WO2007023605A1 - Surface roughness/outline shape measurement device - Google Patents

Surface roughness/outline shape measurement device Download PDF

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Publication number
WO2007023605A1
WO2007023605A1 PCT/JP2006/311150 JP2006311150W WO2007023605A1 WO 2007023605 A1 WO2007023605 A1 WO 2007023605A1 JP 2006311150 W JP2006311150 W JP 2006311150W WO 2007023605 A1 WO2007023605 A1 WO 2007023605A1
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WO
WIPO (PCT)
Prior art keywords
cantilever
stylus
surface roughness
contour shape
workpiece
Prior art date
Application number
PCT/JP2006/311150
Other languages
French (fr)
Japanese (ja)
Inventor
Masafumi Ishii
Original Assignee
Tokyo Seimitsu Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co., Ltd. filed Critical Tokyo Seimitsu Co., Ltd.
Priority to JP2006534503A priority Critical patent/JPWO2007023605A1/en
Priority to GB0624967A priority patent/GB2438640B/en
Publication of WO2007023605A1 publication Critical patent/WO2007023605A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures

Definitions

  • the present invention relates to a surface roughness Z contour shape measuring apparatus, and in particular, by detecting the amount of displacement of the stylus by moving the stylus along the surface of the workpiece (workpiece), the present invention relates to the roughness of the surface of the workpiece.
  • the present invention relates to a surface roughness / contour shape measuring apparatus for measuring a thickness or a contour shape.
  • the surface roughness / contour shape measuring device moves the pickup with the stylus along the surface of the workpiece (workpiece), converts the stylus displacement into an electrical signal, and reads it into a computer such as a computer. Measure the surface roughness or contour of the workpiece (workpiece).
  • a surface roughness Z contour shape measuring apparatus is disclosed in, for example, Japanese Patent Application Laid-Open No. 2 0 0 2-1 0 7 1 4 4.
  • Figure 1 shows the basic configuration of a conventional surface roughness / contour shape measuring device.
  • the surface roughness / contour shape measuring apparatus 1 is provided with a table 2 along the XY plane for placing a workpiece, and a column 3 is erected on the table 2.
  • the movable part 4 is attached to the column 3.
  • the column 3 incorporates a motor (not shown), and the movable part 4 can be moved up and down along the column 3 (along the Z direction) by this motor.
  • the movable part 4 is provided with a holder 5 that supports the pickup 6 via the arm part 10.
  • the movable part 4 also has a built-in mode (not shown), and the holder 5 can be driven in the X direction.
  • the tip of the arm 10 is provided with a measuring element (pickup) 6 for measuring the surface roughness of the workpiece placed on the table 2, and this pick-up 6 has a stylus 1 at one end.
  • a cantilever 7 With a cantilever 7 with 1.
  • the cantilever 7 is provided in the pickup 6 so that its longitudinal direction is along the X direction which is the driving direction of the movable part 4.
  • the pickup 6 is provided with the cantilever 7 and the stylus 11. At the other end opposite to the other end, the longitudinal direction of the cantilever 7 and the direction perpendicular to the protruding direction of the stylus 11 (Z direction) (Y direction) are supported rotatably.
  • the stylus 11 when the stylus 11 is moved in the X direction by the drive unit 4 while being in contact with the measurement surface, the stylus 11 slightly moves in the Z direction according to the unevenness of the measurement surface. This amount of displacement is converted into a rotational motion by the cantilever 7 and transmitted to a differential inductance built in the pickup 6 (not shown) and converted into an electric signal. This electric signal is converted into a digital signal by an AZD converter (not shown).
  • the stylus 11 is moved over the entire measurement surface, and the signals sequentially output from the A / D converter at that time are converted into a data processing device (not shown) composed of a computer or the like.
  • a data processing device (not shown) composed of a computer or the like.
  • the protruding direction of the stylus 1 1 (or the rotational axis direction of the rotational movement of the cantilever 7 associated with the fine movement of the stylus 11) is fixed in a specific direction.
  • the protruding direction of the stylus 1 1 is set vertically downward (Z-axis direction), and the rotation axis of the rotary motion of the cantilever 7 is set in the Y-axis direction).
  • the measurement force force to press the stylus 1 1 against the surface to be measured
  • the direction of the stylus 11 is preferably fixed.
  • FIG. 2B is an enlarged cross-sectional view of the opening of the cylinder 101 shown in FIG. 2A.
  • taper portions (1 0 2, 1 0 3) are formed in the opening of the cylinder 1 0 1.
  • the surface is facing upward. 10 2 Surface roughness Z To measure the contour shape, for example, as shown in FIG. Just tilt the entire workpiece 100 and level the taper 1 0 2 and the stylus 1 1 along the surface.
  • the first part of the workpiece is rotated by 180 degrees with the X axis as the rotation axis.
  • the surface of the taper portion 10 3 portion needs to face upward.
  • the table 2 When measuring the surface roughness and contour shape, the table 2 The position of the workpiece 100 placed on the top needs to be known. In particular, when it is necessary to rotate the workpiece 100 during measurement as described above, the position and direction of the rotating shaft that rotates the workpiece 100 must be known. This is because if the actual rotation axis deviates from the assumed rotation axis, a deviation occurs in the position and direction of the measurement surface, causing an error.
  • the present invention provides a surface roughness / measurement that can measure the measurement surface in various directions without changing the mounting direction of the workpiece by changing the direction of the stylus according to the direction of the measurement surface.
  • An object is to provide a contour shape measuring device.
  • a surface roughness Z contour shape measuring apparatus comprises a rotation support shaft member that rotatably supports a force nail lever with a direction orthogonal to the longitudinal direction of the cantilever as a rotation axis. Rotate the cantilever as the axis of rotation to change the direction of the stylus provided at the tip of the cantilever.
  • a balance member that balances the weight of the force cantilever with the rotation axis of the cantilever as a fulcrum.
  • the tip of the stylus contacts the measurement surface by rotating the rotation support part Orient the stylus in the direction and measure the surface shape with the stylus along the measurement surface.
  • FIG. 1 is a basic configuration diagram of a conventional surface roughness Z contour shape measuring apparatus.
  • FIG. 2A is a diagram showing a cylinder block as an example of a workpiece of the surface roughness / contour shape measuring apparatus.
  • FIG. 2B is an enlarged cross-sectional view of the opening of the cylinder 10 1 shown in FIG. 2A.
  • FIG. 3 is an explanatory diagram of a measurement method using a conventional surface roughness measuring apparatus.
  • FIG. 4 is a basic configuration diagram of a surface roughness / contour shape measuring apparatus according to an embodiment of the present invention.
  • FIG. 5A is an XZ sectional view of the pickup shown in FIG.
  • Fig. 5B is a cross-sectional view taken along line AA in Fig. 5A.
  • FIG. 5C is a perspective view of the fixing portion shown in FIG. 5A.
  • FIG. 6A is a perspective view of the pickup rotating unit shown in FIG.
  • FIG. 6B is an XZ cross-sectional view of the pick-up rotating unit shown in FIG. 6A.
  • FIG. 7A shows a state in which the measurement surface 1 1 0 is measured by the measurement method using the surface roughness / contour shape measuring device of FIG. FIG.
  • FIG. 7B is a diagram showing a state in which the measurement surface 1 1 1 is measured by the measurement method using the surface roughness / contour shape measurement device of FIG.
  • FIG. 7C is a diagram showing a state in which the measurement surface 1 1 2 is measured by the measurement method using the surface roughness measurement apparatus in FIG.
  • FIG. 7D is a diagram showing a state in which the measurement surface 1 1 3 is measured by the measurement method using the surface roughness / contour shape measuring device of FIG.
  • FIG. 8A is a diagram showing a state in which the taper portion 100 2 is measured by the measuring method using the surface roughness Z contour shape measuring apparatus of FIG.
  • FIG. 8B is a diagram showing a state in which the tapered portion 10 3 is measured by the measuring method using the surface roughness / contour shape measuring device of FIG. BEST MODE FOR CARRYING OUT THE INVENTION
  • FIG. 4 is a basic configuration diagram of the surface roughness Z contour shape measuring apparatus according to the embodiment of the present invention.
