WO2008028401A1

WO2008028401A1 - Device and method for closing internal modes/functions of integrated circuit

Info

Publication number: WO2008028401A1
Application number: PCT/CN2007/002416
Authority: WO
Inventors: Jian Qiu
Original assignee: Beijing Sinosun Technology Ltd.
Priority date: 2006-08-30
Filing date: 2007-08-13
Publication date: 2008-03-13
Also published as: CN100470680C; CN1937084A

Abstract

A device and method for closing internal modes/functions of an integrated circuit, wherein the method comprises the steps of: writing a plurality of predetermined mode/function feature values respectively corresponding to multiple mode/function circuits in the nonvolatile memory of the integrated circuit, and storing it in the nonvolatile memory of the integrated circuit; the mode/function circuits in the integrated circuit adopting hierarchical resetting, and the mode/function feature values in the nonvolatile memory of the integrated circuit are verified one by one during the hierarchical resetting, and a corresponding operation is determined based on the result of the verification of the mode/function feature values in the nonvolatile memory.

Description

Device and method for shutting down internal mode/function of integrated circuit

The present invention relates to an integrated circuit incorporating a non-volatile memory, and more particularly to an apparatus and method for shutting down internal modes/functions of an integrated circuit. Background technique

As the functions of integrated circuits become more and more complex, some functions are only used in specific situations, and in other cases, they need to be prohibited. For example: After the integrated circuit is fully tested, in order to prevent illegal users from stealing through test mode Or modify the confidential data, you need to close the available test mode or some test functions; Another example: Sometimes based on a certain sales strategy, the same version of the chip needs to open different functions for different users, thus becoming a different chip, therefore, There is a need for selective permanent shutdown of different functions within the integrated circuit; for example, all integrated circuit chip designs with non-volatile memory require the closure of some internal functions (eg, the write function of non-volatile memory). This requires finding a hardware implementation that allows certain functions within the integrated circuit to automatically fail under certain conditions.

The patent document of the prior art Chinese Patent Publication No. CN1093201 discloses a semiconductor memory and a method of setting the type thereof, comprising: providing a memory function according to information stored in the non-volatile storage element. The semiconductor chip of the function selection circuit is sealed in the package, and the memory function is set by writing the storage element. In this way, the process from the wafer process to the assembly step can be the same, facilitating mass production and production control, and providing a semiconductor memory that meets the user's specifications for memory functions in a short period of time.

However, this technical solution actually requires two wafer processes, which means that an additional design and plate-making process is required, which adds a lot of cost. At the same time, the scheme is not universal and only applies to the design of semiconductor memory. .

A circuit for permanently invalidating a programming function of an Erasable Programmable Read-Only Memory (EEPROM) is disclosed in U.S. Patent No. 5,342,741, the disclosure of which is: The lossy storage component is pre-packaged through a predefined probe point (Probe Pad). When the non-volatile storage element is written for the first time, the programming function of the electrically erasable programmable read-only memory is turned on. The programming function of the electrically erasable programmable read only memory is permanently turned off when the unit is written for the second time. Since the probe point is not encapsulated, that is, it has been packaged closed, the programming function of the electrically erasable programmable read only memory cannot be reopened. However, the solution requires an additional solder joint (PAD) to support the implementation of this function; and the security of the solution is only based on the fact that the contact point (PAD) is not encapsulated, and with sufficient technical guarantee, it may The solder joint (PAD) package is broken, so the security is insufficient. This solution also has no universal application meaning. It is only suitable for the operation of non-volatile memory, and cannot be applied to all kinds of internal functions of the integrated circuit. For permanent closures.

The patent document of the prior art Chinese Patent Publication No. CN1469382 discloses a write protection implementation method for a boot ROM, which belongs to the field of application technology of a semiconductor memory chip. It first sets the write protection data register and the write protection status register. When reset, it sets each initial value. The write protection status register is in the "write protection enable" state, and the data is continuously written to the data register. The write protection status register is " The write protection disables the "state", and decodes the chip select signal of the boot ROM, so that the chip select signal of the boot ROM is valid. At this time, the boot ROM is written, and after the write operation ends, The write protection data register writes a data, causing the write protection status register to be in the "write protection enable" state again.

Similarly, the technical solution is not safe enough to adapt to the protection in multiple states, and it is only suitable for write protection of boot read-only memory, and cannot be applied to various non-volatile memories. The internal functions of the integrated circuit are permanently enclosed.

Therefore, the prior art has drawbacks that need to be improved and developed. Summary of the invention

It is an object of the present invention to provide an apparatus and method for shutting down internal modes/functions of an integrated circuit, applicable to all integrated circuits including non-volatile memories and having such application requirements, and The characteristic value of the memory enables permanent protection against write operations.

An apparatus for turning off an internal mode/function of an integrated circuit provided for the purpose of the present invention, comprising at least one non-volatile memory, further comprising a setting unit for respectively setting circuits of various functions/modes in the integrated circuit Corresponding multiple mode/function feature values and storing them in non-volatile memory;

a hierarchical reset unit for employing a hierarchical reset in the mode/function circuit of the integrated circuit, and verifying the mode/function feature value in the setting unit one by one in the hierarchical reset process, according to the feature in the non-volatile memory The result of the verification of the value determines the corresponding operation.

