spectrum |
| CN104333415B (en) * | 2014-09-26 | 2017-06-09 | 武汉光迅科技股份有限公司 | A kind of multichannel automatic test approach and system for testing optical module |
-
2015
- 2015-07-27 CN CN201510444484.3A patent/CN105182105B/en not_active Expired - Fee Related
- 2015-09-09 WO PCT/CN2015/089226 patent/WO2017016054A1/en active Application Filing
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7154287B2 (en) * | 2005-01-27 | 2006-12-26 | International Business Machines Corporation | Method and apparatus for light-controlled circuit characterization |
| JP2008116420A (en) * | 2006-11-08 | 2008-05-22 | Yokogawa Electric Corp | Test module |
| US20110279109A1 (en) * | 2010-05-17 | 2011-11-17 | Advantest Corporation | Test apparatus and test method |
| CN103364179A (en) * | 2013-07-18 | 2013-10-23 | 湖南师范大学 | Device and method for detecting optical parameters of optoelectronic device |
| CN103955147A (en) * | 2014-04-24 | 2014-07-30 | 电子科技大学 | Control device of micro-ring optical switch |
| CN104597394A (en) * | 2015-02-05 | 2015-05-06 | 电子科技大学 | Microannulus chip drive circuit performance testing device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112087259A (en) * | 2019-06-12 | 2020-12-15 | 中兴通讯股份有限公司 | Detection method for optical switching network |
| CN112087259B (en) * | 2019-06-12 | 2023-08-25 | 中兴通讯股份有限公司 | Method for detecting optical switching network |
| CN112084653A (en) * | 2020-09-07 | 2020-12-15 | 西安电子科技大学 | On-chip optical interconnection analysis graphical method and device, router and evaluation platform |
| CN112084653B (en) * | 2020-09-07 | 2024-02-23 | 西安电子科技大学 | On-chip optical interconnection analysis imaging method, device, router and evaluation platform |
| CN114279681A (en) * | 2021-12-31 | 2022-04-05 | 深圳光泰通信设备有限公司 | Multi-station parallel scanning test method and system for planar waveguide chip |
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| Publication number | Publication date |
|---|---|
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