  • the surface roughness Z contour shape measuring apparatus 1 is provided with a table 2 along the XY plane for placing a workpiece, and a column 3 is erected on the table 2.
  • the first movable part 4 is attached to the column 3.
  • the column 3 has a built-in motor (not shown), and the first movable part 4 can be moved up and down along the column 3 (along the Z direction) by this motor.
  • the first movable part 4 is provided with a second movable part 8.
  • the first movable part 4 also has a built-in motor, not shown, and can drive the second movable part 8 in the X direction.
  • the second movable portion 8 is provided with a pickup rotating portion 9 that supports the pickup 6 via the arm portion 10.
  • the second movable part 8 also incorporates a motor (not shown), and the pickup rotating part 9 can be driven in the Y direction.
  • a measuring element (pickup) 6 is provided at the tip of the arm 10, and the pickup 6 includes a cantilever 7 having a stylus 11 at one end.
  • the cantilever 7 is provided in the pick-up 6 so that its longitudinal direction is along the X direction which is the driving direction of the movable part 4.
  • One end of the cantilever 7 is provided with a stylus 11 that protrudes in a direction substantially perpendicular to the longitudinal direction of the cantilever.
  • FIG. 5A is a sectional view on the XZ plane side of the pickup 6 shown in FIG. 4, and FIG. 5B is a sectional view taken along the line AA ′ of FIG. 5A.
  • the pick-up 6 is rotatably supported by the fixing portion 62 with the fixing portion 6 2 fixed to the case 6 1 and the pipe shaft 6 4 along the Y direction as a rotation axis.
  • the balance movable part 6 3 is provided.
  • FIG. 5C is a perspective view illustrating the shape of the fixing portion 62 shown in FIG. 5A.
  • the fixed portion 6 2 is formed with arm portions 7 2 a and 7 2 b for holding the pivot shaft 6 4 of the balance movable portion 6 3 from both ends.
  • Bearings 7 1 a and 7 lb supporting the pivot shaft 6 4 are attached to 2 a and 7 2 b, respectively.
  • the movable cantilever part 63 is provided with a cantilever mounting pin 70 for fixing the cantilever 7 to the movable balance part 63.
  • the cantilever mounting pin 70 fixed to the balance movable portion 63 is inserted into the mounting hole provided at the mounting end of the cantilever 7, the cantilever 7 is fixed to the balance movable portion 63.
  • the movable movable part 63 has a movable balance that cantilever 7 is fixed so that the stylus 11 provided at the end opposite to the end where the cantilever 7 is attached contacts the surface of the workpiece.
  • an urging means 65 such as a panel for urging the portion 63 in the rotating direction. It is.
  • the urging means 65 is a compression spring 65 attached to the spring receiving recess 66 of the fixed part 62, and the balance movable part 63 and the balance movable part 63 by this compression spring 65.
  • the attached cantilever 7 is urged in a direction to rotate in the direction (protruding direction) of the stylus 11.
  • the stylus 11 is slid on the surface of the work so as to follow the unevenness of the work surface. Can do. Then, when the displacement of the stylus 11 caused by the unevenness of the surface of the hook is transmitted to the balance movable part 63 via the cantilever 7, the balance movable part 63 is rotated around the pivot shaft 64. Move.
  • the differential inductance sensor is configured to insert the magnetic core 6 7 when the balance movable portion 63 is supported by the fixed portion 62 and the magnetic core 6 7 provided in the balance movable portion 63.
  • This differential inductance sensor detects the movement of the magnetic core 6 7 as the balance movable part 6 3 rotates, as a change in the difference in inductance between the two coils 6 9, and the balance movable part 6 3 Then, the stylus 11 is moved over the entire surface of the measurement surface, and the signals sequentially output from the coil 69 are converted into A / D converters (not shown). The surface roughness of the workpiece is converted to a digital signal using a computer and collected by a data processing device (not shown) such as a computer. Is obtained.
  • the pickup rotating section 9 described later rotates the pickup 6 with the longitudinal direction of the cantilever 7 as the rotation axis, and moves in the direction of the pivot shaft 6 4 (that is, the rotating axis of the cantilever 7 and the balance movable section 63). Even if the angle between the vertical direction and the vertical direction changes, the balance movable part 6 3 is arranged so that the force (that is, the measurement force) pressing the stylus 1 1 against the surface to be measured by the biasing means 6 5 does not fluctuate.
  • the shape and position of the pivot shaft 6 4 are determined so as to balance the weight of the assembly of the cantilever 7, the balance movable portion 63, and the magnetic core 6 7 with the pivot shaft 64 as a fulcrum. Configured.
  • the through-hole of the pivot shaft 6 4 provided in the balance movable portion 63 is a set of the cantilever 7, the balance movable portion 63, and the magnetic core 6 7 in a plane orthogonal to the pivot shaft 64. It is provided at the center of gravity of the solid.
  • the pickup 6 is moved in the Y direction by the second movable part 8 and is moved to the cantilever 7 by the friction force in the Y direction generated between the stylus 11 and the surface of the workpiece.
  • the tip of the pivot shaft 6 4 is formed in a substantially conical shape so that the balance movable part 6 3 can rotate smoothly even if the force is applied, and the bearings 7 1 a and 7 lb are the pivot shaft 6
  • the substantially conical tip of 4 may be configured to be supported by a spherical surface.
  • FIG. 6A is a perspective view of the pickup rotating unit 9, and FIG. 6B is an XZ sectional view of the pickup rotating unit 6.
  • the pickup rotating unit 9 includes a case unit 9 1 supported by the second movable unit 8 so as to be drivable in the Y direction, a rotation attachment unit 9 2 for fixing the arm unit 10 having the pickup 6 attached to the tip, and a rotation A motor 9 3 for supplying a driving force for rotating the attachment part 9 2 with the longitudinal direction of the arm part 10 (ie, the longitudinal direction of the cantilever 7) as the rotation axis, and the rotational attachment part 9 2 to the arm part 1 Gears 9 5 and 9 which transmit the rotational motion of the bearing 9 4 fixed to the case 9 1 to be rotatable about the longitudinal direction of 0 as the rotation axis and the rotary shaft 9 6 of the motor 9 3 to the rotary attachment 9 2 7 and.
  • the balance movable part 6 3 that is rotatably supported by the fixed part 62 of the pickup 6 and the force cantilever 7 attached to the balance movable part 63 also have the longitudinal direction of the cantilever 7 as the rotation axis.
  • the direction of the erosion needle protruding direction
  • the orientation of the stylus 11 is the same as in the conventional measuring method. Keep the direction of the Z axis in the negative direction.
  • the pickup 6 when measuring the measurement surface 1 1 1 parallel to the ZX plane and facing the negative direction of the Y-axis, the pickup 6 must be By rotating the cantilever 7 in the direction of the arrow 90 degrees in the longitudinal direction (X direction) as the rotation axis, the stylus 1 1 is oriented in the positive direction of the Y axis, and the tip is measured 1 1 In this state, place the stylus 1 1 along the measurement surface 1 1 1 and measure its surface roughness / surface contour.
  • the pickup 6 is further moved 90 degrees in the direction of the arrow in the figure. Rotate the stylus 1 1 to point in the positive direction of the Z-axis so that the tip can contact the measurement surface 1 1 2 and in this state, bring the stylus 1 1 along the measurement surface 1 1 2 Measure the surface roughness Z surface Contour shape.
  • the rotation direction in which the workpiece 100 needs to be rotated during measurement is also required. Reduces the number of slashes, and saves labor for setting the rotation axis of the rotating jig for rotating the workpiece 100.
  • the conventional Fig. 3 In order to measure the surface roughness / contour shape of the taper portion (1 0 2, 1 0 3) whose surface is facing upward (Z-axis positive direction), for example, the conventional Fig. 3 Like A, the Y axis in the figure is the axis of rotation, and the taper 1 0 2 is inclined by tilting the entire tape 1 0 0 to make the taper part 1 0 2 horizontal, and the stylus 1 1 is in contact with the surface (Fig. 8 A).
  • the present invention by providing a balance member that balances the weight of the cantilever, it is possible to remove the influence of gravity acting on the cantilever even if the direction of the stylus is changed by rotating the cantilever. Become. As a result, the direction of the stylus can be changed in accordance with the direction of various measurement surfaces, and measurement surfaces in various directions can be measured without changing the workpiece placement direction.
