WO2004059334A1 - Programmable logic analyzer data analyzing method - Google Patents

Programmable logic analyzer data analyzing method Download PDF

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Publication number
WO2004059334A1
WO2004059334A1 PCT/US2002/038991 US0238991W WO2004059334A1 WO 2004059334 A1 WO2004059334 A1 WO 2004059334A1 US 0238991 W US0238991 W US 0238991W WO 2004059334 A1 WO2004059334 A1 WO 2004059334A1
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WO
WIPO (PCT)
Prior art keywords
data
test sample
programmable logic
logic analyzer
memory
Prior art date
Application number
PCT/US2002/038991
Other languages
French (fr)
Other versions
WO2004059334A8 (en
Inventor
Chiu-Hao Cheng
Ming-Gwo Cheng
Chun-Feng Tzu
Original Assignee
Zeroplus Technology Co., Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeroplus Technology Co., Ltd filed Critical Zeroplus Technology Co., Ltd
Priority to CA002511394A priority Critical patent/CA2511394A1/en
Priority to CN02830120.XA priority patent/CN1788207A/en
Priority to AU2002364532A priority patent/AU2002364532A1/en
Priority to DE10297849T priority patent/DE10297849T5/en
Priority to JP2004563127A priority patent/JP2006515671A/en
Priority to US10/541,190 priority patent/US20060075212A1/en
Priority to PCT/US2002/038991 priority patent/WO2004059334A1/en
Publication of WO2004059334A1 publication Critical patent/WO2004059334A1/en
Publication of WO2004059334A8 publication Critical patent/WO2004059334A8/en
Priority to GB0512636A priority patent/GB2411965A/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3177Testing of logic operation, e.g. by logic analysers
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25Testing of logic operation, e.g. by logic analysers

Definitions

  • the present invention relates to logic analyzers and, more
  • a regular logic analyzer can simply fetch data from the test
  • digital circuit for example, an integrated circuit
  • the present invention has been accomplished under the
  • programmable logic analyzer data analyzing method comprises the
  • test sample and to store fetched waveform data in a memory
  • control circuit to transmit the waveform data from the buffer to
  • FIG. 1A is a circuit block diagram of a logic analyzer
  • FIG. IB is a circuit block diagram of an alternate form of
  • FIG. 2 is a flow chart of the present invention.
  • FIG. 3 is a flow chart of the test sample waveform quality
  • FIG. 3A is a flow chart of the output logic analysis of the waveform quality analysis according to the present invention.
  • FIG. 3B is a flow chart of the waveform bandwidth analysis
  • FIG. 3C is a flow chart of the comparison data analysis of
  • FIG. 3D is a flow chart of the input forbidding analysis of
  • FIG. 3E is a flow chart of the search data analysis of the
  • FIG. 4 is a flow chart of the communication protocol
  • FIG. 4A is a flow chart of the debugging data analysis of
  • FIG. 4B is a flow chart of the search data analysis of the
  • FIG. 5 is a flow chart of the memory data analysis
  • FIG. 5A is a flow chart of the read write data analysis of
  • FIG. 5B is a flow chart of the comparison data analysis of the memory data analysis according to the present invention.
  • FIG. 5C is a flow chart of the search data analysis of the
  • FIG. 6A is a circuit block diagram of another alternate form
  • FIG. 6B is a circuit block diagram of still another alternate
  • FIG. 7 is a schematic drawing showing the display of the
  • FIG. 8 is a schematic drawing showing the display of the
  • FIG. 9 is a schematic drawing showing the display of the
  • a logic analyzer 10 in accordance with the present disclosure
  • control circuit 11 a control circuit 11 a control circuit 11 a control circuit 11 a control circuit 11 a control circuit 11 a control circuit 11 a
  • control circuit 11 is connected to the test sample 14 through an
  • the transmission interface 12 is connected
  • the control circuit 11 reads in test data from
  • test sample 14 the test sample 14 and then sends obtained test data to the compressor 16 for compression, for enabling compressed data to be
  • circuit 11 transmits compressed storage data from the memory 13 to
  • FIG. IB shows an alternate form of the logic analyzer 10.
  • control circuit 11 obtains test
  • analyzer 10 received a test sample data sheet inputted by the user
  • control circuit 11 of the logic analyzer 10 fetches
  • the computer 15 fills the data in a buffer
  • test sample digital circuit
  • test signal auxiliary analyzing procedure 100 includes waveform
  • FIG. 3A or proceed to step (202B) to mark the waveform
  • step (205B) to mark the waveform display zone
  • the communication protocol display where the user selects a waveform from the waveform display zone (see FIG. 9), the communication protocol display
  • step (302B) proceed to step (302B) if positive, or to step
  • step (302D) if negative; when entered step (302B), it converts the data into communication protocol content, and then proceeds
  • step (302C) to terminate of the communication protocol
  • step (303A) where the user selects a communication
  • step (306) if positive, or
  • step (402A) to determine if same address read data
  • FIG. 8 terminate the analysis action
  • step (404A) where the user selects a data, an address and a
  • FIG. 6A shows another alternate form of the logic analyzer
  • the logic analyzer 10 is comprised of
  • control circuit 11 a control circuit 11
  • memory 13 a display 17, and a buffer 18.
  • the control circuit 11 is connected to the test sample 14 through an
  • control circuit 11 reads in test
  • control circuit 11 transmits
  • circuit 11 fetches the waveform data from the test sample 14, and
  • FIG. 6B shows still another alternate form of the logic
  • control circuit 11 the control circuit 11
  • decompression device 19 to decompress the compressed data
  • the buffer 18 of the logic analyzer 10 varies with the amount of the
  • FIGS.1 ⁇ 9. The programmable logic analyzer data

