WO2015115239A1

WO2015115239A1 - Substrate processing device

Info

Publication number: WO2015115239A1
Application number: PCT/JP2015/051310
Authority: WO
Inventors: 幸嗣安藤
Original assignee: 株式会社Ｓｃｒｅｅｎホールディングス
Priority date: 2014-01-28
Filing date: 2015-01-20
Publication date: 2015-08-06
Also published as: TWI541935B; TW201535585A

Abstract

This substrate processing device is provided with: a substrate support unit (141) that supports a substrate (9) from below; a substrate rotating mechanism that rotates the substrate support unit; and a top plate (123) that opposes the top surface (91) of the substrate. The top plate is selectively disposed at a concatenation position concatenated to the substrate support unit and a separated position separated upwards from the substrate support unit by means of an opposing unit support mechanism. The substrate support unit is provided with a chuck unit (4) having a plurality of claws (41) and a transmission mechanism (42), and when the top plate is positioned at the concatenation position, the abutment sections (43) of the transmission mechanism are pressed in by means of the dead weight of the top plate. The plurality of claws of the transmission mechanism press the edges of the substrate towards the center axis by means of the force acting on the abutment sections being transmitted to the plurality of claws. As a result, the substrate is held while being positioned with respect to the center of rotation.

Description

Substrate processing equipment

The present invention relates to a substrate processing apparatus.

Conventionally, in the process of manufacturing a semiconductor substrate (hereinafter simply referred to as “substrate”), various processes are performed on the substrate using a substrate processing apparatus. For example, by supplying a chemical solution to a substrate having a resist pattern formed on the surface, a process such as etching is performed on the surface of the substrate. In addition, after the etching process is completed, a process of removing the resist on the substrate or cleaning the substrate is also performed.

In a single-wafer type substrate processing apparatus that processes substrates one by one, the substrate is held by the substrate holder, and the processing liquid is supplied to the substrate while rotating the substrate holder. Various methods, such as a vacuum chuck, a mechanical chuck, and a magnet chuck, have been put to practical use as methods for holding a substrate in the substrate holder. For example, in US Pat. No. 6,446,643, the substrate is clamped when the upper and lower chamber members are positioned close to each other, and the substrate is released when the upper and lower chamber members are separated. A mechanism is disclosed. Japanese Patent Application Laid-Open No. 2005-19456 discloses a mechanism for holding a substrate or releasing the holding by rotating each of a plurality of holding members arranged around the substrate. Further, in US Pat. No. 6,485,531 (reference 3), in a device in which a rotating head rotates in a non-contact manner with respect to a stator by magnetism, a wafer is held by the rotating head by a gripping portion having a spring. A technique is disclosed.

By the way, when the substrate holder is rotated in a floating state as in the apparatus of Reference 3, in order to hold the substrate, a driving force by a power source such as electricity or compressed air can be transmitted to the substrate holder. Have difficulty. In the apparatus of Document 3, the wafer is held by a gripping part having a spring, but the complicated operation of fixing the wafer to the rotating head outside the process chamber and introducing the rotating head on which the wafer is mounted into the process chamber. Is required. In the substrate processing apparatus, in order to stably rotate the substrate, it is important to align the substrate with respect to the rotation center, but when the substrate is carried into the substrate processing apparatus by an external transport mechanism, It is not easy to accurately align the substrate with respect to the center of rotation. Therefore, there is a need for a new technique that can hold the substrate while aligning it with respect to the center of rotation.

The present invention is directed to a substrate processing apparatus for processing a substrate, and aims to hold the substrate while aligning the substrate with respect to the center of rotation.

One substrate processing apparatus according to the present invention includes a substrate support portion that supports the substrate from the lower side with an upper surface that is one main surface of the substrate facing upward, and the substrate support portion that is perpendicular to the substrate. A rotation mechanism that rotates about a central axis; an upper surface facing portion that faces at least an outer edge portion of the upper surface; a separation position that separates the upper surface facing portion upward with respect to the substrate supporting portion; and the substrate supporting portion; An opposing portion supporting mechanism that is selectively disposed at a connecting position to be connected; and a chuck portion provided on one of the substrate supporting portion or the upper surface opposing portion, and the chuck portion is viewed along the central axis. In this case, at least three claw portions arranged around the substrate and a contact portion pushed by the other of the substrate support portion or the upper surface facing portion when the upper surface facing portion is located at the connection position. Including the abutment Force acting on the, by transmitting the at least three claws, and a transmission mechanism for pressing toward the edge of the substrate to the central axis to the at least three claws. In the substrate processing apparatus, the substrate can be held while being aligned with the rotation center.

Preferably, the transmission mechanism includes an elastic member, and when the size of the substrate supported by the substrate support portion varies, the elastic member elastically deforms, whereby the upper surface facing portion at the coupling position and the The distance to the substrate is kept constant.

Further, the rotation mechanism is an annular shape centered on the central axis, a rotor portion including a permanent magnet, an annular shape facing the rotor portion and the radial direction centered on the central axis, and the rotor portion; And a stator portion that generates a rotational force about the central axis between the rotor portion and the substrate support portion.

In this case, it is preferable that the substrate processing apparatus further includes a sealed space forming unit that forms a sealed internal space in which processing on the substrate is performed, the substrate support unit, the rotor unit of the rotating mechanism, The upper surface facing portion and the chuck portion are disposed in the sealed space forming portion. More preferably, the sealed space forming portion includes a chamber body having an upper opening and a chamber lid portion that closes the upper opening of the chamber body, and the chamber lid portion may be a part of the facing portion support mechanism. And the chamber lid part is located above the chamber body when the chamber lid part is moved up and down relative to the chamber body and the upper surface part is located at the separation position. When the upper surface facing portion is suspended from a part of the portion and the upper surface facing portion is located at the coupling position, the upper surface facing portion is in a non-contact state with the chamber lid portion that is in contact with or close to the chamber body.

Another substrate processing apparatus according to the present invention includes a substrate support portion that supports a substrate from below with one main surface facing upward, and the substrate support portion that rotates about a central axis perpendicular to the substrate. A rotating mechanism, a first relative position that is relatively different from the substrate support part in the vertical direction, and a weight part that can be arranged at a second relative position above the first relative position; The weight part is disposed at the second relative position by supporting the weight part, and the weight part is rotated together with the substrate and the substrate support part by releasing the support of the weight part. A weight support mechanism positioned at a first relative position; and a chuck portion provided on the substrate support portion or the weight portion, and the chuck portion is disposed around the substrate when viewed along the central axis. At least three claws to be arranged The force due to the weight of the weight portion located at the first relative position is transmitted to the at least three claw portions, so that the edge of the substrate is directed to the central axis at the at least three claw portions. A transmission mechanism to be pushed. In the substrate processing apparatus, the substrate can be held while being aligned with the rotation center.

Preferably, the rotating mechanism has an annular shape centered on the central axis, a rotor portion including a permanent magnet, and an annularly opposed annular shape centering on the rotor portion and the central axis, and the rotor portion And a stator part that generates a rotational force about the central axis between the rotor part and the substrate support part. More preferably, the weight portion is disposed between the substrate support portion and the rotor portion disposed below the substrate support portion, and extends along a guide portion that connects the substrate support portion and the rotor portion. The chuck portion is provided on the substrate support portion.

In this case, in one aspect, the substrate support portion and the weight portion are annular around the central axis. In another aspect, the position of the weight part when the support by the weight support mechanism is released is closer to the rotor part than the position of the weight part when supported by the weight support mechanism.

The above object and other objects, features, aspects, and advantages will become apparent from the following detailed description of the present invention with reference to the accompanying drawings.

It is sectional drawing which shows the substrate processing apparatus which concerns on 1st Embodiment. It is a block diagram which shows a gas-liquid supply part and a gas-liquid discharge part. It is a figure which shows the structure of a chuck | zipper part. It is a figure which shows the flow of a process of the board | substrate in a substrate processing apparatus. It is sectional drawing which shows a substrate processing apparatus. It is a figure which shows a chuck | zipper part and a top plate. It is sectional drawing which shows a substrate processing apparatus. It is sectional drawing which shows the board | substrate holding part vicinity in the substrate processing apparatus of a comparative example. It is a figure which shows the other example of a chuck | zipper part. It is a perspective view which shows a contact part and a some shaft. It is a top view which shows a nail | claw part. It is a figure which shows the further another example of a chuck | zipper part. It is a figure which shows the structure of a top plate moving mechanism. It is sectional drawing which shows the substrate processing apparatus which concerns on 2nd Embodiment. It is a figure which shows the structure of a chuck | zipper part and a weight support mechanism. It is a figure for demonstrating operation | movement of a chuck | zipper part and a weight support mechanism. It is sectional drawing which shows a substrate processing apparatus. It is sectional drawing which shows a substrate processing apparatus. It is a figure which shows the other example of a chuck | zipper part. It is a perspective view which shows a connection part and a some shaft. It is a top view which shows a nail | claw part. It is a figure which shows the other example of the weight support mechanism. It is a figure which shows the other example of a weight support mechanism and a connection part. It is a figure which shows the structure of the chuck | zipper part which concerns on 3rd Embodiment. It is a figure which shows a chuck | zipper part and a top plate. It is a figure which shows the other example of a chuck | zipper part. It is a figure which shows the other example of a chuck | zipper part.

FIG. 1 is a cross-sectional view showing a substrate processing apparatus 1 according to a first embodiment of the present invention. The substrate processing apparatus 1 is a single-wafer type apparatus that supplies a processing liquid to a substantially disk-shaped semiconductor substrate 9 (hereinafter simply referred to as “substrate 9”) to process the substrates 9 one by one. In FIG. 1, the application of parallel oblique lines to the cross section of a part of the configuration of the substrate processing apparatus 1 is omitted (the same applies to other cross sectional views).

The substrate processing apparatus 1 includes a chamber 12, a top plate 123, a chamber opening / closing mechanism 131, a substrate holding unit 14, a substrate rotating mechanism 15, a liquid receiving unit 16, and a cover 17. The cover 17 covers the upper side and the side of the chamber 12.

The chamber 12 includes a chamber main body 121 and a chamber lid portion 122. The chamber 12 has a substantially cylindrical shape with a lid and a bottom with a central axis J1 facing in the vertical direction as a center. The chamber main body 121 includes a chamber bottom portion 210 and a chamber side wall portion 214. The chamber bottom portion 210 has a substantially disc-shaped central portion 211, a substantially cylindrical inner wall portion 212 extending downward from the outer edge portion of the central portion 211, and a radially outer side from the lower end of the inner wall portion 212. A substantially annular plate-like annular bottom 213, a substantially cylindrical outer wall 215 extending upward from the outer edge of the annular bottom 213, and a substantially annular ring extending radially outward from the upper end of the outer wall 215 And a plate-like base portion 216.

The chamber side wall 214 has an annular shape centering on the central axis J1. The chamber side wall portion 214 projects upward from the inner edge portion of the base portion 216. A member forming the chamber side wall portion 214 also serves as a part of the liquid receiving portion 16 as described later. In the following description, a space surrounded by the chamber side wall part 214, the outer wall part 215, the annular bottom part 213, the inner wall part 212, and the outer edge part of the central part 211 is referred to as a lower annular space 217.

When the substrate 9 is supported by a substrate support portion 141 (described later) of the substrate holding portion 14, the lower surface 92 of the substrate 9 faces the upper surface of the central portion 211 of the chamber bottom portion 210. In the following description, the central portion 211 of the chamber bottom 210 is referred to as a “lower surface facing portion 211”.

The chamber lid part 122 has a substantially disc shape perpendicular to the central axis J1 and includes the upper part of the chamber 12. The chamber lid 122 closes the upper opening of the chamber body 121. FIG. 1 shows a state where the chamber lid 122 is separated from the chamber main body 121. When the chamber lid 122 closes the upper opening of the chamber main body 121, the outer edge of the chamber lid 122 contacts the upper portion of the chamber side wall 214.

The chamber opening / closing mechanism 131 moves the chamber lid 122, which is a movable part of the chamber 12, relative to the chamber body 121, which is another part of the chamber 12, in the vertical direction. The chamber opening / closing mechanism 131 is a lid raising / lowering mechanism that raises / lowers the chamber lid 122. When the chamber lid 122 moves in the vertical direction by the chamber opening / closing mechanism 131, the top plate 123 also moves in the vertical direction together with the chamber lid 122. The chamber lid 122 is in contact with the chamber main body 121 to close the upper opening, and the chamber lid 122 is pressed toward the chamber main body 121, whereby the chamber space 120 which is an internal space sealed in the chamber 12. (See FIG. 7) is formed. In other words, the chamber space 120 is sealed by closing the upper opening of the chamber body 121 by the chamber lid 122. The chamber lid part 122 and the chamber body 121 are sealed space forming parts that form the chamber space 120.

The substrate holding unit 14 is disposed in the chamber space 120 and holds the substrate 9 in a horizontal state. That is, the substrate 9 is held by the substrate holding unit 14 in a state where one main surface 91 (hereinafter referred to as “upper surface 91”) on which a fine pattern is formed faces upwards perpendicularly to the central axis J1. The substrate holding unit 14 includes the above-described substrate support unit 141 and the chuck unit 4 provided on the substrate support unit 141. The substrate support portion 141 has a substantially annular shape centered on the central axis J1. The substrate support portion 141 includes a substantially annular plate-like support portion base 142 centered on the central axis J 1 and a plurality of support pins 144 arranged on the support portion base 142 in the circumferential direction. The plurality of support pins 144 support the outer edge portion of the substrate 9 (that is, a portion near the outer periphery including the outer periphery) from below. The chuck portion 4 includes a plurality of claw portions 41. The plurality of claw portions 41 are arranged around the substrate 9 when viewed along the central axis J1. Details of the structure of the chuck portion 4 will be described later.