  • the present invention can be used for a surface roughness / contour shape measuring apparatus, and in particular, by moving the stylus along the surface of the object to be measured (workpiece), the displacement of the stylus By detecting, it can be used in a surface roughness / contour shape measuring device that measures the roughness or contour shape of the surface of the object to be measured.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

A surface roughness/outline shape measurement device (1) has a stylus orientation changing section (9) and a balance member (63). In the surface roughness/outline shape measurement device (1), a pivot support section (62, 64, 71a, 71b) supports a cantilever (7) so that it can pivot about a pivot axis that is in the direction normal to the longitudinal direction of the cantilever (7), and the stylus orientation changing section (9) rotates the pivot support section (62, 64, 71a, 71b) about a rotation axis that is in the longitudinal direction of the cantilever (7), changing the orientation of a stylus (11) provided at the forward end of the cantilever (7). The balance member (63) causes the cantilever (7) supported at the pivot axis to balance in weight in order to eliminate influence of gravity acting on the cantilever (7) that rotates as the pivot support section (62, 64, 71a, 71b) rotates.

Description

技術分野 Technical field
本発明は、 表面粗さ Z輪郭形状測定装置に関し、 特に触針を被測 定物 (ワーク) の表面に沿って移動させ触針の変位量を検出するこ とにより、 被測定物表面の粗さ又は輪郭形状を測定する表面粗さ/ 輪郭形状測定装置に関する。 背景技術  The present invention relates to a surface roughness Z contour shape measuring apparatus, and in particular, by detecting the amount of displacement of the stylus by moving the stylus along the surface of the workpiece (workpiece), the present invention relates to the roughness of the surface of the workpiece. The present invention relates to a surface roughness / contour shape measuring apparatus for measuring a thickness or a contour shape. Background art
表面粗さ/輪郭形状測定装置は、 被測定物 (ワーク) 表面に沿つ て、 触針を有するピックアップを移動させ、 触針の変位量を電気信 号に変換してコンピュータ等の計算機に読み取ることで、 被測定物 (ワーク) 表面の粗さ又は輪郭形状を測定する。 このような表面粗 さ Z輪郭形状測定装置は、 例えば日本国公開特許公報特開平 2 0 0 2 — 1 0 7 1 4 4号に開示される。 図 1 に、 従来の表面粗さ/輪郭 形状測定装置の基本構成を示す。  The surface roughness / contour shape measuring device moves the pickup with the stylus along the surface of the workpiece (workpiece), converts the stylus displacement into an electrical signal, and reads it into a computer such as a computer. Measure the surface roughness or contour of the workpiece (workpiece). Such a surface roughness Z contour shape measuring apparatus is disclosed in, for example, Japanese Patent Application Laid-Open No. 2 0 0 2-1 0 7 1 4 4. Figure 1 shows the basic configuration of a conventional surface roughness / contour shape measuring device.
表面粗さ/輪郭形状測定装置 1 には、 ワークを載置するための X Y平面に沿ったテーブル 2が設けられ、 テーブル 2にはコラム 3が 立設される。 そしてコラム 3 には可動部 4が取り付けられる。 コラ ム 3には図示しないモータが内蔵されており、 このモータによって 可動部 4をコラム 3に沿って ( Z方向に沿って) 上下に移動するこ とが可能である。 可動部 4には、 腕部 1 0 を介してピックアップ 6 を支持するホルダ 5が設けられる。 可動部 4もまた図示しないモー 夕を内蔵しており、 ホルダ 5を X方向に駆動することが可能である 腕部 1 0の先端には、 テ一ブル 2上に載置されたワークの表面粗 さを測定するための測定子 (ピックアップ) 6が設けられ、 このピ ックアップ 6は、 一端に触針 1 1 を有するカンチレバー 7 を備える 。 カンチレバー 7は、 その長手方向が可動部 4の駆動方向である X 方向に沿うように方向付けられてピックアップ 6 に設けられており 、 ピックアップ 6は、 このカンチレバー 7 を、 触針 1 1が設けられ る一端と反対側の他端において、 カンチレバー 7の長手方向と触針 1 1 の突出方向 (Z方向) と直交する方向 (Y方向) を回動軸とし て、 回動可能に支える。 The surface roughness / contour shape measuring apparatus 1 is provided with a table 2 along the XY plane for placing a workpiece, and a column 3 is erected on the table 2. The movable part 4 is attached to the column 3. The column 3 incorporates a motor (not shown), and the movable part 4 can be moved up and down along the column 3 (along the Z direction) by this motor. The movable part 4 is provided with a holder 5 that supports the pickup 6 via the arm part 10. The movable part 4 also has a built-in mode (not shown), and the holder 5 can be driven in the X direction. The tip of the arm 10 is provided with a measuring element (pickup) 6 for measuring the surface roughness of the workpiece placed on the table 2, and this pick-up 6 has a stylus 1 at one end. With a cantilever 7 with 1. The cantilever 7 is provided in the pickup 6 so that its longitudinal direction is along the X direction which is the driving direction of the movable part 4. The pickup 6 is provided with the cantilever 7 and the stylus 11. At the other end opposite to the other end, the longitudinal direction of the cantilever 7 and the direction perpendicular to the protruding direction of the stylus 11 (Z direction) (Y direction) are supported rotatably.
したがって、 触針 1 1 を測定表面に接触させながら駆動部 4によ つて X方向に移動させたとき、 触針 1 1 は測定表面の凹凸量にした がって Z方向に微動する。 この変位量はカンチレバ一 7 によって回 転運動に変換されて、 ピックアップ 6に内蔵された差動インダクタ ンスゃ作動卜ランス (図示せず) に伝えられ、 電気信号に変換され る。 そして、 この電気信号を A Z D変換器 (図示せず) によってデ ィジタル信号に変換する。  Therefore, when the stylus 11 is moved in the X direction by the drive unit 4 while being in contact with the measurement surface, the stylus 11 slightly moves in the Z direction according to the unevenness of the measurement surface. This amount of displacement is converted into a rotational motion by the cantilever 7 and transmitted to a differential inductance built in the pickup 6 (not shown) and converted into an electric signal. This electric signal is converted into a digital signal by an AZD converter (not shown).
そして、 測定表面の全域に亘つて触針 1 1 を移動させて、 そのと きに A / D変換器から順次出力される信号を、 コンピュータ等で構 成されるデータ処理装置 (図示せず) で収集することにより、 ヮー クの表面粗さを示す測定データが取得される。 発明の開示  Then, the stylus 11 is moved over the entire measurement surface, and the signals sequentially output from the A / D converter at that time are converted into a data processing device (not shown) composed of a computer or the like. By collecting in, measurement data indicating the surface roughness of the cake is obtained. Disclosure of the invention
従来の表面粗さ/輪郭形状測定装置 1では、 触針 1 1 の突出方向 (もしくは、 触針 1 1の微動に伴うカンチレバ一 7の回転運動の回 転軸方向) が特定の方向に固定されている (通常は、 触針 1 1の突 出方向は鉛直下方 ( Z軸方向) に設定され、 カンチレバー 7 の回転 運動の回転軸は Y軸方向に設定される) 。 これは、 表面粗さ/輪郭形状測定では、 測定力 (触針 1 1 を測定 対象表面に押しつける力) が各規格 (例えば J I S規格 B 0 6 5 1 ) によって定められており、 重力に影響されずに測定力を一定に 保つには、 触針 1 1の方向を固定した方が好適であるとの事情によ る。 In the conventional surface roughness / contour shape measuring device 1, the protruding direction of the stylus 1 1 (or the rotational axis direction of the rotational movement of the cantilever 7 associated with the fine movement of the stylus 11) is fixed in a specific direction. (Normally, the protruding direction of the stylus 1 1 is set vertically downward (Z-axis direction), and the rotation axis of the rotary motion of the cantilever 7 is set in the Y-axis direction). This is because in surface roughness / contour measurement, the measurement force (force to press the stylus 1 1 against the surface to be measured) is determined by each standard (for example, JIS standard B 0 6 5 1) and is affected by gravity. In order to keep the measuring force constant, the direction of the stylus 11 is preferably fixed.