The hierarchical reset unit may include a verification unit and a reset unit, where:

The verification unit is configured to generate a predetermined or preset time in a plurality of clock cycles before the power-on/reset of the integrated circuit is performed, and before the enable signal of each mode/function circuit has not been generated. Various modes The enable signal of the circuit of the type/function, so that the circuit of each mode/function is in the reset state, one or more mode/function feature values are read from the setting unit, the levels are verified one by one, and the circuit of each mode/function is verified. The resetting unit is configured to: when the circuit of the integrated circuit internal mode/function is powered on/reset, adopt a hierarchical reset, and control the internal part of the integrated circuit according to the verification result of the verified mode/function feature value by the verification unit. The mode/function circuit is turned on or off.

The setting unit may include a mode feature value setting subunit, and a function feature value setting subunit, where: the mode feature value setting subunit is configured to store each mode feature value;

The function feature value setting subunit is configured to store each function feature value.

The verification unit may include a mode feature value verification unit and a function feature value verification unit, where the mode feature value verification unit is configured to be used in the mode feature value setting subunit during the power-on/reset process of the integrated circuit Reading the pattern feature value, then verifying, and after the verification passes, transitioning to the working mode or the test mode, and rewriting the new mode feature value in the mode feature value setting subunit;

The function feature value verification unit is configured to read a function feature value from the function feature value setting sub-unit during the power-on/reset process of the integrated circuit, and then perform verification, and the corresponding address of the function after the verification is passed The space is write-protected and the write operation on the corresponding circuit of the function is permanently prohibited.

The plurality of mode/function feature values are stored in a non-volatile register or a one-time programmable area of the non-volatile memory. '

The non-volatile memory is one of a flash memory, or an electrically erasable programmable read only memory, or a ferroelectric memory, or a magnetic random access memory, or a phase change memory.

The mode is a test mode and/or a work mode.

The functions are one or a combination of RSA encryption function, ECC encryption function, non-volatile memory programming function, Scan scan test function, Boundary-Scan boundary scan test function, BIST built-in self-test function.

In order to achieve the object of the present invention, an integrated circuit chip is further provided, comprising at least one non-volatile memory, and further comprising a setting unit for setting a plurality of modes/functions corresponding to the circuits of the plurality of functions/modes in the integrated circuit respectively Value and store it in non-volatile memory;

a hierarchical reset unit, wherein the circuit for function/function in the integrated circuit adopts a hierarchical reset, and in the hierarchical reset process, the mode/function feature values in the setting unit are verified one by one according to the characteristics in the non-volatile memory The result of the verification of the value determines the corresponding operation.

The hierarchical reset unit may include a verification unit and a reset unit, where: The verification unit is configured to generate a predetermined or preset time in a plurality of clock cycles before the power-on/reset of the integrated circuit is performed, and before the enable signal of each mode/function circuit has not been generated. The enable signals of the circuits of each mode/function enable the circuits of each mode/function to be in a reset state, read one or more mode/function feature values from the setting unit, verify the levels one by one, and verify the circuits of the respective modes/functions. The resetting unit is configured to: when the circuit of the integrated circuit internal mode/function is powered on/reset, adopt a hierarchical reset, and according to the verification result of the verification mode on the stored mode/function feature value, the integrated circuit is controlled. The internal mode/function circuit is turned on or off.

The plurality of mode/function feature values are stored in a non-volatile register or a one-time programmable area of the non-volatile memory.

Further, in order to achieve the object of the present invention, there is still further provided a method of turning off an internal mode/function of an integrated circuit, comprising the steps of:

Step A, writing a plurality of preset mode/function feature values respectively corresponding to the circuits of the plurality of modes/functions into the non-volatile memory of the integrated circuit, and storing the same in the non-volatile memory of the integrated circuit Medium

Step B, the circuit of the internal mode/function of the integrated circuit adopts a hierarchical reset, and during the hierarchical reset process, the mode/function characteristic value in the non-volatile memory of the integrated circuit is verified one by one according to the mode in the non-volatile memory. The verification result of the /feature feature value determines the corresponding operation.

The step B may include the following steps:

Step B1, during the power-on/reset of the integrated circuit, during the hierarchical reset of the integrated circuit, each mode/function is generated or preset in multiple clock cycles before the enable signal of each mode/function circuit has not been generated yet. The enable signal of the circuit, so that each mode/function circuit is in a reset state, one or more mode/function feature values are read from the non-volatile memory, and the levels are verified one by one, and the circuits of each mode/function are verified. Signal

Step B2, when the circuit of the integrated circuit internal mode/function is powered on/reset, a hierarchical reset is adopted, and according to the verification result of the verification mode on the stored mode/function feature value, the circuit of the internal mode/function of the control integrated circuit is turned on or shut down.

The step B may also include the following steps:

Step B10, in the power-on/reset process, detecting that the address data corresponding to the circuit of the first function in the non-volatile memory of the integrated circuit is not the feature value of the first function, and the first function is valid;

Step B20, after the power reset of the integrated circuit chip is completed, the corresponding first function circuit is asserted, and the first function circuit writes the first functional characteristic value in the non-volatile memory. Not yet lost, if the circuit of the first function needs to be turned off, the first functional feature value is written to the address corresponding to the circuit of the first function, Setting the first function is invalid;

Step B30, when the integrated circuit chip is powered on and reset again, detecting that the data corresponding to the first function in the non-volatile memory of the integrated circuit is not the first functional characteristic value, the first function is closed. , its function is invalid.