The top plate 123 has a substantially disc shape perpendicular to the central axis J1. The top plate 123 is disposed below the chamber lid part 122 and above the substrate support part 141. The top plate 123 has an opening at the center. When the substrate 9 is supported by the substrate support portion 141, the upper surface 91 of the substrate 9 faces the lower surface of the top plate 123 perpendicular to the central axis J1. That is, the top plate 123 is an upper surface facing portion that faces the upper surface 91 of the substrate 9. The diameter of the top plate 123 is larger than the diameter of the substrate 9, and the outer peripheral edge of the top plate 123 is located on the outer side in the radial direction over the entire periphery of the outer peripheral edge of the substrate 9. A plurality of engaging portions 241 are arranged in the circumferential direction on the lower surface of the outer edge portion of the top plate 123. A concave portion that is recessed upward is provided at the lower portion of each engaging portion 241.

In the state shown in FIG. 1, the top plate 123 is supported so as to be suspended by the chamber lid 122. Specifically, the chamber lid 122 has a substantially annular plate support 222 at the center. The plate support part 222 includes a substantially cylindrical tube part 223 centered on the central axis J1 and a substantially annular flange part 224 centered on the central axis J1. The flange part 224 spreads radially inward from the lower end of the cylindrical part 223.

The top plate 123 includes an annular supported portion 237. The supported portion 237 includes a substantially cylindrical tube portion 238 centered on the central axis J1 and a substantially annular flange portion 239 centered on the central axis J1. The cylinder portion 238 extends upward from the upper surface of the top plate 123. The flange portion 239 extends outward from the upper end of the cylindrical portion 238 in the radial direction. The cylindrical portion 238 is located on the radially inner side of the cylindrical portion 223 of the plate support portion 222. The flange part 239 is located above the flange part 224 of the plate support part 222 and faces the flange part 224 in the vertical direction. When the lower surface of the flange portion 239 of the supported portion 237 is in contact with the upper surface of the flange portion 224 of the plate support portion 222, the top plate 123 is attached to the chamber lid portion 122 so as to be suspended from the chamber lid portion 122.

In the substrate processing apparatus 1, the plate support part 222 of the chamber cover part 122 supports the top plate 123 in a state where the chamber cover part 122 is spaced upward from the chamber body 121, so that the top plate 123 is supported by the substrate support part 141. On the other hand, they are arranged at positions that are spaced apart upward (hereinafter referred to as “separated positions”). Actually, the chamber cover 122 is supported by a chamber opening / closing mechanism 131, and the chamber opening / closing mechanism 131 and the chamber cover 122 substantially support the top plate 123 that is the upper surface facing portion. It is.

The substrate rotation mechanism 15 is a so-called hollow motor. The substrate rotation mechanism 15 includes an annular stator portion 151 centered on the central axis J1 and an annular rotor portion 152. The rotor portion 152 includes a substantially annular permanent magnet. The surface of the permanent magnet is molded with PTFE resin. The rotor portion 152 is disposed in the lower annular space 217 in the chamber 12. The support portion base 142 of the substrate support portion 141 is connected to the upper portion of the rotor portion 152 via a connection member. The support portion base 142 is disposed above the rotor portion 152.

The stator portion 151 is disposed outside the chamber 12 and around the rotor portion 152, that is, outside in the radial direction with the central axis J1 as the center. In the present embodiment, the stator portion 151 is fixed to the outer wall portion 215 and the base portion 216 of the chamber bottom portion 210 and is positioned below the liquid receiving portion 16. Stator portion 151 includes a plurality of coils arranged in the circumferential direction about central axis J1.

When a current is supplied to the stator portion 151, a rotational force about the central axis J1 is generated between the stator portion 151 and the rotor portion 152. Thereby, the rotor part 152 rotates in a horizontal state around the central axis J1. Due to the magnetic force acting between the stator portion 151 and the rotor portion 152, the rotor portion 152 floats in the chamber 12 without contacting the chamber 12 directly or indirectly, and the substrate 9 is centered on the central axis J1. Are rotated together with the substrate support 141 in a floating state. Thus, the rotating body including the rotor portion 152 rotates in a non-contact state with other members that do not rotate.

The liquid receiving part 16 includes a cup part 161, a cup part moving mechanism 162, and a cup facing part 163. The cup portion 161 has an annular shape centered on the central axis J 1, and is located on the entire outer circumference in the radial direction of the chamber 12. The cup part moving mechanism 162 moves the cup part 161 in the vertical direction. The cup part moving mechanism 162 is disposed on the radially outer side of the cup part 161. The cup moving mechanism 162 is arranged at a position different from the chamber opening / closing mechanism 131 in the circumferential direction. The cup facing part 163 is located below the cup part 161 and faces the cup part 161 in the vertical direction. The cup facing portion 163 is a part of a member that forms the chamber side wall portion 214. The cup facing portion 163 has an annular liquid receiving recess 165 positioned on the radially outer side of the chamber side wall portion 214.

The cup part 161 includes a side wall part 611, an upper surface part 612, and a bellows 617. The side wall portion 611 has a substantially cylindrical shape centered on the central axis J1. The upper surface portion 612 has a substantially annular plate shape centered on the central axis J1, and extends from the upper end portion of the side wall portion 611 radially inward and radially outward. The lower part of the side wall part 611 is located in the liquid receiving recessed part 165 of the cup facing part 163.

The bellows 617 has a substantially cylindrical shape centered on the central axis J1, and can be expanded and contracted in the vertical direction. The bellows 617 is provided over the entire circumference around the side wall 611 outside the side wall 611 in the radial direction. The bellows 617 is formed of a material that does not allow gas or liquid to pass through. The upper end portion of the bellows 617 is connected to the lower surface of the outer edge portion of the upper surface portion 612 over the entire circumference. In other words, the upper end portion of the bellows 617 is indirectly connected to the side wall portion 611 via the upper surface portion 612. The connection portion between the bellows 617 and the upper surface portion 612 is sealed, and passage of gas or liquid is prevented. A lower end portion of the bellows 617 is indirectly connected to the chamber body 121 via the cup facing portion 163. Even at the connecting portion between the lower end portion of the bellows 617 and the cup facing portion 163, the passage of gas or liquid is prevented.

At the center of the chamber lid portion 122, a substantially columnar upper nozzle 181 centering on the central axis J1 is attached. The upper nozzle 181 is fixed to the chamber lid 122 so as to face the central portion of the upper surface 91 of the substrate 9. The upper nozzle 181 can be inserted into the central opening of the top plate 123. A lower nozzle 182 is attached to the center of the lower surface facing portion 211 of the chamber bottom portion 210. The lower nozzle 182 faces the center of the lower surface 92 of the substrate 9. A plurality of heated gas supply nozzles 180 are further attached to the lower surface facing portion 211. The plurality of heated gas supply nozzles 180 are arranged at, for example, equiangular intervals in the circumferential direction around the central axis J1.

FIG. 2 is a block diagram showing the gas-liquid supply unit 18 and the gas-liquid discharge unit 19 provided in the substrate processing apparatus 1. The gas-liquid supply unit 18 includes a chemical solution supply unit 183, a pure water supply unit 184, an IPA supply unit 185, and an inert gas supply unit in addition to the heating gas supply nozzle 180, the upper nozzle 181 and the lower nozzle 182 described above. 186 and a heated gas supply unit 187. The chemical solution supply unit 183, the pure water supply unit 184, and the IPA supply unit 185 are each connected to the upper nozzle 181 through a valve. The lower nozzle 182 is connected to the pure water supply unit 184 via a valve. The upper nozzle 181 is also connected to an inert gas supply unit 186 through a valve. The upper nozzle 181 has a liquid discharge port in the center and a gas jet port around it. Therefore, precisely, a part of the upper nozzle 181 is a part of a broad gas supply part that supplies gas into the chamber 12. The lower nozzle 182 has a liquid discharge port in the center. The plurality of heating gas supply nozzles 180 are connected to the heating gas supply unit 187 via valves.

The first discharge path 191 connected to the liquid receiving recess 165 of the liquid receiving unit 16 is connected to the gas-liquid separation unit 193. The gas-liquid separation unit 193 is connected to the outer exhaust unit 194, the chemical solution recovery unit 195, and the drainage unit 196 through valves. The second discharge path 192 connected to the chamber bottom 210 of the chamber 12 is connected to the gas-liquid separator 197. The gas-liquid separation unit 197 is connected to the inner exhaust unit 198 and the drainage unit 199 via valves. Each configuration of the gas-liquid supply unit 18 and the gas-liquid discharge unit 19 is controlled by the control unit 10. The chamber opening / closing mechanism 131, the substrate rotating mechanism 15, and the cup moving mechanism 162 (see FIG. 1) are also controlled by the control unit 10.

In this embodiment, the chemical solution supplied from the chemical solution supply unit 183 to the substrate 9 via the upper nozzle 181 is an etching solution such as hydrofluoric acid or an aqueous tetramethylammonium hydroxide solution. The pure water supply unit 184 supplies pure water (DIW: Deionized Water) to the substrate 9 via the upper nozzle 181 or the lower nozzle 182. The IPA supply unit 185 supplies isopropyl alcohol (IPA) onto the substrate 9 through the upper nozzle 181. In the substrate processing apparatus 1, a processing liquid supply unit that supplies a processing liquid other than the above may be provided.

Further, the inert gas supply unit 186 supplies an inert gas into the chamber 12 via the upper nozzle 181. The heated gas supply unit 187 supplies a heated gas (for example, a high-temperature inert gas heated to 120 to 130 ° C.) to the lower surface 92 of the substrate 9 through the plurality of heated gas supply nozzles 180. In the present embodiment, the gas used in the inert gas supply unit 186 and the heating gas supply unit 187 is nitrogen (N ₂ ) gas, but may be other than nitrogen gas.

FIG. 3 is a diagram showing a configuration of a part of the chuck portion 4. As described above, the chuck portion 4 is provided on the substrate support portion 141, and a part of the chuck portion 4 is provided inside an annular support portion base 142 centered on the central axis J 1. In FIG. 3, a part of the configuration within the support portion base 142 and the contact portion accommodating portion 431 described later is shown in a cross section by a plane including the central axis J1 (the same applies to FIGS. 6 and 9). The chuck portion 4 includes the plurality of claw portions 41 and the transmission mechanism 42 described above. As described above, the plurality of claw portions 41 are arranged in the circumferential direction around the substrate 9 supported by the plurality of support pins 144. The number of the plurality of claw portions 41 is at least 3, and in each combination of two claw portions 41 adjacent in the circumferential direction among the at least three claw portions 41, the two claw portions 41 and the central axis J1 The angle formed by the line connecting the two is less than 180 degrees. The at least three claw portions 41 are preferably provided at equiangular intervals in the circumferential direction. In the present embodiment, four claw portions 41 are provided at equiangular intervals in the circumferential direction.

The transmission mechanism 42 includes a contact portion 43 provided for each claw portion 41 and a plurality of

bars

44 and 45. The contact portion 43 is a bar member extending in the vertical direction, and a part thereof is disposed in the contact portion accommodating portion 431 provided on the upper surface of the support portion base 142. An annular upper support portion 432 and a lower support portion 433 are provided in the contact portion accommodating portion 431, and the contact portion 43 is movable in the vertical direction by the upper and

lower support portions

432 and 433. Supported. A lower end portion of the contact portion 43 is disposed in an internal space 143 formed in the support portion base 142. A bar 44 is disposed in the internal space 143, and one end portion of the bar 44 is connected to the lower end portion of the contact portion 43 via a pin 421. A long hole 441 extending in the longitudinal direction of the bar 44 is formed in the bar 44, and the pin 421 is inserted into the long hole 441. The bar 44 is supported by a bar support portion 440 provided in the internal space 143 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG.

The other end of the bar 44 is connected via a pin 422 to the lower end of another bar 45 that extends approximately in the vertical direction. A long hole 451 extending in the longitudinal direction of the bar 45 is formed in the bar 45, and the pin 422 is inserted into the long hole 451. A communication hole 145 that communicates with the internal space 143 is provided on the upper surface of the support base 142, and the bar 45 is inserted into the communication hole 145. The bar 45 is supported by a bar support portion 450 fixed around the communication hole 145 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG. In the bar 45, a portion above the bar support portion 450 is disposed outside the internal space 143 of the support portion base 142, and the periphery thereof is covered with a substantially cylindrical bellows 423. A claw portion 41 is attached to the upper end portion of the bar 45. The bellows 423 is formed of a material that does not allow the passage of gas or liquid. A connection part between the bellows 423 and the claw part 41, a connection part between the bellows 423 and the bar support part 450, a connection part between the bar support part 450 and the support part base 142, and the contact part accommodating part 431 and the support part base 142. The connection part is sealed and the passage of gas or liquid is prevented.

