WO2006025018A2 - Device and method for comparing two supply voltages - Google Patents
Device and method for comparing two supply voltages Download PDFInfo
- Publication number
- WO2006025018A2 WO2006025018A2 PCT/IB2005/052831 IB2005052831W WO2006025018A2 WO 2006025018 A2 WO2006025018 A2 WO 2006025018A2 IB 2005052831 W IB2005052831 W IB 2005052831W WO 2006025018 A2 WO2006025018 A2 WO 2006025018A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- current
- supply voltages
- output
- currents
- reflected
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
Definitions
- the invention relates to a device for comparing two supply voltages, comprising two inputs for the supply voltages and one output for outputting a signal, and also relates to a corresponding method.
- Microelectronic components in the form of integrated circuits are used in a wide range of technical fields. For power supply purposes, one or more supply voltages are applied to these components. Suitable devices are used to select and check the correct supply voltage. Devices for comparing supply voltages of electrical equipment are known in which the magnitudes of the voltages are compared with one another by means of an operational amplifier. The disadvantage arises here that such operational amplifiers can only be used to ascertain whether a first supply voltage is greater than a second supply voltage. These devices do not give satisfactory results when it comes to comparing a second supply voltage with a first supply voltage.
- US 2003/0128054 Al discloses a device for comparing two electrical voltages in which the voltages are compared by means of a differential amplifier and a current mirror.
- the voltages applied to the device are in each case converted into currents by means of transistors and reflected at current mirrors in the form of diodes in order to compare the magnitudes of the currents with one another.
- the output signal used is either one of the currents flowing through the diodes or a voltage applied to the diodes or the difference between these.
- US 2004/0032243 Al describes a device for comparing two supply voltages which are each applied to an input of the device.
- PMOS and optionally NMOS transistors are used as current mirrors in the device, with one voltage being passed to each of the transistors. Depending on which of the two voltages is greater, the signal zero or one is output at a digital output of the device.
- This device is of relatively complex design and requires a large number of transistors and further components which have to be connected to one another. It is an object of the invention to provide a device for comparing two supply voltages, which device can be used to reliably ascertain which of the two voltages is greater, the device being of simple design. A corresponding method will furthermore be specified.
- the core concept of the invention consists in that the device essentially consists of three assemblies, namely two voltage/current converters which are tuned to one another, each having a downstream current mirror, a current comparator for the reflected currents and an inverter for generating two digital signals, which inverter is arranged downstream of the output.
- the two supply voltages are each converted into a current in the voltage/current converters in a manner known to the person skilled in the art, and these currents are then reflected via current mirrors which are also known to the person skilled in the art.
- the two converters are tuned to one another such that they generate a current in the same manner.
- the supply voltages are in this case converted synchronously into currents.
- These reflected currents are then passed to a current comparator which compares the current intensities in order to deduce therefrom the ratio of the magnitudes of the supply voltages.
- the current comparator may be designed in any manner known per se or preferably as described below.
- An output signal is present at the output of the current comparator, which output signal could already be used to deduce the ratio of the magnitudes of the currents or supply voltages. According to the invention, however, an inverter is connected downstream of this output since this output itself does not have a sufficient driver capability to be able to read signals.
- the inverter Depending on the potential at the node, the inverter generates in a manner known per se two digital output signals at two outputs, wherein when these two outputs are each occupied by zero or one the information is deduced as to which of the two supply voltages is greater.
- the advantage of the invention consists in that, given a suitable design of the transistors of which the voltage/current converters and the current mirrors and the current comparator essentially consist, very precise switching points can be set. This means that even slight differences in the supply voltages can be reliably ascertained. Moreover, the greater or smaller supply voltage can be fed to the device at either of the two inputs, and the method can be carried out regardless of which of the two supply voltages is greater.
- the current comparator comprises a PMOS transistor and an NMOS transistor.
- the current comparator comprises a PMOS transistor and an NMOS transistor.
- the inverter is connected downstream of this output.
- the currents generated in the voltage/current converters are in each case reflected via the current mirrors connected downstream of the converters in such a way that the current associated with the first supply voltage flows through the PMOS transistor and the current associated with the second supply voltage flows through the NMOS transistor, in order to obtain clear output signals.
- the mirror ratio of the transistors with which the currents generated in the voltage/current converter are reflected in each case, can be set.
- the mirror ratio of the transistors can be set from 1:1 to 1 :2. It can thus be ascertained from when for example a second variable supply voltage is greater than half the first supply voltage. It will be understood that in this case a voltage/current converter with a linear characteristic is used, which means that the current generated in the converter is proportional to the supply voltage.
