USD947693S1 - Measurement probe head assembly - Google Patents
Measurement probe head assembly Download PDFInfo
- Publication number
- USD947693S1 USD947693S1 US29/706,540 US201929706540F USD947693S US D947693 S1 USD947693 S1 US D947693S1 US 201929706540 F US201929706540 F US 201929706540F US D947693 S USD947693 S US D947693S
- Authority
- US
- United States
- Prior art keywords
- head assembly
- probe head
- measurement probe
- view
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
Environmental portions of the measurement probe head assembly and stand are shown in broken lines and form no part of the claimed design.
Claims (1)
- The ornamental design for a measurement probe head assembly, as shown and described.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/706,540 USD947693S1 (en) | 2019-09-20 | 2019-09-20 | Measurement probe head assembly |
JPD2020-5354F JP1664105S (en) | 2019-09-20 | 2020-03-19 | |
JPD2020-5355F JP1664106S (en) | 2019-09-20 | 2020-03-19 | |
US29/832,636 USD992437S1 (en) | 2019-09-20 | 2022-03-29 | Tip cable component of a measurement probe head assembly |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/706,540 USD947693S1 (en) | 2019-09-20 | 2019-09-20 | Measurement probe head assembly |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/832,636 Division USD992437S1 (en) | 2019-09-20 | 2022-03-29 | Tip cable component of a measurement probe head assembly |
Publications (1)
Publication Number | Publication Date |
---|---|
USD947693S1 true USD947693S1 (en) | 2022-04-05 |
Family
ID=71663108
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/706,540 Active USD947693S1 (en) | 2019-09-20 | 2019-09-20 | Measurement probe head assembly |
US29/832,636 Active USD992437S1 (en) | 2019-09-20 | 2022-03-29 | Tip cable component of a measurement probe head assembly |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/832,636 Active USD992437S1 (en) | 2019-09-20 | 2022-03-29 | Tip cable component of a measurement probe head assembly |
Country Status (2)
Country | Link |
---|---|
US (2) | USD947693S1 (en) |
JP (2) | JP1664106S (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD968987S1 (en) * | 2022-02-21 | 2022-11-08 | Kaichun Lin | Soil tester |
USD991058S1 (en) * | 2021-10-12 | 2023-07-04 | Shenzhen Hypersynes Co., Ltd. | Probe |
USD992437S1 (en) * | 2019-09-20 | 2023-07-18 | Tektronix, Inc. | Tip cable component of a measurement probe head assembly |
Citations (76)
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USD354923S (en) | 1994-01-31 | 1995-01-31 | Tektronix, Inc. | Probing head for an electrical test probe |
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US6336592B1 (en) | 1999-12-09 | 2002-01-08 | Tektronix, Inc. | Thermal control for a test and measurement instrument |
USD460371S1 (en) | 2001-12-20 | 2002-07-16 | Tektronix, Inc. | Measurement instrument |
USD460703S1 (en) | 2001-12-20 | 2002-07-23 | Tektronix, Inc. | Measurement instrument |
USD472171S1 (en) | 2001-12-20 | 2003-03-25 | Tektronix, Inc. | Measurement instrument housing |
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US8024141B2 (en) | 2009-09-04 | 2011-09-20 | Tektronix, Inc. | Test and measurement instrument and method for providing post-acquisition trigger control and presentation |
US8055464B2 (en) | 2008-09-08 | 2011-11-08 | Tektronix, Inc. | Method of processing waveform data from one or more channels using a test and measurement instrument |
US8089293B2 (en) | 2009-04-20 | 2012-01-03 | Tektronix, Inc. | Test and measurement instrument and method of configuring using a sensed impedance |
US8103473B2 (en) | 2007-11-12 | 2012-01-24 | Tektronix, Inc. | Test and measurement instrument and method of calibrating |
USD663636S1 (en) | 2011-04-22 | 2012-07-17 | Tektronix, Inc. | Front panel for a measurement instrument |
US8228072B2 (en) | 2009-04-23 | 2012-07-24 | Tektronix, Inc. | Test and measurement instrument with an automatic threshold control |
USD664458S1 (en) | 2011-04-22 | 2012-07-31 | Tektronix, Inc. | Input/output connector receptacles for a measurement instrument |