しかしながら、 触針 1 1の方向が固定された従来の表面粗さ Z輪 郭形状測定装置 1 によってワークの様々な面の表面粗さ/輪郭形状 を測定するには、 各測定面に触針 1 1 を接触させるために、 ワーク をテーブル 2に載置する向きを変えて対応しなければならない。 こ の作業はワークが重量物である場合に多大な労力を要するものとな る。  However, in order to measure the surface roughness / contour shape of various surfaces of the workpiece with the conventional surface roughness Z contour measurement device 1 with the direction of the stylus 1 1 fixed, the stylus 1 on each measurement surface In order to bring 1 into contact, it is necessary to change the direction in which the workpiece is placed on the table 2 and cope with it. This work requires a lot of labor when the work is heavy.
さらに、 例えば図 2 Aに示すエンジンのシリンダ一ブロック 1 0 0のシリンダー 1 0 1の内面の表面形状を測定する場合に以下の問 題が生じる。  Further, for example, the following problem arises when measuring the surface shape of the inner surface of the cylinder 10 1 of the cylinder block 1 100 of the engine shown in FIG. 2A.
図 2 Bは、 図 2 Aに示すシリンダー 1 0 1の開口部の拡大断面図 である。 図 2 Bに示す例では、 シリンダー 1 0 1 の開口部にテーパ —部分 ( 1 0 2、 1 0 3 ) が形成されている。  FIG. 2B is an enlarged cross-sectional view of the opening of the cylinder 101 shown in FIG. 2A. In the example shown in FIG. 2B, taper portions (1 0 2, 1 0 3) are formed in the opening of the cylinder 1 0 1.
このテーパー部分のうち、 表面が上方を向いている 1 0 2部分の 表面粗さ Z輪郭形状を計測するためには、 例えば図 3に示すように 、 図の Y軸を回転輔としてテーパー角 0分だけワーク 1 0 0全体を 傾けてテーパー部分 1 0 2 を水平にして、 触針 1 1 を表面に沿わせ ればよい。  Of this taper portion, the surface is facing upward. 10 2 Surface roughness Z To measure the contour shape, for example, as shown in FIG. Just tilt the entire workpiece 100 and level the taper 1 0 2 and the stylus 1 1 along the surface.
一方で、 表面が下方を向いているテーパー部分 1 0 3部分の表面 粗さ 輪郭形状を計測するためには、 まずワーク 1 0 0全体を図の X軸を回転軸として 1 8 0度回転させて、 テーパー部分 1 0 3部分 の表面を上方に向ける必要がある。  On the other hand, in order to measure the surface roughness and contour shape of the taper portion with the surface facing downward, the first part of the workpiece is rotated by 180 degrees with the X axis as the rotation axis. Thus, the surface of the taper portion 10 3 portion needs to face upward.
ところで、 表面粗さ 輪郭形状を測定する場合には、 テーブル 2 上に載置されたワーク 1 0 0の位置が既知である必要がある。 特に 上述のように測定に際してワーク 1 0 0 を回転させる必要がある場 合には、 ワーク 1 0 0 を回転させる回転軸の位置及び方向が既知で ある必要がある。 実際の回転軸が想定された回転軸から狂っている と、 測定面の位置及び方向にズレが生じて誤差原因となるからであ る。 By the way, when measuring the surface roughness and contour shape, the table 2 The position of the workpiece 100 placed on the top needs to be known. In particular, when it is necessary to rotate the workpiece 100 during measurement as described above, the position and direction of the rotating shaft that rotates the workpiece 100 must be known. This is because if the actual rotation axis deviates from the assumed rotation axis, a deviation occurs in the position and direction of the measurement surface, causing an error.
しかしながら、 例えば図 2 Aに示すシリンダ一ブロック 1 0 0の ようないわゆる角物ワークの場合には、 柱状ワークなどの場合と異 なり回転軸を定めるための目標がなく、 ワーク 1 0 0を回転させる ための回転治具の回転軸を、 想定した回転軸通りに定める作業が困 難になる。 したがって、 従来のような触針 1 1の方向が固定された 表面粗さ/輪郭形状測定装置 1 によっては、 図 2 Aに示すような角 物ワーク各部の表面粗さ/輪郭形状を測定する作業が非常に煩雑な ものとなる。  However, in the case of a so-called square workpiece such as a cylinder block 100 shown in FIG. 2A, for example, unlike a columnar workpiece, there is no target for setting the rotation axis, and the workpiece 100 is rotated. This makes it difficult to set the rotation axis of the rotating jig to match the expected rotation axis. Therefore, depending on the conventional surface roughness / contour shape measuring device 1 in which the direction of the stylus 1 1 is fixed, the work of measuring the surface roughness / contour shape of each part of the square workpiece as shown in FIG. Becomes very cumbersome.
上記問題点を鑑みて、 本発明は、 測定面の方向に合わせて触針の 方向を変えることにより、 ワークの載置方向を変えることなく様々 な方向の測定面を測定可能な表面粗さ/輪郭形状測定装置を提供す ることを目的とする。  In view of the above problems, the present invention provides a surface roughness / measurement that can measure the measurement surface in various directions without changing the mounting direction of the workpiece by changing the direction of the stylus according to the direction of the measurement surface. An object is to provide a contour shape measuring device.
上記目的を達成するために、 本発明による表面粗さ Z輪郭形状測 定装置は、 カンチレバーの長手方向に直交する方向を回動軸として 力ンチレバーを回動可能に支持する回動支持軸部材を、 カンチレバ 一の長手方向を回転軸として回転させて、 カンチレバーの先端に設 けられた触針の方向を変更する。  In order to achieve the above object, a surface roughness Z contour shape measuring apparatus according to the present invention comprises a rotation support shaft member that rotatably supports a force nail lever with a direction orthogonal to the longitudinal direction of the cantilever as a rotation axis. Rotate the cantilever as the axis of rotation to change the direction of the stylus provided at the tip of the cantilever.
さらに、 回動支持部の回転に伴って回転するカンチレバーに作用 する重力の影響を除去するために、 カンチレバーの回動軸を支点と する力ンチレバーの重量バランスをとるバランス部材を設ける。 そして、 回動支持部を回転させて触針の先端が測定面に接触する 方向に触針を方向づけ、 その状態で測定面に触針を沿わせて表面形 状を測定する。 Furthermore, in order to eliminate the influence of gravity acting on the cantilever that rotates with the rotation of the rotation support portion, a balance member is provided that balances the weight of the force cantilever with the rotation axis of the cantilever as a fulcrum. And the tip of the stylus contacts the measurement surface by rotating the rotation support part Orient the stylus in the direction and measure the surface shape with the stylus along the measurement surface.
本発明の上述した及び他の目的及び特徴は、 添付図面を参照しな がら以下に示される好適実施例についての説明を読むことによって 、 より明らかになるであろう。 図面の簡単な説明  The above and other objects and features of the present invention will become more apparent by reading the description of the preferred embodiment shown below with reference to the accompanying drawings. Brief Description of Drawings
図 1 は、 従来の表面粗さ Z輪郭形状測定装置の基本構成図である 図 2 Aは、 表面粗さ/輪郭形状測定装置のワークの例示となるシ リンダ一ブロックを示す図である。  FIG. 1 is a basic configuration diagram of a conventional surface roughness Z contour shape measuring apparatus. FIG. 2A is a diagram showing a cylinder block as an example of a workpiece of the surface roughness / contour shape measuring apparatus.
図 2 Bは、 図 2 Aに示すシリンダー 1 0 1 の開口部の拡大断面図 である。  FIG. 2B is an enlarged cross-sectional view of the opening of the cylinder 10 1 shown in FIG. 2A.
図 3は、 従来の表面粗さノ輪郭形状測定装置による測定方法の説 明図である。  FIG. 3 is an explanatory diagram of a measurement method using a conventional surface roughness measuring apparatus.
図 4は、 本発明の実施例による表面粗さ/輪郭形状測定装置の基 本構成図である。  FIG. 4 is a basic configuration diagram of a surface roughness / contour shape measuring apparatus according to an embodiment of the present invention.
図 5 Aは、 図 4に示すピックアップの X Z断面図である。  FIG. 5A is an XZ sectional view of the pickup shown in FIG.