The step B20 further includes the following steps:

Step B21, if the circuit of the first function has not lost the programming capability of the function value address of the second to Nth functions in the non-volatile memory, and needs to turn off one of the circuits of the second to the first function or a plurality of functions, the function feature values corresponding to the circuit of the function are written;

The step B30 further includes the following step - step B31, when the integrated circuit chip is powered on again, detecting that the data corresponding to the second to Nth functions in the non-volatile memory of the integrated circuit is not the second ~ The Nth function feature value, then one or more of the second to the first functions are turned off, and the function is invalid.

The step B may further comprise the following steps:

Step B100: During the power-on reset of the integrated circuit, detecting the non-volatile memory of the integrated circuit, although the data of the mode characteristic value storage address is the first mode feature value, setting the first mode to be valid;

Step B200, after the power reset of the integrated circuit chip ends, the corresponding first mode circuit is asserted, and the programming capability of the first mode circuit to the mode feature value in the nonvolatile memory has not been lost. And writing a pattern feature value to the mode feature value storage address;

Step B300, when the integrated circuit chip is powered on again, detecting a characteristic value of the corresponding mode in the non-volatile memory setting unit, and the integrated circuit chip switches to the mode.

The step B200 further includes the following steps:

If the first mode to the second mode needs to be converted, writing a second mode feature value to the mode feature value storage address;

If it is necessary to keep the first mode unchanged, the first mode feature value is written into the mode feature value storage address; if the mode is required to be turned off, the mode switch feature value is written into the mode feature value storage address.

The step B may further include the following steps:

Step B1000, in the power-on/reset process, the data corresponding to the circuit that detects the first function in the non-volatile memory of the integrated circuit is not the feature value of the first function, and the first function is valid;

Step B2000, when the first function is valid, detecting that the data of the mode feature value storage address in the non-volatile memory of the integrated circuit is the first mode feature value, and setting the first mode to be valid; Step B3000, after the power-on reset of the integrated circuit chip is finished, the corresponding first mode circuit is asserted, and the programming capability of the first mode circuit to the mode feature value in the non-volatile memory has not been lost. And writing a pattern feature value to the mode feature value storage address;

Step B4000, after the re-power-on reset of the integrated circuit chip is finished, the corresponding mode circuit is set to be valid, and the circuit of the mode corresponds to the functional characteristic value in the non-volatile memory corresponding to the function of the mode. The programming write capability has not been lost. If the circuit of the function needs to be turned off, the function feature value is written to the address corresponding to the circuit of the function, and the function is invalid.

The step B3000 further includes the following steps:

The plurality of pre-set mode/function feature values are stored in a non-volatile register or a one-time programmable area of the non-volatile memory. .

An apparatus and method for shutting down an internal mode/function of an integrated circuit provided by the present invention achieves different mode/function selectivity at power-on reset by a plurality of mode/function feature values stored in a storage area Turning off, thereby enhancing the security of the chip, and achieving permanent selective setting of the integrated circuit for different situations. DRAWINGS

1 is a schematic diagram of a hierarchical reset process of an internal mode/function of an integrated circuit shutdown according to the present invention;

2 is a schematic structural diagram of a nonvolatile memory storage unit of the method of the present invention;

3 is a flow chart of a method for shutting down an internal mode/function of an integrated circuit according to the present invention;

4 is a flow chart of a setting process of a function shutdown of the method of the present invention;

Figure 5 is a flow chart showing the setting of the mode conversion of the method of the present invention;

Figure 6 is a flow chart showing the setting of mode switching and function closing of the method of the present invention. detailed description

In order to make the objects, technical solutions and advantages of the present invention more comprehensible, the following An apparatus and method for inventing an internal mode/function of an integrated circuit is described in further detail. It is understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

The apparatus and method of the present invention for turning off internal modes/functions of an integrated circuit are applicable to all non-volatile memories, as well as to all integrated circuit chips that include non-volatile memory and have multiple modes/functions of protection.

The technical core of the apparatus and method of the present invention has two points: First, setting a plurality of mode/function feature values respectively corresponding to multiple mode/function circuits in the integrated circuit; second, the integrated circuit internal related mode/function circuit With hierarchical reset, the mode/function feature values in the non-volatile memory setting unit are forced to be verified one by one during the hierarchical reset to turn on/off the corresponding mode/function.

The integrated circuit including the nonvolatile memory of the present invention further includes a setting unit for setting a plurality of mode/function feature values corresponding to the circuits of the plurality of functions/modes in the integrated circuit, and storing the same in the non-easy In a specific location of the memory.

Preferably, the specific location is located in a non-volatile memory (Non-Volatile Registers, NVR) or a One Time Programming (OTP) area of the non-volatile memory.

The various mode/function feature values described in the embodiments of the present invention need to be set at the chip design stage, and can usually be stored in any storage location other than the program storage area, such as NVR or OTP of non-volatile memory. In the setting unit of the area.

As shown in FIG. 1 , as an implementable manner, the A block area in the non-volatile memory such as a flash ROM is an NVR/0TP area of a non-volatile memory, which is a functional feature value. a storage area, wherein each functional feature value is verified to pass the eigenvalue verification circuit, and the address space of the functional feature value is prohibited from being written again; the B region is a mode feature value storage region, wherein each mode feature value is subjected to the eigenvalue even When the verification circuit is verified, the write operation of the address space of the feature value is not prohibited. The C block area is a storage area of normal data.

That is to say, each mode/function characteristic value is stored in the setting unit of the non-volatile memory, and the data is not lost even if the integrated circuit chip is powered off.

a hierarchical reset unit, the circuit for functioning in the internal mode/function of the integrated circuit adopts a hierarchical reset, and in the hierarchical reset process, the mode/function feature values in the setting unit are verified one by one according to the characteristics in the non-volatile memory The result of the verification of the value determines the corresponding operation.