A disc portion 434 centered on the contact portion 43 is attached to the contact portion 43. The disc part 434 is disposed between the upper support part 432 and the lower support part 433 in the contact part accommodating part 431. Between the disc part 434 and the lower side support part 433, the spring 435 surrounding the circumference | surroundings of the contact part 43 is provided. The disk portion 434 and the contact portion 43 are urged upward by the spring 435, and the disk portion 434 contacts the lower surface of the upper support portion 432 as shown in FIG. In a state in which the disc portion 434 is in contact with the lower surface of the upper support portion 432, the end portion of the bar 44 on the bar 45 side is positioned below the end portion on the contact portion 43 side, and the bar 45 is in the vertical direction. Approximately upright along. Thereby, the nail | claw part 41 is arrange | positioned in the position spaced apart from the edge of the board | substrate 9 on the outer side (on the opposite side to the central axis J1). An elastic member 436 formed of rubber or the like is provided on a part (or all) of the contact portion 43, and the contact portion 43 can be slightly expanded and contracted in the longitudinal direction. The configuration included in the transmission mechanism 42 is provided for each of the plurality of claw portions 41.

FIG. 4 is a diagram showing the flow of processing of the substrate 9 in the substrate processing apparatus 1. In the substrate processing apparatus 1, as shown in FIG. 1, in a state where the chamber lid part 122 is spaced apart from the chamber body 121 and located above, and the cup part 161 is separated from the chamber lid part 122 and located below. The substrate 9 is carried into the chamber 12 by an external transport mechanism and supported from below by the substrate support 141 (step S10). Hereinafter, the state of the chamber 12 and the cup part 161 shown in FIG. 1 is referred to as an “open state”. The opening between the chamber lid part 122 and the chamber side wall part 214 has an annular shape centering on the central axis J1, and is hereinafter referred to as “annular opening 81”. In the substrate processing apparatus 1, the chamber lid 122 is separated from the chamber main body 121, whereby an annular opening 81 is formed around the substrate 9 (that is, radially outside). In step S 10, the substrate 9 is carried in via the annular opening 81.

When the substrate 9 is carried in, the chamber opening / closing mechanism 131 lowers the chamber lid 122 from the position shown in FIG. 1 to the position shown in FIG. 5 (position close to the chamber body 121). Further, the cup portion 161 rises from the position shown in FIG. 1 to the position shown in FIG. 5, and is located over the entire circumference on the radially outer side of the annular opening 81. In the following description, the state of the chamber 12 and the cup part 161 shown in FIG. 5 is referred to as a “first sealed state”. Further, the position of the cup part 161 shown in FIG. 5 is referred to as a “liquid receiving position”, and the position of the cup part 161 shown in FIG. The cup part moving mechanism 162 moves the cup part 161 in the vertical direction between a liquid receiving position radially outside the annular opening 81 and a retracted position below the liquid receiving position.

In the cup portion 161 located at the liquid receiving position, the side wall portion 611 faces the annular opening 81 in the radial direction. Further, the upper surface of the inner edge portion of the upper surface portion 612 is in contact with the lip seal 232 at the lower end of the outer edge portion of the chamber lid portion 122 over the entire circumference. Between the chamber cover part 122 and the upper surface part 612 of the cup part 161, the seal part which prevents passage of gas and a liquid is formed. Thereby, a sealed space (hereinafter referred to as “enlarged sealed space 100”) surrounded by the chamber body 121, the chamber lid portion 122, the cup portion 161, and the cup facing portion 163 is formed. In the enlarged sealed space 100, the chamber space 120 between the chamber lid portion 122 and the chamber body 121 and the side space 160 surrounded by the cup portion 161 and the cup facing portion 163 communicate with each other via the annular opening 81. It is one space formed by this.

Further, in the first sealed state, as shown in FIG. 6, the upper end portion of the abutting portion 43 protruding upward from the abutting portion accommodating portion 431 is formed in the concave portion 242 of the lower portion of each engaging portion 241 of the top plate 123. fit. As a result, the top plate 123 is connected to the support base 142 of the substrate support 141. In other words, the relative position in the rotation direction (circumferential direction) of the top plate 123 with respect to the substrate support 141 is fixed. In the following description, a position where the top plate 123 is connected to the substrate support portion 141 is referred to as a “connection position”. When the chamber lid 122 is lowered, the rotation position of the support base 142 is controlled by the substrate rotation mechanism 15 so that the engagement portion 241 and the contact portion 43 are fitted. Actually,

magnets

437 and 243 are provided on the upper end surface of each abutting portion 43 and the surface in the concave portion 242 of the engaging portion 241 facing the upper end surface, and between these

magnets

437 and 243. The engaging portion 241 and the contact portion 43 are firmly coupled to each other by the magnetic force (attraction) acting on the.

At this time, as shown in FIG. 5, the flange portion 239 of the supported portion 237 is spaced above the flange portion 224 of the plate support portion 222, and the plate support portion 222 and the supported portion 237 are not in contact with each other. In other words, the support of the top plate 123 by the plate support part 222, that is, the indirect support of the top plate 123 by the chamber opening / closing mechanism 131 is released. For this reason, the top plate 123 can be rotated by the substrate rotating mechanism 15 together with the substrate holding unit 14 and the substrate 9 held by the substrate holding unit 14 independently of the chamber lid 122.

As shown in FIG. 6, the contact portion 43 is pushed downward by the weight of the top plate 123 until the lower surface of the engagement portion 241 contacts the upper surface of the contact portion accommodating portion 431. The end of the bar 44 on the side of the bar 45 moves above the end on the side of the contact part 43, and the bar 45 is inclined so that the upper end of the bar 45 approaches the substrate 9. As a result, the claw portion 41 comes into contact with the edge (side surface) of the substrate 9 on the support pin 144, and the edge is pushed by the claw portion 41 toward the central axis J1. Actually, the forces acting on the plurality of contact portions 43 are transmitted to the plurality of claw portions 41, respectively, and the plurality of claw portions 41 arranged in the circumferential direction cause the different portions of the edge of the substrate 9 to have substantially the same force. It is pushed toward the central axis J1. As a result, the substrate 9 is firmly held by the chuck portion 4 while the center of the substrate 9 is disposed on the central axis J1 (step S11). Even when the size (diameter) of the substrate 9 supported by the substrate support portion 141 varies, the amount of contraction of the elastic member 436 of the contact portion 43 changes, so that the lower surface of the engagement portion 241 is changed. It abuts on the upper surface of the abutting portion accommodating portion 431. Accordingly, the vertical distance between the lower surface of the top plate 123 and the upper surface 91 of the substrate 9 is kept constant.

When the substrate 9 is held, the substrate rotation mechanism 15 shown in FIG. 5 starts rotating the substrate 9 at a constant rotation speed (which is a relatively low rotation speed, hereinafter referred to as “steady rotation speed”). . In addition, the supply of the inert gas (here, nitrogen gas) from the inert gas supply unit 186 (see FIG. 2) to the expanded sealed space 100 is started, and the gas in the expanded sealed space 100 by the outer exhaust unit 194 is started. Starts to be discharged. As a result, after a predetermined time has elapsed, the enlarged sealed space 100 becomes an inert gas filled state filled with an inert gas (that is, a low oxygen atmosphere with a low oxygen concentration). Note that the supply of the inert gas to the enlarged sealed space 100 and the discharge of the gas in the enlarged sealed space 100 may be performed from the open state shown in FIG.

Next, heated gas is ejected from the plurality of heated gas supply nozzles 180 toward the lower surface 92 of the rotating substrate 9. Thereby, the substrate 9 is heated. And supply of a chemical | medical solution is started toward the center part of the upper surface 91 of the board | substrate 9 from the upper nozzle 181 (step S12). The chemical solution from the upper nozzle 181 is continuously supplied to the upper surface 91 of the rotating substrate 9. The chemical solution on the upper surface 91 spreads to the outer peripheral portion of the substrate 9 by the rotation of the substrate 9, and the entire upper surface 91 is covered with the chemical solution.

During the supply of the chemical solution from the upper nozzle 181, the ejection of the heated gas from the heated gas supply nozzle 180 is also continued. Thereby, etching with respect to the upper surface 91 with a chemical | medical solution is performed, heating the board | substrate 9 uniformly at about desired temperature. As a result, the uniformity of the chemical treatment for the substrate 9 can be improved. When supplying the chemical solution from the upper nozzle 181, the lower surface of the top plate 123 positioned at the connection position extends along the upper surface 91 of the substrate 9 so as to cover the substrate 9 above the substrate 9, and the upper surface 91 of the substrate 9. Is close to. As described above, the treatment with the chemical solution for the substrate 9 is performed in a very narrow space between the lower surface of the top plate 123 and the upper surface 91 of the substrate 9. Thereby, the uniformity of the chemical treatment for the substrate 9 can be further improved.

In the enlarged sealed space 100, the chemical liquid splashed from the upper surface 91 of the rotating substrate 9 is received by the cup portion 161 through the annular opening 81 and guided to the liquid receiving recess 165. The chemical liquid guided to the liquid receiving recess 165 flows into the gas-liquid separator 193 via the first discharge path 191 shown in FIG. In the chemical solution recovery unit 195, the chemical solution is recovered from the gas-liquid separation unit 193 and is reused after impurities and the like are removed from the chemical solution through a filter or the like.

When a predetermined time (for example, 60 to 120 seconds) elapses from the start of supply of the chemical solution from the upper nozzle 181, supply of the chemical solution from the upper nozzle 181 and supply of the heated gas from the heated gas supply nozzle 180 are stopped. Then, the substrate rotation mechanism 15 makes the rotation speed of the substrate 9 higher than the steady rotation speed for a predetermined time (for example, 1 to 3 seconds), and the chemical solution is removed from the substrate 9.

Subsequently, the chamber lid part 122 and the cup part 161 move downward in synchronization. Then, as shown in FIG. 7, the lip seal 231 at the lower end of the outer edge portion of the chamber lid portion 122 is in contact with the upper portion of the chamber side wall portion 214, whereby the annular opening 81 is closed, and the chamber space 120 becomes the side space 160. And sealed in an isolated state. The cup part 161 is located at the retracted position as in FIG. Hereinafter, the state of the chamber 12 and the cup part 161 shown in FIG. 7 is referred to as a “second sealed state”. In the second sealed state, the substrate 9 directly faces the inner wall of the chamber 12, and there is no other liquid receiving part therebetween.

Even in the second sealed state, similarly to the first sealed state, the plurality of claws 41 of the chuck portion 4 push the edge of the substrate 9 toward the central axis J1, whereby the substrate 9 is firmly held. Further, the holding of the top plate 123 by the plate support unit 222 is released, and the top plate 123 rotates together with the substrate holding unit 14 and the substrate 9 independently of the chamber lid unit 122.

When the chamber space 120 is sealed, gas discharge by the outer exhaust unit 194 (see FIG. 2) is stopped and gas discharge from the chamber space 120 by the inner exhaust unit 198 is started. Then, the supply of pure water to the substrate 9 is started by the pure water supply unit 184 (step S13).

Pure water from the pure water supply unit 184 is continuously supplied from the upper nozzle 181 to the central portion of the upper surface 91 of the substrate 9. The pure water from the pure water supply unit 184 is also continuously supplied from the lower nozzle 182 to the central portion of the lower surface 92 of the substrate 9. Pure water discharged from the upper nozzle 181 and the lower nozzle 182 is supplied to the substrate 9 as a cleaning liquid.

The pure water spreads to the outer peripheral portions of the upper surface 91 and the lower surface 92 by the rotation of the substrate 9 and scatters from the outer peripheral edge of the substrate 9 to the outside. Pure water splashing from the substrate 9 is received by the inner wall of the chamber 12 (that is, the inner walls of the chamber lid portion 122 and the chamber side wall portion 214), and the second discharge path 192, the gas-liquid separation portion 197, and the discharge portion shown in FIG. It is discarded through the liquid part 199 (the same applies to the drying process of the substrate 9 described later). Thereby, in the chamber space 120, the cleaning of the chamber 12 is substantially performed together with the cleaning process for the substrate 9 with pure water. Actually, a part of pure water splashing from the substrate 9 rebounds to the central axis J1 side on the inner wall of the chamber 12, but the upper surface 91 of the substrate 9 is covered with the top plate 123, so that the inner wall of the chamber 12 is covered. Is prevented from adhering to the upper surface 91 of the substrate 9.

When a predetermined time has elapsed from the start of supplying pure water, the supply of pure water from the pure water supply unit 184 is stopped. The heated gas is ejected from the plurality of heated gas supply nozzles 180 toward the lower surface 92 of the substrate 9. Thereby, the substrate 9 is heated. Further, the rotation speed of the substrate 9 is made sufficiently higher than the steady rotation speed in a state where the heating gas is continuously ejected from the heating gas supply nozzle 180. As a result, pure water is removed from the substrate 9, and the substrate 9 is dried (step S14). When a predetermined time has elapsed from the start of drying of the substrate 9, the rotation of the substrate 9 is stopped. Prior to the drying process of the substrate 9, IPA may be supplied from the upper nozzle 181 onto the upper surface 91 of the substrate 9, and pure water may be replaced with IPA on the upper surface 91. Further, the drying process of the substrate 9 may be performed in a reduced pressure atmosphere lower than the atmospheric pressure by reducing the chamber space 120 by the inner exhaust unit 198.

Thereafter, when the chamber lid 122 is raised, the chamber 12 is opened as shown in FIG. 1, and the top plate 123 is disposed at a separated position with respect to the substrate support 141. In step S14, since the top plate 123 rotates together with the substrate support 141, almost no liquid remains on the lower surface of the top plate 123, and the liquid falls from the top plate 123 onto the substrate 9 when the chamber lid 122 is raised. There is no.