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A programmable logic analyzer data analyzing method includes the step of controlling a control circuit (11) to fetch waveform data from the test sample (14) and to store fetched waveform data in a memory (13), the step of controlling the control circuit (11) to transmit the waveform data from the memory (13) to a computer through a transmission interface (19) when the memory space of the memory (13) is used up (fully occupied), the step of driving the computer to write the received waveform data in a buffer (18) thereof, and the step of running a test sample test signal auxiliary analyzing procedure for enabling the user to use the display screen (17) of the computer for making debugging data analysis, comparison data analysis and search data analysis, to store the analyzed data in the form of a file, or to print out the analyzed data through a printer.

Description

PROGRAMMABLE LOGIC ANALYZER DATA ANALYZING
METHOD
BACKGROUND OF THE INVENTION
1. Field of the Invention:
The present invention relates to logic analyzers and, more
specifically, to a programmable logic analyzer data analyzing
method, which enables the waveform data of the test sample to be
fetched by a logic analyzer and then transmitted to the display
screen of a computer for display, so that the user can use the
displayed data to make debugging data analysis, comparison data
analysis and search data analysis, to store the analyzed data in the
form of a file, or to print out the analyzed data through a printer.
2. Description of the Related Art:
A regular logic analyzer can simply fetch data from the test
digital circuit (for example, an integrated circuit) for display on a
display screen, and for further visual analysis by a man. When
designing a logic analyzer, the designer may consider the factors of
(1 ) depth of memory, (2) speed of data fetching, (3) capability of
triggering, and (4) stability (anti-noise capability). According to
conventional techniques, it is difficult to achieve a breakthrough.
Following fast development of high technology, the limited
functions of conventional logic analyzers cannot meet the
requirements of programming engineers. Programming engineers require high performance analyzer to help developing advanced
products. Current logic analyzer can simply test specific items but
not all products of same category. For example, a logic analyzer for
testing a USB communication interface cannot be used to test other
communication interface such as RS0232. Due to this drawback, a
programming engineer may have to prepare various logic analyzers
for different test purposes.
Therefore, it is desirable to provide a programmable logic
analyzer data analyzing method that provides a complete series of
functions including testing, debugging, and analyzing functions .
SUMMARY OF THE INVENTION
The present invention has been accomplished under the
circumstances in view. According to one embodiment of the present
invention, the programmable logic analyzer data analyzing method
comprises the step of controlling a control circuit to fetch
waveform data from the test sample and to store fetched waveform
data in a memory, the step of controlling the control circuit to
transmit the waveform data from the memory to a computer through
a transmission interface when the memory space of the memory
used up (fully occupied), the step of driving the computer to write
the received waveform data in a buffer thereof, and the step of
running a test sample test signal auxiliary analyzing procedure for
enabling the user to use the displayed on the display screen of the computer for making debugging data analysis, comparison data
analysis and search data analysis, to store the analyzed data in the
form of a file, or to print out the analyzed data through a printer.
According to another embodiment of the present invention, the
programmable logic analyzer data analyzing method comprises the
step of controlling a control circuit to fetch waveform data from the
test sample and to store fetched waveform data in a memory, the
step of writing the waveform data in a buffer when the memory
space of the memory used up (fully occupied), the step of driving
the control circuit to transmit the waveform data from the buffer to
a display, and the step of running a test sample test signal auxiliary
analyzing procedure for enabling the user to make data analyses
based on the data received from the memory by the computer and
displayed on a display screen of the computer.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1A is a circuit block diagram of a logic analyzer
according to the present invention.
FIG. IB is a circuit block diagram of an alternate form of
the logic analyzer according to the present invention.
FIG. 2 is a flow chart of the present invention.