In the hierarchical reset unit of the present invention, the circuit in the internal mode/function of the integrated circuit adopts a hierarchical reset, and the mode/function feature value in the setting unit is verified one by one in the process of hierarchical reset, and the corresponding opening/closing is controlled according to the feature value. Mode/function circuit.

The so-called hierarchical reset refers to the external reset signal of the chip or the internal power-on identification of the chip, using the mode/function feature value. The eigenvalue verification unit controls the reset sequence of each mode/function circuit inside the chip, thereby achieving the purpose of controlling the working order of the internal circuits.

Preferably, the hierarchical reset unit comprises a verification unit and a reset unit, wherein:

The verification unit is configured to generate a predetermined or preset time in a plurality of clock cycles before the power-on/reset of the integrated circuit is performed, and before the enable signal of each mode/function circuit has not been generated. The enable signals of the circuits of each mode/function enable the circuits of each mode/function to be in a reset state, read one or more mode/function feature values from the setting unit, verify the levels one by one, and verify the circuits of the respective modes/functions. Enable signal.

The reset unit is configured to use a hierarchical reset when the circuit of the integrated circuit internal mode/function is powered on/reset, and controls the internal mode/function of the integrated circuit according to the verification result of the verification mode on the stored mode/function feature value. The circuit is turned on or off.

In the device for turning off the internal mode/function of the integrated circuit of the present invention, during the power-on/reset process of the integrated circuit, the circuit of the verifying unit in the hierarchical reset unit is first reset, and the enable signal in each mode/function circuit has not been generated yet. Previously, an enable signal for a predetermined or preset mode/function circuit was generated in multiple clock cycles, so that each mode/function circuit was in a reset state, and then, only when the circuit of the verification unit verified each mode/function After the enable signal of the circuit, the reset unit of the hierarchical reset unit controls each mode/function circuit to enter an open or closed state from the reset state, so that each mode/function circuit is controlled by the verification unit of the hierarchical reset unit according to the mode. / Function characteristic value control, the circuit of each mode/function is turned on or off by the reset unit.

As shown in FIG. 2, during the hierarchical reset process of the integrated circuit including the nonvolatile memory, after the system power-on/reset phase, the IC chip power-on/reset phase is entered, followed by the feature value verification phase, and then The mode/function of the integrated circuit chip is turned on or off.

The non-volatile memory (NVM) includes, but is not limited to, a flash ROM or an electrically erasable programmable read only memory (EEPROM), or a ferroelectric memory (FeRAM), or a magnetic random Memory (MR), or phase change memory (0UM).

A flash memory (Plash ROM) is an electrically erasing nonvolatile memory composed of a floating gate field effect transistor. When writing, hot floating electrons are used to charge the floating gate. When erasing, the tunneling effect under high voltage is utilized. , the floating gate loses electrons. For example, the Strata Flash 28F320J3 flash memory based on the NOR structure produced by Intel Corporation; the K9S5608 SMC card based on the NAND structure produced by Samsung Corporation of South Korea (the flash memory card packaged in the form of a card).

Embodiments of the present invention describe an apparatus and method for shutting down internal functions of an integrated circuit of the present invention in an integrated circuit including a nonvolatile memory such as a flash memory, but it should be noted that the embodiment of the present invention is also applicable. Other existing non-volatile memories, and integrated circuits including the non-volatile memories. Implementation of the invention The descriptions of the examples are for the purpose of better understanding of the invention and are not intended to limit the invention.

Each power-on of the integrated circuit chip first uses the verification unit in the hierarchical reset unit to perform mode/function feature value verification, thereby determining which modes/functions to turn on or off, and the integrated circuit chip can turn on/off the mode/function circuit. That is to say, by setting the characteristic value stored in the unit, the corresponding mode/function circuit can be turned on or off, or permanently turned off.

The mode described in the present invention can be regarded as a collection of functions, including test mode and/or work mode. It can be understood as a function of the upper layer, and there are many functions under it. For example, the test mode often includes various functions such as scan test, memory test, boundary scan test, and IP test. When the mode is turned off, all the functions under it are also turned off at the same time. Therefore, the mode referred to in the present invention And the function is essentially the same.

The functions include, but are not limited to, RSA encryption function, ECC encryption function, non-volatile memory programming function, Scan scan test function, Boundary-Scan boundary scan test function, BIST built-in self test function.

More preferably, the setting unit includes a mode feature value setting subunit, a function feature value setting subunit, wherein the mode feature value setting subunit is configured to store each mode feature value.

The verification unit includes a mode feature value verification unit and a function feature value verification unit, wherein: the mode feature value verification unit is configured to be used in the mode feature value setting subunit during the power-on/reset process of the integrated circuit The mode feature value is read, then verified, and converted to the working mode or test mode after the verification is passed, and the new mode feature value is rewritten in the mode feature value setting subunit.