In a state where the top plate 123 is disposed at the separated position, the engaging portion 241 and the contact portion 43 shown in FIG. 3 are separated in the vertical direction, and the contact portion 43 is moved to FIG. It is arranged at the position shown. Thereby, the bar 45 is substantially upright in the vertical direction, and the claw portion 41 is separated from the edge of the substrate 9 to the outside (on the side opposite to the central axis J1). That is, the holding of the substrate 9 by the chuck portion 4 is released (step S15). Thereafter, the substrate 9 is unloaded from the chamber 12 by an external transport mechanism (step S16), and the processing of the substrate 9 by the substrate processing apparatus 1 is completed. Actually, the processes in steps S10 to S16 are repeated for the other substrates 9.

FIG. 8 is a cross-sectional view showing the vicinity of the substrate holder in the substrate processing apparatus of the comparative example. In the substrate processing apparatus of the comparative example, the substrate holding unit 95 includes a substantially annular substrate support unit 96 that supports the outer edge portion of the substrate 9 from the lower side, and the outer edge portion of the substrate 9 supported by the substrate support unit 96 on the upper side. And a substrate pressing portion 97 for pressing from the substrate. The substrate support portion 96 includes a substantially annular plate-like support portion base 960 and a plurality of first contact portions 961 fixed to the upper surface of the support portion base 960. The plurality of first contact portions 961 are arranged in the circumferential direction. Arranged. The substrate pressing portion 97 includes a plurality of second contact portions 971 fixed to the lower surface of the top plate 123, and the plurality of second contact portions 971 are arranged in the circumferential direction. On the lower surface of the outer edge portion of the top plate 123, a plurality of engagement portions 951 are arranged in the circumferential direction, and on the upper surface of the support portion base 960, a plurality of engagement pins 952 are arranged in the circumferential direction. When the top plate 123 is disposed at the coupling position, the engaging portion 951 and the engaging pin 952 are fitted, and the top plate 123 and the substrate support portion 96 are coupled. In the substrate processing apparatus of the comparative example, the substrate pressing portion 97 presses the substrate 9 against the substrate supporting portion 96 by the weight of the top plate 123, so that the substrate 9 is moved from above and below by the substrate pressing portion 97 and the substrate supporting portion 96. Sandwiched.

By the way, in the substrate processing apparatus, the diameter of the substrate 9 to be carried in slightly varies due to warpage of the substrate 9 or manufacturing errors. In order to cope with such fluctuations, in the substrate processing apparatus of the comparative example, the plurality of first contact portions 961 in the support portion base 960 are matched with the substrate 9 having the maximum diameter in the SEMI (SemiconductoremiEquipment and Materials International) standard. The position and shape, and the positions and shapes of the plurality of second contact portions 971 on the top plate 123 are determined. Therefore, in the substrate processing apparatus of the comparative example, when the substrate 9 having a diameter smaller than the maximum diameter in the above standard is carried in, when the processing liquid is supplied to the substrate 9 or when acceleration / deceleration of the rotation of the substrate 9 is performed. The position of the substrate 9 on the substrate support 96 may fluctuate (that is, the substrate 9 moves slightly). In this case, the substrate 9 and the

contact portions

961 and 971 are rubbed to generate contaminants, and the

contact portions

961 and 971 are worn. Further, if the position of the substrate 9 varies greatly, the substrate 9 may be damaged. In the substrate processing apparatus of the comparative example, the end surface of the first contact portion 961 is an inclined surface for alignment. However, even if such an inclined surface is provided, the substrate 9 is not necessarily aligned accurately. Absent.

On the other hand, in the substrate processing apparatus 1, the substrate support portion 141 is provided with the chuck portion 4 having the plurality of claw portions 41 and the transmission mechanism 42, and when the top plate 123 is positioned at the coupling position, Each contact portion 43 of the transmission mechanism 42 is pushed in the vertical direction by its own weight. The transmission mechanism 42 causes the plurality of claw portions 41 to push the edge of the substrate 9 toward the central axis J 1 by transmitting the force acting on each contact portion 43 to the corresponding claw portion 41. Thereby, even if the diameter of the board | substrate 9 carried in fluctuates, the board | substrate 9 can be hold | maintained from the outer side with the some nail | claw part 41 using the dead weight of the top plate 123 arrange | positioned at a connection position. Realized. As a result, the position of the substrate 9 on the substrate support portion 141 can be prevented from fluctuating when the processing liquid is supplied to the substrate 9 or when the rotation of the substrate 9 is accelerated / decelerated. Can be prevented. Further, the center of the substrate 9 is arranged on the central axis J1 by the plurality of claw portions 41, that is, the substrate 9 is aligned with the rotation center, so that the substrate 9, the substrate support portion 141, and the top plate are aligned. The center of gravity of the rotating body including 123 can be arranged (balanced) in the vicinity of the central axis J1, and the rotating body can be rotated stably.

Further, the top plate 123 arranged at the connection position is close to the upper surface 91 of the substrate 9 and covers the upper surface 91. Thereby, in the process of supplying the processing liquid to the rotating substrate 9, the processing liquid scattered from the outer edge portion of the substrate 9 is prevented from splashing on the inner wall of the chamber 12 and reattaching to the upper surface 91 of the substrate 9. Further, in the substrate holding unit 14, the transmission mechanism 42 includes the elastic member 436, and the elastic member 436 is elastically deformed when the size of the substrate 9 supported by the substrate support unit 141 varies. Thereby, the distance between the top plate 123 and the board | substrate 9 in a connection position can be kept constant. As a result, even if the size of the substrate 9 varies, the substrate 9 can be processed under certain conditions.

In the substrate processing apparatus 1, the substrate rotation mechanism 15 includes an annular rotor portion 152 centered on the central axis J1, and an annular stator portion 151 that faces the rotor portion 152 in the radial direction with a gap. The substrate support unit 141 is connected to the rotor unit 152, and the substrate support unit 141 and the rotor unit 152 rotate without contacting the chamber 12 in the chamber 12. Thus, even when it is not possible to transmit a driving force from a power source such as electricity or compressed air to the chuck portion 4 provided in the substrate support portion 141, the substrate processing apparatus 1 having the above structure The substrate 9 can be held while being aligned with respect to the rotation center.

FIG. 9 is a diagram showing another example of the chuck portion. The transmission mechanism 42a of the chuck portion 4a in FIG. 9 includes an abutting portion 43 and a plurality of

shafts

46 and 47 provided for each claw portion 41a. The internal structure of the contact part 43 and the contact part accommodating part 431 is the same as that of FIG.

FIG. 10 is a perspective view showing the contact portion 43 and the plurality of

shafts

46 and 47. In FIG. 10, other components are not shown for convenience of illustration. As shown in FIG. 9, a shaft 46 extending in a direction perpendicular to the central axis J1 (lateral direction in FIG. 9) is disposed in the internal space 143 of the support base 142. The shaft 46 is supported by a pair of shaft support portions 460 so as to be rotatable about its central axis J2. As shown in FIG. 10, one end of a bar 461 extending in a direction perpendicular to the central axis J2 of the shaft 46 is fixed to one end of the shaft 46, and the other end of the bar 461 is in contact with the other end. The lower end of the portion 43 is connected via a pin 424. A long hole 462 extending in the longitudinal direction of the bar 461 is formed in the bar 461, and the pin 424 is inserted into the long hole 462.

As shown in FIG. 9, a lower portion of another shaft 47 extending in the vertical direction is disposed in the internal space 143 of the support portion base 142. The shaft 47 is supported by the shaft support portion 470 so as to be rotatable about its central axis J3. As shown in FIG. 10, one end of a bar 463 extending in a direction perpendicular to the central axis J 2 of the shaft 46 is fixed to the other end of the shaft 46, and the other end of the bar 463 is fixed to the shaft 47. Is connected to the upper portion of the pin via a pin 425. A long hole 464 extending in the longitudinal direction of the bar 463 is formed in the bar 463, and the pin 425 is inserted into the long hole 464.

FIG. 11 is a plan view showing one claw portion 41a, showing the claw portion 41a viewed along the vertical direction. As shown in FIGS. 9 and 11, the claw portion 41a has a claw portion main body 411 whose shape viewed along the vertical direction is elliptical. An upper surface 412 of the claw body 411 is an inclined surface whose height gradually decreases from one end of the elliptical long axis toward the other end. On the upper surface 412 of the claw body 411, a protrusion 413 that protrudes upward is provided near the position where the height is the largest. The protrusion 413 has an inverted truncated cone shape in which the upper diameter is larger than the lower diameter. The claw portion main body 411 is fixed to the upper surface of the covered claw portion support base 410.

In the shaft 47, the portion excluding the lower portion is disposed outside the internal space 143 of the support portion base 142, and the upper end portion of the shaft 47 is fixed to the lower surface of the lid portion of the claw portion support base 410. The periphery of the portion of the shaft 47 disposed outside the internal space 143 is surrounded by the side wall portion of the claw support base 410. The connecting portion between the side wall portion of the claw support base 410 and the support portion base 142 is sealed in a state where both can slide.

In a state where the top plate 123 is located at the separated position and the disk portion 434 is in contact with the lower surface of the upper support portion 432 by the bias of the spring 435 as indicated by a two-dot chain line in FIG. However, the upper surface 412 of the nail | claw part main body 411 is arrange | positioned in the position left | separated from the protrusion part 413 slightly. As shown by the solid line in FIG. 9, when the contact portion 43 is pushed downward by the weight of the top plate 123 located at the connection position, the shaft 46 shown in FIG. 10 rotates about the central axis J2. The shaft 47 rotates about the central axis J3. As a result, the claw body 411 rotates around the central axis J3 from the rotation position indicated by the two-dot chain line in FIG. 11 to the rotation position indicated by the solid line, as indicated by the solid line in FIG. The side surface of the protruding portion 413 contacts the edge of the substrate 9 while the substrate 9 moves slightly upward. In other words, the outer edge portion of the substrate 9 bites into the recess formed by the side surface of the protruding portion 413 and the upper surface 412 of the claw portion main body 411. Actually, forces acting on the plurality of contact portions 43 are transmitted to the plurality of claw portions 41a arranged along the outer edge of the substrate 9, respectively, and different portions of the edge of the substrate 9 are transmitted by the plurality of claw portions 41a. Are pushed toward the central axis J1 with substantially the same force. In this way, in the chuck portion 4a shown in FIG. 9, it is realized that the substrate 9 is held while being aligned with the center of rotation using the weight of the top plate 123 arranged at the connection position.

FIG. 12 is a diagram showing still another example of the chuck portion. 12 is provided on the top plate 123. As shown in FIG. In FIG. 12, the cross section by the surface containing the central axis J1 is shown about the top plate 123 and a part of structure in the contact part accommodating part 431. In FIG. The chuck portion 4b includes a plurality of claw portions 41 and a transmission mechanism 42b. The plurality of claw portions 41 are arranged around the substrate 9 when viewed along the central axis J1. The transmission mechanism 42b has a structure similar to that obtained by inverting the transmission mechanism 42 in FIG. 3 in the vertical direction.

Specifically, the transmission mechanism 42 b includes an abutting portion 43 provided for each claw portion 41 and a plurality of

bars

44 and 45. The contact portion 43 is supported by the upper support portion 432 and the lower support portion 433 so as to be movable in the vertical direction. A substantially cylindrical contact portion receiving portion 431 is provided on the lower surface of the top plate 123, and the lower support portion 433 is provided in the contact portion receiving portion 431. An upper end portion of the contact portion 43 is disposed in an internal space 124 formed in the top plate 123. A bar 44 is arranged in the internal space 124, and one end portion of the bar 44 is connected to the upper end portion of the contact portion 43 via a pin 421. A long hole 441 extending in the longitudinal direction of the bar 44 is formed in the bar 44, and the pin 421 is inserted into the long hole 441. The bar 44 is supported by the bar support portion 440 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG.

The other end of the bar 44 is connected to the upper end of another bar 45 via a pin 422. A long hole 451 extending in the longitudinal direction of the bar 45 is formed in the bar 45, and the pin 422 is inserted into the long hole 451. The bar 45 is supported by the bar support portion 450 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG. In the bar 45, a portion below the bar support portion 450 is disposed outside the internal space 124 of the top plate 123. The periphery of the bar 45 in the vicinity of the lower side of the bar support 450 is covered with a diaphragm seal 427. A claw portion 41 is attached to the lower end portion of the bar 45.

The disc part 434 attached to the contact part 43 is arranged between the upper support part 432 and the lower support part 433. A spring 435 surrounding the periphery of the contact portion 43 is provided between the disc portion 434 and the upper support portion 432. The disk portion 434 and the contact portion 43 are urged downward by the spring 435. In a state where the top plate 123 is located at the separated position and the disc portion 434 is in contact with the upper surface of the lower support portion 433 as indicated by a two-dot chain line in FIG. 12, the inclination angle of the bar 45 with respect to the vertical direction is small. Thus, the claw portion 41 is separated from the edge of the substrate 9 to the outside.