図 5 Bは、 図 5 Aの A— A, 断面図である。  Fig. 5B is a cross-sectional view taken along line AA in Fig. 5A.
図 5 Cは、 図 5 Aに示す固定部の斜視図である。  FIG. 5C is a perspective view of the fixing portion shown in FIG. 5A.
図 6 Aは、 図 4に示すピックアップ回転部の斜視図である。  FIG. 6A is a perspective view of the pickup rotating unit shown in FIG.
図 6 Bは、 図 6 Aに示すピックアツプ回転部の X Z断面図である 図 7 Aは、 図 4の表面粗さ/輪郭形状測定装置による測定方法に より測定面 1 1 0 を測定する状態を示す図である。  6B is an XZ cross-sectional view of the pick-up rotating unit shown in FIG. 6A. FIG. 7A shows a state in which the measurement surface 1 1 0 is measured by the measurement method using the surface roughness / contour shape measuring device of FIG. FIG.
図 7 Bは、 図 4の表面粗さ/輪郭形状測定装置による測定方法に より測定面 1 1 1 を測定する状態を示す図である。 図 7 Cは、 図 4の表面粗さノ輪郭形状測定装置による測定方法に より測定面 1 1 2 を測定する状態を示す図である。 FIG. 7B is a diagram showing a state in which the measurement surface 1 1 1 is measured by the measurement method using the surface roughness / contour shape measurement device of FIG. FIG. 7C is a diagram showing a state in which the measurement surface 1 1 2 is measured by the measurement method using the surface roughness measurement apparatus in FIG.
図 7 Dは、 図 4の表面粗さ/輪郭形状測定装置による測定方法に より測定面 1 1 3 を測定する状態を示す図である。  FIG. 7D is a diagram showing a state in which the measurement surface 1 1 3 is measured by the measurement method using the surface roughness / contour shape measuring device of FIG.
図 8 Aは、 図 4の表面粗さ Z輪郭形状測定装置による測定方法に よりテ一パ一部分 1 0 2を測定する状態を示す図である。  FIG. 8A is a diagram showing a state in which the taper portion 100 2 is measured by the measuring method using the surface roughness Z contour shape measuring apparatus of FIG.
図 8 Bは、 図 4の表面粗さ/輪郭形状測定装置による測定方法に よりテーパー部分 1 0 3 を測定する状態を示す図である。 発明を実施するための最良の形態  FIG. 8B is a diagram showing a state in which the tapered portion 10 3 is measured by the measuring method using the surface roughness / contour shape measuring device of FIG. BEST MODE FOR CARRYING OUT THE INVENTION
以下、 添付する図面を参照して本発明の実施例を説明する。 図 4 は、 本発明の実施例に係る表面粗さ Z輪郭形状測定装置の基本構成 図である。  Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. FIG. 4 is a basic configuration diagram of the surface roughness Z contour shape measuring apparatus according to the embodiment of the present invention.
図示するように、 表面粗さ Z輪郭形状測定装置 1 には、 ワークを 載置するための X Y平面に沿ったテーブル 2が設けられ、 テーブル 2にはコラム 3が立設される。 そしてコラム 3には第 1可動部 4が 取り付けられる。 コラム 3には図示しないモー夕が内蔵されており 、 このモータによって第 1可動部 4をコラム 3に沿って (Z方向に 沿って) 上下に移動することが可能である。  As shown in the figure, the surface roughness Z contour shape measuring apparatus 1 is provided with a table 2 along the XY plane for placing a workpiece, and a column 3 is erected on the table 2. The first movable part 4 is attached to the column 3. The column 3 has a built-in motor (not shown), and the first movable part 4 can be moved up and down along the column 3 (along the Z direction) by this motor.
第 1可動部 4には第 2可動部 8が設けられる。 第 1可動部 4も図 示しないモー夕を内蔵しており、 第 2可動部 8 を X方向に駆動する ことが可能である。 さらに第 2可動部 8には、 腕部 1 0を介してピ ックアップ 6 を支持するピックアップ回転部 9が設けられる。 第 2 可動部 8 も図示しないモータを内蔵しており、 ピックアップ回転部 9 を Y方向に駆動することが可能である。  The first movable part 4 is provided with a second movable part 8. The first movable part 4 also has a built-in motor, not shown, and can drive the second movable part 8 in the X direction. Further, the second movable portion 8 is provided with a pickup rotating portion 9 that supports the pickup 6 via the arm portion 10. The second movable part 8 also incorporates a motor (not shown), and the pickup rotating part 9 can be driven in the Y direction.
腕部 1 0の先端には測定子 (ピックアップ) 6が設けられ、 この ピックアップ 6は、 一端に触針 1 1 を有するカンチレバ一 7 を備え る。 カンチレバー 7は、 その長手方向が可動部 4の駆動方向である X方向に沿うように方向付けられてピックァップ 6 に設けられる。 カンチレバー 7 の一端には、 カンチレバーの長手方向と略直交する 方向に突出する触針 1 1が設けられる。 A measuring element (pickup) 6 is provided at the tip of the arm 10, and the pickup 6 includes a cantilever 7 having a stylus 11 at one end. The The cantilever 7 is provided in the pick-up 6 so that its longitudinal direction is along the X direction which is the driving direction of the movable part 4. One end of the cantilever 7 is provided with a stylus 11 that protrudes in a direction substantially perpendicular to the longitudinal direction of the cantilever.
ピックアップ 6は、 このカ ンチレパー 7 を、 触針 1 1が設けられ る一端と反対側の他端において、 カンチレバー 7の長手方向と触針 1 1 の突出方向と直交する方向を回動軸として回動可能に支える。 図 5 Aは、 図 4に示すピックアップ 6の X Z平面側断面図であり 、 図 5 Bは図 5 Aの A— A ' 断面図である。 ピックアップ 6はその ケース 6 1 の内部に、 ケース 6 1 に固定される固定部 6 2 と、 Y方 向に沿うピポッ 卜軸 6 4を回転軸として固定部 6 2に回動可能に支 持されるバランス可動部 6 3 と、 を備える。 図 5 Cは、 図 5 Aに示 す固定部 6 2の形状を説明する斜視図である。  The pickup 6 rotates the cantilever 7 at the other end opposite to the one where the stylus 11 is provided, with the longitudinal direction of the cantilever 7 and the direction perpendicular to the protruding direction of the stylus 11 as the rotation axis. Supports in a movable manner. FIG. 5A is a sectional view on the XZ plane side of the pickup 6 shown in FIG. 4, and FIG. 5B is a sectional view taken along the line AA ′ of FIG. 5A. The pick-up 6 is rotatably supported by the fixing portion 62 with the fixing portion 6 2 fixed to the case 6 1 and the pipe shaft 6 4 along the Y direction as a rotation axis. The balance movable part 6 3 is provided. FIG. 5C is a perspective view illustrating the shape of the fixing portion 62 shown in FIG. 5A.
図 5 Cに示すとおり、 固定部 6 2には、 バランス可動部 6 3のピ ポッ ト軸 6 4を両端から挟持するための腕部分 7 2 a及び 7 2 bが 形成され、 この腕部分 7 2 a及び 7 2 bのそれぞれに、 ピボッ ト軸 6 4を支持する軸受け 7 1 a、 7 l bが取り付けられる。  As shown in FIG. 5C, the fixed portion 6 2 is formed with arm portions 7 2 a and 7 2 b for holding the pivot shaft 6 4 of the balance movable portion 6 3 from both ends. Bearings 7 1 a and 7 lb supporting the pivot shaft 6 4 are attached to 2 a and 7 2 b, respectively.
また、 ノ ランス可動部 6 3には、 カンチレバー 7 をバランス可動 部 6 3 に固定するためのカンチレバ一取り付けピン 7 0が設けられ る。 バランス可動部 6 3に固定されたカンチレバー取り付けピン 7 0が、 カンチレバー 7 の取り付け端に設けられた取り付け孔に挿入 されることによりカンチレバー 7がバランス可動部 6 3に固定され る。  In addition, the movable cantilever part 63 is provided with a cantilever mounting pin 70 for fixing the cantilever 7 to the movable balance part 63. When the cantilever mounting pin 70 fixed to the balance movable portion 63 is inserted into the mounting hole provided at the mounting end of the cantilever 7, the cantilever 7 is fixed to the balance movable portion 63.