Preferably, when the function feature values in the function feature value setting unit are verified, and the circuits of all the corresponding functions have been write-protected, and the function writing operation on the corresponding circuit has been permanently prohibited, the The function characteristic value corresponding to the function is prohibited from writing, and the feature value verification is no longer performed, so that the integrated circuit can never perform the mode switching and function writing again. As shown in FIG. 3, the method for turning off the internal function of the integrated circuit of the present invention is described in further detail below: The main operational steps of the method for turning off the internal function of the integrated circuit in the embodiment of the present invention include: Step S100, to the non-integrated circuit Circuits that write multiple modes/functions in specific locations in volatile memory Corresponding to a plurality of preset mode/function feature values and storing them in a specific location of the non-volatile memory of the integrated circuit;

a plurality of preset mode/function feature values, preferably, the preset mode/function feature values are not values for non-volatile memory test, such as 00000000, 11111111, 01010101, 10101010, 00110011, 11001100, 01110111, 10001000 , 00001111, 11110000 are common test data for memory test, and select other data.

If all memory spaces are erased before the end of the memory test, the feature values are set as long as not all data bits are 髙. Because the memory is usually erased by default, the data is high by default. If it is not possible to ensure that all memory spaces are erased before the end of the memory test, it is required to ensure that the mode/feature feature value is not the data that may be used during memory testing. Otherwise, there may be cases where the function that was not expected to be turned off is also accidentally turned off forever, because the non-volatile memory can never be written again. Try to avoid using the common data of the memory test to avoid unnecessary troubles for the non-volatile memory test. At the same time, if you want to select the common data of the memory test, at least ensure that the non-volatile memory is used after the test is completed. The value of the feature value area in which the nonvolatile memory programming function is turned off is not a preset feature value.

Preferably, the integrated circuit chip is configured with a mode/function characteristic value corresponding to each of the plurality of mode/function circuits in the non-volatile memory at the chip design stage.

The mode/function feature values described in the embodiments of the present invention are set at the chip design stage. Once the mode/function feature values are stored in the non-volatile memory, the data is not lost even if the integrated circuit chip is powered off.

Step S200, the circuit in the internal mode/function of the integrated circuit adopts a hierarchical reset, and in the hierarchical reset process, the mode/function feature value in the non-volatile memory of the integrated circuit is verified one by one according to the mode in the non-volatile memory. The verification result of the /feature feature value determines the corresponding operation.

Each power-on/reset of an integrated circuit chip first performs mode/function feature value verification to determine which mode/function circuits are turned on or off, and the integrated circuit chip can turn on or off the corresponding mode/function circuit, that is, It is said that the corresponding function/mode circuit can be turned on/off or permanently turned off by the stored mode/function feature value.

During the power-on/reset of the integrated circuit, during the hierarchical reset of the integrated circuit, the circuit of each mode/function that is established or preset is generated in multiple clock cycles before the enable signal of each mode/function circuit has not been generated. The enable signal is such that each mode/function circuit is in a reset state, one or more mode/function feature values are read from the non-volatile memory, the levels are verified one by one, and the enable signals of the circuits of the respective modes/functions are verified;

In the hierarchical reset of the integrated circuit, the stored mode/function feature values are verified one by one, and the internal mode/function circuit of the integrated circuit is controlled to be turned on or off according to the feature value, thereby realizing different modes/functions at the power-on reset. Choose Selective on/off, thereby enhancing the security of the integrated circuit chip, and possibly enabling permanent selection of integrated circuits for different situations.

In the case of power-on/reset of the internal mode/function of the integrated circuit, a hierarchical reset is used, and the internal mode/function circuit of the control integrated circuit is turned on or off according to the verification result of the stored mode/function characteristic value by the verification unit. As an implementable manner, step S200 includes the following steps:

Step S210, in the power-on/reset process, detecting that the address data corresponding to the circuit of the first function in the non-volatile memory of the integrated circuit is not the feature value of the first function, and setting the first function to be valid;

Determining, in the power-on reset process, a first function feature value corresponding to a circuit of the first function of the non-volatile memory at an address storing the first function feature value, and if yes, indicating that the first function has been turned off; It is stated that the first function can be written, and the first function characteristic value corresponding to the circuit of the first function is valid, so that which function is turned on or off after the chip is completely reset.

Step S220, after the power-on reset of the integrated circuit chip is finished, the corresponding first function circuit is asserted, and the first function circuit writes the first functional feature value in the non-volatile memory. If the circuit of the first function needs to be turned off, the first function feature value is written to the address corresponding to the circuit of the first function, and the first function is invalid;

Meanwhile, if the circuit of the first function has not lost the programming capability of the function value address of the second to Nth functions in the nonvolatile memory, it is necessary to turn off one of the circuits of the second to the first function or For multiple functions, the function feature value corresponding to the circuit of the function is written to turn off the circuit of the function.

Step S230, when the integrated circuit chip is powered on and reset again, detecting that the data corresponding to the first function in the non-volatile memory of the integrated circuit is not the first functional characteristic value, the first function is closed. , its function is invalid, or one or more of the second to Nth functions are turned off, and its function is invalid. Thus, the programming operation of this function and the corresponding function feature value is prohibited.

The following is a detailed description of the method for turning off the internal function of the integrated circuit of the present invention by taking the function of the Function_x in the integrated circuit chip as an example - as shown in FIG. 4, the steps for setting the function of the Function X function are as follows:

A. When the chip is powered on, the non-volatile memory address is detected. The data in Addr-1 is not Data-1. Set Function-1 to enable.

The FunctionJ_enable signal is both a FunctionjL function enable and a program enable signal for the non-volatile memory address Addr-1. After the chip power-on reset, at this time, the Function-I function is valid, and the programming capability of the non-volatile memory address Addr-1 has not been lost. To close the FunctionJL, the non-volatile memory address Addr-1 Write data Data-1, set the mction_l invalid.