FIG. 3 is a flow chart of the test sample waveform quality
analysis according to the present invention.
FIG. 3A is a flow chart of the output logic analysis of the waveform quality analysis according to the present invention.
FIG. 3B is a flow chart of the waveform bandwidth analysis
of the waveform quality analysis according to the present
invention.
FIG. 3C is a flow chart of the comparison data analysis of
the waveform quality analysis according to the present invention.
FIG. 3D is a flow chart of the input forbidding analysis of
the waveform quality analysis according to the present invention.
FIG. 3E is a flow chart of the search data analysis of the
waveform quality analysis according to the present invention.
FIG. 4 is a flow chart of the communication protocol
analysis according to the present invention.
FIG. 4A is a flow chart of the debugging data analysis of
the communication protocol analysis according to the present
invention.
FIG. 4B is a flow chart of the search data analysis of the
communication protocol analysis according to the present
invention.
FIG. 5 is a flow chart of the memory data analysis
according to the present invention.
FIG. 5A is a flow chart of the read write data analysis of
the memory data analysis according to the present invention.
FIG. 5B is a flow chart of the comparison data analysis of the memory data analysis according to the present invention.
FIG. 5C is a flow chart of the search data analysis of the
memory data analysis according to the present invention.
FIG. 6A is a circuit block diagram of another alternate form
of the logic analyzer according to the present invention.
FIG. 6B is a circuit block diagram of still another alternate
form of the present invention.
FIG. 7 is a schematic drawing showing the display of the
communication protocol display window according to the present
invention.
FIG. 8 is a schematic drawing showing the display of the
memory data display window according to the present invention.
FIG. 9 is a schematic drawing showing the display of the
logic analyzer control display window according to the present
invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
Referring to FIG. 1A, a logic analyzer 10 in accordance
with the present invention comprises a control circuit 11, a
transmission interface 12, a memory 13, and a compressor 16. The
control circuit 11 is connected to the test sample 14 through an
implement (not shown). The transmission interface 12 is connected
to a host computer 15. The control circuit 11 reads in test data from
the test sample 14, and then sends obtained test data to the compressor 16 for compression, for enabling compressed data to be
further stored in the memory 13. When the memory space of the
memory 13 used up (fully occupied by storage data), the control
circuit 11 transmits compressed storage data from the memory 13 to
the computer 15 through the transmission interface 12 for
decompression by the computer 15 and for display on the display
screen of the computer 15 after decompression.
FIG. IB shows an alternate form of the logic analyzer 10.
According to this alternate form, the control circuit 11 obtains test
data from the test sample 14, and then directly stores obtained test
data in the memory 13. When the memory space of the memory 13
used up (fully occupied by storage data), the control circuit 11
retrieves storage test data from the memory 13 and sends retrieved
storage test data to the compressor 16 for compression, and then
drives the transmission interface 12 to transmit compressed test
data from the compressor 16 to the computer 15 for decompression
by the computer 15 and for display on the display screen of the
computer 15 after decompression.
With reference to FIGS . 1A and I B again, when the logic
analyzer 10 received a test sample data sheet inputted by the user
or when the user selected the code number of the test sample from
the database, the control circuit 11 of the logic analyzer 10 fetches
waveform data from the test sample 14, and then stores fetched waveform data in the memory 13, and then drives the transmission
interface 12 to transmit storage waveform data from the memory 13
to the computer 15 when the memory space of the memory 13 used
up (fully occupied by storage data). Upon receipt of waveform data
from the data analyzer 10, the computer 15 fills the data in a buffer,
and then transmits the data from the buffer to the display screen for
display. Thereafter, a test sample (digital circuit) test signal
auxiliary analyzing procedure 100 is performed. This test sample
test signal auxiliary analyzing procedure 100 includes waveform
quality analysis 20, communication protocol analysis 30, and
memory data analysis 40. Thus, the user can use the data displayed
on the display screen of the computer 15 to run debugging data