USD671021S1 (en) | 2011-05-05 | 2012-11-20 | Tektronix, Inc. | RF input/output connector receptacle and control buttons for a measurement instrument |
US8324885B2 (en) | 2009-09-17 | 2012-12-04 | Tektronix, Inc. | Mixed signal acquisition system for a measurement instrument |
US8335950B2 (en) | 2009-08-12 | 2012-12-18 | Tektronix, Inc. | Test and measurement instrument with bit-error detection |
USD677184S1 (en) | 2011-09-06 | 2013-03-05 | Tektronix, Inc. | Portable measurement instrument |
US8461850B2 (en) | 2010-08-13 | 2013-06-11 | Tektronix, Inc. | Time-domain measurements in a test and measurement instrument |
US8521460B2 (en) | 2010-09-28 | 2013-08-27 | Tektronix, Inc. | Multi-domain test and measurement instrument |
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US8793536B2 (en) | 2012-08-22 | 2014-07-29 | Tektronix, Inc. | Test and measurement instrument with auto-sync for bit-error detection |
US8818744B2 (en) | 2008-10-16 | 2014-08-26 | Tektronix, Inc. | Test and measurement instrument and method of switching waveform display styles |
US8924175B2 (en) | 2009-03-09 | 2014-12-30 | Tektronix, Inc. | Apparatus and method for performing burst triggering in a test and measurement instrument |
US9026390B2 (en) | 2011-09-06 | 2015-05-05 | Tektronix, Inc. | Interleaved RF triggering on a test and measurement instrument |
US9134347B2 (en) | 2012-10-01 | 2015-09-15 | Tektronix, Inc. | Rare anomaly triggering in a test and measurement instrument |
US9157943B2 (en) | 2010-08-13 | 2015-10-13 | Tektronix, Inc. | Multi-channel frequency domain test and measurement instrument |
US9207269B2 (en) | 2012-05-22 | 2015-12-08 | Tektronix, Inc. | Automatically detecting in-band but out-of-span power in a frequency-domain test and measurement instrument |
US9239343B2 (en) | 2011-06-06 | 2016-01-19 | Tektronix, Inc. | Interleaved digital down-conversion on a test and measurement instrument |
US9291646B2 (en) | 2012-07-27 | 2016-03-22 | Tektronix, Inc. | Cross domain triggering in a test and measurement instrument |
US9297834B2 (en) | 2010-08-13 | 2016-03-29 | Tektronix, Inc. | Time-domain searching in a test and measurement instrument |
US9306590B2 (en) | 2011-05-26 | 2016-04-05 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
US20160187383A1 (en) * | 2014-12-29 | 2016-06-30 | Bosch Automotive Service Solutions Inc. | Talking Test Light |
US9432042B2 (en) | 2011-05-26 | 2016-08-30 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
US9525427B1 (en) | 2015-09-11 | 2016-12-20 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter |
US9568503B2 (en) | 2011-05-26 | 2017-02-14 | Tektronix, Inc. | Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
USD786108S1 (en) | 2016-01-12 | 2017-05-09 | Tektronix, Inc. | Browser probe assembly |
US9714956B2 (en) | 2012-12-13 | 2017-07-25 | Tektronix, Inc. | Test and measurement instrument user interface with move mode |
US9858240B2 (en) | 2012-12-13 | 2018-01-02 | Tektronix, Inc. | Automatic center frequency and span setting in a test and measurement instrument |
USD808832S1 (en) | 2016-02-29 | 2018-01-30 | Tektronix, Inc. | Measurement system with controller and sensor head |
USD820129S1 (en) | 2014-11-21 | 2018-06-12 | Tektronix, Inc. | Front panel for a measurement instrument |
USD821234S1 (en) | 2016-07-11 | 2018-06-26 | Tektronix, Inc. | Multi-channel measurement instrument housing |
US10094868B2 (en) | 2014-04-11 | 2018-10-09 | Tektronix, Inc. | Test and measurement instrument having advanced triggering capability |
US10107649B2 (en) | 2009-09-22 | 2018-10-23 | Tektronix, Inc. | Test and measurement instrument using combined signals |
US10559173B2 (en) * | 2015-03-11 | 2020-02-11 | James Hickman | Non-contact voltage detector |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD947693S1 (en) * | 2019-09-20 | 2022-04-05 | Tektronix, Inc. | Measurement probe head assembly |
-
2019
- 2019-09-20 US US29/706,540 patent/USD947693S1/en active Active
-
2020
- 2020-03-19 JP JPD2020-5355F patent/JP1664106S/ja active Active
- 2020-03-19 JP JPD2020-5354F patent/JP1664105S/ja active Active
-