At the same time, if Function-1 does not invalidate the programming ability of the address Addr_X of the function feature value corresponding to Function_X in the non-volatile memory, and needs to close Function-X, the function characteristic value corresponding to Function_X in Addr_X Data—X writes to turn off the circuit for this function.

B. When the chip is powered on again, it is detected that the data in the non-volatile memory address Addr-1 is the characteristic value Data-1, then the Function_l function enable signal Function-1 is disabled, so that the chip is powered on. The Function_l function of the chip and the programming operation of the nonvolatile memory address Addr-1 are disabled after the reset.

At the same time, when the data in the non-volatile memory address Addr_X is detected as the feature value Data_X, the Function-X function enable signal Functio _n _X_enset is invalid, so that the function of the chip is after the chip power-on reset. The programming operation of the nonvolatile memory address Addr_X is disabled.

Preferably, the functional feature value is distinguished from test case data commonly used in non-volatile memory testing to ensure that the data is not used in testing non-volatile memory. As another implementation manner, the step S200 includes the following step - step S210', during the power-on reset of the integrated circuit, detecting that the data of the mode feature value storage address in the non-volatile memory of the integrated circuit is the first a mode feature value, wherein the first mode is valid;

Step S220', after the power-on reset of the integrated circuit chip is finished, the corresponding first mode circuit is asserted, and the programming capability of the first mode circuit to the mode feature value in the non-volatile memory has not yet been Lost, Bay II writes the mode feature value to the mode feature value storage address;

Step S230', when the integrated circuit chip is powered on again, detecting a feature value of the corresponding mode in the non-volatile memory setting unit, and the integrated circuit chip switches to the mode.

As shown in FIG. 5, the following is a method for switching off the internal mode of the integrated circuit according to the first mode Mode-A to the second mode Mode-B mode switching as an example.

Al, when the chip is powered on, the data in the non-volatile memory setting unit address Addr-mode is detected. The first characteristic value Data_A of a mode Mode-A is set to ModeJ^enable, and after the power-on reset of the chip is finished (in Mode-A mode), the data is written to the non-volatile memory setting unit address Addr_mode. Mode Mode - The second characteristic value of Data B - B.

Bl. When the chip is powered on again, the non-volatile memory address is detected. The data in Addr_mode is the second eigenvalue Data_B, and the chip operates in Mode_B mode.

The Mode A and the Mode B refer to the mode in which the chip adapts to different requirements, including the test mode and the working mode. Different functions are traded off, closed or opened during power-on reset, so that they can be adapted to the requirements of different environmental requirements.

It should be noted that, if the verification is a predetermined mode feature value, after the integrated circuit chip enters the mode, the write operation of the feature value region is not necessarily prohibited, and the mode cannot be switched again.

If the mode is required to be turned off, a mode switch characteristic value is additionally set to turn off the mode switching. In this case, the chip of the present invention can be fixed in various models for use in different situations. As another implementable manner of the present invention, the step S200 includes the following steps:

Step S210", during the power-on/reset process, the data corresponding to the circuit detecting the first function in the non-volatile memory of the integrated circuit is not the feature value of the first function, and the first function is valid;

Step S220", when the first function is valid, detecting that the data of the mode feature value storage address in the non-volatile memory of the integrated circuit is the first mode feature value, and setting the first mode to be valid;

Step S230", after the power-on reset of the integrated circuit chip is finished, the corresponding first mode circuit is asserted, and the programming capability of the first mode circuit to the mode feature value in the non-volatile memory has not yet been If it is lost, the mode feature value is written into the mode feature value storage address;

Step S240", after the re-power-on reset of the integrated circuit chip is finished, the corresponding mode circuit is asserted, and the circuit of the mode corresponds to the functional characteristic value in the non-volatile memory corresponding to the function of the mode. The programming write capability has not been lost. If the circuit of the function needs to be turned off, the function feature value is written to the address corresponding to the circuit of the function, and the function is invalid.

At the same time, if the circuit of the mode pairs the function value address of the second to the Nth function in the non-volatile memory The programming capability has not been lost, and at the same time, one or more functions in the circuit of the second to the first function are required to be turned off, and the function characteristic value corresponding to the circuit of the function is written to turn off the circuit of the function.

As still another preferred embodiment, as shown in FIG. 6, the switching process of the test mode and the operation mode of one chip, and the process of permanently closing the FLASH-Promgram and the RSA encryption algorithm (Rivest-Shamir-Adleman encryption) are temporarily closed. An apparatus and method for shutting down internal functions of an integrated circuit of the present invention will be described in detail by way of example.

among them:

System^rst : system reset signal or chip power-on reset signal;

Clk: system clock or on-chip clock signal;

DataVal i date — reset: eigenvalue verification circuit reset signal;

Founcti on_rest : reset signal of all functional circuits except the eigenvalue verification circuit;

0EN: read signal of non-volatile memory;

DATA_OUT: a data signal read from a non-volatile memory;

TEST-EN: Test mode enable signal;

W0RK—EN: operating mode enable signal;

RSA_ EN _: RSA function enable signal;

ECC_EN : ECC function enable signal;

FLASH—PM—EN: non-volatile memory programming function signal;

TDI and STROBE: input signals for programming non-volatile memory;

ADDR: Address entered when programming non-volatile memory;

DATA— IN: Data input when programming non-volatile memory;

WEN: Write enable signal input when programming non-volatile memory.