An engaging portion 241a that protrudes upward is provided on the upper surface of the support portion base 142, and when the top plate 123 is located at the coupling position, the abutting portion that protrudes downward from the abutting portion accommodating portion 431. The lower end portion of 43 fits into the recess 242a at the top of the engaging portion 241a. As a result, the top plate 123 is connected to the substrate support portion 141. Further, as indicated by a solid line in FIG. 12, the contact portion 43 is pushed upward by the substrate support portion 141 until the upper surface of the engagement portion 241 a contacts the lower surface of the contact portion accommodating portion 431. Thereby, the bar 45 is inclined so that the lower end portion of the bar 45 approaches the substrate 9, and the claw portion 41 comes into contact with the edge of the substrate 9. Actually, the forces acting on the plurality of contact portions 43 are transmitted to the plurality of claw portions 41 arranged along the outer edge of the substrate 9, respectively, and the plurality of claw portions 41 are different parts of the edge of the substrate 9. Is pushed toward the central axis J1. In this way, in the chuck portion 4b shown in FIG. 12, it is possible to hold the substrate 9 while aligning it with the center of rotation using the weight of the top plate 123 arranged at the connection position. In addition, the chuck part is provided in the substrate support part 141 from the viewpoint of preventing the processing liquid splashed from the upper surface 91 of the substrate 9 from splashing and adhering to the upper surface 91 by the components of the transmission mechanism connected to the claw part. It is preferred that

The substrate processing apparatus 1 can be variously modified.

Various structures other than those described above may be employed as a transmission mechanism that transmits the force acting on the contact portion to the plurality of claw portions. For example, in the transmission mechanism 42 a of FIG. 9, a screw may be formed at an end portion of the shaft 46 on the shaft 47 side, and the screw may be screwed into the shaft 47 because it is provided on the shaft 47. In this case, when the contact portion 43 moves in the vertical direction, the shaft 46 rotates about the central axis J2, and the shaft 47 linearly extends in the direction along the upper surface 91 of the substrate 9 (left-right direction in FIG. 9). Moving. Further, the transmission mechanism interlocks the force acting on one or a plurality of contact portions 43 in addition to the structure that transmits the force acting on the contact portion 43 provided for each claw portion only to the claw portion. And a structure for transmitting to a plurality of claws.

When the size of the substrate 9 supported by the substrate support portion 141 varies, the elastic member that is elastically deformed so that the distance between the top plate 123 and the substrate 9 at the connection position is constant is the contact of the transmission mechanism. It may be provided other than the contact part 43. When the distance between the top plate 123 and the substrate 9 at the coupling position is allowed to slightly vary depending on the size of the substrate 9, the elastic member may be omitted from the transmission mechanism.

In the above-described embodiment, the chamber opening / closing mechanism 131 that is a sealed space opening / closing mechanism also serves as (a part of) the opposed portion support mechanism that supports the top plate 123 that is the upper surface opposed portion, whereby the structure of the substrate processing apparatus 1 is configured. Although simplified, depending on the design of the substrate processing apparatus 1, the facing portion support mechanism may be provided separately from the chamber opening / closing mechanism 131.

In the example shown in FIG. 13, a top plate moving mechanism 126 that moves the top plate 123 in the vertical direction is provided as an opposing portion supporting mechanism. The top plate moving mechanism 126 includes a first magnet 261, a second magnet 262, and a magnet moving mechanism 263. Each of the first magnet 261 and the second magnet 262 has a substantially annular shape centered on the central axis J1. A cylindrical top plate shaft portion 235 formed of a non-magnetic material is provided on the top surface of the top plate 123, and the first magnet 261 is an outer peripheral surface of the top plate shaft portion 235 inside the top plate shaft portion 235. It is arranged along. The second magnet 262 is disposed so as to surround the top plate shaft portion 235 in the annular hole 264 formed in the chamber lid portion 122. The second magnet 262 moves up and down in the annular hole 264 by the magnet moving mechanism 263. As a result, the top plate 123 can move relative to the substrate support portion 141 between a separation position where the top plate 123 is spaced upward with respect to the substrate support portion 141 and a connection position where the top plate 123 is connected to the substrate support portion 141. It becomes possible.

Further, the chamber opening / closing mechanism 131 may raise and lower the chamber lid 122 relative to the chamber main body 121, and the chamber main body 121 may move up and down relative to the chamber lid 122 whose position is fixed. Also in this case, the chamber main body 121 is raised and the upper end portion of the chamber main body 121 is brought close to or in contact with the chamber lid portion 122, so that the top plate 123 is brought into a non-contact state with the chamber lid portion 122 and disposed at the coupling position. (See FIG. 5 or FIG. 7). Further, the chamber main body 121 is lowered and separated from the chamber lid portion 122, so that the top plate 123 is suspended from a part of the chamber lid portion 122 located above the chamber main body 121 and arranged at the separation position (see FIG. 1). As described above, the opposed portion support mechanism that selectively arranges the top plate 123 at the separation position and the connection position can be realized by various structures.

In the substrate processing apparatus 1, an annular plate-like member facing only the outer edge portion of the upper surface 91 of the substrate 9 may be provided as the upper surface facing portion. Also in this case, in the process of supplying the processing liquid to the rotating substrate 9, the processing liquid splashing from the outer edge of the substrate 9 rebounds on the inner wall of the chamber 12 and reattaches to the upper surface 91 of the substrate 9. This is prevented by the annular plate-like member disposed in the frame. As described above, the substrate processing apparatus 1 is provided with the upper surface facing portion facing at least the outer edge portion of the upper surface 91 of the substrate 9.

The shapes and structures of the stator portion 151 and the rotor portion 152 of the substrate rotation mechanism 15 may be variously changed. For example, the stator part 151 may be provided inside the rotor part 152 (center axis J1 side). The rotor unit 152 does not necessarily need to rotate in a floating state, and a structure such as a guide for mechanically supporting the rotor unit 152 is provided in the chamber 12, and the rotor unit 152 rotates along the guide. Good. Further, the substrate rotation mechanism 15 is not necessarily a hollow motor. For example, a substrate rotation mechanism that rotates a shaft fixed to the lower surface of the disk-shaped substrate support 141 may be used.

In the substrate processing apparatus 1, the substrate support 141, the rotor 152 of the substrate rotation mechanism 15, the top plate 123, and the

chucks

4, 4 a and 4 b are provided in the chamber 12 which is a sealed space forming unit and sealed. The processing for the substrate 9 is performed in the internal space, but depending on the design of the substrate processing apparatus, the processing for the substrate 9 may be performed in the open space.

The substrate processed by the substrate processing apparatus 1 is not limited to a semiconductor substrate, and may be a glass substrate or another substrate.

FIG. 14 is a sectional view showing a substrate processing apparatus 1a according to the second embodiment of the present invention. The basic structure of the substrate processing apparatus 1a is the same as that of the substrate processing apparatus 1 of FIG. 1 (including the gas-liquid supply unit 18 and the gas-liquid discharge unit 19 of FIG. 2), and the same reference numerals are given to the same configurations. In the following description of the structure of the substrate processing apparatus 1a, differences from the substrate processing apparatus 1 will be mainly described.

14 is provided with a plurality of engaging pins 140 protruding upward, and the plurality of engaging pins 140 are arranged in the circumferential direction. As described above, a concave portion that is recessed upward is provided in the lower portion of each engaging portion 241, and the engaging pin 140 is inserted into the concave portion as will be described later. Actually, the engaging pin 140 and the engaging portion 241 are arranged at different positions in the circumferential direction from the plurality of claw portions 41. The number of combinations of the engagement pin 140 and the engagement portion 241 is preferably 3 or more.

A plurality of rod-like connection members 52 extending in the vertical direction are provided on the upper portion of the rotor portion 152, and the rotor portion 152 is connected to the support portion base 142 of the substrate support portion 141 by the plurality of connection members 52. The plurality of connection members 52 are preferably arranged at equiangular intervals in the circumferential direction.

Between the rotor part 152 and the board | substrate support part 141, the cyclic | annular weight part 51 centering on the central axis J1 is provided. The weight portion 51 is provided with a plurality of through holes 511 (see FIG. 15) penetrating in the vertical direction. The plurality of connection members 52 described above are inserted into the plurality of through holes 511, respectively. The weight 51 can move in the vertical direction along the connecting member 52 while the inner peripheral surface of each through hole 511 of the weight 51 slides on the outer peripheral surface of the connecting member 52. The plurality of connection members 52 are guide portions that guide the vertical movement of the weight portion 51 between the substrate support portion 141 and the rotor portion 152 disposed below the substrate support portion 141.

FIG. 15 is a diagram showing the configuration of the chuck portion 4 and the weight support mechanism 53, and shows an enlarged vicinity of the left cross section showing the support portion base 142 in FIG. As described above, the chuck portion 4 is provided on the substrate support portion 141, and a part of the chuck portion 4 is provided inside an annular support portion base 142 centered on the central axis J 1. In FIG. 15, the chamber body 121, the weight portion 51, the support portion base 142, and a connecting portion support portion 492 and a bellows 493 to be described later are shown in a cross section by a plane including the central axis J 1 (FIGS. 16 and 19). And the same in FIG. 23). The chuck portion 4 includes the plurality of claw portions 41 and the transmission mechanism 42 described above. As described above, the plurality of claw portions 41 are arranged in the circumferential direction around the substrate 9 supported by the plurality of support pins 144. The number of the plurality of claw portions 41 is at least 3, and in each combination of two claw portions 41 adjacent in the circumferential direction among the at least three claw portions 41, the two claw portions 41 and the central axis J1 The angle formed by the line connecting the two is less than 180 degrees. The at least three claw portions 41 are preferably provided at equiangular intervals in the circumferential direction. In the present embodiment, four claw portions 41 are provided at equiangular intervals in the circumferential direction.

The transmission mechanism 42 includes a connecting portion 49 provided for each claw portion 41 and a plurality of

bars

44 and 45. The connecting portion 49 is a bar member extending in the vertical direction, and is supported by a cylindrical connecting portion support portion 492 provided on the lower surface of the support portion base 142 so as to be movable in the vertical direction. A lower end portion of the connecting portion 49 is connected to the weight portion 51. A substantially cylindrical bellows 493 is provided on the lower end surface of the connecting portion support portion 492. The bellows 493 is formed of a material that does not allow the passage of gas or liquid. The connecting portion between the bellows 493 and the connecting portion 49, the connecting portion between the bellows 493 and the connecting portion supporting portion 492, and the connecting portion between the connecting portion supporting portion 492 and the supporting portion base 142 are sealed, and gas or liquid Passage is prevented.

The upper end portion of the connecting portion 49 is disposed in an internal space 143 formed in the support portion base 142. A bar 44 is disposed in the internal space 143, and one end of the bar 44 is connected to the upper end of the connecting portion 49 via a pin 421. A long hole 441 extending in the longitudinal direction of the bar 44 is formed in the bar 44, and the pin 421 is inserted into the long hole 441. The bar 44 is supported by a bar support portion 440 provided in the internal space 143 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG.

The other end of the bar 44 is connected via a pin 422 to the lower end of another bar 45 that extends approximately in the vertical direction. A long hole 451 extending in the longitudinal direction of the bar 45 is formed in the bar 45, and the pin 422 is inserted into the long hole 451. A communication hole 145 that communicates with the internal space 143 is provided on the upper surface of the support base 142, and the bar 45 is inserted into the communication hole 145. The bar 45 is supported by a bar support portion 450 fixed around the communication hole 145 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG. In the bar 45, a portion above the bar support portion 450 is disposed outside the internal space 143 of the support portion base 142, and the periphery thereof is covered with a substantially cylindrical bellows 423. A claw portion 41 is attached to the upper end portion of the bar 45. The bellows 423 is formed of a material that does not allow the passage of gas or liquid. The connection part between the bellows 423 and the claw part 41, the connection part between the bellows 423 and the bar support part 450, and the connection part between the bar support part 450 and the support part base 142 are sealed, and the passage of gas or liquid is prevented. Is prevented.

As shown in FIG. 15, the chamber side wall 214 is provided with a recess 218 that opens toward the lower annular space 217, and the recess 218 is provided with a weight support mechanism 53. The weight support mechanism 53 includes an air cylinder 531, and a support member 533 is attached to the tip of the piston rod 532 of the air cylinder 531. The front end surface (surface on the central axis J1 side) 534 of the support member 533 is an inclined surface that is separated from the central axis J1 as it goes upward. A bellows 535 is provided between the main body of the air cylinder 531 and the support member 533 so as to surround the piston rod 532. The bellows 535 is formed of a material that does not allow gas or liquid to pass therethrough, and prevents the gas or liquid from entering the air cylinder 531. In a state where the air cylinder 531 pushes out the piston rod 532, the outer edge portion of the weight portion 51 is supported from below by the support member 533, and the weight portion 51 is a position shown in FIG. 15 (hereinafter referred to as “support position”). Placed in. The connecting portion 49 is pushed upward by the weight portion 51 located at the support position. Therefore, the end of the bar 44 on the bar 45 side is located below the end of the connecting part 49, and the bar 45 is substantially upright along the vertical direction. Thereby, the nail | claw part 41 is arrange | positioned in the position spaced apart from the edge of the board | substrate 9 on the outer side (on the opposite side to the central axis J1). The configuration included in the transmission mechanism 42 is provided for each of the plurality of claw portions 41. The weight support mechanism 53 may have a motor or the like.

Next, the flow of processing of the substrate 9 in the substrate processing apparatus 1a will be described with reference to FIG. In the substrate processing apparatus 1a, as shown in FIG. 14, in a state where the chamber lid part 122 is spaced apart from the chamber body 121 and positioned above, and the cup part 161 is spaced apart from the chamber lid part 122 and positioned below. The substrate 9 is carried into the chamber 12 by an external transport mechanism and supported from below by the substrate support 141 (step S10). Hereinafter, the state of the chamber 12 and the cup part 161 shown in FIG. 14 is referred to as an “open state”. The opening between the chamber lid part 122 and the chamber side wall part 214 has an annular shape centering on the central axis J1, and is hereinafter referred to as “annular opening 81”. In the substrate processing apparatus 1a, the chamber lid 122 is separated from the chamber main body 121, whereby an annular opening 81 is formed around the substrate 9 (that is, radially outside). In step S 10, the substrate 9 is carried in via the annular opening 81.