2022
- 2022-03-29 US US29/832,636 patent/USD992437S1/en active Active
Patent Citations (83)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5149182A (en) | 1991-05-02 | 1992-09-22 | Tektronix, Inc. | Optical filter for an optical measurement instrument |
US5406067A (en) | 1993-08-17 | 1995-04-11 | Tektronix, Inc. | Electrically adjusted mosaic filter for use as an optical sensor in an optical measurement instrument |
USD354923S (en) | 1994-01-31 | 1995-01-31 | Tektronix, Inc. | Probing head for an electrical test probe |
US5491548A (en) | 1994-03-18 | 1996-02-13 | Tektronix, Inc. | Optical signal measurement instrument and wide dynamic range optical receiver for use therein |
USD365997S (en) | 1995-03-03 | 1996-01-09 | Tektronix, Inc. | Hand-held measurement instrument with grip |
USD366432S (en) | 1995-03-03 | 1996-01-23 | Tektronix, Inc. | Electronic measurement instrument |
USD404664S (en) | 1998-01-22 | 1999-01-26 | Tektronix, Inc. | Recessed display bezel for a hand-held electronic measurement instrument |
USD401875S (en) | 1998-01-22 | 1998-12-01 | Tektronix, Inc. | Button configuration in a hand-held electronic measurement instrument |
USD404665S (en) | 1998-01-22 | 1999-01-26 | Tektronix, Inc. | Hand-held electronic measurement instrument |
USD404666S (en) | 1998-01-22 | 1999-01-26 | Tektronix, Inc. | Raised display bezel for a hand-held electronic measurement instrument |
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USD420607S (en) | 1999-04-09 | 2000-02-15 | Tektronix, Inc. | Front panel for a measurement instrument |
US6728648B1 (en) | 1999-09-24 | 2004-04-27 | Tektronix, Inc. | Test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature |
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USD444085S1 (en) | 2000-03-13 | 2001-06-26 | Tektronix, Inc. | Processor and display module for a modular measurement instrument |
USD444086S1 (en) | 2000-03-13 | 2001-06-26 | Tektronix, Inc. | Modular measurement instrument |
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US7734442B2 (en) | 2007-04-23 | 2010-06-08 | Tektronix, Inc. | Apparatus and method for a test and measurement instrument |
US8103473B2 (en) | 2007-11-12 | 2012-01-24 | Tektronix, Inc. | Test and measurement instrument and method of calibrating |
US8055464B2 (en) | 2008-09-08 | 2011-11-08 | Tektronix, Inc. | Method of processing waveform data from one or more channels using a test and measurement instrument |
US8818744B2 (en) | 2008-10-16 | 2014-08-26 | Tektronix, Inc. | Test and measurement instrument and method of switching waveform display styles |
US9529017B2 (en) | 2008-10-16 | 2016-12-27 | Tektronix, Inc. | Test and measurement instrument and method of switching waveform display styles |
US8924175B2 (en) | 2009-03-09 | 2014-12-30 | Tektronix, Inc. | Apparatus and method for performing burst triggering in a test and measurement instrument |
US9075696B2 (en) | 2009-03-09 | 2015-07-07 | Tektronix, Inc. | Apparatus and method for performing burst triggering in a test and measurement instrument |
US9934355B2 (en) | 2009-03-09 | 2018-04-03 | Tektronix, Inc. | Apparatus and method for performing burst triggering in a test and measurement instrument |
US8089293B2 (en) | 2009-04-20 | 2012-01-03 | Tektronix, Inc. | Test and measurement instrument and method of configuring using a sensed impedance |
US8228072B2 (en) | 2009-04-23 | 2012-07-24 | Tektronix, Inc. | Test and measurement instrument with an automatic threshold control |
US8335950B2 (en) | 2009-08-12 | 2012-12-18 | Tektronix, Inc. | Test and measurement instrument with bit-error detection |
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US10107649B2 (en) | 2009-09-22 | 2018-10-23 | Tektronix, Inc. | Test and measurement instrument using combined signals |
US8461850B2 (en) | 2010-08-13 | 2013-06-11 | Tektronix, Inc. | Time-domain measurements in a test and measurement instrument |
US8649989B2 (en) | 2010-08-13 | 2014-02-11 | Tektronix, Inc. | Time-domain triggering in a test and measurement instrument |
US9297834B2 (en) | 2010-08-13 | 2016-03-29 | Tektronix, Inc. | Time-domain searching in a test and measurement instrument |