analysis, comparison data analysis and search data analysis, or
store analyzed data in the form of a file or print out analyzed data
through a printer.
Referring to FIG. 3 and FIG. 2 again, the waveform quality
analysis 20 of the test sample test signal auxiliary analyzing
procedure 100 works subject to the steps bellows:
(200) Input test signal;
(201) Make a logic comparison with the data base to see if the
inputted test signal meets feature specification;
(202) Output logic analysis; at this time, proceed to step (202A) to
determine if output waveform logic fits the specification or not? And then terminate the analysis action if positive (see
FIG. 3A), or proceed to step (202B) to mark the waveform
display zone with another color and then terminate the
analysis action if negative (see FIG. 3A and also FIG. 9);
(203) Waveform bandwidth analysis; at this time, proceed to step
(203A) to determine if the waveform bandwidth fits the
specification or not? And then terminate the analysis action if
positive (see FIG. 3B), or proceed to step (203B) to mark the
waveform display zone with another color and then terminate
the analysis action if negative (see FIG. 3B and also FIG. 9);
(204) Comparison data analysis; at this time, proceed to step (204A)
to input test signal again, and then to step (204B) to let the
user select the data for comparison, and then to step (204C)
to mark the currently analyzed waveform data in the
waveform display zone with another color, and then terminate
the analysis action (see FIG. 3 C and FIG. 9);
(205) Input forbidding analysis; at this time, proceed to step (205A)
to determine if input waveform logic fits the specification or
not? And then terminate the analysis action if positive, or
proceed to step (205B) to mark the waveform display zone
with another color if negative (see FIG. 3D and also FIG. 9);
(206) Search data analysis; at this time, proceed to step (206A)
where the user selects a waveform from the waveform display zone (see FIG. 9), the communication protocol display
window (see FIG. 7) skips to the communication protocol
content corresponding to the selected waveform, and the
analysis action is terminated after the marking of another
color (see FIG. 3E);
(207) Display analyzed waveform data on the waveform display
zone (see FIG. 9);
(208) Store the waveform data in the form of a file or not? And then
proceed to step (209) if positive, or terminate the analysis
action if negative;
(209) Store the waveform data in the form of a file, and then
terminate the analysis action.
With reference to FIGS. 2 and 4, the communication
protocol analysis 30 of the test sample test signal auxiliary
analyzing procedure 100 works subject to the steps bellows:
(300) Convert waveform analysis data into letters, numerals, or
signs to show the communication protocol content;
(301) Make a logic comparison with the database to see if it fits the
specification or not;
(302) Debugging data analysis; at this time, proceed to step (302A)
to determine if the waveform bandwidth fits the specification
or not? And then proceed to step (302B) if positive, or to step
(302D) if negative; when entered step (302B), it converts the data into communication protocol content, and then proceeds
to step (302C) to terminate of the communication protocol
contents fits the specification or not? And then terminate the
analysis action if positive, or proceed to step (302D) to
convert the data into error message and then terminate the
analysis action if negative (see FIG. 4A);
(303) Search data analysis; at this time (see also FIG. 4B), proceed
to step (303A) where the user selects a communication
protocol content from the communication protocol display
zone (See FIG. 7), the waveform display zone (See FIG. 9)
and the memory data display window (see FIG. 8) skip to the
waveform and the memory content corresponding to the
selected communication protocol content, and the analysis
action is terminated after the marking of another color;
(304) Display analyzed communication protocol content on the
display zone of the communication protocol display window
(See FIG. 7), and then proceed to step (305);
(305) Store the displayed communication protocol content in the
form of a file or not? Proceed to step (306) if positive, or
terminate the analysis action if negative;
(306) Store the communication protocol content in the form of a
file, and terminate the analysis action.
With reference to FIGS . 2 and 5, the memory data analysis 40 of the test sample test signal auxiliary analyzing procedure 100
works subject to the steps bellows:
(400) Use the data of the communication protocol content to
duplicate one copy of memory content same as the test
sample;
(401 ) Make a logical comparison with the database to see if it fits
the specification or not;