When the substrate 9 is carried in, the air cylinder 531 of the weight support mechanism 53 shown in FIG. 15 draws the piston rod 532 slowly, so that the support member 533 is recessed 218 of the chamber side wall 214 as shown in FIG. Move in. Thereby, the front end surface 534 of the support member 533 is separated from the outer edge portion of the weight portion 51, and the support of the weight portion 51 by the weight support mechanism 53 is released. The connecting portion 49 and the weight portion 51 descend from the support position indicated by the two-dot chain line in FIG. The end of the bar 44 on the bar 45 side moves to the upper side of the end on the connecting part 49 side, and the bar 45 is inclined so that the upper end of the bar 45 approaches the substrate 9. As a result, the claw portion 41 comes into contact with the edge (side surface) of the substrate 9 on the support pin 144, and the edge is pushed by the claw portion 41 toward the central axis J1. Actually, the forces acting on the plurality of connecting portions 49 are transmitted to the plurality of claw portions 41, respectively, and the different portions of the edge of the substrate 9 are centered by substantially the same force by the plurality of claw portions 41 arranged in the circumferential direction. It is pushed toward the axis J1. As a result, the substrate 9 is firmly held by the chuck portion 4 while the center of the substrate 9 is disposed on the central axis J1 (step S11). At this time, the plurality of claws 41 abut against the edge of the substrate 9 to restrict the downward movement of the weight 51, and the weight 51 is located at a position indicated by a solid line in FIG. It is referred to as “release position”.

Subsequently, the chamber opening / closing mechanism 131 lowers the chamber lid 122 from the position shown in FIG. 14 to the position shown in FIG. 17 (position close to the chamber body 121). Further, the cup portion 161 rises from the position shown in FIG. 14 to the position shown in FIG. 17 and is located over the entire circumference on the radially outer side of the annular opening 81. In the following description, the state of the chamber 12 and the cup part 161 shown in FIG. 17 is referred to as a “first sealed state”. 17 is referred to as a “liquid receiving position”, and the position of the cup 161 illustrated in FIG. 14 is referred to as a “retracted position”. The cup part moving mechanism 162 moves the cup part 161 in the vertical direction between a liquid receiving position radially outside the annular opening 81 and a retracted position below the liquid receiving position.

Further, in the first sealed state, the upper end portion of the engagement pin 140 protruding upward from the support portion base 142 is fitted into the concave portion below each engagement portion 241 of the top plate 123. As a result, the top plate 123 is connected to the support base 142 of the substrate support 141. In other words, the relative position in the rotation direction (circumferential direction) of the top plate 123 with respect to the substrate support 141 is fixed. In the following description, a position where the top plate 123 is connected to the substrate support portion 141 is referred to as a “connection position”. When the chamber lid part 122 moves down, the rotation position of the support part base 142 is controlled by the substrate rotation mechanism 15 so that the engagement part 241 and the engagement pin 140 are fitted. Actually, magnets are provided on the upper end surface of each engagement pin 140 and the surface in the concave portion of the engagement portion 241 facing the upper end surface, and a magnetic force (attraction) acting between these magnets is provided. The engaging portion 241 and the engaging pin 140 are firmly coupled.

At this time, the flange portion 239 of the supported portion 237 is spaced above the flange portion 224 of the plate support portion 222, and the plate support portion 222 and the supported portion 237 are not in contact with each other. In other words, the support of the top plate 123 by the plate support part 222, that is, the indirect support of the top plate 123 by the chamber opening / closing mechanism 131 is released. For this reason, the top plate 123 can be rotated by the substrate rotating mechanism 15 together with the substrate holding unit 14 and the substrate 9 held by the substrate holding unit 14 independently of the chamber lid 122.

Subsequently, the substrate rotation mechanism 15 starts rotating the substrate 9 at a constant rotation speed (which is a relatively low rotation speed, hereinafter referred to as “steady rotation speed”). In addition, the supply of the inert gas (here, nitrogen gas) from the inert gas supply unit 186 (see FIG. 2) to the expanded sealed space 100 is started, and the gas in the expanded sealed space 100 by the outer exhaust unit 194 is started. Starts to be discharged. As a result, after a predetermined time has elapsed, the enlarged sealed space 100 becomes an inert gas filled state filled with an inert gas (that is, a low oxygen atmosphere with a low oxygen concentration). The supply of the inert gas to the expanded sealed space 100 and the discharge of the gas in the expanded sealed space 100 may be performed from the open state shown in FIG.

Next, heated gas is ejected from the plurality of heated gas supply nozzles 180 toward the lower surface 92 of the rotating substrate 9. Thereby, the substrate 9 is heated. And supply of a chemical | medical solution is started toward the center part of the upper surface 91 of the board | substrate 9 from the upper nozzle 181 (step S12). The operation related to the supply of the chemical solution in step S12 is the same as that in the first embodiment.

Subsequently, the chamber lid part 122 and the cup part 161 move downward in synchronization. Then, as shown in FIG. 18, the lip seal 231 at the lower end of the outer edge portion of the chamber lid portion 122 is in contact with the upper portion of the chamber side wall portion 214, whereby the annular opening 81 is closed, and the chamber space 120 becomes the side space 160. And sealed in an isolated state. The cup portion 161 is located at the retracted position as in FIG. Hereinafter, the state of the chamber 12 and the cup part 161 shown in FIG. 18 is referred to as a “second sealed state”. In the second sealed state, the substrate 9 directly faces the inner wall of the chamber 12, and there is no other liquid receiving part therebetween.

When the chamber space 120 is sealed, gas discharge by the outer exhaust unit 194 (see FIG. 2) is stopped and gas discharge from the chamber space 120 by the inner exhaust unit 198 is started. Then, the supply of pure water to the substrate 9 is started by the pure water supply unit 184 (step S13). The operation related to the supply of pure water in step S13 is the same as that in the first embodiment.

Thereafter, as the chamber lid part 122 is raised, the chamber 12 is opened as shown in FIG. 14, and the top plate 123 is arranged at a separated position with respect to the substrate support part 141. In step S14, since the top plate 123 rotates together with the substrate support 141, almost no liquid remains on the lower surface of the top plate 123, and the liquid falls from the top plate 123 onto the substrate 9 when the chamber lid 122 is raised. There is no.

Further, the air cylinder 531 of the weight support mechanism 53 shown in FIG. 16 slowly pushes the piston rod 532, so that the front end surface 534 of the support member 533 comes into contact with the outer edge portion of the weight portion 51, and further along the front end surface 534. The weight 51 is pushed upward. Accordingly, the weight portion 51 and the connecting portion 49 are arranged at the positions shown in FIG. 15, the bar 45 is substantially upright along the vertical direction, and the claw portion 41 is outward from the edge of the substrate 9 (opposite to the central axis J1). Apart). That is, the holding of the substrate 9 by the chuck portion 4 is released (step S15). Thereafter, the substrate 9 is unloaded from the chamber 12 by an external transport mechanism (step S16), and the processing of the substrate 9 by the substrate processing apparatus 1a is completed. Actually, the processes in steps S10 to S16 are repeated for the other substrates 9.

By the way, in the substrate processing apparatus, the diameter of the substrate 9 to be carried in slightly varies due to warpage of the substrate 9 or manufacturing errors. In order to cope with such fluctuations, the substrate processing apparatus of the comparative example shown in FIG. 8 has a plurality of first portions in the support base 960 in accordance with the substrate 9 having the maximum diameter in the SEMI (Semiconductor Equipment and Materials International) standard. The position and shape of the contact portion 961 and the positions and shapes of the plurality of second contact portions 971 on the top plate 123 are determined. Therefore, in the substrate processing apparatus of the comparative example, when the substrate 9 having a diameter smaller than the maximum diameter in the above standard is carried in, when the processing liquid is supplied to the substrate 9 or when acceleration / deceleration of the rotation of the substrate 9 is performed. The position of the substrate 9 on the substrate support 96 may fluctuate (that is, the substrate 9 moves slightly). In this case, the substrate 9 and the

contact portions

961 and 971 are rubbed to generate contaminants, and the

contact portions

On the other hand, in the substrate processing apparatus 1a, the weight part 51 supported at the support position by the weight support mechanism 53, and the chuck part 4 having the plurality of claw parts 41 and the transmission mechanism 42 are provided. When the support of the weight part 51 by the weight support mechanism 53 is released, the weight part 51 descends to a support release position below the support position by its own weight, and each connecting part of the transmission mechanism 42 connected to the weight part 51 49 is pulled downward. The transmission mechanism 42 transmits the force acting on each connecting portion 49, that is, the force due to the weight of the weight portion 51, to the corresponding claw portion 41, so that the edges of the substrate 9 are centered on the central axis J 1. Push it toward you. Thereby, even if the diameter of the board | substrate 9 carried in fluctuates, the board | substrate 9 is hold | maintained from the outer side by the some nail | claw part 41 using the weight of the weight part 51 arrange | positioned in a support cancellation | release position. Is realized. As a result, the position of the substrate 9 on the substrate support portion 141 can be prevented from fluctuating when the processing liquid is supplied to the substrate 9 or when the rotation of the substrate 9 is accelerated / decelerated. Can be prevented. Further, the center of the substrate 9 is arranged on the central axis J1 by the plurality of claw portions 41, that is, the substrate 9 is aligned with the rotation center, so that the substrate 9, the substrate support portion 141, and the top plate are aligned. The center of gravity of the rotating body including 123 can be arranged (balanced) in the vicinity of the central axis J1, and the rotating body can be rotated stably.

Further, when releasing the holding of the substrate 9 (releasing the substrate 9), the weight portion 51 is only lifted along the connecting member 52 which is a guide portion, which is excessive with respect to other configurations of the rotating body. There is no power. Therefore, the substrate 9 can be held and released without shifting the position of the rotating body. Further, since no metal member such as a spring is used in the chuck portion 4, the chemical resistance of the substrate holding portion 14 can be easily improved, and the substrate holding portion 14 that can be used in various chemical atmospheres is provided. Can be realized.

In the substrate processing apparatus 1a, the substrate rotation mechanism 15 includes an annular rotor portion 152 centered on the central axis J1, and an annular stator portion 151 that faces the rotor portion 152 in the radial direction with a gap. The substrate support unit 141 is connected to the rotor unit 152, and the substrate support unit 141 and the rotor unit 152 rotate without contacting the chamber 12 in the chamber 12. Thus, even if it is a case where the driving force by power sources, such as electricity and compressed air, cannot be transmitted with respect to the chuck | zipper part 4 provided in the board | substrate support part 141, in the substrate processing apparatus 1a which has the said structure, The substrate 9 can be held while being aligned with respect to the rotation center.

In addition, the position of the weight portion 51 (support release position) when the support by the weight support mechanism 53 is released is greater than the position (support position) of the weight portion 51 when supported by the weight support mechanism 53. Close to 152. Thereby, generation | occurrence | production of the vibration at the time of the weight part 51 rotating with the rotor part 152 can be suppressed. The support release position of the weight portion 51 can be regarded as a position for rotating the weight portion 51 together with the substrate 9 and the substrate support portion 141.

FIG. 19 is a diagram showing another example of the chuck portion. The transmission mechanism 42a of the chuck portion 4a in FIG. 19 includes a connecting portion 49 and a plurality of

shafts

46 and 47 provided for each claw portion 41a. The structure of the connection part 49 and the connection part support part 492 is the same as that of FIG.

FIG. 20 is a perspective view showing the connecting portion 49 and the plurality of

shafts

46 and 47. In FIG. 20, for convenience of illustration, illustration of other components is omitted. As shown in FIG. 19, a shaft 46 extending in a direction perpendicular to the central axis J 1 (lateral direction in FIG. 19) is disposed in the internal space 143 of the support base 142. The shaft 46 is supported by a pair of shaft support portions 460 so as to be rotatable about its central axis J2. As shown in FIG. 20, one end portion of a bar 461 extending in a direction perpendicular to the central axis J2 of the shaft 46 is fixed to one end portion of the shaft 46, and the other end portion of the bar 461 is a connecting portion. 49 is connected to the upper end of 49 via a pin 424. A long hole 462 extending in the longitudinal direction of the bar 461 is formed in the bar 461, and the pin 424 is inserted into the long hole 462.

As shown in FIG. 19, the lower portion of another shaft 47 extending in the vertical direction is disposed in the internal space 143 of the support portion base 142. The shaft 47 is supported by the shaft support portion 470 so as to be rotatable about its central axis J3. As shown in FIG. 20, one end of a bar 463 extending in a direction perpendicular to the central axis J2 of the shaft 46 is fixed to the other end of the shaft 46, and the other end of the bar 463 is fixed to the shaft 47. Is connected to the upper portion of the pin via a pin 425. A long hole 464 extending in the longitudinal direction of the bar 463 is formed in the bar 463, and the pin 425 is inserted into the long hole 464.

FIG. 21 is a plan view showing one claw portion 41a, showing the claw portion 41a viewed along the vertical direction. As shown in FIG. 19 and FIG. 21, the claw portion 41a has a claw portion body 411 whose shape viewed along the vertical direction is elliptical. An upper surface 412 of the claw body 411 is an inclined surface whose height gradually decreases from one end of the elliptical long axis toward the other end. On the upper surface 412 of the claw body 411, a protrusion 413 that protrudes upward is provided near the position where the height is the largest. The protrusion 413 has an inverted truncated cone shape in which the upper diameter is larger than the lower diameter. The claw portion main body 411 is fixed to the upper surface of the covered claw portion support base 410.

