WO2004088287A3 - Method of automatic correction for an optoelectronic measuring device - Google Patents

Method of automatic correction for an optoelectronic measuring device Download PDF

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Publication number
WO2004088287A3
WO2004088287A3 PCT/FR2004/000717 FR2004000717W WO2004088287A3 WO 2004088287 A3 WO2004088287 A3 WO 2004088287A3 FR 2004000717 W FR2004000717 W FR 2004000717W WO 2004088287 A3 WO2004088287 A3 WO 2004088287A3
Authority
WO
WIPO (PCT)
Prior art keywords
devices
measuring device
automatic correction
optoelectronic measuring
green
Prior art date
Application number
PCT/FR2004/000717
Other languages
French (fr)
Other versions
WO2004088287A2 (en
Inventor
Bernard Genot
Original Assignee
Bernard Genot
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bernard Genot filed Critical Bernard Genot
Publication of WO2004088287A2 publication Critical patent/WO2004088287A2/en
Publication of WO2004088287A3 publication Critical patent/WO2004088287A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Color Television Image Signal Generators (AREA)

Abstract

The invention relates to measuring devices using optoelectronic detector devices (4) of the CCD or CMS-imager types. According to the invention, the precision of said devices can be improved by using colour CCD or CMOS devices, measuring the relative sensitivities of the red pixels to the green and the blue to the green and to weight the measures using the above data to establish a precise value for the wavelength of an incident beam on a pixel.
PCT/FR2004/000717 2003-03-26 2004-03-24 Method of automatic correction for an optoelectronic measuring device WO2004088287A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR03/03730 2003-03-26
FR0303730A FR2853068B1 (en) 2003-03-26 2003-03-26 AUTOMATIC CORRECTION PROCEDURE FOR OPTOELECTRONIC MEASURING APPARATUS AND RELATED MEANS

Publications (2)

Publication Number Publication Date
WO2004088287A2 WO2004088287A2 (en) 2004-10-14
WO2004088287A3 true WO2004088287A3 (en) 2004-11-18

Family

ID=32947190

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2004/000717 WO2004088287A2 (en) 2003-03-26 2004-03-24 Method of automatic correction for an optoelectronic measuring device

Country Status (2)

Country Link
FR (1) FR2853068B1 (en)
WO (1) WO2004088287A2 (en)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0646784A1 (en) * 1993-09-07 1995-04-05 Bayer Corporation Video test strip reader and method for evaluating test strips
WO2001015597A1 (en) * 1999-08-31 2001-03-08 Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno Imaging apparatus for displaying concentration ratios
WO2002001209A1 (en) * 2000-06-23 2002-01-03 Teradyne, Inc. Compensation system and related techniques for use in a printed circuit board inspection system
WO2002039094A1 (en) * 2000-11-10 2002-05-16 Arkray, Inc. Measuring method and instrument comprising image sensor
US6400468B1 (en) * 1998-03-31 2002-06-04 International Business Machines Corporation Smoothing calibration files to improve reproduction of digitized images
US20020071041A1 (en) * 2000-12-07 2002-06-13 Pine Joshua I. Enhanced resolution mode using color image capture device
US20020122192A1 (en) * 2000-12-08 2002-09-05 Gretag-Macbeth Ag Device for the pixel-by-pixel photoelectric measurement of a planar measured object
US20020122123A1 (en) * 2001-03-01 2002-09-05 Semiconductor Energy Laboratory Co., Ltd. Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system
US6452179B1 (en) * 1998-08-14 2002-09-17 Global Technovations, Inc. On-site analyzer

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0646784A1 (en) * 1993-09-07 1995-04-05 Bayer Corporation Video test strip reader and method for evaluating test strips
US6400468B1 (en) * 1998-03-31 2002-06-04 International Business Machines Corporation Smoothing calibration files to improve reproduction of digitized images
US6452179B1 (en) * 1998-08-14 2002-09-17 Global Technovations, Inc. On-site analyzer
WO2001015597A1 (en) * 1999-08-31 2001-03-08 Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno Imaging apparatus for displaying concentration ratios
WO2002001209A1 (en) * 2000-06-23 2002-01-03 Teradyne, Inc. Compensation system and related techniques for use in a printed circuit board inspection system
WO2002039094A1 (en) * 2000-11-10 2002-05-16 Arkray, Inc. Measuring method and instrument comprising image sensor
US20020071041A1 (en) * 2000-12-07 2002-06-13 Pine Joshua I. Enhanced resolution mode using color image capture device
US20020122192A1 (en) * 2000-12-08 2002-09-05 Gretag-Macbeth Ag Device for the pixel-by-pixel photoelectric measurement of a planar measured object
US20020122123A1 (en) * 2001-03-01 2002-09-05 Semiconductor Energy Laboratory Co., Ltd. Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system

Also Published As

Publication number Publication date
WO2004088287A2 (en) 2004-10-14
FR2853068B1 (en) 2006-06-16
FR2853068A1 (en) 2004-10-01

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