- the device for comparing two supply voltages is preferably associated with an integrated circuit or even integrated in the latter, in order to compare the magnitudes of supply voltages which are fed into the integrated circuit from outside and to deliver corresponding output signals. It is thus possible to select the supply voltage which is suitable for a desired application, for example to supply power to an electronic component.
- the device and the method according to the invention may be used inter alia in the increasingly used smartcards which comprise an integrated circuit arranged on a chip, by means of which various functions can be carried out or controlled. For this purpose, these smartcards are inserted into readers and the chip is exposed to various supply voltages from the reader.
- Fig. 1 shows a schematic diagram of the device.
- the device 100 for comparing two supply voltages V 1 , V 2 which device is shown in Fig. 1, has two inputs 1, 2 to which the supply voltages V 1 , V 2 are respectively applied.
- two voltage/current converters 3, 4 which are tuned to one another, currents I 1 , 1 2 are respectively generated from the supply voltages V 1 , V 2 , wherein the converters 3, 4 are preferably linear in order to be able to directly deduce the supply voltages V], V 2 from the magnitude of the currents I 1 , 1 2 .
- a current mirror 5, 6 is in each case arranged downstream of the converters 3, 4, which current mirrors are formed by means of transistors in a manner known to the person skilled in the art.
- the reflected currents I 3 , 1 4 are compared with one another with regard to their magnitude in a current comparator 7 in a manner known per se, wherein the current comparator 7 preferably has a PMOS transistor for the first current I 3 or the first supply voltage Vi and an NMOS transistor for the second current I 4 or the second supply voltage V 2 , which are in each case passed through these transistors.
- the two transistors are connected to one another via a node. Accordingly, the potential of the supply voltage V 2 or ground is present at this node at the output 8 of the current comparator 7, depending on which of the two supply voltages V 1 , V 2 is greater.
- An inverter 9 is connected downstream of the output 8 or the node, which inverter in each case outputs the value zero or one via two digital outputs 10, 11 depending on the potential at the node.
- the ratio of the magnitudes of the supply voltages V 1 , V 2 can thus be deduced from the values at these outputs 10, 11.
- the mirror ratio of the transistors in the current mirrors 5, 6 is set to be variable, the relative ratio of the magnitudes of the supply voltages Vi, V 2 can also be deduced. If, for example, the mirror ratio of the transistor in the first current mirror 5 to the transistor in the second current mirror 6 is set from 1:1 to 1:2, by changing the digital output signals it can be ascertained when the supply voltage V 2 is greater than half the supply voltage Vi. LIST OF REFERENCES:
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Electronic Switches (AREA)
- Manipulation Of Pulses (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05781727A EP1790076A2 (en) | 2004-09-02 | 2005-08-30 | Device and method for comparing two supply voltages |
JP2007529117A JP2008512026A (en) | 2004-09-02 | 2005-08-30 | Device and method for comparing two supply voltages |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04104217 | 2004-09-02 | ||
EP04104217.7 | 2004-09-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006025018A2 true WO2006025018A2 (en) | 2006-03-09 |
WO2006025018A3 WO2006025018A3 (en) | 2006-07-13 |
Family
ID=36000425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2005/052831 WO2006025018A2 (en) | 2004-09-02 | 2005-08-30 | Device and method for comparing two supply voltages |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1790076A2 (en) |
JP (1) | JP2008512026A (en) |
CN (1) | CN101053155A (en) |
WO (1) | WO2006025018A2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009239471A (en) * | 2008-03-26 | 2009-10-15 | Panasonic Corp | Mos integrated circuit and electronic equipment including the same |
DE102017102499A1 (en) | 2017-02-08 | 2018-08-09 | Infineon Technologies Ag | Electrical components, integrated circuits and methods for monitoring voltages |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5839593B2 (en) * | 2012-12-05 | 2016-01-06 | 日本電信電話株式会社 | Peak hold circuit |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0174736A1 (en) * | 1984-08-10 | 1986-03-19 | Nec Corporation | Circuit for detecting level of input voltage |
EP0372647A2 (en) * | 1988-12-08 | 1990-06-13 | Philips Electronics Uk Limited | Processing sampled analogue electrical signals |
US5206552A (en) * | 1990-10-12 | 1993-04-27 | Nec Corporation | Sense amplifier for non-volatile semiconductor storage device |
US5568082A (en) * | 1994-02-21 | 1996-10-22 | Telefonaktiebolaget L M Ericsson | Signal-receiving and signal-processing unit |