(402) Read write data analysis; at this time (see FIG. 5A), proceed
to step (402A) to determine if same address read data and
write data are identical or not? And then terminate the
analysis action if positive, or proceed to step (402B) to
mark the memory data display window with another color
and then to terminate the analysis action if negative;
(403) Comparison data analysis; at this time (See FIG. 5B),
proceed to step (403A) to input the communication protocol
content again, and then proceed to step (403B) to let the
user select which data to be compared, and then proceed to
step (403 C) to mark the currently analyzed memory content
on the memory data display window with another color (see
FIG. 8), and then terminate the analysis action;
(404) Search data analysis; at this time (see FIG. 5C), proceed to
step (404A) where the user selects a data, an address and a
data, or an address from the memory data display window (See FIG. 8), the communication protocol display window
(see FIG. 7) skips to the communication protocol content
corresponding to the selected data, selected address and
data, or selected address, and the analysis action is
terminated after the marking of another color;
(405) Display the analyzed memory data on the memory data
display window (see FIG. 8);
(406) Store the analyzed memory data in the form of a file? And
then proceed to step (407) when positive, or terminate the
analysis action when negative;
(407) Store the analyzed memory data in the form of a file, and
then terminate the analysis action.
FIG. 6A shows another alternate form of the logic analyzer
10. According to this design, the logic analyzer 10 is comprised of
a control circuit 11, a memory 13, a display 17, and a buffer 18.
The control circuit 11 is connected to the test sample 14 through an
implement. During operation, the control circuit 11 reads in test
data from the test sample 14, and then stores obtained test data in
the memory 13. When the memory space of the memory 13 used up
(fully occupied by storage data), the control circuit 11 transmits
storage data from the memory 13 to the buffer 18, and then
transmits the data from the buffer 18 to the display 17 for display.
Further, when the logic analyzer 10 received a test sample data sheet inputted by the user or a test sample code number selected
from the database of the logic analyzer 10 by the user, the control
circuit 11 fetches the waveform data from the test sample 14, and
then stores the fetched data in the memory 13, and then transmits
the data from the memory 13 to the buffer 18 when the memory
space of the memory used up (fully occupied), and then transmits
the data from the buffer 18 to the display 17 for display, and then
runs the waveform quality analysis 20, communication protocol
analysis 30 and memory data analysis 40 of the test sample test
signal auxiliary analyzing procedure 100 (see FIG. 2). Thus, the
user can use the data displayed on the display 17 for making
debugging data analysis, comparison data analysis, search data
analysis, etc., store the analyzed data in the form of a file, or print
out the analyzed data through a printer. This logic analyzer 10
further comprises a compression decompression device 19, which
compresses data obtained by the control circuit 11 from the test
sample 14 before storing in the memory 13, and decompresses the
storage data for display on the display 17 when the memory space
of the memory 13 used up (fully occupied).
FIG. 6B shows still another alternate form of the logic
analyzer 10. According to this design, the control circuit 11
directly stores the fetched test data from the test sample 14 in the
memory 13, and then drives the compression decompression device 19 to compress the storage data when the memory space of the
memory 13 used up (fully occupied), and then stores the
compressed data in the buffer 18, and then drives the compression
decompression device 19 to decompress the compressed data, and
then transmits the decompressed data to the display 17 for display.
According to the embodiments shown in FIGS. 6A and 6B,
the capacity of the buffer 18 of the computer 15 or the capacity of
the buffer 18 of the logic analyzer 10 varies with the amount of the
internal data of the test sample 14.
A prototype of programmable logic analyzer data analyzing
method has been constructed with the features of the annexed
drawings of FIGS.1~9. The programmable logic analyzer data
analyzing method functions smoothly to provide all of the features
discussed earlier.
Although particular embodiments of the invention have
been described in detail for purposes of illustration, various
modifications and enhancements may be made without departing
from the spirit and scope of the invention. Accordingly, the
invention is not to be limited except as by the appended claims.

