USD1003181S1 - Test and measurement instrument and accessories - Google Patents

Test and measurement instrument and accessories Download PDF

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Publication number
USD1003181S1
USD1003181S1 US29/809,745 US202129809745F USD1003181S US D1003181 S1 USD1003181 S1 US D1003181S1 US 202129809745 F US202129809745 F US 202129809745F US D1003181 S USD1003181 S US D1003181S
Authority
US
United States
Prior art keywords
test
accessories
measurement instrument
view
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/809,745
Inventor
Chris A. Valentine
Neil Clayton
David M. Ediger
Marc A. Gessford
Taylor S. K. Heen
Brian A. Hollenberg
Steve U. Reinhold
Prashanth Thota
Satya N. Whitlock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/809,745 priority Critical patent/USD1003181S1/en
Assigned to TEKTRONIX, INC reassignment TEKTRONIX, INC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: REINHOLD, STEVE U., EDIGER, DAVID M., HEEN, TAYLOR S. K., VALENTINE, CHRIS A., WHITLOCK, SATYA N., GESSFORD, MARC A., HOLLENBERG, BRIAN A., CLAYTON, NEIL, THOTA, PRASHANTH
Priority to TW111301482F priority patent/TWD224179S/en
Priority to TW111305708F priority patent/TWD225702S/en
Priority to TW111305709F priority patent/TWD225703S/en
Priority to TW111305710F priority patent/TWD225704S/en
Priority to JP2022006490F priority patent/JP1731016S/en
Priority to JP2022006486F priority patent/JP1743919S/en
Priority to TW111305707F priority patent/TWD225701S/en
Priority to JP2022006488F priority patent/JP1731014S/en
Priority to JP2022006489F priority patent/JP1731015S/en
Priority to JP2022006487F priority patent/JP1743857S/en
Priority to US17/953,234 priority patent/US20230016996A1/en
Priority to CN202211201397.1A priority patent/CN115875544A/en
Publication of USD1003181S1 publication Critical patent/USD1003181S1/en
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a top, front, right, isometric view of a test and measurement instrument showing the new design;
FIG. 2 is a top, rear, left isometric view thereof;
FIG. 3 is a front elevational view thereof
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof;
FIG. 8 is a rear elevational view thereof;
FIG. 9 is a top, front, right, isometric view of another embodiment of a test and measurement instrument showing the new design;
FIG. 10 is a top, rear, left isometric view thereof;
FIG. 11 is a front elevational view thereof
FIG. 12 is a left side elevational view thereof;
FIG. 13 is a right side elevational view thereof;
FIG. 14 is a top plan view thereof;
FIG. 15 is a bottom plan view thereof; and,
FIG. 16 is a rear elevational view thereof.
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the test and measurement instrument and accessories, neither of which form any part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a test and measurement instrument and accessories, as shown and described.
US29/809,745 2019-09-17 2021-09-29 Test and measurement instrument and accessories Active USD1003181S1 (en)

Priority Applications (13)

Application Number Priority Date Filing Date Title
US29/809,745 USD1003181S1 (en) 2021-09-29 2021-09-29 Test and measurement instrument and accessories
JP2022006486F JP1743919S (en) 2021-09-29 2022-03-29 electrical measuring instrument
JP2022006488F JP1731014S (en) 2021-09-29 2022-03-29 electrical measuring instrument
TW111305709F TWD225703S (en) 2021-09-29 2022-03-29 Battery accessory for test and measurement instrument
TW111305710F TWD225704S (en) 2021-09-29 2022-03-29 Test and measurement instrument
JP2022006490F JP1731016S (en) 2021-09-29 2022-03-29 electrical measuring instrument
TW111301482F TWD224179S (en) 2021-09-29 2022-03-29 Test and measurement instrument
TW111305707F TWD225701S (en) 2021-09-29 2022-03-29 Test and measurement instrument with stand and battery
TW111305708F TWD225702S (en) 2021-09-29 2022-03-29 Stand accessory for test and measurement instrument
JP2022006489F JP1731015S (en) 2021-09-29 2022-03-29 electrical measuring instrument
JP2022006487F JP1743857S (en) 2021-09-29 2022-03-29 electrical measuring instrument
US17/953,234 US20230016996A1 (en) 2019-09-17 2022-09-26 Stand for a test and measurement instrument
CN202211201397.1A CN115875544A (en) 2021-09-29 2022-09-29 Support for a test and measurement instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/809,745 USD1003181S1 (en) 2021-09-29 2021-09-29 Test and measurement instrument and accessories

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US29706063 Continuation-In-Part 2019-09-17 2019-09-17