In the first stage, the FLASH-Promgram function is detected;

FLASH—The Promgram function has not yet written the feature value. By default, the FLASH-PM-EN is valid. By default, the flash memory (FLASH) can be tested or flashed to work, such as data download.

Among them, FLASH_PM_EN is a non-volatile memory programming function enable signal.

In the second stage, when the FLASH-Promgram function is valid, enter the test mode of the integrated circuit chip; write the mode feature value 8 ' h42 to the mode feature value storage address through the FLASH programming circuit, so that the flash memory (FLASH) is next time At power-on, the test mode can be entered. That is, when power is turned on again, the feature value verification circuit first reads the mode feature value in the B area in the flash memory (FLASH), and the TEST_EN signal is asserted, Founction_rests Going high, the chip enters the test (TEST) mode. The third stage, switching from test mode to work mode:

The FLASH programming circuit writes the mode switching mode value 8' M3 to the mode feature value storage address, so that the flash memory can enter the working mode at the next power-on, that is, when the power is turned on again, the feature value verification circuit first reads the flash memory ( Each mode feature value in FLASH, the W0RK_EN signal is asserted, Founction_rests goes high, and the chip enters the working mode.

In the fourth phase, in the working mode, the RSA encryption function is turned off:

When the RSA function feature value 8' hdl is written to the address storing the RSA encryption function feature value through the FLASH programming circuit, the flash memory (FLASH) is turned off at the next power-on, that is, when the power is turned on again, the feature value verification is performed. The circuit first reads the individual eigenvalues in the flash memory (FLASH), the control disables RSA-EN, and when Founrtion-rests goes high, the RSA encryption function is turned off.

In the fifth stage, in the working mode, the FLASH_Promgram function is turned off.

In the working mode, the programming ability of the function value address of the FLASH_Pro _m gram function has not been lost. When the FLASH-Promgram function is turned off, the FLASH-Profflgram is written to the functional characteristic value address of the FLASH-Promgram function through the FLASH programming circuit. The function characteristic value is 8' hd3 , which causes the flash memory to turn off the FLASH. Promgrara function when the power is turned on next time. That is, when power is turned on again, the feature value verification circuit first reads each feature value in the flash memory (FLASH), and then FLASH—PM—EN is disabled, Founction_rests goes high, and the FLASH_Promgram function is turned off.

Preferably, if all the functions in a certain mode of the integrated circuit chip are turned off, the mode switch characteristic value is set to turn off the mode switching. In this case, the integrated circuit chip can be fixed in various models. For different situations, the integrated circuit chip can never perform mode switching and function switching in this mode.

Therefore, the method of the present invention realizes two types of settings for mode switching of the integrated circuit and whether the function is effective by setting the mode/function characteristic value in the non-volatile memory, and can be combined and used flexibly, which is simple to implement. Convenience.

It is to be understood that the above description of the specific embodiments is intended to be illustrative, and the scope of the invention is not to be construed as limited.

Claims

Claim

What is claimed is: 1. A device for shutting down an internal mode/function of an integrated circuit, comprising at least one non-volatile memory, characterized by further comprising a setting unit for respectively setting circuits of various functions/modes in the integrated circuit respectively Multiple mode/function feature values and stored in non-volatile memory;

2. The apparatus for turning off an internal mode/function of an integrated circuit according to claim 1, wherein the hierarchical reset unit comprises a verification unit and a reset unit, wherein:

The verification unit is configured to generate a predetermined or preset time in a plurality of clock cycles before the power-on/reset of the integrated circuit is performed, and before the enable signal of each mode/function circuit has not been generated. The enable signals of the circuits of each mode/function enable the circuits of each mode/function to be in a reset state, read one or more mode/function feature values from the setting unit, verify the levels one by one, and verify the circuits of the respective modes/functions. The resetting unit is configured to: when the circuit of the integrated circuit internal mode/function is powered on/reset, adopt a hierarchical reset, and according to the verification result of the verification mode on the stored mode/function feature value, the integrated circuit is controlled. The internal mode/function circuit is turned on or off.

3. The apparatus for turning off an internal mode/function of an integrated circuit according to claim 2, wherein the setting unit comprises a mode feature value setting subunit, and a function feature value setting subunit, wherein:

The mode feature value setting subunit is configured to store each mode feature value;

4. The apparatus for turning off an internal mode/function of an integrated circuit according to claim 2 or 3, wherein the verification unit comprises a mode feature value verification unit and a function feature value verification unit, wherein:

The mode feature value verification unit is configured to read a mode feature value from a mode feature value setting sub-unit during an power-on/reset process of the integrated circuit, and then perform verification, and convert to a working mode or test after the verification is passed Mode, and rewriting the new mode feature value in the mode feature value setting subunit;

5. Apparatus for turning off an internal mode/function of an integrated circuit according to any one of claims 1 to 4, characterized in that The plurality of mode/function feature values are stored in a non-volatile register or a one-time programmable area of the non-volatile memory.

6. The apparatus for turning off an internal mode/function of an integrated circuit according to claim 5, wherein said nonvolatile memory is a flash memory, or an electrically erasable programmable read only memory, or a ferroelectric Memory, or magnetic random access memory, or one of phase change memories.

7. Apparatus for shutting down an internal mode/function of an integrated circuit according to claim 6 wherein said mode is a test mode and/or an operational mode.

8. The apparatus for turning off an internal mode/function of an integrated circuit according to claim 7, wherein said function is RSA encryption function, ECC encryption function, non-volatile memory programming function, Scan scan test function, Boundary - One or more combinations of Scan boundary scan test function and BIST built-in self test function.