Claims

What the invention claimed is:
1. A programmable logic analyzer data analyzing method
comprising the step of controlling a control circuit to fetch
waveform data from the test sample and to store fetched waveform
data in a memory, the step of controlling said control circuit to
transmit the waveform data from said memory to a computer
through a transmission interface when the memory space of said
memory used up (fully occupied), the step of driving said computer
to write the received waveform data in a buffer thereof, and the
step of running a test sample test signal auxiliary analyzing
procedure for enabling the user to make data analyses based on the
data received from said memory by said computer and displayed on
a display screen of said computer.
2. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein said test sample test signal
auxiliary analyzing procedure includes a waveform quality analysis
function.
3. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein said test sample test signal
auxiliary analyzing procedure includes a communication protocol
analysis function.
4. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein said test sample test signal auxiliary analyzing procedure includes a memory data analysis
function.
5. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein when said control circuit
fetched said waveform data from said test sample, a test sample
data sheet inputted by the user is used for making the related
analysis. .
6. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein when said control circuit
fetched said waveform data from said test sample, the code number
of the test sample selected from a database by the user is used for
making the related analysis.
7. The programmable logic analyzer data analyzing
method as claimed in claim 1 further comprising the step of storing
analyzed data in the form of a file.
8. The programmable logic analyzer data analyzing
method as claimed in claim 1 further comprising the step of
printing out analyzed data through a printer.
9. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein the capacity of the buffer of
said computer varies with the amount of the internal data of said
test sample. .
10. The programmable logic analyzer data analyzing method as claimed in claim 1 wherein said test sample test signal
auxiliary analyzing procedure makes a debugging data analysis on
the data fetched from said test sample.
1 1. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein said test sample test signal
auxiliary analyzing procedure makes a comparison data analysis on
the data fetched from said test sample.
12. The programmable logic analyzer data analyzing
method as claimed in claim 1 wherein said test sample test signal
auxiliary analyzing procedure makes a search data analysis on the
data fetched from said test sample.
13. The programmable logic analyzer data analyzing
method as claimed in claim 1 further comprising the sub-step of
using a compressor to compress the waveform data fetched by said
control circuit from said test sample before driving said control
circuit to store the fetched waveform data in said memory.
14. The programmable logic analyzer data analyzing
method as claimed in claim 1 further comprising the sub-step of
using a compressor to compress the storage waveform data for
enabling compressed waveform data to be transmitted to said
computer during the step of controlling said control circuit to
transmit the waveform data from said memory to a computer
through a transmission interface when the memory space of said memory used up (fully occupied).
15. A programmable logic analyzer data analyzing method
comprising the step of controlling a control circuit to fetch
waveform data from the test sample and to store fetched waveform
data in a memory, the step of writing the waveform data in a buffer
when the memory space of said memory used up (fully occupied),
the step of driving said control circuit to transmit the waveform
data from said buffer to a display, and the step of running a test
sample test signal auxiliary analyzing procedure for enabling the
user to make data analyses based on the data received from said
memory by said computer and displayed on a display screen of said
computer.
16. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein said test sample test signal
auxiliary analyzing procedure includes a waveform quality analysis
function.
17. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein said test sample test signal
auxiliary analyzing procedure includes a communication protocol
analysis function.
18. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein said test sample test signal
auxiliary analyzing procedure includes a memory data analysis function.
19. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein when said control circuit
fetched said waveform data from said test sample, a test sample
data sheet inputted by the user is used for making the related
analysis. .
20. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein when said control circuit
fetched said waveform data from said test sample, the code number
of the test sample selected from a database by the user is used for
making the related analysis.
21. The programmable logic analyzer data analyzing
method as claimed in claim 15 further comprising the step of
storing analyzed data in the form of a file.
22. The programmable logic analyzer data analyzing
method as claimed in claim 15 further comprising the step of
printing out analyzed data through a printer.
23. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein the capacity of said buffer
varies with the amount of the internal data of said test sample.
24. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein said test sample test signal
auxiliary analyzing procedure makes a debugging data analysis on the data fetched from said test sample.
25. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein said test sample test signal
auxiliary analyzing procedure makes a comparison data analysis on
the data fetched from said test sample.
26. The programmable logic analyzer data analyzing
method as claimed in claim 15 wherein said test sample test signal
auxiliary analyzing procedure makes a search data analysis on the
data fetched from said test sample.
27. The programmable logic analyzer data analyzing
method as claimed in claim 15 further comprising the sub-step of
using a compression decompression device to compress said
waveform data fetched from said test sample before storing in said
memory and to decompress compressed storage waveform data
before writing in said buffer after the memory capacity of said
memory used up (fully occupied).
28. The programmable logic analyzer data analyzing
method as claimed in claim 15 further comprising the sub-step of
using a compression decompression device to compress said
waveform data stored in said memory before writing in said buffer
and to decompress the compressed waveform data before
transmitting from said buffer to said display for display.
PCT/US2002/038991 2002-12-31 2002-12-31 Programmable logic analyzer data analyzing method WO2004059334A1 (en)