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US17/953,234 Continuation-In-Part US20230016996A1 (en) 2019-09-17 2022-09-26 Stand for a test and measurement instrument

Publications (1)

Publication Number Publication Date
USD1003181S1 true USD1003181S1 (en) 2023-10-31

Family

ID=84227967

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/809,745 Active USD1003181S1 (en) 2019-09-17 2021-09-29 Test and measurement instrument and accessories

Country Status (3)

Country Link
US (1) USD1003181S1 (en)
JP (5) JP1731016S (en)
TW (5) TWD225703S (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109514396A (en) * 2019-01-17 2019-03-26 滦南县丰田五金农具制造有限公司 A kind of quincunx drum curved surface polishing machine and its polishing method

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD340701S (en) * 1991-07-05 1993-10-26 Canon Kabushiki Kaisha Input and output terminal for electronic computers
USD345346S (en) * 1991-10-18 1994-03-22 International Business Machines Corp. Pen-based computer
USD354743S (en) * 1993-04-02 1995-01-24 Vieira Osvaldo B Microprocessor controlled road map
USD355170S (en) * 1993-06-24 1995-02-07 Sharp Kabushiki Kaisha Computer
USD356548S (en) * 1993-05-27 1995-03-21 International Business Machines Corp. Enclosure of a hand held computer
USD386099S (en) * 1996-06-24 1997-11-11 Machinexpert, LLC Portable machinery analyzer
US6437552B1 (en) * 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
US7463015B2 (en) * 2006-12-29 2008-12-09 Tektronix, Inc. Time shifting signal acquisition probe system
USD742371S1 (en) * 2013-07-29 2015-11-03 Raytheon Company Mounted computer design
USD797586S1 (en) * 2015-05-26 2017-09-19 Graphtec Corporation Measurement data collector
USD864952S1 (en) * 2016-10-28 2019-10-29 Mitsubishi Electric Corporation Input device for industrial equipment
TWD201506S (en) 2018-05-15 2019-12-21 日商國際計測器股份有限公&#x5 Testing instrument (steering testing system)
JP1663342S (en) 2019-06-12 2020-07-13
USD898735S1 (en) * 2018-08-10 2020-10-13 Shenzhen Ugee Technology Co., Ltd Pen display
USD909899S1 (en) 2019-01-25 2021-02-09 Tektronix, Inc. Housing for a test and measurement instrument

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD865489S1 (en) 2017-04-14 2019-11-05 Fluke Electronics Corporation Combined magnetic hanger and tilt stand for a portable test tool

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD340701S (en) * 1991-07-05 1993-10-26 Canon Kabushiki Kaisha Input and output terminal for electronic computers
USD345346S (en) * 1991-10-18 1994-03-22 International Business Machines Corp. Pen-based computer
USD354743S (en) * 1993-04-02 1995-01-24 Vieira Osvaldo B Microprocessor controlled road map
USD356548S (en) * 1993-05-27 1995-03-21 International Business Machines Corp. Enclosure of a hand held computer
USD355170S (en) * 1993-06-24 1995-02-07 Sharp Kabushiki Kaisha Computer
USD386099S (en) * 1996-06-24 1997-11-11 Machinexpert, LLC Portable machinery analyzer
US6437552B1 (en) * 2000-07-31 2002-08-20 Lecroy Corporation Automatic probe identification system
US7463015B2 (en) * 2006-12-29 2008-12-09 Tektronix, Inc. Time shifting signal acquisition probe system
USD742371S1 (en) * 2013-07-29 2015-11-03 Raytheon Company Mounted computer design
USD797586S1 (en) * 2015-05-26 2017-09-19 Graphtec Corporation Measurement data collector
USD864952S1 (en) * 2016-10-28 2019-10-29 Mitsubishi Electric Corporation Input device for industrial equipment
TWD201506S (en) 2018-05-15 2019-12-21 日商國際計測器股份有限公&#x5 Testing instrument (steering testing system)
USD898735S1 (en) * 2018-08-10 2020-10-13 Shenzhen Ugee Technology Co., Ltd Pen display
USD909899S1 (en) 2019-01-25 2021-02-09 Tektronix, Inc. Housing for a test and measurement instrument
JP1663342S (en) 2019-06-12 2020-07-13

Also Published As

Publication number Publication date
JP1731016S (en) 2022-11-30
TWD225704S (en) 2023-06-01
JP1731015S (en) 2022-11-30
JP1743919S (en) 2023-05-11
TWD224179S (en) 2023-03-11
TWD225702S (en) 2023-06-01
TWD225701S (en) 2023-06-01
JP1743857S (en) 2023-05-11
JP1731014S (en) 2022-11-30
TWD225703S (en) 2023-06-01

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