さらに、 ノ ランス可動部 6 3には、 カンチレバー 7の取り付け端 と反対側の端に設けられた触針 1 1がワークの表面に追従しながら 接触するように、 カンチレバー 7が固定されたバランス可動部 6 3 を、 その回動方向に付勢するためのパネ等の付勢手段 6 5が設けら れている。 図 5 Aの例では、 付勢手段 6 5は、 固定部 6 2 のバネ受 け凹部 6 6に取り付けられた圧縮ばね 6 5であり、 この圧縮ばね 6 5によってバランス可動部 6 3及びこれに取り付けられたカンチレ バ一 7は、 触針 1 1 の向き (突出方向) に回動させる方向に付勢さ れる。 In addition, the movable movable part 63 has a movable balance that cantilever 7 is fixed so that the stylus 11 provided at the end opposite to the end where the cantilever 7 is attached contacts the surface of the workpiece. There is provided an urging means 65 such as a panel for urging the portion 63 in the rotating direction. It is. In the example of FIG. 5A, the urging means 65 is a compression spring 65 attached to the spring receiving recess 66 of the fixed part 62, and the balance movable part 63 and the balance movable part 63 by this compression spring 65. The attached cantilever 7 is urged in a direction to rotate in the direction (protruding direction) of the stylus 11.
したがって、 ピックァップ 6が第 1可動部 4及び第 2可動部 8 に よって移動されたとき、 その触針 1 1 は、 ワークの表面の凹凸に追 従するようにワークの表面上で摺動することができる。 そして、 ヮ —クの表面の凹凸により生じる触針 1 1の変位が、 カンチレバー 7 を介してバランス可動部 6 3に伝わると、 バランス可動部 6 3はピ ポッ ト軸 6 4を回転軸として回動する。  Therefore, when the pick-up 6 is moved by the first movable part 4 and the second movable part 8, the stylus 11 is slid on the surface of the work so as to follow the unevenness of the work surface. Can do. Then, when the displacement of the stylus 11 caused by the unevenness of the surface of the hook is transmitted to the balance movable part 63 via the cantilever 7, the balance movable part 63 is rotated around the pivot shaft 64. Move.
また、 ワークの表面上を摺動する触針 1 1が、 ワーク表面の凹凸 によって変位すると、 その変位量はピックアップ 6 に設けられた差 動インダク夕ンスセンサによって、 電気信号に変換される。 この差 動イングクタンスセンサは、 バランス可動部 6 3に設けられた磁性 体コア 6 7 と、 バランス可動部 6 3が固定部 6 2に支持されたとき 、 磁性体コア 6 7 を挿入するように固定部 6 2に設けられたコア挿 入口 6 8 と、 このコア揷入口 6 8 の周囲に、 磁性体コア 6 7 を囲う ように設けられた 2つのコイル 6 9から構成される。 この差動イン ダク夕ンスセンサは、 バランス可動部 6 3の回動に伴う磁性体コア 6 7の動きを、 2つのコイル 6 9のインダクタンスの差の変化とし て検出して、 バランス可動部 6 3 の変位量を電気的信号に変換する そして、 測定表面の全域に亘つて触針 1 1 を移動させて、 そのと きにコイル 6 9から順次出力される信号を A / D変換器 (図示せず ) にてディ ジタル信号に変換し、 コンピュータ等で構成されるデー 夕処理装置 (図示せず) で収集することにより、 ワークの表面粗さ を示す測定データが取得される。 Further, when the stylus 11 that slides on the surface of the workpiece is displaced by the unevenness on the surface of the workpiece, the amount of displacement is converted into an electric signal by the differential inductance sensor provided in the pickup 6. This differential inductance sensor is configured to insert the magnetic core 6 7 when the balance movable portion 63 is supported by the fixed portion 62 and the magnetic core 6 7 provided in the balance movable portion 63. A core insertion port 6 8 provided in the fixed portion 62 and two coils 69 provided around the core rod inlet 6 8 so as to surround the magnetic core 6 7. This differential inductance sensor detects the movement of the magnetic core 6 7 as the balance movable part 6 3 rotates, as a change in the difference in inductance between the two coils 6 9, and the balance movable part 6 3 Then, the stylus 11 is moved over the entire surface of the measurement surface, and the signals sequentially output from the coil 69 are converted into A / D converters (not shown). The surface roughness of the workpiece is converted to a digital signal using a computer and collected by a data processing device (not shown) such as a computer. Is obtained.
ここで、 後述するピックアップ回転部 9がピックアップ 6 をカン チレバー 7 の長手方向を回転軸として回転し、 ピポッ ト軸 6 4の方 向 (すなわちカンチレバー 7及びバランス可動部 6 3の回動軸の方 向) と鉛直方向とがなす角が変化しても、 付勢手段 6 5によって触 針 1 1 を測定対象表面に押しつける力 (すなわち測定力) が変動し ないように、 前記バランス可動部 6 3は、 ピボッ ト軸 6 4を支点と する、 カンチレバ一 7、 バランス可動部 6 3及び磁性体コア 6 7の 組立体の重量バランスを取るように、 その形状とピボッ ト軸 6 4の 位置を定めて構成される。  Here, the pickup rotating section 9 described later rotates the pickup 6 with the longitudinal direction of the cantilever 7 as the rotation axis, and moves in the direction of the pivot shaft 6 4 (that is, the rotating axis of the cantilever 7 and the balance movable section 63). Even if the angle between the vertical direction and the vertical direction changes, the balance movable part 6 3 is arranged so that the force (that is, the measurement force) pressing the stylus 1 1 against the surface to be measured by the biasing means 6 5 does not fluctuate. The shape and position of the pivot shaft 6 4 are determined so as to balance the weight of the assembly of the cantilever 7, the balance movable portion 63, and the magnetic core 6 7 with the pivot shaft 64 as a fulcrum. Configured.
具体的には、 バランス可動部 6 3 に設けられるピポッ ト軸 6 4の 貫通口は、 ピボッ ト軸 6 4に直交する平面において、 カンチレバー 7、 バランス可動部 6 3及び磁性体コァ 6 7の組立体の重心に設け られる。  Specifically, the through-hole of the pivot shaft 6 4 provided in the balance movable portion 63 is a set of the cantilever 7, the balance movable portion 63, and the magnetic core 6 7 in a plane orthogonal to the pivot shaft 64. It is provided at the center of gravity of the solid.
このようにピポッ ト軸 6 4の位置を決定することにより、 ピック アップ 6の回転によってピポッ ト軸 6 4の方向と鉛直方向とがなす 角が変化して、 カンチレバー 7、 バランス可動部 6 3及び磁性体コ ァ 6 7の組立体の姿勢が変化しても、 組立体には重力によるモーメ ントが発生しないため、 付勢手段 6 5による測定力を一定に維持す ることが可能となる。  By determining the position of the pipette shaft 6 4 in this way, the angle between the direction of the pipette shaft 6 4 and the vertical direction is changed by the rotation of the pickup 6, and the cantilever 7, the balance movable portion 6 3 and Even if the posture of the magnetic core 67 is changed, no moment due to gravity is generated in the assembly, so that the measuring force by the biasing means 65 can be kept constant.