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CA002511394A CA2511394A1 (en) 2002-12-31 2002-12-31 Programmable logic analyzer data analyzing method
CN02830120.XA CN1788207A (en) 2002-12-31 2002-12-31 Method for data analysing of programmable logic analysing device
AU2002364532A AU2002364532A1 (en) 2002-12-31 2002-12-31 Programmable logic analyzer data analyzing method
DE10297849T DE10297849T5 (en) 2002-12-31 2002-12-31 Programmable logic analyzer data analysis method
JP2004563127A JP2006515671A (en) 2002-12-31 2002-12-31 Programmable logic analyzer data analysis method
US10/541,190 US20060075212A1 (en) 2002-12-31 2002-12-31 Programmable logic analyzer data analyzing method
PCT/US2002/038991 WO2004059334A1 (en) 2002-12-31 2002-12-31 Programmable logic analyzer data analyzing method
GB0512636A GB2411965A (en) 2002-12-31 2005-06-21 Programmable logic analyzer data analyzing method

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CN103730168A (en) * 2012-10-11 2014-04-16 孕龙科技股份有限公司 Method for detecting data storage apparatus
TWI554768B (en) * 2014-10-21 2016-10-21 Zeroplus Technology Co Ltd Logic analyzer calibration method
TWI546551B (en) * 2015-06-24 2016-08-21 Zeroplus Technology Co Ltd Multi-analysis system and its multi-analyzer

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AU2002364532A1 (en) 2004-07-22
DE10297849T5 (en) 2005-12-15
CA2511394A1 (en) 2004-07-15
CN1788207A (en) 2006-06-14
WO2004059334A8 (en) 2004-09-30
GB2411965A (en) 2005-09-14
GB0512636D0 (en) 2005-07-27

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