As shown by a two-dot chain line in FIG. 19, in a state where the weight portion 51 is positioned at the support position by the weight support mechanism 53, the edge of the substrate 9 slightly extends from the protruding portion 413 on the upper surface 412 of the claw portion main body 411. It is arranged at a distant position. As shown by a solid line in FIG. 19, when the connecting portion 49 is pulled downward by the weight of the weight portion 51 disposed at the support release position, the shaft 46 shown in FIG. 20 rotates about the central axis J2. The shaft 47 rotates about the central axis J3. Thereby, the claw body 411 rotates around the central axis J3 from the rotation position indicated by the two-dot chain line in FIG. 21 to the rotation position indicated by the solid line, and as indicated by the solid line in FIG. The side surface of the protruding portion 413 contacts the edge of the substrate 9 while the substrate 9 moves slightly upward. In other words, the outer edge portion of the substrate 9 bites into the recess formed by the side surface of the protruding portion 413 and the upper surface 412 of the claw portion main body 411. Actually, forces acting on the plurality of connecting portions 49 are transmitted to the plurality of claw portions 41a arranged along the outer edge of the substrate 9, respectively, and the plurality of claw portions 41a cause different portions of the edge of the substrate 9 to be located. It is pushed toward the central axis J1 with almost the same force. In this way, in the chuck portion 4a shown in FIG. 19, it is realized that the substrate 9 is held while being aligned with the rotation center by using the weight of the weight portion 51 arranged at the support release position. .

In the substrate processing apparatus 1 a of FIG. 14, the weight support mechanism 53 is provided in the chamber 12, but the weight support mechanism may be provided outside the chamber 12. FIG. 22 is a diagram illustrating another example of the weight support mechanism. The weight support mechanism 53a shown in FIG. 22 can rotate the support arm 536 about a central axis J4 parallel to the vertical direction, and can move the support arm 536 up and down along the vertical direction.

When the weight part 51 is supported by the weight support mechanism 53a, the chamber 12 and the cup part 161 are opened. The weight support mechanism 53a moves up the support arm 536, and then rotates about the central axis J4, so that the support arm 536 is disposed in the chamber 12 via the annular opening 81. Thereafter, the weight support mechanism 53 a moves down the support arm 536 and then rotates, whereby the support member 537 provided at the tip of the support arm 536 is disposed below the outer edge of the weight part 51. Then, when the weight support mechanism 53a slightly raises the support arm 536, the weight portion 51 is supported from below by the support member 537, and is disposed at the support position. Thereby, holding | maintenance of the board | substrate 9 by the some nail | claw part 41 is cancelled | released. When holding the substrate 9 by the plurality of claw portions 41, the support of the weight portion 51 is released by slightly lowering the support arm 536, and the weight portion 51 is disposed at the support release position. The weight support mechanism 53a sequentially rotates, lifts, and rotates the support arm 536, thereby removing the support arm 536 from the chamber 12. The weight support mechanism 53a may move the support arm 536 in the horizontal direction and move up and down in the vertical direction.

Further, as shown in FIG. 23, the weight support mechanism 53 may indirectly support the weight part 51 via the connecting part 49. In the example of FIG. 23, the connecting portion 49 protrudes above the upper surface of the supporting portion base 142, and a supported portion 498 that extends to the opposite side of the central axis J 1 is provided at the upper end portion of the connecting portion 49. Then, the supported portion 498 is supported from below by the support member 533 of the weight support mechanism 53, whereby the weight portion 51 is disposed at the support position. Further, when the support of the supported portion 498 by the support member 533 of the weight support mechanism 53 is released, the weight portion 51 is disposed at the support release position. Of course, the supported portion 498 of the connecting portion 49 shown in FIG. 23 may be supported by the weight support mechanism 53a of FIG.

FIG. 24 is a view showing a part of the substrate processing apparatus 1a according to the third embodiment of the present invention, and shows the configuration of the chuck portion 4b. In the substrate processing apparatus 1a of FIG. 24, the weight part 51 and the weight support mechanism 53 are omitted and the structure of the chuck part 4b is different from that of the chuck part 4 of FIG. 15 as compared with the substrate processing apparatus 1a of FIG. . Other configurations are the same as those in FIG. 15, and the same components are denoted by the same reference numerals.

Similar to the chuck part 4 of FIG. 15, the chuck part 4b of FIG. 24 is provided on the substrate support part 141, and a part of the chuck part 4b is located inside the annular support part base 142 centering on the central axis J1. Provided. In FIG. 24, a part of the configuration within the support portion base 142 and the abutting portion accommodating portion 431 described later is shown by a cross section including the central axis J1 (the same applies to FIGS. 25 and 26 described later). ). The chuck portion 4b includes a plurality of claw portions 41 and a transmission mechanism 42b. The plurality of claw portions 41 are arranged in the circumferential direction around the substrate 9 supported by the plurality of support pins 144.

In the transmission mechanism 42b, a contact portion 43 is provided for each claw portion 41 instead of the connecting portion 49 in the chuck portion 4 of FIG. The contact portion 43 is a bar member extending in the vertical direction, and a part thereof is disposed in the contact portion accommodating portion 431 provided on the upper surface of the support portion base 142. An annular upper support portion 432 and a lower support portion 433 are provided in the contact portion accommodating portion 431, and the contact portion 43 is movable in the vertical direction by the upper and

lower support portions

432 and 433. Supported. A lower end portion of the contact portion 43 is disposed in an internal space 143 formed in the support portion base 142. The contact portion 43 is connected to the claw portion 41 via the

bars

44 and 45. The structure of the

bars

44 and 45 is the same as that of the chuck portion 4 of FIG.

A disc portion 434 centered on the contact portion 43 is attached to the contact portion 43. The disc part 434 is disposed between the upper support part 432 and the lower support part 433 in the contact part accommodating part 431. Between the disc part 434 and the lower side support part 433, the spring 435 surrounding the circumference | surroundings of the contact part 43 is provided. The disk portion 434 and the contact portion 43 are urged upward by the spring 435, and the disk portion 434 contacts the lower surface of the upper support portion 432 as shown in FIG. In a state in which the disc portion 434 is in contact with the upper support portion 432, the end of the bar 44 on the bar 45 side is positioned below the end of the contact portion 43, and the bar 45 is along the vertical direction. Approximately upright. Thereby, the nail | claw part 41 is arrange | positioned in the position spaced apart from the edge of the board | substrate 9 on the outer side (on the opposite side to the central axis J1). An elastic member 436 formed of rubber or the like is provided on a part (or all) of the contact portion 43, and the contact portion 43 can be slightly expanded and contracted in the longitudinal direction. The configuration included in the transmission mechanism 42 b is provided for each of the plurality of claw portions 41.

As shown in FIG. 25, when the top plate 123 is disposed at the connecting position for rotation together with the substrate 9 and the substrate support portion 141, the concave portions 242 below the respective engaging portions 241 of the top plate 123 The upper end part of the contact part 43 which protrudes upward from the contact part accommodating part 431 fits. As a result, the top plate 123 is connected to the support base 142 of the substrate support 141. Thus, the contact part 43 also has the function of the engagement pin 140 of FIG. Actually,

magnets

In the substrate processing apparatus 1a, the contact portion 43 is pushed downward by the weight of the top plate 123 until the lower surface of the engagement portion 241 contacts the upper surface of the contact portion accommodating portion 431. The end of the bar 44 on the side of the bar 45 moves above the end on the side of the contact part 43, and the bar 45 is inclined so that the upper end of the bar 45 approaches the substrate 9. As a result, the claw portion 41 comes into contact with the edge (side surface) of the substrate 9 on the support pin 144, and the edge is pushed by the claw portion 41 toward the central axis J1. Actually, the forces acting on the plurality of contact portions 43 are transmitted to the plurality of claw portions 41, respectively, and the plurality of claw portions 41 arranged in the circumferential direction cause the different portions of the edge of the substrate 9 to have substantially the same force. It is pushed toward the central axis J1. As a result, the substrate 9 is firmly held by the chuck portion 4b while the center of the substrate 9 is disposed on the central axis J1. Even when the size (diameter) of the substrate 9 supported by the substrate support portion 141 varies, the amount of contraction of the elastic member 436 of the contact portion 43 changes, so that the engagement portion 241 The lower surface comes into contact with the upper surface of the contact portion accommodating portion 431. Accordingly, the vertical distance between the lower surface of the top plate 123 and the upper surface 91 of the substrate 9 is kept constant.

Further, when the top plate 123 that is a weight portion is disposed at a separated position away from the substrate support portion 141 (see FIG. 14), the engaging portion 241 is separated from the contact portion 43 in the vertical direction, and the spring 435 is attached. Due to the force, the contact portion 43 rises to the position shown in FIG. Thereby, the bar 45 is substantially upright in the vertical direction, and the claw portion 41 is separated from the edge of the substrate 9 to the outside (on the side opposite to the central axis J1). That is, the holding of the substrate 9 by the chuck portion 4b is released. Since the top plate 123 positioned at the separated position is supported by the chamber opening / closing mechanism 131 and the chamber lid portion 122 which are weight supporting mechanisms, the separated position can be regarded as the supporting position of the weight portion. Further, since the top plate 123 positioned at the connection position is released from the support by the chamber opening / closing mechanism 131 and the chamber lid part 122 (see FIGS. 17 and 18), the connection position is regarded as the support release position of the weight part. be able to.

As described above, in the substrate processing apparatus 1a, when the top plate 123 is located at the connection position, the contact portions 43 of the transmission mechanism 42b are pushed in the vertical direction by the weight of the top plate 123. The transmission mechanism 42b transmits the force acting on each contact portion 43 to the corresponding claw portion 41, thereby causing the plurality of claw portions 41 to push the edge of the substrate 9 toward the central axis J1. Thereby, it is realized that the substrate 9 is held from the outside by the plurality of claw portions 41 by utilizing the weight of the top plate 123 arranged at the connection position. Further, the center of the substrate 9 is arranged on the central axis J1 by the plurality of claw portions 41, that is, the substrate 9 is aligned with the rotation center, so that the substrate 9, the substrate support portion 141, and the top plate are aligned. The center of gravity of the rotating body including 123 can be arranged (balanced) in the vicinity of the central axis J1, and the rotating body can be rotated stably.

Further, when the transmission mechanism 42b includes the elastic member 436 and the size of the substrate 9 supported by the substrate support portion 141 varies, the elastic member 436 is elastically deformed. Thereby, the distance between the top plate 123 and the board | substrate 9 in a connection position can be kept constant. As a result, even if the size of the substrate 9 varies, the substrate 9 can be processed under certain conditions. The elastic member 436 may be provided other than the contact portion 43 in the transmission mechanism 42b. When the distance between the top plate 123 and the substrate 9 at the coupling position is allowed to slightly vary depending on the size of the substrate 9, the elastic member may be omitted in the transmission mechanism.

In the substrate processing apparatus 1a of FIG. 24 using the top plate 123 as the weight part, it is not necessary to separately provide the weight part 51 and the weight support mechanism 53 unlike the substrate processing apparatus 1a of FIG. The structure can be simplified. On the other hand, in the substrate processing apparatus 1a of FIG. 14 having the weight portion 51 and the weight support mechanism 53, it is possible to dispose a scan nozzle or a brush for cleaning the upper surface 91 above the substrate 9 while omitting the top plate 123. It becomes.

FIG. 26 is a diagram showing another example of the chuck portion. In the transmission mechanism 42c of the chuck portion 4c in FIG. 26, a contact portion 43 similar to that in FIGS. 24 and 25 is provided instead of the connecting portion 49 in the chuck portion 4a in FIG.

In a state where the top plate 123 is located at the separated position and the disk portion 434 is in contact with the lower surface of the upper support portion 432 by the bias of the spring 435 as indicated by a two-dot chain line in FIG. However, the upper surface 412 of the nail | claw part main body 411 is arrange | positioned in the position left | separated from the protrusion part 413 slightly. As shown by the solid line in FIG. 26, when the contact portion 43 is pushed downward by the weight of the top plate 123 located at the connection position, the shaft 46 rotates about the central axis J2, and the shaft 47 and the claw The main part 411 rotates around the central axis J3. As a result, as shown by a solid line in FIG. 26, the side surface of the protruding portion 413 contacts the edge of the substrate 9 while the substrate 9 moves slightly upward. Actually, forces acting on the plurality of contact portions 43 are transmitted to the plurality of claw portions 41a arranged along the outer edge of the substrate 9, respectively, and different portions of the edge of the substrate 9 are transmitted by the plurality of claw portions 41a. Are pushed toward the central axis J1 with substantially the same force. In this way, in the chuck portion 4c shown in FIG. 26, it is realized that the substrate 9 is held while being aligned with the rotation center by using the weight of the top plate 123 arranged at the connection position.

FIG. 27 is a diagram showing still another example of the chuck portion. The chuck portion 4d in FIG. 27 is provided on the top plate 123 which is a weight portion. In FIG. 27, the top plate 123 and a part of the configuration in the contact portion accommodating portion 431 are shown in a cross section by a plane including the central axis J1. The chuck portion 4d includes a plurality of claw portions 41 and a transmission mechanism 42d. The plurality of claw portions 41 are arranged around the substrate 9 when viewed along the central axis J1. The transmission mechanism 42d has a structure similar to that obtained by inverting the transmission mechanism 42b in FIG. 24 in the vertical direction.