US9157943B2 (en) | 2010-08-13 | 2015-10-13 | Tektronix, Inc. | Multi-channel frequency domain test and measurement instrument |
US8521460B2 (en) | 2010-09-28 | 2013-08-27 | Tektronix, Inc. | Multi-domain test and measurement instrument |
US8675719B2 (en) | 2010-09-28 | 2014-03-18 | Tektronix, Inc. | Multi-domain test and measurement instrument |
US9020016B2 (en) | 2010-09-28 | 2015-04-28 | Tektronix, Inc. | Multi-domain test and measurement instrument |
US8615382B2 (en) | 2011-01-27 | 2013-12-24 | Tektronix, Inc. | Test and measurement instrument with common presentation of time domain data |
USD663636S1 (en) | 2011-04-22 | 2012-07-17 | Tektronix, Inc. | Front panel for a measurement instrument |
USD664458S1 (en) | 2011-04-22 | 2012-07-31 | Tektronix, Inc. | Input/output connector receptacles for a measurement instrument |
USD671021S1 (en) | 2011-05-05 | 2012-11-20 | Tektronix, Inc. | RF input/output connector receptacle and control buttons for a measurement instrument |
US8742749B2 (en) | 2011-05-26 | 2014-06-03 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
US9306590B2 (en) | 2011-05-26 | 2016-04-05 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
US9568503B2 (en) | 2011-05-26 | 2017-02-14 | Tektronix, Inc. | Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
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US10330705B2 (en) | 2011-05-26 | 2019-06-25 | Tektronix, Inc. | Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing |
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USD677184S1 (en) | 2011-09-06 | 2013-03-05 | Tektronix, Inc. | Portable measurement instrument |
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US9291646B2 (en) | 2012-07-27 | 2016-03-22 | Tektronix, Inc. | Cross domain triggering in a test and measurement instrument |
US8793536B2 (en) | 2012-08-22 | 2014-07-29 | Tektronix, Inc. | Test and measurement instrument with auto-sync for bit-error detection |
US9134347B2 (en) | 2012-10-01 | 2015-09-15 | Tektronix, Inc. | Rare anomaly triggering in a test and measurement instrument |
US9858240B2 (en) | 2012-12-13 | 2018-01-02 | Tektronix, Inc. | Automatic center frequency and span setting in a test and measurement instrument |
US9714956B2 (en) | 2012-12-13 | 2017-07-25 | Tektronix, Inc. | Test and measurement instrument user interface with move mode |
US10094868B2 (en) | 2014-04-11 | 2018-10-09 | Tektronix, Inc. | Test and measurement instrument having advanced triggering capability |
USD820129S1 (en) | 2014-11-21 | 2018-06-12 | Tektronix, Inc. | Front panel for a measurement instrument |
USD820127S1 (en) | 2014-11-21 | 2018-06-12 | Tektronix, Inc. | Housing for a test and measurement instrument |
US20160187383A1 (en) * | 2014-12-29 | 2016-06-30 | Bosch Automotive Service Solutions Inc. | Talking Test Light |
US10559173B2 (en) * | 2015-03-11 | 2020-02-11 | James Hickman | Non-contact voltage detector |
US9859908B2 (en) | 2015-09-11 | 2018-01-02 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter |
US9525427B1 (en) | 2015-09-11 | 2016-12-20 | Tektronix, Inc. | Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter |
USD786108S1 (en) | 2016-01-12 | 2017-05-09 | Tektronix, Inc. | Browser probe assembly |
USD808832S1 (en) | 2016-02-29 | 2018-01-30 | Tektronix, Inc. | Measurement system with controller and sensor head |
USD821234S1 (en) | 2016-07-11 | 2018-06-26 | Tektronix, Inc. | Multi-channel measurement instrument housing |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD992437S1 (en) * | 2019-09-20 | 2023-07-18 | Tektronix, Inc. | Tip cable component of a measurement probe head assembly |
USD991058S1 (en) * | 2021-10-12 | 2023-07-04 | Shenzhen Hypersynes Co., Ltd. | Probe |
USD968987S1 (en) * | 2022-02-21 | 2022-11-08 | Kaichun Lin | Soil tester |
Also Published As
Publication number | Publication date |
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USD992437S1 (en) | 2023-07-18 |
JP1664105S (en) | 2020-07-20 |
JP1664106S (en) | 2020-07-20 |
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