なお、 ピックアップ 6が第 2可動部 8により Y方向に移動され、 それに伴って移動する触針 1 1 とワークの表面との間で生じる Y方 向の摩擦力によって、 カンチレバ一 7 にョ一イングさせる力が働い ても、 バランス可動部 6 3がスムーズに回動するように、 ピボッ ト 軸 6 4の先端は略円錐形に形成され、 また軸受け 7 1 a、 7 l bは 、 ピボッ ト軸 6 4の略円錐形の先端を球面によって支持するように 構成されることとしてよい。 図 6 Aはピックアップ回転部 9 の斜視図であり、 図 6 Bはピック アップ回転部 6の X Z断面図である。 ピックアップ回転部 9は、 第 2可動部 8によって Y方向に駆動可能に支持されるケース部 9 1 と 、 先端にピックアップ 6が取り付けられた腕部 1 0 を固定する回転 アタッチメント部 9 2 と、 回転アタッチメント部 9 2 を腕部 1 0 の 長手方向 (すなわちカンチレバ一 7の長手方向) を回転軸として回 転させるための駆動力を供給するモータ 9 3 と、 回転アタッチメン ト部 9 2 を腕部 1 0の長手方向を回転軸として回転可能にケース部 9 1 に固定するベアリング 9 4と、 モー夕 9 3の回転シャフ ト 9 6 の回転運動を回転アタッチメント部 9 2に伝達するギア 9 5及び 9 7 と、 を備える。 The pickup 6 is moved in the Y direction by the second movable part 8 and is moved to the cantilever 7 by the friction force in the Y direction generated between the stylus 11 and the surface of the workpiece. The tip of the pivot shaft 6 4 is formed in a substantially conical shape so that the balance movable part 6 3 can rotate smoothly even if the force is applied, and the bearings 7 1 a and 7 lb are the pivot shaft 6 The substantially conical tip of 4 may be configured to be supported by a spherical surface. FIG. 6A is a perspective view of the pickup rotating unit 9, and FIG. 6B is an XZ sectional view of the pickup rotating unit 6. The pickup rotating unit 9 includes a case unit 9 1 supported by the second movable unit 8 so as to be drivable in the Y direction, a rotation attachment unit 9 2 for fixing the arm unit 10 having the pickup 6 attached to the tip, and a rotation A motor 9 3 for supplying a driving force for rotating the attachment part 9 2 with the longitudinal direction of the arm part 10 (ie, the longitudinal direction of the cantilever 7) as the rotation axis, and the rotational attachment part 9 2 to the arm part 1 Gears 9 5 and 9 which transmit the rotational motion of the bearing 9 4 fixed to the case 9 1 to be rotatable about the longitudinal direction of 0 as the rotation axis and the rotary shaft 9 6 of the motor 9 3 to the rotary attachment 9 2 7 and.
モータ 9 3が回転するとその回転シャフ ト 9 6に生じた回転力が ギア 9 5及び 9 7を伝わって回転アタッチメント部 9 2を回転させ る。 この回転アタッチメント部 9 2は腕部 1 0を介してピックアツ プ 6に連結されているため、 回転アタッチメント部 9 2が回転する ことによって、 ピックアップ 6はカンチレバー 7の長手方向を回転 軸として回転する。  When the motor 93 rotates, the rotational force generated in the rotation shaft 96 is transmitted to the gears 95 and 97 to rotate the rotation attachment part 92. Since the rotation attachment portion 92 is connected to the pick-up 6 via the arm portion 10, the pickup 6 rotates with the longitudinal direction of the cantilever 7 as the rotation axis by the rotation of the rotation attachment portion 92.
すると、 ピックアップ 6の固定部 6 2に回動可能に支持されたバ ランス可動部 6 3 と、 このバランス可動部 6 3に取り付けられた力 ンチレバー 7 もまた、 カンチレバー 7 の長手方向を回転軸として回 転し、 その結果として図 7 A〜図 7 Dに示すように、 蝕針の向き ( 突出方向) が変わる。  Then, the balance movable part 6 3 that is rotatably supported by the fixed part 62 of the pickup 6 and the force cantilever 7 attached to the balance movable part 63 also have the longitudinal direction of the cantilever 7 as the rotation axis. As a result, as shown in FIGS. 7A to 7D, the direction of the erosion needle (protruding direction) changes.
例えば、 図 7 Aに示すように、 X Y平面に平行でありかつ Z軸の 正方向に向く測定面 1 1 0の測定を行う場合には、 従来の測定方法 と同様に触針 1 1の向きを Z軸の負方向に向けた状態にしておく。 次に、 Z X平面に平行でありかつ Y軸の負方向に向く測定面 1 1 1の測定を行う場合には、 図 7 Bに示すように、 ピックアップ 6 を カンチレバー 7の長手方向 (X方向) を回転軸として図の矢印の方 向に 9 0度回転させることによって、 触針 1 1 の向きを Y軸の正方 向に向けて、 先端を測定面 1 1 1 に接触できるようにし、 この状態 で触針 1 1 を測定面 1 1 1上で沿わせてその表面粗さ/表面輪郭形 状を測定する。 For example, as shown in Fig. 7A, when measuring the measuring surface 110 that is parallel to the XY plane and faces the positive direction of the Z axis, the orientation of the stylus 11 is the same as in the conventional measuring method. Keep the direction of the Z axis in the negative direction. Next, when measuring the measurement surface 1 1 1 parallel to the ZX plane and facing the negative direction of the Y-axis, the pickup 6 must be By rotating the cantilever 7 in the direction of the arrow 90 degrees in the longitudinal direction (X direction) as the rotation axis, the stylus 1 1 is oriented in the positive direction of the Y axis, and the tip is measured 1 1 In this state, place the stylus 1 1 along the measurement surface 1 1 1 and measure its surface roughness / surface contour.
さらに、 X Y平面に平行でありかつ Z軸の負方向に向く測定面 1 1 2 の測定を行う場合には、 図 7 Cに示すように、 ピックアップ 6 を図の矢印の方向にさらに 9 0度回転させて触針 1 1の向きを Z軸 の正方向に向けて、 先端を測定面 1 1 2に接触できるようにし、 こ の状態で触針 1 1 を測定面 1 1 2上で沿わせてその表面粗さ Z表面 輪郭形状を測定する。  Furthermore, when measuring the measurement surface 1 1 2 parallel to the XY plane and facing the negative direction of the Z axis, as shown in Fig. 7 C, the pickup 6 is further moved 90 degrees in the direction of the arrow in the figure. Rotate the stylus 1 1 to point in the positive direction of the Z-axis so that the tip can contact the measurement surface 1 1 2 and in this state, bring the stylus 1 1 along the measurement surface 1 1 2 Measure the surface roughness Z surface Contour shape.
また、 X Z平面に平行でありかつ Y軸の正方向に向く測定面 1 1 3 の測定を行う場合には、 図 7 Dに示すように、 ピックアップ 6 を 図の矢印の方向にさらに 9 0度回転させて触針 1 1 の向きを Y軸の 負方向に向けて、 先端を測定面 1 1 3に接触できるようにし、 この 状態で触針 1 1 を測定面 1 1 3上で沿わせてその表面粗さ Z表面輪 郭形状を測定する。  When measuring the measurement surface 1 1 3 parallel to the XZ plane and facing the positive direction of the Y axis, as shown in Fig. 7D, move the pickup 6 further 90 degrees in the direction of the arrow in the figure. Rotate the stylus 1 1 in the negative direction of the Y-axis so that the tip can come into contact with the measurement surface 1 1 3 and keep the stylus 1 1 along the measurement surface 1 1 3 in this state. The surface roughness Z surface contour shape is measured.
このように、 測定面の方向に応じてピックアップ 6 を回転させ、 触針 1 1の方向を変えることにより、 従来の測定装置ではワークの 向きを変えなければ測定することが不可能であった測定面を、 ヮー クの向きを変えることなく測定することを可能とする。  In this way, by rotating the pickup 6 in accordance with the direction of the measurement surface and changing the direction of the stylus 11, the measurement that was impossible with conventional measuring devices was not possible without changing the direction of the workpiece. It is possible to measure the surface without changing the direction of the cake.
また、 図 2及び図 3 を参照して上記説明した、 シリンダープロッ ク 1 0 0のような角物ワークを測定する場合にも、 測定に際してヮ ーク 1 0 0 を回転させる必要のある回転方向の数を減らし、 ワーク 1 0 0 を回転させるための回転治具の、 回転軸の設定作業を省力化 する。  In addition, when measuring a square workpiece such as a cylinder block 100 described above with reference to FIGS. 2 and 3, the rotation direction in which the workpiece 100 needs to be rotated during measurement is also required. Reduces the number of slashes, and saves labor for setting the rotation axis of the rotating jig for rotating the workpiece 100.
例えば図 2 Bに示すシリ ンダー 1 0 1の開口部のテーパー部分 ( 1 0 2、 1 0 3 ) の表面粗さ/輪郭形状を計測する場合を、 図 8 A 及び図 8 Bを参照して説明する。 For example, the taper part of the opening of the cylinder 1 0 1 shown in Fig. 2B ( The case of measuring the surface roughness / contour shape of 1 0 2, 10 3) will be described with reference to FIGS. 8A and 8B.