An integrated circuit chip, comprising at least one non-volatile memory, further comprising a setting unit for setting a plurality of mode/function feature values respectively corresponding to the circuits of the plurality of functions/modes in the integrated circuit And storing it in non-volatile memory;

The integrated circuit chip according to claim 9, wherein the hierarchical reset unit comprises a verification unit and a reset unit, wherein - the verification unit is used for powering on/off the integrated circuit, and classifying the integrated circuit During the reset process, an enable signal of a predetermined or preset mode/function circuit is generated in multiple clock cycles before the enable signal of each mode/function circuit has not been generated, so that each mode/function circuit In the reset state, one or more mode/function feature values are read from the setting unit, and the circuit is verified one by one to verify the enable signals of the circuits of the respective modes/functions; the reset unit is used in the integrated circuit internal mode/function When the circuit is powered on/reset, a hierarchical reset is used, and the circuit for controlling the internal mode/function of the integrated circuit is turned on or off according to the verification result of the verification unit for the stored mode/function characteristic value.

The integrated circuit chip according to claim 9 or 10, wherein the plurality of mode/function feature values are stored in a nonvolatile register or a one-time programmable area of the nonvolatile memory.

12. A method for shutting down an internal mode/function of an integrated circuit, comprising the steps of: Step A: writing a plurality of modes/functions corresponding to the non-volatile memory of the integrated circuit respectively Pre-set mode/function feature values and store them in the non-volatile memory of the integrated circuit; Step B, the circuit of the internal mode/function of the integrated circuit adopts a hierarchical reset, and during the hierarchical reset process, the mode/function characteristic value in the non-volatile memory of the integrated circuit is verified one by one according to the mode in the non-volatile memory. The verification result of the /feature feature value determines the corresponding operation.

13. The method of turning off an internal mode/function of an integrated circuit according to claim 12, wherein said step B comprises the following steps - step B1, during power-on/reset of the integrated circuit, and during the hierarchical reset of the integrated circuit, An enable signal of a circuit of a predetermined or preset mode/function is generated in a plurality of clock cycles before the enable signal of each mode/function circuit has not been generated, so that each mode/function circuit is in a reset state. Reading one or more mode/function feature values from the non-volatile memory, verifying the levels one by one, and verifying the enable signals of the circuits of the respective modes/functions;

14. The method of turning off an internal mode/function of an integrated circuit according to claim 12, wherein said step B comprises the following steps:

Step B20, after the power reset of the integrated circuit chip is completed, the corresponding first function circuit is asserted, and the first function circuit writes the first functional characteristic value in the non-volatile memory. If the circuit of the first function needs to be turned off, the first function feature value is written to the address corresponding to the circuit of the first function, and the first function is invalid;

Step B30, when the integrated circuit chip is powered on and reset again, detecting that the data corresponding to the first function in the non-volatile memory of the integrated circuit is not the first functional characteristic value, the first function is Off, its function is invalid.

The method of turning off an internal mode/function of an integrated circuit according to claim 14, wherein the step B20 further comprises the following steps:

Step B21, if the circuit of the first function has not lost the programming capability of the function value address of the second to Nth functions in the non-volatile memory, and needs to turn off one or more functions in the circuit of the second function, Write the function feature value corresponding to the circuit of the function;

The step B30 further includes the following steps:

Step B31, when the integrated circuit chip is powered on and reset again, detecting a non-volatile memory of the integrated circuit The data corresponding to the second to Nth function circuits is not the second to Nth function characteristic values, and one or more of the second to Nth functions are already turned off, and the function is invalid.

16. A method of shutting down an internal mode/function of an integrated circuit according to claim 12, wherein said step B comprises the steps of:

Step B100: During the power-on reset of the integrated circuit, detecting that the data of the mode feature value storage address in the non-volatile memory of the integrated circuit is the first mode feature value, and setting the first mode to be valid;

The method of turning off an internal mode/function of an integrated circuit according to claim 16, wherein the step B200 further comprises the following steps:

18. The method of turning off an internal mode/function of an integrated circuit according to claim 12, wherein said step B comprises the following steps:

Step B2000, when the first function is valid, detecting that the data of the mode feature value storage address in the non-volatile memory of the integrated circuit is the first mode feature value, and setting the first mode to be valid;

Step B3000, after the power-on reset of the integrated circuit chip is finished, the corresponding first mode circuit is asserted, and the programming capability of the first mode circuit to the mode feature value in the non-volatile memory has not been lost. And writing a pattern feature value to the mode feature value storage address;

Step B4000, after the power chip reset is completed, the corresponding mode circuit is enabled, and the circuit of the mode is programmed in the non-volatile memory corresponding to the function circuit of the mode. The write capability has not been lost. If the circuit of the function needs to be turned off, the function feature value is written to the address corresponding to the circuit of the function, and the function is invalid.

The method of turning off an internal mode/function of an integrated circuit according to claim 18, wherein the step B3000 further comprises the following steps:

20. A method of shutting down an internal mode/function of an integrated circuit according to any one of claims 12 to 19, wherein said plurality of pre-set mode/function feature values are stored in said non-volatile memory Nonvolatile registers or one time programmable area. .

21. The method of turning off an internal mode/function of an integrated circuit according to claim 20, wherein said nonvolatile memory is a flash memory, or an electrically erasable programmable read only memory, or a ferroelectric Memory, or magnetic random access memory, or one of phase change memories.