Specifically, the transmission mechanism 42d includes a contact portion 43 and a plurality of

bars

44 and 45 provided for each claw portion 41. The contact portion 43 is supported by the upper support portion 432 and the lower support portion 433 so as to be movable in the vertical direction. A substantially cylindrical contact portion receiving portion 431 is provided on the lower surface of the top plate 123, and the lower support portion 433 is provided in the contact portion receiving portion 431. An upper end portion of the contact portion 43 is disposed in an internal space 124 formed in the top plate 123. A bar 44 is arranged in the internal space 124, and one end portion of the bar 44 is connected to the upper end portion of the contact portion 43 via a pin 421. A long hole 441 extending in the longitudinal direction of the bar 44 is formed in the bar 44, and the pin 421 is inserted into the long hole 441. The bar 44 is supported by the bar support portion 440 so as to be rotatable about a rotation axis perpendicular to the paper surface of FIG.

The disc part 434 attached to the contact part 43 is arranged between the upper support part 432 and the lower support part 433. A spring 435 surrounding the periphery of the contact portion 43 is provided between the disc portion 434 and the upper support portion 432. The disk portion 434 and the contact portion 43 are urged downward by the spring 435. In a state where the top plate 123 is located at the separated position and the disc portion 434 is in contact with the upper surface of the lower support portion 433 as shown by a two-dot chain line in FIG. 27, the inclination angle of the bar 45 with respect to the vertical direction is small. Thus, the claw portion 41 is separated from the edge of the substrate 9 to the outside.

An engaging portion 241a that protrudes upward is provided on the upper surface of the support portion base 142, and when the top plate 123 is located at the coupling position, the abutting portion that protrudes downward from the abutting portion accommodating portion 431. The lower end portion of 43 fits into the recess 242a at the top of the engaging portion 241a. As a result, the top plate 123 is connected to the substrate support portion 141. Further, as indicated by a solid line in FIG. 27, the contact portion 43 is pushed upward by the substrate support portion 141 until the upper surface of the engagement portion 241 a contacts the lower surface of the contact portion accommodating portion 431. Thereby, the bar 45 is inclined so that the lower end portion of the bar 45 approaches the substrate 9, and the claw portion 41 comes into contact with the edge of the substrate 9. Actually, the forces acting on the plurality of contact portions 43 are transmitted to the plurality of claw portions 41 arranged along the outer edge of the substrate 9, respectively, and the plurality of claw portions 41 are different parts of the edge of the substrate 9. Is pushed toward the central axis J1. In this way, in the chuck portion 4d shown in FIG. 27, it is realized that the substrate 9 is held while being aligned with the rotation center by utilizing the weight of the top plate 123 arranged at the coupling position. In addition, the chuck part is provided in the substrate support part 141 from the viewpoint of preventing the processing liquid splashed from the upper surface 91 of the substrate 9 from splashing and adhering to the upper surface 91 by the components of the transmission mechanism connected to the claw part. It is preferred that

The substrate processing apparatus 1a can be variously modified.

Various structures other than the above may be adopted as a transmission mechanism that transmits the force acting on the connecting portion 49 or the contact portion 43 to the plurality of claw portions. For example, in the transmission mechanism 42a of FIG. 19, a screw may be formed at the end of the shaft 46 on the shaft 47 side, and may be screwed to the screw because it is provided on the shaft 47 (the same applies to FIG. 26). In this case, when the connecting portion 49 moves in the vertical direction, the shaft 46 rotates about the central axis J2, and the shaft 47 moves linearly in the direction along the upper surface 91 of the substrate 9 (left and right direction in FIG. 19). To do. Further, the transmission mechanism has one or a plurality of

connection portions

49 or 1 other than the structure that transmits the force acting on the connection portion 49 or the contact portion 43 provided to each nail portion only to the nail portion. Alternatively, the force acting on one or a plurality of contact portions 43 may be transmitted to the plurality of claw portions in conjunction with each other.

In the example of FIGS. 25 to 27, the chamber opening / closing mechanism 131 serving as a sealed space opening / closing mechanism also serves as a weight supporting mechanism (a part) for supporting the top plate 123 serving as a weight portion. However, a weight support mechanism for supporting the top plate 123 may be provided separately from the chamber opening / closing mechanism 131.

Further, the chamber opening / closing mechanism 131 may raise and lower the chamber lid 122 relative to the chamber main body 121, and the chamber main body 121 may move up and down relative to the chamber lid 122 whose position is fixed. Also in this case, by raising the chamber main body 121 and bringing the upper end portion of the chamber main body 121 close to or in contact with the chamber lid portion 122, the top plate 123 is brought into a non-contact state with the chamber lid portion 122, and the support release position (connection) (Refer to FIG. 17 or FIG. 18). In addition, the top plate 123 is suspended from a part of the chamber lid part 122 located above the chamber body 121 by being lowered and separated from the chamber lid part 122 and arranged at the support position (separation position). (See FIG. 14).

Further, depending on the design of the substrate processing apparatus 1a, the chuck portion 4 in FIG. 15 and the weight portion 51 in the chuck portion 4a in FIG. 19 may be provided above or on the side of the support portion base 142. As described above, in the substrate processing apparatus 1a, the substrate processing apparatus 1a is arranged at the first relative position that is relatively different from the substrate support portion 141 in the vertical direction and the second relative position that is above the first relative position. Possible weights are provided at arbitrary positions. Further, the weight part is arranged at the second relative position by supporting the weight part by the weight support mechanism, and the weight part rotates together with the substrate 9 and the substrate support part 141 by releasing the support of the weight part. For the first relative position. And the force by the weight of the weight part located in the 1st relative position is transmitted to a plurality of claw parts by a transmission mechanism, and it is realized holding the board 9 in alignment with the rotation center. .

In the substrate processing apparatus 1a, an annular plate-like member facing only the outer edge portion of the upper surface 91 of the substrate 9 may be provided as the upper surface facing portion. Also in this case, in the process of supplying the processing liquid to the rotating substrate 9, the processing liquid splashing from the outer edge of the substrate 9 rebounds on the inner wall of the chamber 12 and reattaches to the upper surface 91 of the substrate 9. This is prevented by the annular plate-like member disposed in the frame. Thus, from the viewpoint of preventing re-adhesion of the processing liquid, it is preferable that the substrate processing apparatus 1 a is provided with an upper surface facing portion that faces at least the outer edge portion of the upper surface 91 of the substrate 9.

The shapes and structures of the stator portion 151 and the rotor portion 152 of the substrate rotation mechanism 15 may be variously changed. For example, the stator part 151 may be provided inside the rotor part 152 (center axis J1 side). The rotor unit 152 does not necessarily need to rotate in a floating state, and a structure such as a guide for mechanically supporting the rotor unit 152 is provided in the chamber 12, and the rotor unit 152 rotates along the guide. Good. In the substrate processing apparatus 1a having a hollow motor, the substrate support portion 141 and the weight portion 51 are annular with the central axis J1 as the center, so that the lower nozzle 182 and the plurality of heating gases are positioned at positions facing the lower surface 92 of the substrate 9. The supply nozzle 180 can be easily arranged. Further, the substrate rotation mechanism 15 is not necessarily a hollow motor. For example, a substrate rotation mechanism that rotates a shaft fixed to the lower surface of the disk-shaped substrate support 141 may be used.

In the substrate processing apparatus 1a, the substrate support portion 141, the rotor portion 152 of the substrate rotation mechanism 15, the weight portion 51 (or the top plate 123 that is the weight portion), and the

chuck portions

4, 4a to 4d are the sealed space forming portion. Although the processing for the substrate 9 is performed in a sealed internal space provided in a certain chamber 12, the processing for the substrate 9 may be performed in an open space depending on the design of the substrate processing apparatus.

The substrate processed by the substrate processing apparatus 1a is not limited to a semiconductor substrate, and may be a glass substrate or another substrate.

The configurations in the above embodiment and each modification may be combined as appropriate as long as they do not contradict each other.

Although the invention has been described in detail, the above description is illustrative and not restrictive. Therefore, it can be said that many modifications and embodiments are possible without departing from the scope of the present invention.

DESCRIPTION OF SYMBOLS 1, 1a

Substrate processing apparatus

4, 4a-4d Chuck part 9 Substrate 12 Chamber 15

Substrate rotation mechanism

41,

41a Claw part

42, 42a-42d Transmission mechanism 43 Contact part 51 Weight part 52

Connection member

53, 53a Weight support mechanism 91 Upper surface 120 Chamber space 121 Chamber body 122 Chamber lid portion 123 Top plate 126 Top plate moving mechanism 131 Chamber opening / closing mechanism 141 Substrate support portion 151 Stator portion 152 Rotor portion 181 Upper nozzle 436 Elastic member J1 Central axis

Claims

A substrate processing apparatus for processing a substrate,
A substrate support portion for supporting the substrate from the lower side in a state where the upper surface, which is one main surface of the substrate, is directed upward,
A rotation mechanism for rotating the substrate support portion about a central axis perpendicular to the substrate;
An upper surface facing portion facing at least an outer edge portion of the upper surface;
A facing portion support mechanism that selectively disposes the upper surface facing portion at a separating position that is spaced upward with respect to the substrate supporting portion and a connecting position that is coupled to the substrate supporting portion;
A chuck portion provided on one of the substrate support portion or the upper surface facing portion;
With
The chuck portion is
At least three claws disposed around the substrate when viewed along the central axis;
A contact portion that is pushed in by the other of the substrate support portion and the upper surface facing portion when the upper surface facing portion is located at the coupling position, and the force acting on the contact portion is configured to receive the at least three claw portions A transmission mechanism that causes the at least three claw portions to push the edge of the substrate toward the central axis,
Is provided.
The substrate processing apparatus according to claim 1,
The transmission mechanism includes an elastic member;
When the size of the substrate supported by the substrate support portion varies, the elastic member is elastically deformed, so that the distance between the upper surface facing portion and the substrate at the connection position is kept constant. .
The substrate processing apparatus according to claim 1,
The rotation mechanism is
A rotor centered around the central axis, and including a permanent magnet;
A stator portion that is annularly opposed to the rotor portion in the radial direction centered on the central axis, and that generates a rotational force about the central axis between the rotor portion;
With
The rotor part is connected to the substrate support part.
The substrate processing apparatus according to claim 3, wherein
Further comprising a sealed space forming part that forms a sealed internal space in which processing for the substrate is performed,
The substrate support portion, the rotor portion of the rotation mechanism, the upper surface facing portion, and the chuck portion are disposed in the sealed space forming portion.
The substrate processing apparatus according to claim 4,
The sealed space forming part is
A chamber body having an upper opening;
A chamber lid for closing the upper opening of the chamber body;
With
The chamber lid is also a part of the opposed portion support mechanism, the chamber lid is raised and lowered relative to the chamber body;
When the upper surface facing portion is located at the separated position, the upper surface facing portion is suspended from a part of the chamber lid portion located above the chamber body,
When the upper surface facing portion is located at the coupling position, the upper surface facing portion is in a non-contact state with the chamber lid portion in contact with or close to the chamber body.
A substrate processing apparatus according to any one of claims 1 to 5,
A nozzle for supplying a predetermined chemical solution is further provided between the upper surface facing portion that extends along the upper surface so as to cover the substrate when positioned at the connection position, and the upper surface of the substrate.
A substrate processing apparatus for processing a substrate,
A substrate support part for supporting the substrate from below with one main surface facing upward,
A rotation mechanism for rotating the substrate support portion about a central axis perpendicular to the substrate;
A weight portion that can be disposed at a first relative position that is relatively different from the substrate support portion in the vertical direction and a second relative position that is above the first relative position;
The weight part is disposed at the second relative position by supporting the weight part, and the weight part is rotated together with the substrate and the substrate support part by releasing the support of the weight part. A weight support mechanism positioned at the first relative position;
A chuck portion provided on the substrate support portion or the weight portion;
With
The chuck portion is
At least three claws disposed around the substrate when viewed along the central axis;
By transmitting the force due to the weight of the weight portion located at the first relative position to the at least three claw portions, the edge of the substrate is pushed toward the central axis on the at least three claw portions. A transmission mechanism
Is provided.
The substrate processing apparatus according to claim 7,
The rotation mechanism is
A rotor centered around the central axis, and including a permanent magnet;
A stator portion that is annularly opposed to the rotor portion in the radial direction centered on the central axis, and that generates a rotational force about the central axis between the rotor portion;
With
The rotor part is connected to the substrate support part.
The substrate processing apparatus according to claim 8, comprising:
The weight portion is disposed between the substrate support portion and the rotor portion disposed below the substrate support portion, and the vertical direction along a guide portion connecting the substrate support portion and the rotor portion. Can be moved to
The chuck portion is provided on the substrate support portion.
The substrate processing apparatus according to claim 9, comprising:
The substrate support portion and the weight portion are annular with the central axis as a center.
The substrate processing apparatus according to claim 9, comprising:
The position of the weight part when the support by the weight support mechanism is released is closer to the rotor part than the position of the weight part when supported by the weight support mechanism.
A substrate processing apparatus according to any one of claims 8 to 11,
Further comprising a sealed space forming part that forms a sealed internal space in which processing for the substrate is performed,
The substrate support portion, the rotor portion of the rotation mechanism, the weight portion, and the chuck portion are disposed in the sealed space forming portion.
The substrate processing apparatus according to claim 12,
The weight support mechanism is provided in the sealed space forming part.