テーパー部分 ( 1 0 2、 1 0 3 ) のうち、 表面が上方 ( Z軸正方 向) を向いている 1 0 2部分の表面粗さ/輪郭形状を計測するため には、 例えば従来の図 3 Aと同様に、 図の Y軸を回転軸としてテー パ一角 0分だけワーク 1 0 0全体を傾けてテーパー部分 1 0 2 を水 平にして、 触針 1 1 を表面に接触させる (図 8 A ) 。  In order to measure the surface roughness / contour shape of the taper portion (1 0 2, 1 0 3) whose surface is facing upward (Z-axis positive direction), for example, the conventional Fig. 3 Like A, the Y axis in the figure is the axis of rotation, and the taper 1 0 2 is inclined by tilting the entire tape 1 0 0 to make the taper part 1 0 2 horizontal, and the stylus 1 1 is in contact with the surface (Fig. 8 A).
一方で、 表面が下方 ( Z軸負方向) を向いているテーパー部分 1 0 3部分の表面粗さ Z輪郭形状を計測するためには、 図 8 Bに示す ように、 図の Y軸を回転軸としてテーパー角 (一 Θ ) 分だけヮ一ク 1 0 0全体を傾けてテーパー部分 1 0 3 を水平にするとともに、 力 ンチレバ一 7 を 1 8 0度回転させて触針 1 1 の向きを Z軸正方向に 向けることによって、 触針先端がテーパー部分 1 0 3 に接触するこ とを可能とする。  On the other hand, in order to measure the surface roughness Z contour shape of the taper part 10 3 part where the surface is facing downward (Z axis negative direction), rotate the Y axis in the figure as shown in Fig. 8B. Tilt the entire taper angle by one taper angle (one Θ) as an axis to level the taper part 1 0 3 and rotate the force lever 7 1 180 degrees to change the orientation of the stylus 1 1 By directing in the positive direction of the Z-axis, the tip of the stylus can contact the tapered portion 10 3.
このように、 従来複数方向を回転軸としてワーク 1 0 0 を回転さ せつつ測定を行う必要があったワーク 1 0 0の表面粗さ/輪郭形状 において、 触針 1 1側の向きを変えることにより (回転させること により) 、 ワーク 1 0 0の回転軸の方向を 1次元減らすことが可能 となる。  In this way, in the surface roughness / contour shape of the workpiece 100, which has conventionally been required to measure the workpiece 100 while rotating the plurality of directions about the rotation axis, the direction of the stylus 11 side is changed. By (by rotating), it becomes possible to reduce the direction of the rotation axis of the work 100 by one dimension.
このように本発明によれば、 カンチレバーの重量バランスをとる バランス部材を設けることにより、 カンチレバーを回転させて触針 の方向を変えてもカンチレバーに作用する重力の影響を除去するこ とが可能となる。 これにより触針の方向を様々な測定面の方向に合 わせて変えることが可能となり、 ワークの載置方向を変えることな く様々な方向の測定面を測定することが可能となる。  As described above, according to the present invention, by providing a balance member that balances the weight of the cantilever, it is possible to remove the influence of gravity acting on the cantilever even if the direction of the stylus is changed by rotating the cantilever. Become. As a result, the direction of the stylus can be changed in accordance with the direction of various measurement surfaces, and measurement surfaces in various directions can be measured without changing the workpiece placement direction.
本発明は、 表面粗さ 輪郭形状測定装置に利用可能であり、 特に 触針を被測定物 (ワーク) の表面に沿って移動させ触針の変位量を 検出することにより、 被測定物表面の粗さ又は輪郭形状を測定する 表面粗さ/輪郭形状測定装置に利用可能である。 INDUSTRIAL APPLICABILITY The present invention can be used for a surface roughness / contour shape measuring apparatus, and in particular, by moving the stylus along the surface of the object to be measured (workpiece), the displacement of the stylus By detecting, it can be used in a surface roughness / contour shape measuring device that measures the roughness or contour shape of the surface of the object to be measured.
以上、 本発明の好適な実施態様について詳述したが、 当業者が種 々の修正及び変更をなし得ること、 並びに、 特許請求の範囲は本発 明の真の精神および趣旨の範囲内にあるこの様な全ての修正及び変 更を包含することは、 本発明の範囲に含まれることは当業者に理解 されるべきものである。  The preferred embodiments of the present invention have been described in detail above, but it will be understood by those skilled in the art that various modifications and changes can be made, and the scope of the claims is within the true spirit and scope of the present invention. It is to be understood by those skilled in the art that all such modifications and changes are included in the scope of the present invention.

Claims

請 求 の 範 囲 The scope of the claims
1 . カンチレバーと、 該カンチレバーの一端に設けられる触針と 、 該カンチレバーの長手方向に直交する方向を回動軸として該カン チレバーを回動可能に支持する回動支持部と、 該カンチレバーを前 記触針の向きに回動させる方向に付勢する付勢部材と、 前記触針を ワークの測定面に接触させたまま移動させたときに前記カンチレバ 一に生じる回転変位を検出する検出器と、 を備える表面粗さ 輪郭 形状測定装置であって、 1. a cantilever, a stylus provided at one end of the cantilever, a rotation support portion that rotatably supports the cantilever with a direction orthogonal to the longitudinal direction of the cantilever as a rotation axis, and the cantilever in front An urging member that urges the stylus to rotate in the direction of the stylus; a detector that detects rotational displacement generated in the cantilever when the stylus is moved while being in contact with the measurement surface of the workpiece; A surface roughness contour shape measuring device comprising:
前記カンチレバーの長手方向を回転軸として前記回動支持部を回 転させることにより、 前記触針の方向を変更する触針方向変更部と 前記回動軸を支点とする前記カンチレバーの重量バランスをとる バランス部材と、  By rotating the rotation support portion with the longitudinal direction of the cantilever as the rotation axis, the stylus direction changing portion for changing the direction of the stylus and the weight balance of the cantilever with the rotation shaft as a fulcrum are obtained. A balance member;
を備えることを特徴とする表面粗さ/輪郭形状測定装置。  A surface roughness / contour shape measuring apparatus comprising:
2 . 前記触針方向変更部によって前記触針の先端が測定面に接触 する方向に該触針を方向づけて、 該測定面の表面形状を測定するこ とを特徴とする請求項 1 に記載の表面粗さ Z輪郭形状測定装置。  2. The surface shape of the measurement surface is measured by orienting the stylus in a direction in which the tip of the stylus contacts the measurement surface by the stylus direction changing unit. Surface roughness Z contour shape measuring device.
PCT/JP2006/311150 2005-08-23 2006-05-29 Surface roughness/outline shape measurement device WO2007023605A1 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2312260A1 (en) * 2009-10-13 2011-04-20 Mitutoyo Corporation Detector and measuring device
CN106568989A (en) * 2016-11-03 2017-04-19 北京航空航天大学 Horizontal-type probe device for deep-space environment atomic force microscope system based on quartz tuning fork probe
CN112033342A (en) * 2020-09-30 2020-12-04 吴祖伟 Detection equipment for detecting polishing flatness of optical lens

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11248404A (en) * 1998-03-02 1999-09-17 Mitsutoyo Corp Detector for surface property-measuring instrument
JP2001133248A (en) * 1999-11-01 2001-05-18 Mitsutoyo Corp Detector for surface property measuring instrument

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11248404A (en) * 1998-03-02 1999-09-17 Mitsutoyo Corp Detector for surface property-measuring instrument
JP2001133248A (en) * 1999-11-01 2001-05-18 Mitsutoyo Corp Detector for surface property measuring instrument

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2312260A1 (en) * 2009-10-13 2011-04-20 Mitutoyo Corporation Detector and measuring device
CN106568989A (en) * 2016-11-03 2017-04-19 北京航空航天大学 Horizontal-type probe device for deep-space environment atomic force microscope system based on quartz tuning fork probe
CN112033342A (en) * 2020-09-30 2020-12-04 吴祖伟 Detection equipment for detecting polishing flatness of optical lens

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