US6008673A (en) * | 1997-09-30 | 1999-12-28 | Intel Corporation | High speed, low power, current mode comparator |
US6281716B1 (en) * | 1998-07-01 | 2001-08-28 | Mitsubishi Denki Kabushiki Kaisha | Potential detect circuit for detecting whether output potential of potential generation circuit has arrived at target potential or not |
-
2005
- 2005-08-30 CN CNA2005800374367A patent/CN101053155A/en active Pending
- 2005-08-30 WO PCT/IB2005/052831 patent/WO2006025018A2/en active Application Filing
- 2005-08-30 JP JP2007529117A patent/JP2008512026A/en not_active Withdrawn
- 2005-08-30 EP EP05781727A patent/EP1790076A2/en not_active Withdrawn
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0174736A1 (en) * | 1984-08-10 | 1986-03-19 | Nec Corporation | Circuit for detecting level of input voltage |
EP0372647A2 (en) * | 1988-12-08 | 1990-06-13 | Philips Electronics Uk Limited | Processing sampled analogue electrical signals |
US5206552A (en) * | 1990-10-12 | 1993-04-27 | Nec Corporation | Sense amplifier for non-volatile semiconductor storage device |
US5568082A (en) * | 1994-02-21 | 1996-10-22 | Telefonaktiebolaget L M Ericsson | Signal-receiving and signal-processing unit |
US6008673A (en) * | 1997-09-30 | 1999-12-28 | Intel Corporation | High speed, low power, current mode comparator |
US6281716B1 (en) * | 1998-07-01 | 2001-08-28 | Mitsubishi Denki Kabushiki Kaisha | Potential detect circuit for detecting whether output potential of potential generation circuit has arrived at target potential or not |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009239471A (en) * | 2008-03-26 | 2009-10-15 | Panasonic Corp | Mos integrated circuit and electronic equipment including the same |
DE102017102499A1 (en) | 2017-02-08 | 2018-08-09 | Infineon Technologies Ag | Electrical components, integrated circuits and methods for monitoring voltages |
DE102017102499B4 (en) * | 2017-02-08 | 2021-06-17 | Infineon Technologies Ag | Electrical components, integrated circuits and methods for monitoring voltages |
Also Published As
Publication number | Publication date |
---|---|
JP2008512026A (en) | 2008-04-17 |
WO2006025018A3 (en) | 2006-07-13 |
CN101053155A (en) | 2007-10-10 |
EP1790076A2 (en) | 2007-05-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3841428B2 (en) | Charge transfer device | |
US7236905B2 (en) | Test apparatus and power supply circuit | |
US4841175A (en) | ECL-compatible input/output circuits in CMOS technology | |
AU2002359642A1 (en) | Input buffer and method for voltage level detection | |
KR100806157B1 (en) | Power source control circuit, power supply device, and control method for the same | |
US7710089B2 (en) | Automatic configuration for linear mode of switching power supply | |
KR940012849A (en) | Stress Mode Circuits for Integrated Circuits with On-Chip Dropout Converters | |
CN103684295B (en) | The apparatus and method of wide common mode difference | |
US20020075035A1 (en) | Circuit for providing a logical output signal in accordance with crossing points of differential signals | |
US7005867B2 (en) | Power supply circuit and testing device | |
EP1790076A2 (en) | Device and method for comparing two supply voltages | |
US6462521B1 (en) | High-speed charge-mode controller for a multi-phase switched-mode power converter | |
US6236268B1 (en) | High-gain amplifier having a limited output dynamic range | |
US5914626A (en) | Voltage clamping circuit for semiconductor devices | |
US8085092B2 (en) | Amplifier arrangement and method for amplification | |
KR100526642B1 (en) | Electronic circuit for converting a differential signal into a single-ended signal with common mode voltage rejection by resistor network | |
US6100738A (en) | High-speed current switch with complementary stages | |
KR100272951B1 (en) | Circuit for voltage applying | |
KR20000075637A (en) | Current-limit circuit | |
US6198311B1 (en) | Expandable analog current sorter based on magnitude | |
US7236346B2 (en) | Semiconductor apparatus and method of charging desired number of capacitors | |
JP3297361B2 (en) | Semiconductor integrated circuit with hysteresis | |
KR100234873B1 (en) | Clock signal input buffer | |
US6236547B1 (en) | Zener zapping device and zener zapping method | |
US20230126379A1 (en) | Systems and methods for detecting currents of power management systems |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KM KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NG NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SM SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU LV MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 2005781727 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2007529117 Country of ref document: JP |
|
NENP | Non-entry into the national phase in: |
Ref country code: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 200580037436.7 Country of ref document: CN |
|
WWP | Wipo information: published in national office |
Ref document number: 2005781727 Country of ref document: EP |